BS EN 62024-1-2008 High frequency inductive components - Electrical characteristics and measuring methods - Part 1 Nanohenry range chip inductor《高频感应元件 电气特性和测量方法 毫微亨等级芯片感应器》.pdf

《BS EN 62024-1-2008 High frequency inductive components - Electrical characteristics and measuring methods - Part 1 Nanohenry range chip inductor《高频感应元件 电气特性和测量方法 毫微亨等级芯片感应器》.pdf》由会员分享，可在线阅读，更多相关《BS EN 62024-1-2008 High frequency inductive components - Electrical characteristics and measuring methods - Part 1 Nanohenry range chip inductor《高频感应元件 电气特性和测量方法 毫微亨等级芯片感应器》.pdf（22页珍藏版）》请在麦多课文档分享上搜索。

1、BRITISH STANDARDBS EN 62024-1:2008High frequency inductive components Electrical characteristics and measuring methods Part 1: Nanohenry range chip inductorICS 29.100.10g49g50g3g38g50g51g60g44g49g42g3g58g44g55g43g50g56g55g3g37g54g44g3g51g40g53g48g44g54g54g44g50g49g3g40g59g38g40g51g55g3g36g54g3g51g40

2、g53g48g44g55g55g40g39g3g37g60g3g38g50g51g60g53g44g42g43g55g3g47g36g58Incorporating corrigendumJuly 2008BS EN 62024-1:2008This British Standard was published under the authority of the Standards Policy and Strategy Committee on 29 August 2008 BSI 2009ISBN 978 0 580 67780 9National forewordThe UK part

3、icipation in its preparation was entrusted to Technical Committee EPL/51, Transformers, inductors, magnetic components and ferrite materials.A list of organizations represented on this committee can be obtained on request to its secretary.This publication does not purport to include all the necessar

4、y provisions of a contract. Users are responsible for its correct application.Compliance with a British Standard cannot confer immunity from legal obligations.Amendments/corrigenda issued since publicationThis British Standard is the UK implementation of EN 62024-1:2008. It is identical to IEC 62024

5、-1:2008, incorporating corrigendum July 2008. It supersedes BS EN 62024-1:2002 which is withdrawn.Date Comments 30 June 2009 Change made to formula on page 17, 5.4 measuring temperature EUROPEAN STANDARD EN 62024-1 NORME EUROPENNE EUROPISCHE NORM May 2008 CENELEC European Committee for Electrotechni

6、cal Standardization Comit Europen de Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische Normung Central Secretariat: rue de Stassart 35, B - 1050 Brussels 2008 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members. Ref. No. EN 6

7、2024-1:2008 E ICS 29.100.10 Supersedes EN 62024-1:2002English version High frequency inductive components - Electrical characteristics and measuring methods - Part 1: Nanohenry range chip inductor (IEC 62024-1:2008) Composants inductifs haute frquence - Caractristiques lectriques et mthodes de mesur

8、e - Partie 1: Inductance puce de lordre du nanohenry (CEI 62024-1:2008) Induktive Hochfrequenz-Bauelemente - Elektrische Eigenschaften und Messmethoden - Teil 1: Chipinduktivitten im Nanohenry-Bereich (IEC 62024-1:2008) This European Standard was approved by CENELEC on 2008-03-01. CENELEC members ar

9、e bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to

10、the Central Secretariat or to any CENELEC member. This European Standard exists in two official versions (English and German). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the Central Secretariat has the same s

11、tatus as the official versions. CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Cyprus, the Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the Netherlands, Norway,

12、 Poland, Portugal, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland and the United Kingdom. Foreword The text of document 51/908/FDIS, future edition 2 of IEC 62024-1, prepared by IEC TC 51, Magnetic components and ferrite materials, was submitted to the IEC-CENELEC parallel vote and was appr

13、oved by CENELEC as EN 62024-1 on 2008-03-01. This European Standard supersedes EN 62024-1:2002. EN 62024-1:2008 includes the following significant technical changes with respect to EN 62024-1:2002: size 0402 added in Table 1 and Table 2; contents of 4.4 reviewed for easier understanding; errors in 3

14、.1.4.2 corrected. The following dates were fixed: latest date by which the EN has to be implemented at national level by publication of an identical national standard or by endorsement (dop) 2008-12-01 latest date by which the national standards conflicting with the EN have to be withdrawn (dow) 201

15、1-03-01 Annex ZA has been added by CENELEC. _ Endorsement notice The text of the International Standard IEC 62024-1:2008 was approved by CENELEC as a European Standard without any modification. _ BS EN 62024-1:2008 2 CONTENTS 1 Scope.5 2 Normative references .5 3 Inductance, Q-factor and impedance 5

16、 3.1 Inductance 5 3.1.1 Measuring circuit .6 3.1.2 Mounting of the inductor to the test fixture.6 3.1.3 Measurement method and calculation8 3.1.4 Notes on measurement8 3.2 Quality factor.9 3.2.1 Measurement method 9 3.2.2 Measurement circuit 10 3.2.3 Mounting of the inductor 10 3.2.4 Methods of meas

