BS EN 60689-2009 Measurement and test methods for tuning fork quartz crystal units in the range from 10 kHz to 200 kHz and standard values《10 kHz至200 kHz及标准值范围内音叉水晶振子的测量和试验方法》.pdf

《BS EN 60689-2009 Measurement and test methods for tuning fork quartz crystal units in the range from 10 kHz to 200 kHz and standard values《10 kHz至200 kHz及标准值范围内音叉水晶振子的测量和试验方法》.pdf》由会员分享，可在线阅读，更多相关《BS EN 60689-2009 Measurement and test methods for tuning fork quartz crystal units in the range from 10 kHz to 200 kHz and standard values《10 kHz至200 kHz及标准值范围内音叉水晶振子的测量和试验方法》.pdf（24页珍藏版）》请在麦多课文档分享上搜索。

1、Measurement and test methodsfor tuning fork quartz crystalunits in the range from 10 kHzto 200 kHz and standard valuesBS EN 60689:2009raising standards worldwideNO COPYING WITHOUT BSI PERMISSION EXCEPT AS PERMITTED BY COPYRIGHT LAWBSI British StandardsNational forewordThis British Standard is the UK

2、 implementation of EN 60689:2009. It is identical to IEC 60689:2008.The UK participation in its preparation was entrusted to Technical CommitteeEPL/49, Piezoelectric devices for frequency control and selection.A list of organizations represented on this committee can be obtained onrequest to its sec

3、retary.This publication does not purport to include all the necessary provisions of acontract. Users are responsible for its correct application. BSI 2009ISBN 978 0 580 55654 8ICS 31.140Compliance with a British Standard cannot confer immunity fromlegal obligations.This British Standard was publishe

4、d under the authority of the StandardsPolicy and Strategy Committee on 30 April 2009Amendments issued since publicationAmd. No. Date Text affectedBRITISH STANDARDBS EN 60689:2009EUROPEAN STANDARD EN 60689 NORME EUROPENNE EUROPISCHE NORM March 2009 CENELEC European Committee for Electrotechnical Stan

5、dardization Comit Europen de Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische Normung Central Secretariat: avenue Marnix 17, B - 1000 Brussels 2009 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members. Ref. No. EN 60689:2009

6、E ICS 31.140 English version Measurement and test methods for tuning fork quartz crystal units in the range from 10 kHz to 200 kHz and standard values (IEC 60689:2008) Mthodes de mesure et dessai concernant le rglage des rsonateurs quartz dans la plage comprise entre 10 kHz et 200 kHz et valeurs nor

7、males (CEI 60689:2008) Mess- und Prfverfahren fr Stimmgabelquarze im Frequenzbereich von 10 kHz bis 200 kHz sowie Richtwerte (IEC 60689:2008) This European Standard was approved by CENELEC on 2009-03-01. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate th

8、e conditions for giving this European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the Central Secretariat or to any CENELEC member. This European Standard exist

9、s in three official versions (English, French, German). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the Central Secretariat has the same status as the official versions. CENELEC members are the national electr

10、otechnical committees of Austria, Belgium, Bulgaria, Cyprus, the Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerl

11、and and the United Kingdom. BS EN 60689:2009EN 60689:2009 - 2 - Foreword The text of document 48/809/FDIS, future edition 2 of IEC 60689, prepared by IEC TC 49, Piezoelectric and dielectric devices for frequency control and selection, was submitted to the IEC-CENELEC parallel vote and was approved b

12、y CENELEC as EN 60689 on 2009-03-01. The following dates were fixed: latest date by which the EN has to be implemented at national level by publication of an identical national standard or by endorsement (dop) 2009-12-01 latest date by which the national standards conflicting with the EN have to be

13、withdrawn (dow) 2012-03-01 Annex ZA has been added by CENELEC. _ Endorsement notice The text of the International Standard IEC 60689:2008 was approved by CENELEC as a European Standard without any modification. In the official version, for Bibliography, the following notes have to be added for the s

