BS EN 61340-4-8-2015 Electrostatics Standard test methods for specific applications Electrostatic discharge shielding Bags《静电学 特殊用途标准试验方法 静电放电屏蔽 包》.pdf

《BS EN 61340-4-8-2015 Electrostatics Standard test methods for specific applications Electrostatic discharge shielding Bags《静电学 特殊用途标准试验方法 静电放电屏蔽 包》.pdf》由会员分享，可在线阅读，更多相关《BS EN 61340-4-8-2015 Electrostatics Standard test methods for specific applications Electrostatic discharge shielding Bags《静电学 特殊用途标准试验方法 静电放电屏蔽 包》.pdf（18页珍藏版）》请在麦多课文档分享上搜索。

1、BSI Standards PublicationElectrostaticsPart 4-8: Standard test methods for specific applications Electrostatic discharge shielding BagsBS EN 61340-4-8:2015National forewordThis British Standard is the UK implementation of EN 61340-4-8:2015. It isidentical to IEC 61340-4-8:2014. It supersedes BS IEC

2、61340-4-8:2010, whichwill be withdrawn on 1 January 2018.The UK participation in its preparation was entrusted to TechnicalCommittee GEL/101, Electrostatics.A list of organizations represented on this committee can be obtained onrequest to its secretary.This publication does not purport to include a

3、ll the necessary provisions ofa contract. Users are responsible for its correct application. The British Standards Institution 2015.Published by BSI Standards Limited 2015ISBN 978 0 580 79805 4ICS 17.220.99; 29.020Compliance with a British Standard cannot confer immunity fromlegal obligations.This B

4、ritish Standard was published under the authority of theStandards Policy and Strategy Committee on 31 January 2015.Amendments/corrigenda issued since publicationDate Text affectedBRITISH STANDARDBS EN 61340-4-8:2015EUROPEAN STANDARD NORME EUROPENNE EUROPISCHE NORM EN 61340-4-8 January 2015 ICS 17.22

5、0.99; 29.020 English Version Electrostatics - Part 4-8: Standard test methods for specific applications - Electrostatic discharge shielding - Bags (IEC 61340-4-8:2014) Electrostatique - Partie 4-8: Mthodes dessai normalises pour des applications spcifiques - Blindage contre les dcharges lectrostatiq

6、ues - Sacs (IEC 61340-4-8:2014) Elektrostatik - Teil 4-8: Standard-Prfverfahren fr spezielle Anwendungen - Schirmwirkung gegen elektrostatische Entladung - Beutel (IEC 61340-4-8:2014) This European Standard was approved by CENELEC on 2015-01-01. CENELEC members are bound to comply with the CEN/CENEL

7、EC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC Management Centre or

8、 to any CENELEC member. This European Standard exists in three official versions (English, French, German). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the same status as

9、the official versions. CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic, Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxe

10、mbourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland, Turkey and the United Kingdom. European Committee for Electrotechnical Standardization Comit Europen de Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische Normung C

11、EN-CENELEC Management Centre: Avenue Marnix 17, B-1000 Brussels 2015 CENELEC All rights of exploitation in any form and by any means reserved worldwide for CENELEC Members. Ref. No. EN 61340-4-8:2015 E BS EN 61340-4-8:2015EN 61340-4-8:2015 - 2 - Foreword The text of document 101/448/FDIS, future edi

12、tion 2 of IEC 61340-4-8, prepared by IEC/TC 101 “Electrostatics“ was submitted to the IEC-CENELEC parallel vote and approved by CENELEC as EN 61340-4-8:2015. The following dates are fixed: latest date by which the document has to be implemented at national level by publication of an identical nation

13、al standard or by endorsement (dop) 2015-10-01 latest date by which the national standards conflicting with the document have to be withdrawn (dow) 2018-01-01 Attention is drawn to the possibility that some of the elements of this document may be the subject of patent rights. CENELEC and/or CEN shal

14、l not be held responsible for identifying any or all such patent rights. Endorsement notice The text of the International Standard IEC 61340-4-8:2014 was approved by CENELEC as a European Standard without any modification. BS EN 61340-4-8:2015- 3 - EN 61340-4-8:2015 Annex ZA (normative) Normative re

15、ferences to international publications with their corresponding European publications The following documents, in whole or in part, are normatively referenced in this document and are indispensable for its application. For dated references, only the edition cited applies. For undated references, the

16、 latest edition of the referenced document (including any amendments) applies. NOTE 1 When an International Publication has been modified by common modifications, indicated by (mod), the relevant EN/HD applies. NOTE 2 Up-to-date information on the latest versions of the European Standards listed in

