BS EN 61747-5-1998 Liquid crystal and solid-state display devices - Environmental endurance and mechanical test methods《液态晶体和固态显示装置 环境、耐久性和机械试验方法》.pdf

《BS EN 61747-5-1998 Liquid crystal and solid-state display devices - Environmental endurance and mechanical test methods《液态晶体和固态显示装置 环境、耐久性和机械试验方法》.pdf》由会员分享，可在线阅读，更多相关《BS EN 61747-5-1998 Liquid crystal and solid-state display devices - Environmental endurance and mechanical test methods《液态晶体和固态显示装置 环境、耐久性和机械试验方法》.pdf（40页珍藏版）》请在麦多课文档分享上搜索。

1、BRITISH STANDARD BS EN 61747-5:1998 IEC 61747-5: 1998 Liquid crystal and solid-state display devices Part 5: Environmental, endurance and mechanical test methods The European Standard EN61747-5:1998 has the status of a British Standard ICS 31.120BSEN61747-5:1998 This British Standard, having been pr

2、epared under the directionof the Electrotechnical Sector Board, was published underthe authority of the Standards Board and comes intoeffect on 15November1998 BSI 05-1999 ISBN 0 580 30410 8 National foreword This British Standard is the English language version of EN61747-5:1998. Itis identical with

3、 IEC61747-5:1998. The UK participation in its preparation was entrusted by Technical Committee EPL/47, Semiconductor devices, to Subcommittee EPL/47/3, Optoelectronic display and imaging devices, which has the responsibility to: aid enquirers to understand the text; present to the responsible intern

4、ational/European committee any enquiries on the interpretation, or proposals for change, and keep the UK interests informed; monitor related international and European developments and promulgate them in the UK. A list of organizations represented on this committee can be obtained on request to its

5、secretary. From1January1997, all IEC publications have the number60000 added to the old number. For instance, IEC27-1 has been renumbered as IEC60027-1. For a period of time during the change over from one numbering system to the other, publications may contain identifiers from both systems. Cross-r

6、eferences Attention is drawn to the fact that CEN and CENELEC standards normally include an annex which lists normative references to international publications with their corresponding European publications. The British Standards which implement these international or Europeani publications may be

7、found in the BSI Standards Catalogue under the section entitled “International Standards Correspondence Index”, or by using the “Find” facility of the BSI Standards Electronic Catalogue. A British Standard does not purport to include all the necessary provisions of a contract. Users of British Stand

8、ards are responsible for their correct application. Compliance with a British Standard does not of itself confer immunity from legal obligations. Summary of pages This document comprises a front cover, an inside front cover, pages i and ii, theEN title page, pages2 to34 and a back cover. This standa

9、rd has been updated (see copyright date) and may have had amendments incorporated. This will be indicated in the amendment table on the inside front cover. Amendments issued since publication Amd. No. Date CommentsBSEN61747-5:1998 BSI 05-1999 i Contents Page National foreword Inside front cover Fore

10、word 2 Text of EN 61747-5 5ii blankEUROPEAN STANDARD NORME EUROPENNE EUROPISCHE NORM EN 61747-5 September 1998 ICS 31.120 English version Liquid crystal and solid-state display devices Part5:Environmental, endurance and mechanical testmethods (IEC 61747-5:1998) Dispositifs daffichage cristaux liquid

11、esetsemiconducteurs Partie5: Mthodes dessais denvironnement,dendurance et mcaniques (CEI61747-5:1998) Flssigkristall- und Halbleiter- Anzeige-Bauelemente Teil5: Umwelt-, Lebensdauer- und mechanische Prfverfahren (IEC61747-5:1998) This European Standard was approved by CENELEC on1998-08-01. CENELEC m

12、embers are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national standards may be obtained on applic

13、ation to the Central Secretariat or to any CENELEC member. This European Standard exists in three official versions (English, French, German). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the Central Secretaria

14、t has the same status as the official versions. CENELEC members are the national electrotechnical committees of Austria, Belgium, Czech Republic, Denmark, Finland, France, Germany, Greece, Iceland, Ireland, Italy, Luxembourg, Netherlands, Norway, Portugal, Spain, Sweden, Switzerland and United Kingd

15、om. CENELEC European Committee for Electrotechnical Standardization Comit Europen de Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische Normung Central Secretariat: rue de Stassart 35, B-1050 Brussels 1998 CENELEC All rights of exploitation in any form and by any means reserved

16、worldwide for CENELEC members. Ref. No. EN 61747-5:1998 EEN61747-5:1998 BSI 05-1999 2 Foreword The text of document47C/203/FDIS, future edition1 of IEC61747-5, prepared by SC47C, Optoelectronic, display and imaging devices, of IECTC47, Semiconductor devices, was submitted to the IEC-CENELEC parallel

17、 vote and was approved by CENELEC as EN61747-5 on1998-08-01. The following dates were fixed: Annexes designated “normative” are part of the body of the standard. Annexes designated “informative” are given for information only. In this standard, Annex ZA is normative and Annex A is informative. Annex