14、tandards indicated: IEC 60068-1 NOTE Harmonized as EN 60668-1:1994 (not modified). IEC 60068-2-1 NOTE Harmonized as EN 60668-2-1:2007 (not modified). IEC 60068-2-2 NOTE Harmonized as EN 60668-2-2:2007 (not modified). IEC 60068-2-7 NOTE Harmonized as EN 60668-2-7:1993 (not modified). IEC 60068-2-13 N

15、OTE Harmonized as EN 60668-2-13:1999 (not modified). IEC 60068-2-14 NOTE Harmonized as EN 60668-2-14:1999 (not modified). IEC 60068-2-17 NOTE Harmonized as EN 60668-2-17:1994 (not modified). IEC 60068-2-20 NOTE Harmonized as EN 60668-2-20:2008 (not modified). IEC 60068-2-21 NOTE Harmonized as EN 606

16、68-2-21:2006 (not modified). IEC 60068-2-27 NOTE Harmonized as EN 60668-2-27:1993 (not modified). IEC 60068-2-30 NOTE Harmonized as EN 60668-2-30:2005 (not modified). IEC 60068-2-31 NOTE Harmonized as EN 60668-2-31:2008 (not modified). IEC 60068-2-45 NOTE Harmonized as EN 60668-2-45:1992 (not modifi

17、ed). IEC 60068-2-78 NOTE Harmonized as EN 60668-2-78:2001 (not modified). _ BS EN 60689:2009- 3 - EN 60689:2009 Annex ZA (normative) Normative references to international publications with their corresponding European publications The following referenced documents are indispensable for the applicat

18、ion of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. NOTE When an international publication has been modified by common modifications, indicated by (mod), the relevant EN/

19、HD applies. Publication Year Title EN/HD Year IEC 60027 Series Letter symbols to be used in electrical technology EN 60027 Series IEC 60050-561 -1)International Electrotechnical Vocabulary (IEV) - Chapter 561: Piezoelectric devices for frequency control and selection - - IEC 60122-1 -1)Quartz crysta

20、l units of assessed quality - Part 1: Generic specification EN 60122-1 20022)IEC 60122-3 -1)Quartz crystal units of assessed quality - Part 3: Standard outlines and lead connections EN 60122-3 20012)IEC 60444 Series Measurement of quartz crystal unit parameters by zero phase technique in a pi-networ

21、k EN 60444 Series IEC 60617 Data-base Graphical symbols for diagrams - - ISO 1000 1992 SI units and recommendations for the use of their multiples and of certain other units - - 1)Undated reference. 2)Valid edition at date of issue. BS EN 60689:2009 2 60689 IEC:2008(E) CONTENTS 1 Scope.6 2 Normative

22、 references .6 3 Overview 6 3.1 General .6 3.2 Applied frequency range6 3.3 Measurement method6 3.4 Load capacitance 7 3.5 Recommended drive level .7 3.6 Measurement conditions7 3.7 Measurement of frequency-temperature characteristics.7 3.8 Load capacitance frequency characteristics 7 4 Measurement

23、methods .7 4.1 Method A.7 4.1.1 Vector network analyzer/vector impedance analyzer7 4.1.2 Block diagram7 4.1.3 Specifications for vector network analyzer/vector impedance analyzer 8 4.1.4 Test fixture 8 4.1.5 Measurement of equivalent circuit constants .9 4.1.6 Frequency pulling 10 4.2 Method B.10 4.

