BS EN 190100-1986 Harmonized system of quality assessment for electronic components sectional specification digital monolithic integrated circuits《电子元件的质量评定协调体系 分规范 数字单片集成电路》.pdf

《BS EN 190100-1986 Harmonized system of quality assessment for electronic components sectional specification digital monolithic integrated circuits《电子元件的质量评定协调体系 分规范 数字单片集成电路》.pdf》由会员分享，可在线阅读，更多相关《BS EN 190100-1986 Harmonized system of quality assessment for electronic components sectional specification digital monolithic integrated circuits《电子元件的质量评定协调体系 分规范 数字单片集成电路》.pdf（60页珍藏版）》请在麦多课文档分享上搜索。

1、BRITISH STANDARD BS EN 190100:1993 Incorporating Amendment Nos. 1, 2 and 3 Harmonized system of quality assessment for electronic components: Sectional specification: Digital monolithic integrated circuits The European Standard EN190100:1993 has the status of a British Standard UDC 621.3.049.774:621

2、.3.037.37BSEN190100:1993 This British Standard, having been prepared under the directionof the Electronic Components Standards Committee, was published underthe authority of the BoardofBSI and comes into effecton 31December1986 BSI 10-1999 First published November1977 First revision August1983 Secon

3、d revision December1986 The following BSI references relate to the work on this standard: Committee reference ECL/17 Draft for comment83/26311 DC ISBN 0 580 15560 9 Committees responsible for this British Standard The preparation of this British Standard was entrusted by the Electronic Components St

4、andards Committee (ECL/-) to Technical Committee ECL/17, upon which the following bodies were represented: British Broadcasting Corporation British Telecommunications plc Business Equipment Trade Association Electronic Components Industry Federation Electronic Engineering Association GAMBICA (BEAMA

5、Ltd.) Ministry of Defence National Supervising Inspectorate Society of British Aerospace Companies Limited Telecommunication Engineering and Manufacturing Association (TEMA) Amendments issued since publication Amd. No. Date of issue Comments 5562 December 1987 5954 March 1991 7845 July 1993 Indicate

6、d by a sideline in the marginBSEN190100:1993 BSI 10-1999 i Contents Page Committees responsible Inside front cover National foreword ii Foreword 2 Foreword iv Text of EN 190100 1 Publications referred to Inside back coverBSEN190100:1993 ii BSI 10-1999 National foreword This British Standard has been

7、 prepared under the direction of the Electronic Components Standards Committee. It is identical with CENELEC Electronic Components Committee (CECC)90100:1986 “Harmonized system of quality assessment for electronic components: Sectional specification: Digital monolithic integrated circuits”. It super

8、sedes BS CECC90100:1983, which is withdrawn. It should be noted that the withdrawal of BS CECC90100:1983 does not affect the validity of approvals which make reference to that standard. In 1993 the CENELEC Electronic Components Committee (CECC) accepted CECC90100:1986 with Amendments 1 and 2 as Euro

9、pean Standard EN190100:1993. This standard gives the terminology, quality assessment procedure, test and measurement procedure applicable to the sub-family of digital monolithic integrated circuits. It also includes the common blank detail specification for digital monolithic integrated circuits. Th

10、is standard is a harmonized specification within the CECC system and should be read in conjunction with BS CECC90000. This standard specifies the use of substances and/or test procedures that may be injurious to health if adequate precautions are not taken. It refers only to technical suitability an

11、d in no way absolves either the supplier or the user from statutory obligations relating to health and safety at any stage of manufacture or use. The British Standards Institutions prescribed layout for a harmonized detail specification will in due course be incorporated in the revised BS9000-1:1981

12、, by amendment. This third issue of CECC90100 results from amendments and additions which have been agreed since the second issue was published in1983. The 1st and 2nd Amendments to CECC90100, Issue3 were implemented as Amendment Nos. 1 and2 to this British Standard. Terminology and conventions. The

13、 text of the CECC specification has been approved as suitable for publication as a British Standard without deviation. Some terminology and certain conventions are not identical with those used in British Standards; attention is drawn especially to the following. The comma has been used as a decimal

14、 marker. In British Standards it is current practice to use a full point on the baseline as the decimal marker. Cross-references International Standard Corresponding British Standard IEC 148:1969 BS3363:1980 Letter symbols for semiconductor devices and integrated microcircuits (Identical) IEC 617-12

15、:1983 BS3939 Graphical symbols for electrical power, telecommunications and electronic diagrams Part 12:1985 Binary logic elements (Identical) IEC 747-1:1983 BS6493 Semiconductor devices: discrete devices and integrated circuits Part 1 Discrete devices Section 1.1:1984 General (Identical) IEC 747-10

16、:1984 BS 9970 Harmonized system of quality assessment for electronic components: Semiconductor devices Part 0:1985 Generic specification (Identical)BSEN190100:1993 BSI 10-1999 iii A British Standard does not purport to include all the necessary provisions of a contract. Users of British Standards ar

17、e responsible for their correct application. Compliance with a British Standard does not of itself confer immunity from legal obligations. International Standard Corresponding British Standard IEC 748-1:1984 BS 6493 Semiconductor devices: discrete devices and integrated circuits Part 2 Integrated ci

