BS EN 61207-7-2013 Expression of performance of gas analyzers Tuneable semiconductor laser gas analyzers《气体分析器性能表示 可调谐半导体激光气体分析器》.pdf

《BS EN 61207-7-2013 Expression of performance of gas analyzers Tuneable semiconductor laser gas analyzers《气体分析器性能表示 可调谐半导体激光气体分析器》.pdf》由会员分享，可在线阅读，更多相关《BS EN 61207-7-2013 Expression of performance of gas analyzers Tuneable semiconductor laser gas analyzers《气体分析器性能表示 可调谐半导体激光气体分析器》.pdf（28页珍藏版）》请在麦多课文档分享上搜索。

1、BSI Standards PublicationExpression of performance of gas analyzersPart 7: Tuneable semiconductor laser gas analyzersBS EN 61207-7:2013Copyright British Standards Institution Provided by IHS under license with BSI - Uncontrolled Copy Not for ResaleNo reproduction or networking permitted without lice

2、nse from IHS-,-,-National forewordThis British Standard is the UK implementation of EN 61207-7:2013. It isidentical to IEC 61207-7:2013.The UK participation in its preparation was entrusted by Technical Com-mittee GEL/65, Measurement and control, to Subcommittee GEL/65/2,Elements of systems.A list o

3、f organizations represented on this committee can be obtained onrequest to its secretary.This publication does not purport to include all the necessary provisions ofa contract. Users are responsible for its correct application. The British Standards Institution 2014.Published by BSI Standards Limite

4、d 2014ISBN 978 0 580 64282 1ICS 19.040; 71.040.40Compliance with a British Standard cannot confer immunity fromlegal obligations.This British Standard was published under the authority of theStandards Policy and Strategy Committee on 31 January 2014.Amendments/corrigenda issued since publicationDate

5、 Text affectedBRITISH STANDARDBS EN 61207-7:2013Copyright British Standards Institution Provided by IHS under license with BSI - Uncontrolled Copy Not for ResaleNo reproduction or networking permitted without license from IHS-,-,-EUROPEAN STANDARD EN 61207-7 NORME EUROPENNE EUROPISCHE NORM December

6、2013 CENELEC European Committee for Electrotechnical Standardization Comit Europen de Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische Normung CEN-CENELEC Management Centre: Avenue Marnix 17, B - 1000 Brussels 2013 CENELEC - All rights of exploitation in any form and by any me

7、ans reserved worldwide for CENELEC members. Ref. No. EN 61207-7:2013 E ICS 19.040; 71.040.40 English version Expression of performance of gas analyzers - Part 7: Tuneable semiconductor laser gas analyzers (IEC 61207-7:2013) Expression des performances des analyseurs de gaz - Partie 7: Analyseurs de

8、gaz laser semi-conducteurs accordables (CEI 61207-7:2013) Angabe zum Betriebsverhalten von Gasanalysatoren - Teil 7: Gasanalysatoren mit abstimmbaren Halbleiterlasern (IEC 61207-7:2013) This European Standard was approved by CENELEC on 2013-10-30. CENELEC members are bound to comply with the CEN/CEN

9、ELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC Management Centre

10、or to any CENELEC member. This European Standard exists in three official versions (English, French, German). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the same status a

11、s the official versions. CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic, Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Lu

12、xembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland, Turkey and the United Kingdom. BS EN 61207-7:2013Copyright British Standards Institution Provided by IHS under license with BSI - Uncontrolled Copy Not for ResaleNo reproduction or ne

13、tworking permitted without license from IHS-,-,-EN 61207-7:2013 - 2 - Foreword The text of document 65B/876/FDIS, future edition 1 of IEC 61207-7, prepared by SC 65B “Measurement and control devices” of IEC/TC 65 “Industrial-process measurement, control and automation“ was submitted to the IEC-CENEL

14、EC parallel vote and approved by CENELEC as EN 61207-7:2013. The following dates are fixed: latest date by which the document has to be implemented at national level by publication of an identical national standard or by endorsement (dop) 2014-07-30 latest date by which the national standards confli

15、cting with the document have to be withdrawn (dow) 2016-10-30 This Standard is to be used in conjunction with EN 61207-1:2010. Attention is drawn to the possibility that some of the elements of this document may be the subject of patent rights. CENELEC and/or CEN shall not be held responsible for id

16、entifying any or all such patent rights. Endorsement notice The text of the International Standard IEC 61207-7:2013 was approved by CENELEC as a European Standard without any modification. In the official version, for Bibliography, the following note has to be added for the standard indicated: ISO 9