24、2.1 General .10 4.2.2 Block diagram10 4.2.3 Calibration.11 4.2.4 Procedure12 5 Measurement conditions.12 5.1 General .12 5.2 Measurement conditions12 5.3 Measurement of the frequency-temperature dependence 13 5.3.1 General .13 5.3.2 Block diagram13 5.3.3 Determination of the turnover point and parab

25、olic coefficient (standard reference method) .14 5.3.4 Measurement of the frequency versus temperature characteristics (mass production method) .14 5.3.5 Frequency CLcurve.15 6 Test and environmental examination 15 6.1 Application of the definition of IEC 60122-1 .15 6.2 Magnetism Influence of a mag

26、netic field on the frequency16 6.3 Enclosure16 6.4 Measuring conditions and electric performance .16 6.4.1 General .16 6.4.2 Measurement conditions16 6.4.3 Standard values 16 Bibliography18 BS EN 60689:200960689 IEC:2008(E) 3 Figure 1 Block diagram of the measurement method using the vector network

27、analyzer or vector impedance analyzer .8 Figure 2 Block diagram of test fixture.9 Figure 3 Block diagram of test fixture (including a load capacitance)9 Figure 4 Block diagram of test fixture for bridge method 11 Figure 5 Block diagram of test fixture for bridge method (including a load capacitance)

28、 .11 Figure 6 Block diagram of measurement of the frequency-temperature dependence 13 Figure 7 Frequencytemperature template (Turnover point: 25 5 C, =45 109/C2) 14 Figure 8a) f/f versus CLcurve 15 Figure 8b) f/f versus CLcurve .15 Figure 8 f/f versus CLcurve with different CLs.15 Table 1 Specificat

29、ions for vector network analyzer/vector impedance analyzer 8 Table 2 Standard values 17 BS EN 60689:2009 6 60689 IEC:2008(E) MEASUREMENT AND TEST METHODS FOR TUNING FORK QUARTZ CRYSTAL UNITS IN THE RANGE FROM 10 kHz TO 200 kHz AND STANDARD VALUES 1 Scope This International Standard applies to measur

30、ements and test methods for tuning fork quartz crystal units in the range from 10 kHz to 200 kHz and standard values for frequency control and selection. 2 Normative references The following referenced documents are indispensable for the application of this document. For dated references, only the e

31、dition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. IEC 60027 (all parts), Letter symbols to be used in electrical technology IEC 60050-561, International Electrotechnical Vocabulary Chapter 561: Piezoelectric devices for fr

32、equency control and selection IEC 60122-1, Quartz crystal units of assessed quality Part 1: Generic specification IEC 60122-3, Quartz crystal units of assessed quality Part 3: Standard outlines and lead connections IEC 60444 (series), Measurement of quartz crystal unit parameters by zero phase techn

33、ique in a -network IEC 60617, Graphical symbols for diagrams ISO 1000:1992, SI units and recommendations for the use of their multiples and certain other Units 3 Overview 3.1 General Units, graphical symbols, letter symbols and terminology shall, wherever possible, be taken from the following standa

34、rds: IEC 60027, IEC 60050-561, IEC 60122-1, IEC 60617, and ISO 1000. 3.2 Applied frequency range The frequency range is from 10 kHz to 200 kHz. 3.3 Measurement method The measurement method is according to the IEC 60444 series. It is permitted to use the bridge method as a simple measuring method. B

35、S EN 60689:200960689 IEC:2008(E) 7 NOTE Other methods like Lissajous-or oscillator methods are not recommended for measurement of equivalent circuit constants. 3.4 Load capacitance Currently, defined values of load capacitance are 8 pF, 10 pF, 12 pF, 15 pF, 20 pF and 30 pF. 3.5 Recommended drive lev

36、el Currently, the recommended drive level is 0,1 W. 3.6 Measurement conditions Measurement conditions are given in 5.2. 3.7 Measurement of frequency-temperature characteristics The measurement of frequency-temperature characteristics is given in Clause 5. 3.8 Load capacitance frequency characteristi

37、cs The present conditions of load capacitance and frequency characteristics are given in 5.3.4. 4 Measurement methods 4.1 Method A The measurement method according to the IEC 60444 series gives a copy of a block diagram (including a load capacitance), test fixture (for Surface Mounted Device-units i

