BS ISO 17901-2-2015 Optics and photonics Holography Methods for measurement of hologram recording characteristics《光学和光子学 全息摄影术 全息记录特性的测量方法》.pdf

《BS ISO 17901-2-2015 Optics and photonics Holography Methods for measurement of hologram recording characteristics《光学和光子学 全息摄影术 全息记录特性的测量方法》.pdf》由会员分享，可在线阅读，更多相关《BS ISO 17901-2-2015 Optics and photonics Holography Methods for measurement of hologram recording characteristics《光学和光子学 全息摄影术 全息记录特性的测量方法》.pdf（32页珍藏版）》请在麦多课文档分享上搜索。

1、BSI Standards PublicationBS ISO 17901-2:2015Optics and photonics HolographyPart 2: Methods for measurement ofhologram recording characteristicsBS ISO 17901-2:2015 BRITISH STANDARDNational forewordThis British Standard is the UK implementation of ISO 17901-2:2015. The UK participation in its preparat

2、ion was entrusted to TechnicalCommittee CPW/172, Optics and Photonics.A list of organizations represented on this committee can be obtained on request to its secretary.This publication does not purport to include all the necessary provisions of a contract. Users are responsible for its correct appli

3、cation. The British Standards Institution 2015.Published by BSI Standards Limited 2015ISBN 978 0 580 81128 9 ICS 31.020 Compliance with a British Standard cannot confer immunity from legal obligations.This British Standard was published under the authority of the Standards Policy and Strategy Commit

4、tee on 31 July 2015.Amendments/corrigenda issued since publicationDate T e x t a f f e c t e d ISO 2015Optics and photonics Holography Part 2: Methods for measurement of hologram recording characteristicsOptique et photonique Holographie Partie 2: Mthodes de mesurage des caractristiques denregistrem

5、ent holographiqueINTERNATIONAL STANDARDISO 17901-2First edition 2015-07-01Reference number ISO 17901-2:2015(E)BS ISO 17901-2:2015ISO 17901-2:2015(E)ii ISO 2015 All rights reservedCOPYRIGHT PROTECTED DOCUMENT ISO 2015, Published in SwitzerlandAll rights reserved. Unless otherwise specified, no part o

6、f this publication may be reproduced or utilized otherwise in any form or by any means, electronic or mechanical, including photocopying, or posting on the internet or an intranet, without prior written permission. Permission can be requested from either ISO at the address below or ISOs member body

7、in the country of the requester.ISO copyright officeCh. de Blandonnet 8 CP 401CH-1214 Vernier, Geneva, SwitzerlandTel. +41 22 749 01 11Fax +41 22 749 09 47copyrightiso.orgwww.iso.orgBS ISO 17901-2:2015ISO 17901-2:2015(E)Foreword ivIntroduction v1 Scope . 12 Normative references 13 Terms and definiti

8、ons . 14 Symbols and abbreviated terms . 25 Principles . 26 Measurement methods 36.1 General . 36.2 Definition of the Coordinate System. 46.3 Hologram recording environment . 46.4 Measurement device and apparatus 46.5 Exposure characteristics curve measurement method for recording of the hologram .

9、66.6 Exposure at half-maximum measurement method for recording of the hologram 66.7 Method to measure the R-value of the hologram 76.8 Method to measure the amplitude of refractive index modulation of the hologram . 76.8.1 General 76.8.2 Measurement using the transmission hologram . 86.8.3 Measureme

10、nt using the reflection hologram 87 Description of measurement results . 97.1 General . 97.2 Description of the information concerning the object to be measured . 97.3 Description of the measurement results on the exposure characteristics curve and exposure at half-maximum for hologram recording 97.

11、4 Description of the R-value measurement result of the hologram . 97.5 Description of the measurement result of refractive index modulation of the hologram 10Annex A (informative) Assembly procedure and stability confirmation of hologram recording optical system based on double-beam interference 13A

12、nnex B (informative) Hologram recording procedure 15Annex C (informative) Relationship between the hologram and interference fringes due to double-beam interference .16 ISO 2015 All rights reserved iiiContents PageBS ISO 17901-2:2015ISO 17901-2:2015(E)ForewordISO (the International Organization for

13、Standardization) is a worldwide federation of national standards bodies (ISO member bodies). The work of preparing International Standards is normally carried out through ISO technical committees. Each member body interested in a subject for which a technical committee has been established has the r

14、ight to be represented on that committee. International organizations, governmental and non-governmental, in liaison with ISO, also take part in the work. ISO collaborates closely with the International Electrotechnical Commission (IEC) on all matters of electrotechnical standardization.The procedur