18、 ZA has been added by CENELEC. Endorsement notice The text of the International Standard IEC61747-5:1998 was approved by CENELEC as a European Standard without any modification. latest date by which the EN has to be implemented at national level by publication of an identical national standard or by

19、 endorsement (dop) 1999-05-01 latest date by which the national standards conflicting with the EN have to be withdrawn (dow) 2001-05-01EN61747-5:1998 BSI 05-1999 3 Contents Page Foreword 2 1 General 5 1.1 Scope and object 5 1.2 Normative references 5 1.3 Terms, definitions and letter symbols 6 1.4 S

20、tandard atmospheric conditions 6 1.5 Visual examination and verification of dimensions 7 1.6 Electrical and optical measurements 7 1.7 Electrical operating conditions 8 2 Mechanical test methods 8 2.1 Robustness of terminations 8 2.2 Soldering 8 2.3 Vibration (sinusoidal) 8 2.4 Shock 10 2.5 Accelera

21、tion, steady state 11 2.6 Bond strength test 12 3 Environmental and endurance test methods 13 3.1 Change of temperature 13 3.2 Storage (at high temperature) 16 3.3 Storage (at low temperature) 17 3.4 Low air pressure 17 3.5 Damp heat, steady state 17 3.6 Damp heat, cyclic(12+12-hour cycle) 18 3.7 Co

22、mposite temperature/humidity cyclic test 18 3.8 Light exposure 22 3.9 ESD Test 22 4 Miscellaneous test methods 22 4.1 Permanence of marking 22 4.2 Scratch test (of face plate) 22 4.3 Life test 22 5 Visual inspection of monochrome matrix liquid crystal display modules (Excluding all active matrix liq

23、uid crystal display modules) 22 5.1 General 23 5.2 Visual inspection of displays 23 6 Visual inspection of monochrome liquidcrystal display cells (Excluding all active matrix liquid crystal display modules) 26 6.1 General 26 6.2 Visual inspection of displays 27 Page 6.3 Seal inspections (see Figure

24、13) 29 6.4 Visual inspection of contact pad area (see Figure 14) 30 6.5 Visual inspection for chipped material at the borders and edges of the support plates of cells 31 Annex A (informative) Cross references index 32 Annex ZA (normative) Normative references tointernational publications with their

25、corresponding European publications 33 Figure 1 Example of bond strength 12 Figure 2 Temperature profile 14 Figure 3 Temperature profile 15 Figure 4 Preconditioning 19 Figure 5a Conditioning Exposure to humidityfollowed by exposure to cold 20 Figure 5b Conditioning Exposure to humiditynot followed b

26、y exposure to cold 21 Figure 6 Defects within the viewing area 24 Figure 7 Deviations and misshapes of a squarepicture element 24 Figure 8 Notched edges of picture elements 25 Figure 9 Defects within picture elements andtheir surroundings 26 Figure 10 Defects within the viewing area 27 Figure 11 Dev

27、iations of dimensions and shapee1.e4: deviations 28 Figure 12 Defects within segments 28 Figure 13 Defects within the sealing areas 29 Figure 14 Defects of contact pad area 30 Figure 15 Damage of a corner and of an edge 31 Table 1 Frequency range Lower end 9 Table 2 Frequency range Upper end 9 Table

28、 3 Recommended frequency ranges 9 Table 4 Recommended vibration amplitudes 10 Table 5 Conditions for shock test 11 Table 6 Acceleration conditions 11 Table 7 Low test temperature 13 Table 8 High test temperature 13 Table 9 Low test temperature 15 Table 10 High test temperature 15 Table 11 Conditions

29、 of temperature andhumidity 174 blankEN61747-5:1998 BSI 05-1999 5 1 General 1.1 Scope and object This part of IEC61747 lists test methods applicable to liquid crystal display devices. It takes into account, wherever possible, the environmental test methods outlined in IEC60068. It also includes visu

30、al inspection for both liquid crystal display cells and modules. NOTE 1This standard is established separately from IEC60749, because the technology of liquid crystal display devices is completely different from that of semiconductor devices in such matters as shape and size; used materials and stru

31、cture; function; measuring methods; operation principles. NOTE 2Devices include cells and modules. The object of this standard is to establish uniform preferred test methods with preferred values for stress levels for judging the environmental properties of liquid crystal display devices. In case of

32、 contradiction between this standard and a relevant specification, the latter shall govern. 1.2 Normative references The following normative documents contain provisions which, through reference in this text, constitute provisions of this part of IEC61747. At the time of publication, the editions in

33、dicated were valid. All normative documents are subject to revision, and parties to agreements based on this part of IEC61747 are encouraged to investigate the possibility of applying the most recent editions of the normative documents indicated below. Members of IEC and ISO maintain registers of cu

