BS QC 400102-1992 Specification for harmonized system of quality assessment for electronic components - Fixed resistors for use in electronic equipment - Blank detail specificatione.pdf

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1、BRITISH STANDARD BS QC 400102:1992 IEC 115-2-2: 1992 Specification for Harmonized system of quality assessment for electronic components Fixed resistors for use in electronic equipment Blank detail specification Fixed low-power non-wirewound resistors Assessment level FBSQC400102:1992 BSI 10-1999 IS

2、BN 0 580 35647 7 Amendments issued since publication Amd. No. Date CommentsBSQC400102:1992 BSI 10-1999 i Contents Page National foreword ii Introduction 1 Section 1. General data 2 1 General data 2 Section 2. Inspection requirements 3 2 Inspection requirements 3 Table I 2 Table II 4BSQC400102:1992 i

3、i BSI 10-1999 National foreword This British Standard has been prepared under the direction of the Electronic Components Standards Policy Committee (ECL/-). It is identical with IEC115-2-2:1992 (QC400102) “Fixed resistors for use in electronic equipment. Part2: Blank detail specification: Fixed low-

4、power non-wirewound resistors. Assessment level F”, published by the International Electrotechnical Commission (IEC) and is a harmonized specification within the IECQ System of quality assessment for electronic components. IEC115-2-2 was prepared by IEC Technical Committee No.40, Capacitors and resi

5、stors for electronic equipment, and the United Kingdom participation in the drafting was provided by Technical Committee ECL/4, Capacitors and resistors for electronic equipment. Scope. This standard lists the ratings, characteristics and inspection requirements which shall be included as mandatory

6、requirements in accordance with BSQC400100 in any detail specifications for these components. The British Standard which implements the IECQ Rules of Procedure is BS9000 “General requirements for a system for electronic components of assessed quality” Part3:1991 “Specification for the national imple

7、mentation of the IECQ System”. The Technical Committee has reviewed the provisions of IEC410 to which reference is made in the text and has decided that they are acceptable for use in conjunction with this standard. Detail Specification. Detail specifications shall comply with the requirements of th

8、is Blank Detail Specification and BSQC001002:1991 “Rules of Procedure of the IEC Quality Assessment System for Electronic Components (IECQ)”. A British Standard does not purport to include all the necessary provisions of a contract. Users of British Standards are responsible for their correct applic

9、ation. Compliance with a British Standard does not of itself confer immunity from legal obligations. Cross-references International Standard Corresponding British Standard IEC 115-1:1982 (QC 400000) BS QC 400000:1990 Harmonized system of quality assessment for electronic components. Fixed resistors

10、for use in electronic equipment. Generic specification (Identical) IEC 115-2:1982 (QC 400100) BS 9940 Harmonized system of quality assessment for electronic components. Fixed resistors for use in electronic equipment Part 01.0:1983: Sectional specification for fixed low-power non-wirewound resistors

11、 (Identical) Summary of pages This document comprises a front cover, an inside front cover, pages i and ii, pages 1 to 8 and a back cover. This standard has been updated (see copyright date) and may have had amendments incorporated. This will be indicated in the amendment table on the inside front c

12、over.BSQC400102:1992 BSI 10-1999 1 Introduction Blank detail specification A blank detail specification is a supplementary document to the Sectional Specification and contains requirements for style and layout and minimum content of detail specifications. Detail specifications not complying with the

13、se requirements shall not be considered as being in accordance with IEC specifications nor shall they so be described. In the preparation of detail specifications the content of Sub-clause1.4 of the Sectional Specification shall be taken into account. The numbers between brackets on the first page c

14、orrespond to the following information which shall be inserted in the position indicated. Identification of the detail specification 1) The “International Electrotechnical Commission” or the National Standards Organisation under whose authority the detail specification is drafted. 2) The IEC or Nati

15、onal Standards number of the detail specification, date of issue and any further information required by the national system. 3) The number and issue number of the IEC or national Generic Specification. 4) The IEC number of the blank detail specification. Identification of the resistor 5) A short de

16、scription of the type of resistor. 6) Information on typical construction (when applicable). NOTEWhen the resistor is not designed for use in printed board applications, this shall be clearly stated in the detail specification in this position. 7) Outline drawing with main dimensions which are of im

17、portance for interchangeability and/or reference to the national or international documents for outlines. Alternatively, this drawing may be given in an appendix to the detail specification. 8) Application or group of applications covered and/or assessment level. NOTEThe assessment level(s) to be us

18、ed in a detail specification shall be selected from the sectional specification, Sub-clause 3.3.3. This implies that one blank detail specification may be used in combination with several assessment levels, provided the grouping of the tests does not change. 9) Reference data on the most important p

19、roperties, to allow comparison between the various resistor types. (1) IEC 115-2-2-XXX QC 400102-XXX (2) ELECTRONIC COMPONENTS OF ASSESSED QUALITY IN ACCORDANCE WITH: IEC 115-2-2 QC 400102 (4) (3) FIXED LOW-POWER NON-WIREWOUND RESISTORS (5) Outline drawing: (see Table I) (. . . angle projection) (7)