15、es used to develop this document and those intended for its further maintenance are described in the ISO/IEC Directives, Part 1. In particular the different approval criteria needed for the different types of ISO documents should be noted. This document was drafted in accordance with the editorial r

16、ules of the ISO/IEC Directives, Part 2 (see www.iso.org/directives).Attention is drawn to the possibility that some of the elements of this document may be the subject of patent rights. ISO shall not be held responsible for identifying any or all such patent rights. Details of any patent rights iden

17、tified during the development of the document will be in the Introduction and/or on the ISO list of patent declarations received (see www.iso.org/patents).Any trade name used in this document is information given for the convenience of users and does not constitute an endorsement.For an explanation

18、on the meaning of ISO specific terms and expressions related to conformity assessment, as well as information about ISOs adherence to the WTO principles in the Technical Barriers to Trade (TBT) see the following URL: Foreword - Supplementary information.The committee responsible for this document is

19、 ISO/TC 172, Optics and Photonics, Subcommittee SC 9, Electro-optical systems.ISO 17901 consists of the following parts, under the general title Optics and photonics Holography: Part 1: Methods of measuring diffraction efficiency and associated optical characteristics of holograms Part 2: Methods fo

20、r measurement of hologram recording characteristicsiv ISO 2015 All rights reservedBS ISO 17901-2:2015ISO 17901-2:2015(E)IntroductionA hologram is an optical device utilizing interference and applied in numerous fields. In order to know the exposure characteristics of materials on which the hologram

21、is to be recorded, it is enough to initially record the hologram under common conditions and subsequently establish the numeral values representing exposure characteristics by measuring the diffraction efficiency. Though the hologram-related terms and the measurement method of critical evaluation pa

22、rameters (diffraction efficiency, angular selectivity, wavelength selectivity) pertinent to optical characteristics are specified in ISO 17901-1, there is no stipulation as to the conditions concerning hologram recording or the way to calculate the numeral values. Therefore, the purpose of this part

23、 of ISO 17901 is to provide the terms and measurement method concerning the hologram exposure characteristics. This part of ISO 17901 does not intend to restrict manufacturing process. ISO 2015 All rights reserved vBS ISO 17901-2:2015ISO 17901-2:2015(E)BS ISO 17901-2:2015Optics and photonics Hologra

24、phy Part 2: Methods for measurement of hologram recording characteristics1 ScopeThis part of ISO 17901 specifies the terms and measurement method concerning exposure characteristics (exposure characteristic curve, exposure at half-maximum, R-value, amplitude of refractive index modulation) for the h

25、ologram recorded by double-beam interference. The materials of hologram to be measured are not restricted to any particular ones. This part of ISO 17901 does not intend to restrict manufacturing process.2 Normative referencesThe following documents, in whole or in part, are normatively referenced in

26、 this document and are indispensable for its application. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies.ISO 15902, Optics and photonics Diffractive optics VocabularyISO 17901-1:2015, Opti

27、cs and photonics Holography Part 1: Methods of measuring diffraction efficiency and associated optical characteristics of holograms3 Terms and definitionsFor the purposes of this document, the terms and definitions given in ISO 15902, ISO 17901-1, and the following apply.3.1exposureproduct of the la

28、ser beam irradiance and exposure time on the recording material surface, when the hologram is to be recorded on the recording materialNote 1 to entry: Exposure is represented in Joules per square meter (J/m2) in the SI unit system, but may also be expressed in micro-Joules per square centimetre (J/c

29、m2) or milli-Joules per square centimetre (mJ/cm2).Note 2 to entry: If the object wave or reference wave enters the detector obliquely in the course of the measurement of the irradiance, the value of irradiance might not be measured correctly because of reflection on the surface of the detector. In

30、such an event, it is enough to allow the object wave or reference wave to enter the detector in an approximately vertical direction to measure the radiant flux and then to divide the obtained value by the flux sectional area on the recording material surface.3.2exposure characteristics curvecurve of

31、 measured values plotted with the exposure taken on the axis of abscissa and the diffraction efficiency taken on the axis of ordinate, which indicate the characteristics of hologram recording materialsNote 1 to entry: This curve is also called -E characteristics curve.INTERNATIONAL STANDARD ISO 1790

32、1-2:2015(E) ISO 2015 All rights reserved 1BS ISO 17901-2:2015ISO 17901-2:2015(E)3.3exposure at half-maximumsmallest exposure that can achieve 50 % of the highest diffraction efficiency in the exposure characteristics curveNote 1 to entry: This term is a measure to indicate the sensitivity of the hol