34、rrently valid International Standards. IEC 60068, Environmental testing. IEC 60068-1:1988, Environmental testing Part1: General and guidance. IEC 60068-2-1:1990, Environmental testing Part2: Tests Test A: Cold. IEC 60068-2-2:1974, Environmental testing Part2: Tests Test B: Dry heat. IEC 60068-2-3:19

35、69, Environmental testing Part2: Tests Test Ca: Damp heat, steady state. IEC 60068-2-5:1975, Environmental testing Part2: Tests Test Sa: Simulated solar radiation at groundlevel. IEC 60068-2-6:1995, Environmental testing Part2: Tests Test Fc: Vibration (sinusoidal). IEC 60068-2-7:1983, Environmental

36、 testing Part2: Tests Test Ga: Acceleration, steady state. IEC 60068-2-13:1983, Environmental testing Part2: Tests Test M: Low air pressure. IEC 60068-2-14:1984, Environmental testing Part2: Tests Test N: Change of temperature. IEC 60068-2-20:1979, Environmental testing Part2: Tests Test T: Solderin

37、g. IEC 60068-2-21:1983, Environmental testing Part2: Tests Test U: Robustness of terminations and integral mounting devices. IEC 60068-2-27:1987, Environmental testing Part2: Tests Test Ea and guidance: Shock. IEC 60068-2-30:1980, Environmental testing Part2: Tests Test Db and guidance: Damp heat, c

38、yclic(12+12-hour cycle). IEC 60068-2-38:1974, Environmental testing Part2: Tests Test Z/AD: Composite temperature/humidity cyclic test. IEC 60068-2-45:1980, Environmental testing Part2: Tests Test XA and guidance: Immersion in cleaning solvents. IEC 60747, Semiconductor devices. IEC 60747-1:1983, Se

39、miconductor devices Discrete devices Part1 General. Amendment1(1991) Amendment2(1993) Amendment3(1996)EN61747-5:1998 6 BSI 05-1999 IEC 60747-5:1984, Semiconductor devices Part5:Optoelctronic devices. Amendment1(1994) Amendment2(1995) IEC 60748-1:1984, Semiconductor devices Integrated circuits Part1:

40、 General. IEC 60749:1996, Semiconductor devices Mechanical and climatic test methods. IEC 61747:1998, Liquid crystal and solid-state display devices. 1.3 Terms, definitions and letter symbols For the purpose of this standard, the definitions and letter symbols of IEC60068, IEC60747, IEC60748 and IEC

41、61747-1 apply. 1.4 Standard atmospheric conditions The atmospheric conditions specified in IEC60068-1 apply. 1.4.1 Standard reference atmosphere 1.4.2 Standard atmosphere for referee measurements and tests If the parameters of liquid crystal display devices to be measured depend on temperature, pres

42、sure, and humidity and the law of dependence is unknown, the atmospheres to be specified shall be selected from the following: 1.4.3 Standard atmospheric conditions for measurements and tests Unless otherwise specified, all tests and measurements shall be carried out under standard atmospheric condi

43、tions for testing. The absolute humidity of the atmosphere shall not exceed22g/m 3 . 1.4.4 Recovery conditions After the conditioning period and before making the final measurements, the specimens should be allowed to stabilize at the ambient temperature, the temperature at which the measurements sh

44、all be made. The “controlled recovery conditions” (see1.4.4.1) shall be applied if the electrical parameters to be measured are affected by absorbed humidity or by the surface conditions of the specimens, and change rapidly, for example if the insulation resistance rises considerably within approxim

45、ately2h after removal of the specimens from the humidity chamber. If the electrical parameters of the specimens affected by absorbed humidity or surface conditions do not vary rapidly, recovery may be carried out in the conditions specified in1.4.3. Temperature: 25C Air pressure: 86kPa to106kPa(860m

46、bar to1060mbar) Temperature Relative humidity Air pressure C % RH kPa 20 1 25 1 30 1 35 1 45 to75 45 to75 45 to75 45 to75 86 to106 86 to106 86 to106 86 to106 NOTEAtmospheric conditions for initial and final measurements shall be the same. Temperature: 15C to35C Relative humidity: 25% to85% RH, where

47、 appropriate Air pressure: 86kPa to106kPa(860mbar to1060mbar)EN61747-5:1998 BSI 05-1999 7 1.4.4.1 Controlled recovery conditions Unless otherwise specified, all recovery shall be carried out under controlled atmospheric conditions: Before the measurements are made, the devices shall be stored until

48、temperature equilibrium is reached. The ambient temperature during the measurements shall be stated in the test report. During measurements, the devices shall not be exposed to draught, illumination or other influences likely to cause error. The environment shall be controlled to avoid error. If rec

49、overy and measurements are performed in separate chambers, the combination of temperature and humidity conditions shall be such that condensation on the surface of the devices does not occur when the device is transferred to the measurement chamber. 1.4.4.2 Recovery procedure The device shall be placed in the recovery chamber within10 min of completing of conditioning. Where the relevant specificati