20、 Insulated/non-insulated (6) (Other shapes are permitted within the dimensions given) Assessment level(s): F (8) Stability class: . . . %BSQC400102:1992 2 BSI 10-1999 Section 1. General data 1 General data 1.1 Recommended method(s) of mounting (to be inserted) (See Sub-clause 1.4.2 of IEC Publicatio

21、n115-2.) 1.2 Dimensions, ratings and characteristics Table I All dimensions are in millimetres or inches and millimetres. 1.2.1 Derating Resistors covered by this specification are derated according to the curve: (A suitable curve to be included in the detail specification) NOTESee also Sub-clause 2

22、.2.3 of the sectional specification. 1.3 Related documents Information on the availability of components qualified to this detail specification is given in the Qualified Products List. (9) Style Rated dissipation at 70 C (W) Limiting element voltage (V d.c. or a.c. r.m.s.) Isolation voltage (V.d.c.

23、or a.c. peak) Maximum dimensions d nom: L D Tol.: Resistance range a . . . to . . . 7 Tolerance on rated resistance . . . % Climatic category / Low air pressure 8,5 kPa (85 mbar) Stability class . . . % Limits for change of resistance: for long-term tests (. . . %R + . . . 7) for short-term tests (.

24、 . . %R + . . . 7) Variation of resistance with temperature (for carbon composition types) k . . . % Temperature coefficient (for all other resistors) !: . . . 10 6 / C a The preferred values are those of the E-series of IEC Publication 63: Preferred Number Series for Resistors and Capacitors. Gener

25、ic Specification: IEC Publication 115-1:(1982): Fixed Resistors for Use in Electronic Equipment Part 1: Generic Specification. Amendment No. 2 (1987). Sectional Specification: IEC Publication 115-2:(1982): Part 2: Sectional Specification: Fixed Low-power Non-wirewound Resistors. %R R -BSQC400102:199

26、2 BSI 10-1999 3 1.4 Marking The marking of the components and packaging shall be in accordance with the requirements of IECPublication115-1, Sub-clause 2.4. NOTEThe details of the marking of the component and packaging shall be given in full in the detail specification. 1.5 Ordering information Orde

27、rs for resistors covered by this specification shall contain, in clear or in coded form, the following minimum information: a) Rated resistance. b) Tolerance on rated resistance. c) Number and issue number reference of the detail specification and style reference. 1.6 Certified records of released l

28、ots Required/not required. 1.7 Additional information (not for inspection purposes) 1.8 Additional or increased severities or requirements to those specified in the generic and/or sectional specification NOTEAdditions or increased requirements should be specified only when essential. Section 2. Insp

29、ection requirements 2 Inspection requirements 2.1 Procedures 2.1.1 For Qualification Approval the procedure shall be in accordance with the Sectional Specification, IEC Publication115-2, Sub-clause 3.2. 2.1.2 For Quality Conformance Inspection the test schedule (Table II) includes sampling, periodic

30、ity, severities and requirements. The formation of inspection lots is covered by Sub-clause 3.3.1 of the Sectional Specification. NOTEWhen drying is called for, Procedure I of Sub-clause 4.3 of the Generic Specification, IEC Publication115-1, shall be used.BSQC400102:1992 4 BSI 10-1999 Table II NOTE

31、 1Sub-clause numbers of test and performance requirements refer to the Generic Specification, IEC Publication 115-1, except for resistance change requirements, which shall be selected from the Table I and Table II of the sectional specification, as appropriate. NOTE 2Inspection Levels and AQLs are s

32、elected from IEC Publication 410: Sampling Plans and Procedures for Inspection by Attributes. NOTE 3In this table: p = periodicity (in months) n = sample size c = acceptance criterion (permitted number of defectives) D = destructive ND = non-destructive IL = inspection level IEC Publication 410 AQL

33、= acceptable quality level Sub-clause number and Test (see Note 1) D or ND Conditions of test (see Note 1) IL AQL Performance requirements (see Note 1) (see Note 2) Group A Inspection (lot-by-lot) Sub-group A1 ND S3 1,5 % 4.4.1 Visual examination As in 4.4.1 Legible marking and as specified in 1.4 o

34、f this specification Sub-Group A2 ND S4 1,5 % 4.5 Resistance As in 4.5.2 Group B Inspection (lot-by-lot) Sub-group B1 D S2 1,0 % 4.17 Solderability Without ageing Method: . . . Good tinning as evidenced by free flowing of the solder with wetting of the terminations or solder shall flow within . . .

