BS EN 50527-1-2010 Procedure for the assessment of the exposure to electromagnetic fields of workers bearing active implantable medical devices - General《工作轴承有源植入性医疗器械的电磁场辐射暴露的评定规程.pdf
《BS EN 50527-1-2010 Procedure for the assessment of the exposure to electromagnetic fields of workers bearing active implantable medical devices - General《工作轴承有源植入性医疗器械的电磁场辐射暴露的评定规程.pdf》由会员分享,可在线阅读,更多相关《BS EN 50527-1-2010 Procedure for the assessment of the exposure to electromagnetic fields of workers bearing active implantable medical devices - General《工作轴承有源植入性医疗器械的电磁场辐射暴露的评定规程.pdf(44页珍藏版)》请在麦多课文档分享上搜索。
1、raising standards worldwideNO COPYING WITHOUT BSI PERMISSION EXCEPT AS PERMITTED BY COPYRIGHT LAWBSI Standards PublicationProcedure for the assessment of the exposure to electromagnetic fields of workers bearing activeimplantable medical devicesPart 1: GeneralBS EN 50527-1:2010National forewordThis
2、British Standard is the UK implementation of EN 50527-1:2010.The UK participation in its preparation was entrusted to Technical Committee GEL/106, Human exposure to low frequency and high frequency electromagnetic radiation.A list of organizations represented on this committee can be obtained onrequ
3、est to its secretary.This publication does not purport to include all the necessary provisions of acontract. Users are responsible for its correct application. BSI 2010ISBN 978 0 580 64934 9ICS 11.040.40; 13.100; 13.280Compliance with a British Standard cannot confer immunity fromlegal obligations.T
4、his British Standard was published under the authority of the StandardsPolicy and Strategy Committee on 31 May 2010.Amendments issued since publicationAmd. No. Date Text affectedBRITISH STANDARDBS EN 50527-1:2010EUROPEAN STANDARD EN 50527-1 NORME EUROPENNE EUROPISCHE NORM April 2010 CENELEC European
5、 Committee for Electrotechnical Standardization Comit Europen de Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische Normung Management Centre: Avenue Marnix 17, B - 1000 Brussels 2010 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELE
6、C members. Ref. No. EN 50527-1:2010 E ICS 11.040.40; 13.100; 13.280 English version Procedure for the assessment of the exposure to electromagnetic fields of workers bearing active implantable medical devices - Part 1: General Procdure pour lvaluation de lexposition des travailleurs porteurs de disp
7、ositifs mdicaux implantables actifs aux champs lectromagntiques - Partie 1 : Gnralits Verfahren zur Beurteilung der Exposition von Arbeitnehmern mit aktiven implantierbaren medizinischen Gerten (AIMD) gegenber elektromagnetischen Feldern - Teil 1: Allgemeine Festlegungen This European Standard was a
8、pproved by CENELEC on 2010-02-01. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such n
9、ational standards may be obtained on application to the Central Secretariat or to any CENELEC member. This European Standard exists in three official versions (English, French, German). A version in any other language made by translation under the responsibility of a CENELEC member into its own lang
10、uage and notified to the Central Secretariat has the same status as the official versions. CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, I
11、taly, Latvia, Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland and the United Kingdom. BS EN 50527-1:2010EN 50527-1:2010 2 Foreword This European Standard was prepared by the Technical Committee CENELEC TC 106X, Electrom
12、agnetic fields in the human environment. The text of the draft was submitted to the formal vote and was approved by CENELEC as EN 50527-1 on 2010-02-01. Attention is drawn to the possibility that some of the elements of this document may be the subject of patent rights. CEN and CENELEC shall not be
13、held responsible for identifying any or all such patent rights. The following dates were fixed: latest date by which the EN has to be implemented at national level by publication of an identical national standard or by endorsement (dop) 2011-02-01 latest date by which the national standards conflict
14、ing with the EN have to be withdrawn (dow) 2013-02-01 This European Standard has been prepared under Mandate M/351 given to CENELEC by the European Commission and the European Free Trade Association and covers essential requirements of EC Directive 2004/40/EC. The human exposure to electromagnetic f
15、ields (EMF) is regulated at European level in a twofold way. For the general public, Council Recommendation 1999/519/EC stipulates maximum exposure limits based on the ICNIRP guidelines. Nevertheless, Article 153 of the European treaty grants the member states the right to set stricter limit values
16、in their obligation to govern public health and safety. For occupational exposure directive (2004/40/EC) as individual physical agents directive issued under the occupational health and safety framework directive 89/391/EEC sets the minimum health and safety requirements based on the maximum occupat
17、ional exposure limits of the ICNIRP guidelines. Common to both directives limiting human exposure to EMF and to the ICNIRP guidelines is the fact that their limit values are based on direct effects of EMF exposure to the human body. For the low frequency range the induced current density in the nerv
18、ous system is the limiting factor whereas in the higher frequency area tissue heating by absorption has to be limited. The occupational exposure directive 2004/40/EC in Article 4.5 additionally obliges the employer to investigate during the risk assessment process also indirect effects like interfer
19、ence with medical electronic equipment and devices (including cardiac pacemakers and other implanted devices). Risks to the bearer may be caused by different effects: a conductive implant may directly cause an increase of current density in the body tissue surrounding the implant, or the behaviour o
20、f the device may be interfered with (for examples see D.8). The possibility of interference to the device depends on the EMF exposure level and the electromagnetic performance of the device, its settings and the method of implantation. The clinical relevance of interference may depend on the duratio
21、n of exposure. The main objective of this standard is to describe how a risk assessment for an employee bearing one or more active implantable medical devices (AIMD-Employee) in electromagnetic fields may be performed. A first step consists of a simplified risk analysis, followed where necessary, by
22、 a more extensive risk assessment. BS EN 50527-1:2010 3 EN 50527-1:2010 Directives 90/385/EEC and 2007/47/EC on medical devices requires that AIMDs are designed and manufactured in such a way as to remove or minimize as far as possible risks connected with reasonably foreseeable environmental condit
23、ions such as magnetic fields, external electromagnetic interference effects, and electrostatic discharge. EN 50499 introduces a concept of identifying equipment not likely to cause exposure to EMF above the limit values. This standard follows this approach but some of the identified equipment for ge
24、neral purpose assessment may need further analysis for AIMD-Employee. For higher frequency exposures, human body tissue has a time constant with respect to heating effects and a high immunity to pulsating exposure, whereas the electronic circuitry of an implant may be interfered with even by short p
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