33、ogram recording material. The smaller the exposure at half-maximum, the smaller the light quantity required for hologram recording.3.4R-valuediffraction efficiency of the hologram that has recorded the interference fringes of a certain spatial frequencyNote 1 to entry: For the spatial frequency of i

34、nterference fringes, the value measured in air is used.Note 2 to entry: This is an index to indicate the resolution of a recording material in terms of the fine detail of the interference fringes identified spatially in the hologram. For the finer interference fringes, the recording material that ca

35、n achieve the high R-value (diffraction efficiency) can be the recording material that ensures the high resolution in the hologram. For example, R (1000) is equal to 30 when the diffraction efficiency of hologram recorded with the spatial frequency of interference fringes being 1 000 lines/mm is ass

36、umed to be 30 %.3.5spatial frequencynumber of interference fringes per unit lengthNote 1 to entry: This indicates the density of a periodic pattern of interference fringes and is expressed by the number of interference fringes repeated per unit length (lines/mm). This is proportional to the reciproc

37、al of the spacing of interference fringes.3.6amplitude of refractive index modulationamount of modulation of the refractive index and equivalent to the contrast of interference fringes and the mean refractive index in the recording material of a phase hologram in which the phase is modulated accordi

38、ng to the difference in the refractive indices of the recording material.Note 1 to entry: This is an index to indicate the phase modulation capacity of recording material and expressed also in n.4 Symbols and abbreviated termsNA Numerical aperture of objective Laser wavelength in air (m) Diffraction

39、 efficiency (%)T Thickness of hologram (m)BBragg diffraction angle (angle inside the hologram) (radian)5 PrinciplesHolograms are recorded through mutual double-beam interference of plane waves. Examples of hologram recording optical systems are shown in Figure 1. The measurement is made of the diffr

40、action efficiency of each hologram according to any one of measurement methods specified in ISO 17901-1:2015, 6.5. The exposure characteristics curve, exposure at half-maximum, R-value, or amplitude of refractive index modulation is derived from the relationship between the measured diffraction effi

41、ciency value and exposure conditions.To derive the exposure characteristics curve or exposure at half-maximum, multiple holograms are recorded while changing the exposure and the diffraction efficiency is then measured for each 2 ISO 2015 All rights reservedBS ISO 17901-2:2015ISO 17901-2:2015(E)holo

42、gram. To derive the R-value, one or multiple holograms are recorded while adjusting the incident angle of double beams in such a manner that the interference fringes with specific spatial frequency are obtained and subsequently, the diffraction efficiency of each hologram is measured. To derive the

43、amplitude of refractive index modulation, the diffraction efficiency is measured according to any one of measurement methods specified in ISO 17901-1:2015, 6.5. Finally, the amplitude of refractive index modulation can be obtained from the Formula (2) or Formula (3) described in 6.8 to substitute va

44、lues of the wavelength of light used for the measurement of diffraction efficiency, volume of the hologram, double-beam incident angle, mean refractive index of hologram, and the measured diffraction efficiency.a) Transmission hologram b) Volume reflection hologramKey1 laser 7 mirror 22 objective 8

45、mirror 33 pinhole 9 hologram recording material4 collimating lens 10 holder5 mirror 11 reference wave6 half mirror 12 object waveFigure 1 Example of optical arrangements for hologram recording6 Measurement methods6.1 GeneralThe exposure characteristics (exposure characteristics curve, exposure at ha

46、lf-maximum, R-value, and amplitude of refractive index modulation) as specified in this part of ISO 17901 are measured as follows on the basis of the diffraction efficiency as specified in ISO 17901-1. It should be noted that, according to this part of ISO 17901, the exposure characteristics during

47、a hologram recording is derived by measuring the diffractive efficiency of holograms recorded through double-beam interference of plane waves. ISO 2015 All rights reserved 3BS ISO 17901-2:2015ISO 17901-2:2015(E)6.2 Definition of the Coordinate SystemThe axis of coordinate and the angle of wave are d

48、efined as follows.a) The recording material (or hologram) plane shall be the xy-plane while the axis vertical to the plane shall be the z-axis.b) For the z-axis, the advance direction of the object (or reconstructed) wave shall be positive.c) As shown in Figure 2, the angle of incidence, , is formed

49、 between the z-axis in positive direction and the extension of the incident wave; the positive symbol indicates a counter-clockwise direction).a) Wave advancing in the +z direction b) Wave advancing in the z directionKey1 light wave2 recording material or hologramFigure 2 How to establish the coordinate system and wave angle in measurement of exposure characteristics of hologram6.3 Hologram recording environmentHologram recording shall be made inside a dark room at stable room temperature and humidity and under conditions