17、this annex is available here: www.cenelec.eu. Publication Year Title EN/HD Year IEC 60093 - Methods of test for volume resistivity and surface resistivity of solid electrical insulating materials HD 429 S1 - IEC 61340-3-1 - Electrostatics - Part 3-1: Methods for simulation of electrostatic effects -

18、 Human body model (HBM) electrostatic discharge test waveforms EN 61340-3-1 - IEC 61340-5-3 - Electrostatics - Part 5-3: Protection of electronic devices from electrostatic phenomena - Properties and requirements classifications for packaging intended for electrostatic discharge sensitive devices EN

19、 61340-5-3 - BS EN 61340-4-8:2015 2 IEC 61340-4-8:2014 IEC 2014 CONTENTS INTRODUCTION . 5 1 Scope 6 2 Normative references 6 3 Terms and definitions 6 4 Required equipment 7 4.1 ESD simulator . 7 4.2 Waveform verification equipment 7 General . 7 4.2.1Oscilloscope 7 4.2.2Current probe 7 4.2.3High vol

20、tage resistor 7 4.2.44.3 Capacitive probe . 7 4.4 Discharge electrode and ground electrode 7 4.5 Bag size 7 4.6 Computer/software 8 4.7 Environmental chamber 8 5 ESD simulator waveform verification procedure . 8 6 System verification procedure 8 7 Test procedure including conditioning 9 8 Reporting.

21、 9 Annex A (informative) Energy calculation program . 13 Figure 1 ESD simulator 10 Figure 2 Parallel plate capacitive probe . 11 Figure 3 Current waveform through a 500 resistor 12 BS EN 61340-4-8:2015IEC 61340-4-8:2014 IEC 2014 5 INTRODUCTION It is the intention of this part of IEC 61340 to provide

22、 industry with a common, repeatable method for testing and determining the electrostatic discharge shielding ability of electrostatic discharge shielding bags. This test method describes the use of a single current probe in order to obtain the energy value inside a bag when tested with a 1 000 V hum

23、an body model discharge pulse in an ESD simulator. The standard addresses important variables such as: discharge waveform characteristics; capacitive probe capacitance; bag size. BS EN 61340-4-8:2015 6 IEC 61340-4-8:2014 IEC 2014 ELECTROSTATICS Part 4-8: Standard test methods for specific applicatio

24、ns Electrostatic discharge shielding Bags 1 Scope This part of IEC 61340 provides a test method for evaluating the performance of electrostatic discharge shielding bags tested according to the requirements of IEC 61340-5-3. The design voltage for the test apparatus is 1 000 V d.c. The test method pr

25、esented in this standard can also be applied to packaging other than shielding bags. The purpose of this standard is to ensure that testing laboratories who use this test method to evaluate a given packaging material will obtain similar results. This standard does not address protection from electro

26、magnetic interference (EMI), radio frequency interference (RFI), electromagnetic pulsing (EMP) nor protection against volatile materials. 2 Normative references The following documents, in whole or in part, are normatively referenced in this document and are indispensable for its application. For da

27、ted references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. IEC 60093, Methods of test for volume resistivity and surface resistivity of solid electrical insulating materials1IEC 61340-3-1, Electrostatics P

28、art 3-1: Methods for simulation of electrostatic effects Human body model (HBM) electrostatic discharge test waveforms IEC 61340-5-3, Electrostatics Part 5-3: Protection of electronic devices from electrostatic phenomena Properties and requirements classification for packaging intended for electrost

29、atic discharge sensitive devices 3 Terms and definitions For the purposes of this document, the following terms and definitions apply. 3.1 electrostatic discharge shield barrier or enclosure that limits the passage of current and attenuates an electromagnetic field resulting from an electrostatic di

30、scharge _ 1Replacements for IEC 60093 are currently under consideration and have been assigned project numbers in the IEC 62631-3 series. The relevant project is IEC 62631-3-2, Dielectric and resistive properties of solid insulating materials Part 3-2: Determination of resistive properties (DC metho

31、ds) Surface resistance and surface resistivity. BS EN 61340-4-8:2015IEC 61340-4-8:2014 IEC 2014 7 4 Required equipment 4.1 ESD simulator A basic ESD simulator is shown in Figure 1. This simulator and the resulting waveforms are taken from IEC 61340-3-1. The equivalent circuit for the simulator consi

32、sts of a 100 pF capacitor in series with a 1 500 resistor. 4.2 Waveform verification equipment General 4.2.1Equipment capable of verifying the pulse waveforms defined in this part of IEC 61340 shall include, but is not limited to, a storage oscilloscope, a suitable current probe and a high voltage r

33、esistor. Oscilloscope 4.2.2A digital storage oscilloscope capable of a minimum 200 MHz single shot bandwidth and a minimum sampling rate of 500 mega samples per second. Current probe 4.2.3The current probe shall have a minimum frequency response of 200 MHz. Included in the current probes that meet t

