BS EN 60904-1-2006 Photovoltaic devices - Measurement of photovoltaic current-voltage characteristics《光电器件 光电电流-电压特性的测量》.pdf

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1、 g49g50g3g38g50g51g60g44g49g42g3g58g44g55g43g50g56g55g3g37g54g44g3g51g40g53g48g44g54g54g44g50g49g3g40g59g38g40g51g55g3g36g54g3g51g40g53g48g44g55g55g40g39g3g37g60g3g38g50g51g60g53g44g42g43g55g3g47g36g58The European Standard EN 60904-1:2006 has the status of a British StandardICS 27.160Photovoltaic de

2、vices Part 1: Measurement of photovoltaic current-voltage characteristicsBRITISH STANDARDBS EN 60904-1:2006BS EN 60904-1:2006This British Standard was published under the authority of the Standards Policy and Strategy Committee on 29 December 2006 BSI 2006ISBN 0 580 49894 8Amendments issued since pu

3、blicationAmd. No. Date CommentsThis publication does not purport to include all the necessary provisions of a contract. Users are responsible for its correct application.Compliance with a British Standard cannot confer immunity from legal obligations. National forewordThis British Standard was publi

4、shed by BSI. It is the UK implementation of EN 60904-1:2006. It is identical with IEC 60904-1:2006. It supersedes BS EN 60904-1:1993 which is withdrawn.The UK participation in its preparation was entrusted to Technical Committee GEL/82, Solar photovoltaic energy systems.A list of organizations repre

5、sented on GEL/82 can be obtained on request to its secretary.EUROPEAN STANDARD EN 60904-1 NORME EUROPENNE EUROPISCHE NORM November 2006 CENELEC European Committee for Electrotechnical Standardization Comit Europen de Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische Normung Cen

6、tral Secretariat: rue de Stassart 35, B - 1050 Brussels 2006 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members. Ref. No. EN 60904-1:2006 E ICS 27.160 Supersedes EN 60904-1:1993English version Photovoltaic devices Part 1: Measurement of photovolt

7、aic current-voltage characteristics (IEC 60904-1:2006) Dispositifs photovoltaques Partie 1: Mesure des caractristiques courant-tension des dispositifs photovoltaques (CEI 60904-1:2006) Photovoltaische Einrichtungen Teil 1: Messen der photovoltaischen Strom-/Spannungskennlinien (IEC 60904-1:2006) Thi

8、s European Standard was approved by CENELEC on 2006-10-01. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical ref

9、erences concerning such national standards may be obtained on application to the Central Secretariat or to any CENELEC member. This European Standard exists in three official versions (English, French, German). A version in any other language made by translation under the responsibility of a CENELEC

10、 member into its own language and notified to the Central Secretariat has the same status as the official versions. CENELEC members are the national electrotechnical committees of Austria, Belgium, Cyprus, the Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Irel

11、and, Italy, Latvia, Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland and the United Kingdom. Foreword The text of document 82/433/FDIS, future edition 2 of IEC 60904-1, prepared by IEC TC 82, Solar photovoltaic energy sy

12、stems, was submitted to the IEC-CENELEC parallel vote and was approved by CENELEC as EN 60904-1 on 2006-10-01. This European Standard supersedes EN 60904-1:1993. The main changes with respect to EN 60904-1:1993 are as follows: Added object. Added normative references. Updated original Clause 2 (Gene

13、ral Measurement Requirements), removing Figure 1 as it is obsolete. Provided more detail and guidance on how to measure in sunlight or simulated sunlight. Expanded original Clause 6 (Test Report) with requirements based on ISO 17025. The following dates were fixed: latest date by which the EN has to

14、 be implemented at national level by publication of an identical national standard or by endorsement (dop) 2007-07-01 latest date by which the national standards conflicting with the EN have to be withdrawn (dow) 2009-10-01 Annex ZA has been added by CENELEC. _ Endorsement notice The text of the Int

15、ernational Standard IEC 60904-1:2006 was approved by CENELEC as a European Standard without any modification. _ 2 EN 60904-1:2006CONTENTS 1 2 3 4 4.1 4.2 5 6 7 8 3 EN 60904-1:2006Scope and object4 Normative references .4 General measurement requirements.5 Apparatus.6 For measurements in natural sunl