17、001 NOTE Harmonized as EN ISO 9001. BS EN 61207-7:2013Copyright British Standards Institution Provided by IHS under license with BSI - Uncontrolled Copy Not for ResaleNo reproduction or networking permitted without license from IHS-,-,- 3 - EN 61207-7:2013 Annex ZA (normative) Normative references t

18、o international publications with their corresponding European publications The following documents, in whole or in part, are normatively referenced in this document and are indispensable for its application. For dated references, only the edition cited applies. For undated references, the latest ed

19、ition of the referenced document (including any amendments) applies. NOTE When an international publication has been modified by common modifications, indicated by (mod), the relevant EN/HD applies. Publication Year Title EN/HD Year IEC 60654-1 1993 Industrial-process measurement and control equipme

20、nt - Operating conditions - Part 1: Climatic conditions EN 60654-1 1993 IEC 60654-2 + A1 1979 1992 Operating conditions for industrial-process measurement and control equipment - Part 2: Power EN 60654-2 1) 1997 IEC 60654-3 1983 Operating conditions for industrial-process measurement and control equ

21、ipment - Part 3: Mechanical influences EN 60654-3 1997 IEC 60825-1 2007 Safety of laser products - Part 1: Equipment classification and requirements EN 60825-1 2007 IEC 61207-1 2010 Expression of performance of gas analyzers - Part 1: General EN 61207-1 2010 1) EN 60654-2 includes A1 to IEC 60654-2.

22、 BS EN 61207-7:2013Copyright British Standards Institution Provided by IHS under license with BSI - Uncontrolled Copy Not for ResaleNo reproduction or networking permitted without license from IHS-,-,- 2 61207-7 IEC:2013 CONTENTS INTRODUCTION . 5 1 Scope . 6 2 Normative references . 6 3 Terms and de

23、finitions . 7 4 Procedure for specification . 10 4.1 General . 10 4.2 In situ analyzers 10 4.2.1 Additional operation and maintenance requirements 10 4.2.2 Additional terms related to the specification of performance 10 4.2.3 Additional limits of uncertainties 11 4.3 Extractive analyzers 11 4.3.1 Ad

24、ditional operation and maintenance requirements 11 4.3.2 Additional terms related to the specification of performance 12 4.4 Recommended standard values and range of influence quantities . 12 4.5 Laser safety 12 5 Procedures for compliance testing 12 5.1 In situ analyzers 12 5.1.1 General . 12 5.1.2

25、 Apparatus to simulate measurement condition . 13 5.1.3 Apparatus to generate test gas mixture . 13 5.1.4 Apparatus to investigate the attenuation induced by opaque dust, liquid droplets and other particles 13 5.1.5 Testing procedures 14 5.2 Extractive analyzers 16 5.2.1 General . 16 5.2.2 Apparatus

26、 to generate test gas mixture . 16 5.2.3 Testing procedures 16 Annex A (informative) Systems of tuneable semiconductor laser gas analyzers . 18 Annex B (normative) Examples of the test apparatus . 19 Bibliography 23 Figure A.1 Tuneable semiconductor laser gas analyzers 18 Figure B.1 Example of a tes

27、t apparatus to simulate measurement condition for across-duct and open-path analyzers 19 Figure B.2 Example of a test apparatus to simulate measurement condition for probe type analyzers 19 Figure B.3 Example of apparatus to generate the test gas mixture . 20 Figure B.4 Delay time, rise time and fal

28、l time . 21 Figure B.5 Example of a grid to simulate the attenuation by the dust in optical path . 22 BS EN 61207-7:2013Copyright British Standards Institution Provided by IHS under license with BSI - Uncontrolled Copy Not for ResaleNo reproduction or networking permitted without license from IHS-,-

29、,-61207-7 IEC:2013 5 INTRODUCTION This part of IEC 61207 includes the terminology, definitions, statements and tests that are specific to tuneable semiconductor laser gas analyzers, which utilize tuneable semiconductor laser absorption spectroscopy (TSLAS). Tuneable semiconductor laser gas analyzers

30、 utilize tuneable semiconductor lasers (e.g. diode lasers, quantum cascade lasers, interband cascade lasers) as light sources, whose wavelength covers ultraviolet, visible and infrared part of the electromagnetic spectrum, to detect the absorption spectra and thus determine the concentration of gase

31、s to be analyzed. These analyzers may employ different TSLAS techniques such as direct absorption spectroscopy, frequency modulation spectroscopy (FMS), wavelength modulation spectroscopy (WMS), etc. Multi-pass absorption spectroscopy, photoacoustic spectroscopy (PAS), and cavity-enhanced absorption