34、his requirement are for example a Tektronix CT-1, CT-2 and CT-6 2. The maximum cable length shall be 1 m. High voltage resistor 4.2.4The resistor shall be a 500 , 1 % tolerance, voltage rating at least 2 000 V, low inductance, sputtered metal film type. 4.3 Capacitive probe A parallel plate capaciti

35、ve probe shall be constructed as shown in Figure 2. The capacitance of the probe shall be 8 pF 2 pF. The probe capacitance can be verified according to Clause 6, point c). The spacer between the plates shall be made of an insulating material such as polycarbonate or acrylic. 4.4 Discharge electrode

36、and ground electrode The discharge electrode and the ground electrode shall be 3,8 cm 0,025 cm in diameter and shall be made of a conductive material. The support area that surrounds the ground electrode shall be 22 cm 1,0 cm 27 cm 1,0 cm and have a surface resistance greater than 1 1012 as measured

37、 by IEC 60093. 4.5 Bag size The bags used for this test shall be 20 cm 0,5 cm 25 cm 0,5 cm with 20 cm being the open end. The defined bag size relates to the inner dimension of a bag. _ 2The information concerning Tektronix CT-1, CT-2 and CT-6 is given for the convenience of users of this standard a

38、nd does not constitute an endorsement by IEC of the product named. Equivalent products may be used if they can be shown to lead to the same results. BS EN 61340-4-8:2015 8 IEC 61340-4-8:2014 IEC 2014 When bags are tested for reasons other than to evaluate performance according to the requirement of

39、IEC 61340-5-3, it is recommended to compare bags of the same size. 4.6 Computer/software A computer is recommended to analyse the data that is acquired by the oscilloscope. A generic description of the analysis system is described in Annex A. 4.7 Environmental chamber A chamber is required that can

40、meet the following environmental test conditions: control humidity to 12 % RH 3 % RH at a temperature of 23 C 2 C; control humidity to 50 % RH 5 % RH at a temperature of 23 C 2 C. 5 ESD simulator waveform verification procedure The following procedure shall be used to verify the resistive current (I

41、p) waveform from the ESD simulator: a) Connect the 500 resistor specified in 4.2.4 to the wiring from the ESD simulator discharge and ground connections keeping the cabling as short as possible (the cables used shall be the same as those used to perform the shielding test). Connect the current probe

42、 around the wire end of the resistor which is connected to the ESD simulator ground. Connect the discharge electrode cable to the tester output and the ground electrode cable to equipment ground. NOTE The conductive discharge and ground electrodes are not used for this portion of the test. b) Connec

43、t the current probe to the storage oscilloscope. Set the oscilloscope input impedance to 50 . (Match the impedance of the probe and the scope input.) c) Set the ESD simulator discharge voltage to 1 000 V d.c. d) Set the horizontal time scale in the oscilloscope to 5 ns per division and initiate a pu

44、lse. Observe the waveform rise time, peak current and leading edge ringing. All parameters shall be within the limits specified in Figure 3a and Clause 5, point e). e) If necessary, adjust the ESD simulator voltage level until a peak current (Ip) of 0,50 A 10 % is obtained. This voltage level repres

45、ents an equivalent 1 000 V discharge level. This is the voltage level that will be used in Clause 7. f) Set the horizontal time scale in the oscilloscope to 100 ns per division and observe the complete current waveform. The pulse shall meet the decay time requirement (td) as shown in Figure 3b. g) U

46、sing the computer, analyse the resulting current waveform. The software shall be capable of calculating energy for different resistances. For this portion of the procedure the resistance is 2 000 (this consists of the 1 500 ESD simulator resistance and the 500 high-voltage resistor). The energy from

47、 a 1 000 V (100 pF) discharge shall be 50 J (6 J). This is obtained from the equation W = 1/2 CV2. 6 System verification procedure The following procedure shall be followed: a) Connect the 500 resistor between the two conductive plates of the capacitive probe. Place the capacitive probe between the

48、discharge and ground electrodes. Ensure that the discharge electrode, the capacitive probe and the ground electrode are vertically aligned and that there is good constant contact between all three elements. b) Connect the current probe to the storage oscilloscope. Set the oscilloscope input resistan

49、ce to 50 . BS EN 61340-4-8:2015IEC 61340-4-8:2014 IEC 2014 9 c) Set the horizontal time scale in the oscilloscope to 5 ns per division and initiate a 1 000 V pulse. The peak current, due to the capacitive loading of the capacitive probe, shall not reduce the peak current to less than 0,42 A. If the reading is outside of this range, check the capacitance of the capacitive probe with a capacitance meter and/or adjust the l