BS IEC 62899-502-1-2017 Printed electronics Quality assessment Organic light emitting diode (OLED) elements Mechanical stress testing of OLED elements formed on flexible substrates.pdf
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1、Printed electronicsPart 502-1: Quality assessment Organic light emitting diode (OLED) elements Mechanical stress testing of OLED elements formed on flexible substratesBS IEC 62899-502-1:2017BSI Standards PublicationWB11885_BSI_StandardCovs_2013_AW.indd 1 15/05/2013 15:06National forewordThis British
2、 Standard is the UK implementation of IEC 62899-502-1:2017. The UK participation in its preparation was entrusted to TechnicalCommittee AMT/9, Printed Electronics.A list of organizations represented on this committee can be obtained onrequest to its secretary.This publication does not purport to inc
3、lude all the necessary provisions ofa contract. Users are responsible for its correct application. The British Standards Institution 2017.Published by BSI Standards Limited 2017ISBN 978 0 580 91286 3ICS 29.035.01; 31.260Compliance with a British Standard cannot confer immunity fromlegal obligations.
4、This British Standard was published under the authority of theStandards Policy and Strategy Committee on 31 March 2017.Amendments/corrigenda issued since publicationDate Text affectedBRITISH STANDARDBS IEC 62899-502-1:2017IEC 62899-502-1 Edition 1.0 2017-03 INTERNATIONAL STANDARD Printed electronics
5、 Part 502-1: Quality assessment Organic light emitting diode (OLED) elements Mechanical stress testing of OLED elements formed on flexible substrates INTERNATIONAL ELECTROTECHNICAL COMMISSION ICS 29.035.01; 31.260 ISBN 978-2-8322-4078-6 Registered trademark of the International Electrotechnical Comm
6、ission Warning! Make sure that you obtained this publication from an authorized distributor. colourinsideBS IEC 62899-502-1:2017 2 IEC 62899-502-1:2017 IEC 2017 CONTENTS FOREWORD . 4 INTRODUCTION . 6 1 Scope 7 2 Normative references 7 3 Terms and definitions 7 3.1 General terms . 8 3.2 Terms related
7、 to optical and electrical properties 8 3.3 Terms related to mechanical stress test 9 4 Standard atmospheric condition for measurements and tests . 9 5 Evaluation methods of optical and electrical properties 9 5.1 General . 9 5.2 Sample preparation of OLED element(s) for optical and electrical measu
8、rements 9 5.3 IVL characteristics 10 5.4 Luminous flux . 10 5.5 Luminance uniformity 10 6 Mechanical stress test methods . 10 6.1 General . 10 6.2 Bending test 10 6.2.1 General . 10 6.2.2 Testing apparatus 10 6.2.3 Testing procedure 10 6.2.4 Evaluation . 11 6.2.5 Testing conditions . 11 6.3 Rolling
9、test 12 6.3.1 General . 12 6.3.2 Testing apparatus 12 6.3.3 Testing procedure 12 6.3.4 Evaluation . 13 6.3.5 Testing conditions . 13 6.4 Torsion test . 14 6.4.1 General . 14 6.4.2 Testing apparatus 14 6.4.3 Testing procedure 14 6.4.4 Evaluation . 15 6.4.5 Testing conditions . 15 6.5 Tension test 16
10、6.5.1 General . 16 6.5.2 Testing apparatus 16 6.5.3 Testing procedure 16 6.5.4 Evaluation . 16 6.5.5 Testing conditions . 16 7 Failure criteria . 17 Annex A (normative) Measurement methods of IVL characteristics 18 A.1 General . 18 A.2 Measurement method . 18 BS IEC 62899-502-1:2017IEC 62899-502-1:2
11、017 IEC 2017 3 A.2.1 General . 18 A.2.2 Measurement apparatus 18 A.2.3 Measurement procedure 18 A.2.4 Acceptance 18 A.2.5 Items for relevant specification 18 Annex B (normative) Measurement methods of luminous flux . 20 B.1 General . 20 B.2 Measurement method . 20 B.2.1 General . 20 B.2.2 Measuremen
12、t apparatus 20 B.2.3 Measurement procedure 21 B.2.4 Acceptance 22 B.2.5 Terms for additional definition 22 Figure 1 Apparatus for bending test . 12 Figure 2 Apparatus for rolling test 13 Figure 3 Apparatus for torsion test . 15 Figure 4 Example of sample alignment for torsion testing . 15 Figure 5 A
13、pparatus for tension test 17 Figure A.1 Layout of luminous measurement system 19 Figure B.1 Example of measurement apparatus for luminous flux using an integral sphere 21 BS IEC 62899-502-1:2017 4 IEC 62899-502-1:2017 IEC 2017 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ PRINTED ELECTRONICS Part 502-
14、1: Quality assessment Organic light emitting diode (OLED) elements Mechanical stress testing of OLED elements formed on flexible substrates FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committ
15、ees (IEC National Committees). The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical R
16、eports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with may participate in this preparatory work. International, governmental an
17、d non-governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely with the International Organization for Standardization (ISO) in accordance with conditions determined by agreement between the two organizations. 2) The formal decisions or agreemen
18、ts of IEC on technical matters express, as nearly as possible, an international consensus of opinion on the relevant subjects since each technical committee has representation from all interested IEC National Committees. 3) IEC Publications have the form of recommendations for international use and
19、are accepted by IEC National Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any misinterpretation by any end user. 4) In order to promote in
20、ternational uniformity, IEC National Committees undertake to apply IEC Publications transparently to the maximum extent possible in their national and regional publications. Any divergence between any IEC Publication and the corresponding national or regional publication shall be clearly indicated i
21、n the latter. 5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any services carried out by independent certification bodies. 6) All u
22、sers should ensure that they have the latest edition of this publication. 7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and members of its technical committees and IEC National Committees for any personal injury, property damage or o
23、ther damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications. 8) Attention is drawn to the Normative references cited in this publication
24、. Use of the referenced publications is indispensable for the correct application of this publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for identifying any or all such pat
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