32、 spectroscopy (CEAS) such as cavity-ringdown spectroscopy (CRDS) are also used to take advantage of their high detection sensitivity. Tuneable semiconductor laser gas analyzers are usually used to measure concentration of small molecule gases, such as oxygen, carbon monoxide, carbon dioxide, hydroge

33、n sulfide, ammonia, hydrogen fluoride, hydrogen chloride, nitrogen dioxide, water vapour etc. There are two main types of tuneable semiconductor laser gas analyzers: extractive and in situ analyzers. The extractive analyzers measure the sample gas withdrawn from a process or air by a sample handling

34、 system. The in situ analyzers measure the gas in its original place, including across-duct, probe and open-path types. Across-duct analyzers either have a laser source and a detector mounted on opposite sides of a duct, or both the laser and the detector are mounted on the same side and a retrorefl

35、ector on the opposite side of a duct. Probe analyzers comprise a probe mounted into the duct, and the measured gas either passes through or diffuses into the measuring optical path inside the probe. And open-path analyzers measure the gas in an open environment with a hardware approach similar to ac

36、ross duct analyzers (source and detector on opposite sides of the open area or a retroreflector on one side and the source and detector on the opposite side), except the sample is in an open path and not contained in a duct. NOTE 1 Traditionally, only diode lasers were employed, and thus tuneable di

37、ode laser gas analyzers and tuneable diode laser absorption spectroscopy (TDLAS) are widely used terms. However, with the development of laser technology, many other types of semiconductor lasers, such as quantum cascade lasers (QCLs) and interband cascade lasers (ICLs) have been developed and emplo

38、yed in laser gas analyzers. Therefore, the term of semiconductor laser rather than diode laser is used in this standard to reflect this technology advancement. NOTE 2 Though tuneable semiconductor laser photoacoustic spectroscopy (PAS) is in principle different from absorption spectroscopy typically

39、 used in tuneable semiconductor laser gas analyzers, the hardware and data reduction software are almost the same for analyzers utilizing these two spectroscopy technologies, and thus PAS is considered a variant of absorption spectroscopy and this standard also applies to the analyzers based on PAS.

40、 BS EN 61207-7:2013Copyright British Standards Institution Provided by IHS under license with BSI - Uncontrolled Copy Not for ResaleNo reproduction or networking permitted without license from IHS-,-,- 6 61207-7 IEC:2013 EXPRESSION OF PERFORMANCE OF GAS ANALYZERS Part 7: Tuneable semiconductor laser

41、 gas analyzers 1 Scope This part of IEC 61207 applies to all aspects of analyzers utilizing TSLAS for the concentration measurement of one or more gas components in a gaseous mixture or vapour. It applies to analyzers utilizing tuneable semiconductor lasers as sources and utilizing absorption spectr

42、oscopy, such as direct absorption, FMS, WMS, multi-pass absorption spectroscopy, CRDS, ICOS, PAS and CEAS techniques, etc. It applies both to in situ or extractive type analyzers. This standard includes the following, it specifies the terms and definitions related to the functional performance of ga

43、s analyzers, utilizing tuneable semiconductor laser gas absorption spectroscopy, for the continuous measurement of gas or vapour concentration in a source gas, unifies methods used in making and verifying statements on the functional performance of this type of analyzers, specifies the type of tests

44、 to be performed to determine the functional performance and how to carry out these tests, provides basic documents to support the application of the standards of quality assurance with in ISO 9001 2 Normative references The following documents, in whole or in part, are normatively referenced in thi

45、s document and are indispensable for its application. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. IEC 60654-1:1993, Industrial-process measurement and control equipment Operating condi

46、tions Part 1: Climatic conditions IEC 60654-2:1979, Operating conditions for industrial-process measurement and control equipment Part 2: Power Amendment 1:1992 IEC 60654-3:1983, Operating conditions for industrial-process measurement and control equipment Part 3: Mechanical influences IEC 60825-1:2

47、007, Safety of laser products Part 1: Equipment classification and requirements IEC 61207-1:2010, Expression of performance of gas analyzers Part 1: General BS EN 61207-7:2013Copyright British Standards Institution Provided by IHS under license with BSI - Uncontrolled Copy Not for ResaleNo reproduct

48、ion or networking permitted without license from IHS-,-,-61207-7 IEC:2013 7 3 Terms and definitions For the purposes of this document, the following terms and definitions apply. 3.1 semiconductor laser solid-state laser, in which the semiconductor material is used as active media 3.2 diode laser semiconductor laser which is formed from a p-n junction and powered by injected electric current 3.3 quantum cascade laser semiconductor laser whose laser emission is achieved through the use of intersubband transitions in a repeated stack of semiconductor multiple quantum structure, a