35、s, as applicable 4.30 Solvent resistance of the marking (if applicable) Solvent: . . . Solvent temperature: . . . Method 1 Rubbing material: cotton wool Legible marking Recovery: . . . BSQC400102:1992 BSI 10-1999 5 Sub-clause number and Test (see Note 1) D or ND Conditions of test (see Note 1) Sampl

36、e size & criterion of acceptability (see Note 3) Performance requirements (see Note 1) p n c Group C Inspection (periodic) Sub-group C1 D 6 20 1 4.25.1 Endurance at 70 C Duration: 1000 h Examination at 48 h, 500 h and 1000 h: Visual examination No visible damage Resistance %R k (. . . %R + . . . 7)

37、Examination at 1000 h: Insulation resistance (Insulated resistors only) R U 1 G7 If required by the detail specification the test shall be extended to8000 h 12 20 Examination at 2000 h, 4000h and 8000 h: Resistance %R k (. . . %R +. . . 7) (The results obtained are for information only) Sub-group C2

38、 ND 6 20 1 4.4.2 Dimensions (gauging) A gauge-plate of . . . mm shall be used (if applicable) As specified in Table I of this specification Group D Inspection (periodic) Sub-group D1 D 6 20 1 4.24 Damp heat, steady state 1) Sub-clause 4.24.2.1 1st group 6: specimens 2nd group 7: specimens 3nd group

39、7: specimens 2) Sub-group 4.24.2.2 1st group 10: specimens 2nd group 10: specimens Visual examination No visible damage Legible marking Resistance %R k (. . . %R + . . . 7) Insulation resistance (Insulated resistors only) R U 100 M7BSQC400102:1992 6 BSI 10-1999 Sub-clause number and Test (see Note 1

40、) D or ND Conditions of test (see Note 1) Sample size & criterion of acceptability (see Note 3) Performance requirements (see Note 1) p n c Sub-group D2A D 36 10 Half of the sample of Sub-group D2 4.16 Robustness of terminations Tensile, bending and torsion tests (as applicable) Visual examination N

41、o visible damage Resistance %R k (. . . %R + . . . 7) 4.18 Resistance to soldering heat Method: . . . Visual examination No visible damage Legible marking Resistance %R k (. . . %R + . . . 7) 4.29 Component solvent resistance (if applicable) Solvent: . . . Solvent temperature: . . . Method 2 See det

42、ail specification Recovery: . . . Sub-group D2B D 36 10 Other half of the sample of Sub-group D2 4.19 Rapid change of temperature F A : Lower category temperature F B : Upper category temperature Visual examination No visible damage Resistance %R k (. . . %R + . . . 7) 4.22 Vibration Method of mount

43、ing: see 1.1 of this specification Procedure B4 Frequency range: . . . Hz to . . . Hz (see 2.3.2 of the sectional specification) Amplitude: 0,75 mm or 98 m/s 2(whichever is the less severe) Total duration: 6 h Visual examination No visible damage Resistance %R k (. . . %R + . . . 7)BSQC400102:1992 B

44、SI 10-1999 7 Sub-clause number and Test (see Note 1) D or ND Conditions of test (see Note 1) Sample size & criterion of acceptability (see Note 3) Performance requirements (see Note 1) p n c Sub-group D2 36 20 1 Combined sample of Sub-groups D2A and D2B 4.23 Climatic sequence Dry heat Damp heat, cyc

45、lic, Test Db, first cycle Cold Low air pressure 8,5 kPa (85 mbar) Damp heat, cyclic, Test Db, remaining cycles D.C. load (for non-wirewound types only) Visual examination No visible damage Legible marking Resistance %R k (. . . %R + . . . 7) Insulation resistance (Insulated resistors only) R U 100 M

46、7 Sub-group D3 D 36 20 1 4.4.3 Dimensions (detail) As specified in Table I of this specification 4.25.3 Endurance at upper category temperature Duration: 1000h Examination at 48 h, 500 h and 1000 h: Visual examination No visible damage Resistance %R k (. . . %R + . . . 7) Examination at 1000 h: Insu

47、lation resistance (Insulated resistors only) R U 1 G7BSQC400102:1992 8 BSI 10-1999 Sub-clause number and Test (see Note 1) D or ND Conditions of test (see Note 1) Sample size & criterion of acceptability (see Note 3) Performance requirements (see Note 1) p n c Sub-group D4 D 36 20 1 4.25 Endurance a

48、t other temperatures (if applicable) (This sub-group is only applicable if a derating curve other than those shown in the sectional specification,IEC Publication 115-2, sub-clause 2.2.3, is claimed in the detail specification) Duration: 1000 h Examination at 48 h, 500 h and 1000 h: Visual examinatio

49、n No visible damage Resistance %R k (. . . %R + . . . 7) (As for sub-group C2) Examination at 1000 h: Insulation resistance (Insulated resistors only) R U 1 G7 Sub-group D5 ND 36 20 1 4.8 Variation of resistance with temperature Lower category temperature/20 C k . . . % or !: . . . 10 6 / C 20 C/upper category temperature k . . . % or !: . . . 10 6 / C Sub-group D6 ND 36 20 1 4.7 Voltage proof (Insulated resistors only) Method: . . . No breakdown or flashover %R R -