16、ight6 For measurements in simulated sunlight6 Measurements in natural sunlight .6 Measurement in steady-state simulated sunlight.7 Measurement in pulsed simulated sunlight .9 Test report11 corresponding European publications .12 Annex ZA (normative) Normative references to international publications

17、 with their PHOTOVOLTAIC DEVICES Part 1: Measurement of photovoltaic current-voltage characteristics 1 Scope and object This part of IEC 60904 describes procedures for the measurement of current-voltage characteristics of photovoltaic devices in natural or simulated sunlight. These procedures are ap

18、plicable to a single photovoltaic solar cell, a sub-assembly of photovoltaic solar cells, or a PV module. NOTE 1 This standard may be applicable to multi-junction test specimens, if each sub-junction generates the same amount of current as it would under the reference AM1,5 spectrum in IEC 60904-3.

19、NOTE 2 This standard may be applicable to PV devices designed for use under concentrated irradiation if they are irradiated using direct normal irradiance and a mismatch correction with respect to a direct normal reference spectrum is performed. The purpose of this standard is to lay down basic requ

20、irements for the measurement of current-voltage characteristics of photovoltaic devices, to define procedures for different measuring techniques in use and to show practices for minimising measurement uncertainty. 2 Normative references The following referenced documents are indispensable for the ap

21、plication of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. IEC 60891: Procedures for temperature and irradiance corrections to measured I-V characteristics of crystalline

22、silicon photovoltaic (PV) devices IEC 60904-2: Photovoltaic devices Part 2: Requirements for reference solar cells IEC 60904-3: Photovoltaic devices Part 3: Measurement principles for terrestrial photovoltaic (PV) solar devices with reference spectral irradiance data IEC 60904-5: Photovoltaic device

23、s Part 5: Determination of equivalent cell temperature (ECT) of photovoltaic (PV) devices by the open-circuit voltage method IEC 60904-6: Photovoltaic devices Part 6: Requirements for reference solar modules IEC 60904-7: Photovoltaic devices Part 7: Computation of spectral mismatch error introduced

24、in the testing of a photovoltaic device IEC 60904-9: Photovoltaic devices Part 9: Solar simulator performance requirements IEC 60904-10: Photovoltaic devices Part 10: Methods for linearity measurements ISO/IEC 17025: General requirements for competence of testing and calibration laboratories 4 EN 60

25、904-1:20063 General measurement requirements a) The irradiance measurements shall be made using a PV reference device packaged and calibrated in conformance with IEC 60904-2 or IEC 60904-6 or a pyranometer. The PV reference device shall either be spectrally matched to the test specimen, or a spectra

26、l mismatch correction shall be performed in conformance with IEC 60904-7. The reference device shall be linear in short-circuit current as defined in IEC 60904-10 over the irradiance range of interest. NOTE To be considered spectrally matched, a reference device must be constructed using the same ce

27、ll technology and encapsulation package as the test device. If this is not the case, the spectral mismatch must be reported. b) The temperature of the reference device and the specimen shall be measured using instrumentation with an accuracy of 1 C with repeatability of 0,5 C. If the temperature of

28、the reference device differs by more than 2 C from the temperature at which it was calibrated, the calibration value shall be adjusted to the measured temperature. If the reference device is a pyranometer, temperature measurement and temperature correction of its output signal are not required. c) T

29、he active surface of the specimen shall be coplanar within 2 with the active surface of the reference device. d) Voltages and currents shall be measured using instrumentation with an accuracy of 0,2 % of the open-circuit voltage and short-circuit current using independent leads from the terminals of

30、 the specimen and keeping them as short as possible. The measurement ranges of the data acquisition should be carefully chosen. If the test specimen is a module, the 4-wire connection should start at the terminals or connectors. If the test specimen is a cell, the 4-wire connection should start at t

31、he cell bus bars. NOTE The connection method for cells should be carefully evaluated. Differences may occur if soldered tabs are used as probe or non-soldered methods are implemented such as bars having contact springs or conductive plates having a large-area contact with the cell back contact. Non-

32、soldered methods can result in higher fill factors than are observed in the module. The contacting method should be appropriate to the intended use of the cell or of the measurement. e) The short-circuit current shall be measured at zero voltage, using a variable bias (preferably electronic) to offs