17、urement and calculation 10 3.2.5 Notes on measurement10 3.3 Impedance 10 3.3.1 Measurement method 10 3.3.2 Measurement circuit 10 3.3.3 Measurement method and calculation10 3.3.4 Notes on measurement11 4 Resonance frequency.11 4.1 Self-resonance frequency11 4.2 Minimum output method 11 4.2.1 Measure

18、ment circuit 11 4.2.2 Mounting the inductor for test 12 4.2.3 Measuring method .12 4.2.4 Note on measurement .13 4.3 Reflection method .13 4.3.1 Measurement circuit 13 4.3.2 Mounting the inductor for test 13 4.3.3 Measurement method 14 4.3.4 Notes on measurement14 4.4 Measurement by analyser15 4.4.1

19、 Measurement by impedance analyser15 4.4.2 Measurement by network analyser.15 5 DC resistance.15 5.1 Measuring circuit (Bridge method) .15 5.2 Measuring method and calculation formula16 5.3 Precaution for measurement16 5.4 Measuring temperature17 Annex A (normative) Mounting method for a surface mou

20、nting coil 18 BS EN 62024-1:2008 3 Annex ZA (normative) Normative references to international publications with theircorresponding European publications.19Figure 3 Fixture B 7 Figure 4 Short device shape 9 Figure 5 Example of test circuit for the minimum output method.11 Figure 6 Self-resonance freq

21、uency test board (minimum output method) .12 Figure 7 Example of test circuit for the reflection method .13 Figure 8 Self-resonance frequency test board (reflection method)14 Figure 9 Suitable test fixture for measuring self-resonance frequency15 Figure 10 Example of measuring circuit of d.c. resist

22、ance16 Table 1 Dimensions of l and d7 Table 2 Short device dimensions and inductances .9 BS EN 62024-1:2008 4 Figure 1 Example of circuit for vector voltage/current method 6 Figure 2 Fixture A 7 HIGH FREQUENCY INDUCTIVE COMPONENTS ELECTRICAL CHARACTERISTICS AND MEASURING METHODS Part 1: Nanohenry ra

23、nge chip inductor 1 Scope This part of IEC 62024 specifies electrical characteristics and measuring methods for the nanohenry range chip inductor that is normally used in high frequency (over 100 kHz) range. 2 Normative references The following referenced documents are indispensable for the applicat

24、ion of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. IEC 61249-2-7, Materials for printed boards and other interconnecting structures Part 2-7: Reinforced base materials c

25、lad and unclad Epoxide woven E-glass laminated sheet of defined flammability (vertical burning test) copper-clad ISO 6353-3, Reagents for chemical analysis Part 3: Specifications Second series ISO 9453, Soft solder alloys Chemical compositions and forms 3 Inductance, Q-factor and impedance 3.1 Induc

26、tance The inductance of an inductor is measured by the vector voltage/current method. BS EN 62024-1:2008 5 3.1.1 Measuring circuit Components Rgsource resistance (50 ) R resistor Lxinductor under test Cddistributed capacitance of inductor under test Lsseries inductance of inductor under test Rsserie

27、s resistance of inductor under test phase reference signal Ev1, Ev2vector voltmeter G signal generator Figure 1 Example of circuit for vector voltage/current method 3.1.2 Mounting of the inductor to the test fixture The inductor shall be measured in a test fixture as specified in the relevant standa

28、rd. If no fixture is specified, one of the following test fixtures A or B shall be used. The fixture used shall be reported. LsRsLxCdG Rg EV2EV1R IEC 317/08 BS EN 62024-1:2008 6 3.1.2.1 Fixture A The shape and dimensions of fixture A shall be as shown in Figure 2. Figure 2 Fixture A Table 1 Dimensio

29、ns of l and d Size of inductor under test l mm d mm 1608 1,6 0,95 1005 1,0 0,60 0603 0,6 0,36 0402 0,4 0,26 The electrodes of test fixture shall contact the electrodes of inductor under test by mechanical force provided by an appropriate method. This force shall be chosen so as to provide satisfacto

30、ry measurement stability without influencing the characteristics of the inductor. The electrode force shall be specified. The structure between the measurement circuit and test fixture shall maintain a characteristic impedance as near as possible to 50 . 3.1.2.2 Fixture B The test fixture B as shown

31、 in Figure 3 shall be used. Figure 3 Fixture B d External electrodeInductor under test Central electrode Dielectric material Structure of connection with measurement circuit Dielectric material Central electrode External electrode Inductor under test d Structure of connection to the measurement circ

32、uit Electrical length l IEC 318/08 IEC 319/08 BS EN 62024-1:2008 7 The electrodes of the test fixture shall be in contact with the electrodes of the inductor under test by mechanical force provided by an appropriate method. This force shall be chosen so as to provide satisfactory measurement stabili