38、ncluded) with additional values of the resistances for high impedance value (standard PI-network 25 ) and hardware requirements for a frequency range from 10 kHz to 200 kHz. This measuring method is a standard measuring method in this document. 4.1.1 Vector network analyzer/vector impedance analyzer

39、 The measurement method using the vector network analyzer or vector impedance analyzer is based on the following method. 4.1.2 Block diagram Figure 1 is a block diagram of the measurement method using the vector network analyzer or vector impedance analyzer. BS EN 60689:2009 8 60689 IEC:2008(E) Anal

40、yzer Personal computer Test fixture IEC 2108/08 Figure 1 Block diagram of the measurement method using the vector network analyzer or vector impedance analyzer 4.1.3 Specifications for vector network analyzer/vector impedance analyzer Specifications for vector impedance analyzer are shown in Table 1

41、. Table 1 Specifications for vector network analyzer/vector impedance analyzer Item Specifications Frequency range The measurement range of equipment shall be from 10 kHz to 200 kHz. 1 10-6Frequency accuracy Series resistance accuracy 1 % Signal level adjusted range 5 mVrms 1Vrmsor 200 Arms 20 mArms

42、Spurious 40 dB max. Others RC23C, LAN, etc. 4.1.4 Test fixture A test fixture shall be used. This test fixture shall be electrically and mechanically compatible with the vector network analyzer or the vector impedance analyzer that is used. Figures 2 and Figure 3 show the block diagrams of the equiv

43、alent circuit of the test fixture. BS EN 60689:200960689 IEC:2008(E) 9 R2T (N: 1) Zin= 50 OUT IN Zout= 50 T (1: N) R2R1R1IEC 2109/08 Figure 2 Block diagram of test fixture CL1R2T (N: 1) Zin= 50 OUT IN Zout= 50 T (1: N) R2R1R1CL2IEC 2110/08 Figure 3 Block diagram of test fixture (including a load cap

44、acitance) The equivalent series resistance of the crystal units takes on various values according to the design. This resistance value varies in a range from 1 k to 100 k. For this reason, the equivalent series resistance of the crystal units determines R1and R2appropriately. These values should be

45、determined through a contract with the customer. Since it is the low frequency range, the structure and material of the test fixture are not defined specifically. EXAMPLE Each constant takes on the following values in the following ranges. Rris 1 k to 10 k: N_TF = 10 000, R1 = 49,5 k, and R2 = 5,008

46、 M Rris 10 k to 20 k: N_TF = 17 000, R1 = 50 k, and R2 = 15,000 M Rris 20 k to 40 k: N_TF = 24 000, R1 = 50,464 k, and R2 = 30 M Rris 40 k to 70 k: N_TF = 33 000, R1 = 49,809 k, and R2 = 55,008 M Rris 70 k to 200 k: N_TF = 41, R1 = 50,119 k, and R2 = 85,008 M NOTE The structure and material of the t

47、est fixture are determined through due examination. 4.1.5 Measurement of equivalent circuit constants The measurements of equivalent resistance Rr, resonance frequency fr, motional capacitance C1, quality factor Q and load resonance frequency fLare in accordance with the IEC 60444 series. The load r

48、esonance offset between load resonance frequency fLand resonance frequency frcan be calculated from the parameters C0and C1by the following formula. ()L012 CCCff+=BS EN 60689:2009 10 60689 IEC:2008(E) 4.1.6 Frequency pulling 4.1.6.1 General The frequency pulling shall compensate the frequency shifts

49、 by means of the following: a) tolerances on other components of oscillator (e.g. watch) circuits; b) adjustment tolerance; c) ageing during the economic life of oscillator (e.g. watch) circuits; d) frequency shifts due to shocks and vibrations. 4.1.6.2 Alternative determination of the motional capacitance C1The motional capacitance C1can be determined alternatively with the frequency di