33、et the voltage drop across the external series resistance. Alternatively, short circuit current may be extrapolated from the current-voltage characteristic. The curve is extrapolated to zero voltage provided that voltage drop is not higher than 3 % of the device open-circuit voltage and that there i

34、s a linear relationship between current and voltage. f) The accuracy of the procedure for irradiance and temperature correction in conformance with IEC 60891 shall be verified periodically by measuring the performance of a specimen at selected irradiance and temperature levels and comparing the resu

35、lts with corresponding extrapolated data as in IEC 60904-10. NOTE If temperature and irradiance correction is performed across wide ranges module correction parameters can considerably affect the test result. Care should be taken regarding the relevance of the module parameters used. In particular s

36、eries resistance cannot be generalized to a batch of specimens of the same type. In measuring PV devices which are non stable, care must be taken in selecting a representative spectral response. 5 EN 60904-1:20064 Apparatus 4.1 For measurements in natural sunlight In addition to the general measurem

37、ent requirements of Clause 3 the following equipment is required to perform I-V characteristic measurements in natural sunlight: a) A PV reference device or pyranometer that meets the conditions stated in item a) of Clause 3. b) Means for measuring temperature of the reference device that meets the

38、conditions stated in item b) of Clause 3, if necessary. c) Equipment to determine the temperature of the test device using the Equivalent Cell Temperature (ECT) method specified in IEC 60904-5 or other means to measure the temperature of the test device as stated in item b) of Clause 3. d) A two-axi

39、s tracking system capable of tracking the sun to an accuracy of 5. e) A spectroradiometer capable of measuring the spectral irradiance of the sunlight in the range of the spectral response of the test specimen and the reference device, if spectral corrections are needed as defined in item a) of Clau

40、se 3. 4.2 For measurements in simulated sunlight In addition to the general measurement requirements of Clause 3 the following equipment is required to perform I-V characteristic measurements in simulated sunlight: a) A PV reference device that is well matched to the test device over the ranges of i

41、rradiances, spectral distributions and temperatures of interest and meets the conditions stated in item a) of Clause 3. b) Means for measuring the temperature of the reference device and the test specimen that meets the conditions stated in item b) of Clause 3. c) A Class BBB or better solar simulat

42、or in accordance with IEC 60904-9. The designated test area shall be equal to or greater than the area that is spanned by the test specimen. d) An irradiance sensor that tracks the instantaneous irradiance in the test plane. This irradiance sensor should be linear in the range of irradiances over wh

43、ich the measurements are taken (see IEC 60904-10). e) A spectroradiometer capable of measuring the spectral irradiance of the simulator in the range of the spectral response of the test specimen and the reference device, if spectral corrections are needed as defined in item a) of Clause 3. NOTE Care

44、 should be taken in the use of an emission lamp such as Xenon for testing direct band gap cells. As the band gap changes due to temperature, it can pass through various emission lines in the lamp spectrum and give rise to large shifts in performance. 5 Measurements in natural sunlight Measurements i

45、n natural sunlight shall be made only when global solar irradiance is not fluctuating by more than 1 % during a measurement. When the measurements are intended for reference to STC the irradiance shall be at least 800 Wm2. 6 EN 60904-1:2006The test procedure is as follows: 5.1 Mount the reference de

46、vice as near as possible to and co-planar with the specimen on the two-axis tracker. Both shall be normal to the direct solar beam within 5. Connect to the necessary instrumentation. 5.2 If the specimen and reference device are equipped with temperature controls, set the controls at the desired leve

47、l. If temperature controls are not used: 5.2.1 shade the specimen and the reference device from the sun and wind until their temperature is uniform within 2 C of the ambient air temperature, or 5.2.2 allow the test specimen to equilibrate to its stabilized temperature, or 5.2.3 pre-condition the tes

48、t specimen to a point below the target temperature and then let the module warm up naturally. NOTE There may be differences between average cell temperature and average back temperature during warming up. 5.3 Record the current-voltage characteristic and temperature of the specimen concurrently with

49、 recording the output and temperature (if required) of the reference device at the desired temperatures. If necessary, make the measurements immediately after removing the shade. NOTE In most cases the thermal inertia of the specimen and the reference device will limit the temperature rise during the first few seconds to less than 2 C. Their temperatures will remain reasonably uniform. 5.4 Ensure that the specimen and reference device temperature are stable and