33、ty without influencing the characteristics of the inductor. The electrode force shall be specified. The structure between the measurement circuit and test fixture shall maintain a characteristic impedance as near as possible to 50 . Dimension d shall be specified between parties concerned. 3.1.3 Mea

34、surement method and calculation Inductance Lxof the inductor Lx is defined by the vector sum of reactance caused by Lsand Cd(see Figure 1). The frequency f of the signal generator output signal shall be set to a frequency as separately specified. The inductor under test shall be connected to the mea

35、surement circuit by using the test fixture as described above. Vector voltage E1and E2shall be measured by vector voltage meters Ev1and Ev2, Respectively. The inductance Lxshall be calculated by the following formula: =21EERLxlm(1) where Lxis the inductance of inductor under test; lm is the imaginar

36、y part of the complex value; R is the resistance of resistor; E1is the value indicated on vector voltmeter Ev1; E2is the value indicated on vector voltmeter Ev2; is the angular frequency: 2f. 3.1.4 Notes on measurement The electrical length of the test fixture shall be compensated by an appropriate

37、method followed by open-short compensation. If an electrical length that is not commonly accepted is used, it shall be specified. Open-short compensation shall be calculated by the following formulae: cmcmcx1 CZBZAZ= (2) Ac= 1 + j0 (3) ()ssossmomssossmsssmomsmc11ZYZYZYZZZYZB= (4) ()ssossmomssosomoss

38、momomc11ZYZYZYYYZYYC= (5) where Zxis impedance measurement value after compensation; Zmis impedance measurement value before compensation; BS EN 62024-1:2008 8 Zsmis the impedance measurement value of short device; Zssis the short device inductance as defined in 3.1.4.1; Yomis the admittance measure

39、ment value of the fixture with test device absent; Yosis the admittance measurement value of the test fixture as defined in 3.1.4.2. 3.1.4.1 Short compensation For test fixture A, the applicable short device dimension and shape are as shown in Figure 4 and Table 2. The appropriate short device induc

40、tance shall be selected from Table 2 depending on the dimension of the inductor under test. The inductance of the selected short device shall be used as a compensation value. Figure 4 Short device shape Table 2 Short device dimensions and inductances Size of inductor under test l mm d mm Inductance

41、value nH 1608 1,6 0,95 0,43 1005 1,0 0,60 0,27 0603 0,6 0,36 0,16 0402 0,4 0,26 0,11 If an inductance value other than defined in Table 2 is used for test fixture A, the employed value shall be specified. For test fixture B, short device dimension, shape and inductance values shall be specified. 3.1

42、.4.2 Open compensation Open compensation for test fixture A shall be performed with test fixture electrodes at the same distance apart from each other as with the inductor under test mounted in the fixture. The admittance Yosis defined as 0S (zero Siemens) unless otherwise specified. Open compensati

43、on for test fixture B shall be performed without mounting the inductor. The admittance Yosis defined as 0S (zero Siemens) unless otherwise specified. 3.2 Quality factor 3.2.1 Measurement method The Q of the inductor shall be measured by the vector voltage/current method. l d Gold-plated copper or go

44、ld-plated equivalent metal IEC 320/08 BS EN 62024-1:2008 9 3.2.2 Measurement circuit The measurement circuit is as shown in Figure 1. 3.2.3 Mounting of the inductor Mounting of the inductor is described in 3.1.2. 3.2.4 Methods of measurement and calculation The frequency of the signal generator (Fig

45、ure 1) output signal shall be set to a frequency as separately specified. The inductor shall be connected to the measurement circuit by using the test fixture as described above. Vector voltage E1and E2shall be measured by vector voltage meters Ev1and Ev2respectively. The Q value shall be calculated

46、 by the following formula: 2121/Re/ImEEEEQ = (6) where Q is the Q of the inductor under test; Re is the real part of the complex value; lm is the imaginary part of the complex value; E1is the value indicated on vector voltmeter Ev1; E2is the value indicated on vector voltmeter Ev2. 3.2.5 Notes on me

47、asurement Refer to 3.1.4 in the inductance measurement part. 3.3 Impedance 3.3.1 Measurement method The impedance of an inductor shall be measured by the vector voltage/current method. The vector voltage/current method is as follows: 3.3.2 Measurement circuit The measurement circuit is as shown in F

48、igure 1. Mounting of the inductor to the test fixture as described in 3.1.2. 3.3.3 Measurement method and calculation The frequency of the signal generator (Figure 1) output signal shall be set to a frequency f as separately specified. The inductor shall be connected to the measurement circuit by us

49、ing the test fixture as described above. Vector voltage E1and E2shall be measured by vector voltage meters Ev1and Ev2, respectively. The impedance shall be calculated by the following formula: 21EERZ = (7) where Z is the absolute value of the impedance; BS EN 62024-1:2008 10 R is the resistance; 1E is the absolute value of Ev1; 2E is the absolute value of Ev2. 3.3.4 Notes on measurement Refer to 3.1.4 in the inductance measurement part. 4 Res