18、rcuits Section 2.1:1985 General (Identical) IEC 748-2:1985 Section 2.2:1986 Recommendations for digital integrated circuits (Identical) CECC 90000:1985 BS CECC90000:1985 Harmonized system of quality assessment for electronic components. Generic specification: Monolithic integrated circuits (Identica

19、l) Summary of pages This document comprises a front cover, an inside front cover, pages i to iv, theENtitle page, page 2, the CECC title page, pages ii to vi, pages 1 to 44, aninsideback cover and a back cover. This standard has been updated (see copyright date) and may have had amendments incorpora

20、ted. This will be indicated in the amendment table on the inside front cover.iv blankEUROPEAN STANDARD NORME EUROPENNE EUROPISCHE NORM EN 190100 April 1993 Supersedes CECC90100 Issue3:1986 Descriptors: Quality, electronic components, integrated circuits English version Sectional Specification: Digit

21、al monolithic integrated circuits Spcification intermdiaire: Circuits intgrs digitaux monolithiques Rahmenspezifikation: Digitale monolithische integrierte Schaltungen This European Standard was approved by CENELEC Electronic Components Committee (CECC) on21January1993. CENELEC members are bound to

22、comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the General

23、 Secretariat of the CECC or to any CENELEC member. This European Standard exists in three official versions (English, French, German). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the CECC General Secretariat h

24、as the same status as the official versions. CENELEC members are the national electrotechnical committees of Austria, Belgium, Denmark, Finland, France, Germany, Greece, Iceland, Ireland, Italy, Luxembourg, Netherlands, Norway, Portugal, Spain, Sweden, Switzerland and UnitedKingdom. The membership o

25、f the CECC is identical, with the exception of the national electrotechnical committees of Greece, Iceland and Luxembourg. CECC European Committee for Electrotechnical Standardization Comit Europen de Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische Normung Central Secretariat

26、: rue de Stassart 35, B-1050 Brussels 1993 Copyright reserved to CENELEC members Ref. No. EN190100:1993 EEN190100:1993 BSI 10-1999 2 Foreword The CENELEC Electronic Components Committee (CECC) is composed of those member countries of the European Committee for Electrotechnical Standardization (CENEL

27、EC) who wish to take part in a harmonized System for electronic components of assessed quality. The object of the System is to facilitate international trade by the harmonization of the specifications and quality assessment procedures for electronic components, and by the grant of an internationally

28、 recognized Mark, or Certificate, of Conformity. The components produced under the System are thereby acceptable in all member countries without further testing. This European Standard was prepared by CECC WG 9, “Integrated Circuits”. The text of the draft based on document CECC90100 Issue 3:1986 (w

29、ith A1 and A2) was submitted to the formal vote for conversion to a European Standard; together with the voting report, circulated as document CECC (Secretariat)3284 it was approved by CECC as EN190100 on21January1993. The following dates were fixed: latest date of announcement of the EN at national

30、 level (doa) 1993-02-26 latest date of publication of an identical national standard (dop) 1993-08-26 latest date of declaration of national standards obsolescence 1993-08-26 latest date of withdrawal of conflicting national standards (dow) 2003-02-26EN190100:1993 ii BSI 10-1999 Contents Page Forewo

31、rd iv 1 Scope 1 2 General 1 2.1 Related documents 1 2.2 Preferred voltages for digital monolithic integrated circuits 1 2.3 Symbols and terminology 1 3 Quality assessment procedures 2 3.1 Structurally similar circuits 2 3.2 Certified test records 4 4 Test and measurement procedures 4 4.1 Electrical

32、measurement procedures 4 4.1.1 Verification of the function 4 4.1.2 Measurement of static characteristics 5 4.1.3 Measurement of dynamic characteristics 11 4.1.4 Output short-circuit current 16 4.1.5 Breakdown voltage 17 4.1.6 Power supply current 18 4.1.7 Capacitance 19 4.1.8 Leakage current 21 4.1

33、.9 Transient energy rating 22 4.1.10 Input clamping voltage 23 4.2 Endurance tests 24 4.2.1 General 24 4.2.2 Test conditions 24 5 Common blank detail specification for digital monolithic integrated circuits 26 5.1 Introduction 26 5.2 Front page 26 5.3 Identification of the component and supplementar

34、y information 28 5.4 Inspection requirements 30 5.4.1 Explanation of assessment quality levels P, Y and L 30 5.4.2 Key of abbreviations 30 Group A inspection 31 Group B inspection 33 Group C inspection 34 Group D inspection 38 5.5 Requirements for Sub-Groups A3, A4 and A5 38 5.5.1 Requirements for T

35、TL combinatorial circuits 39 5.5.2 Requirements for C.MOS circuits 42 Figure 1 2 Figure 2 4 Figure 3 6 Figure 4 6 Figure 5 7 Figure 6 8 Figure 7 9 Figure 8 10 Figure 9 11 Figure 10 12EN190100:1993 BSI 10-1999 iii Page Figure 11 13 Figure 12 15 Figure 13 16 Figure 14 17 Figure 15 18 Figure 16 19 Figu

36、re 17 20 Figure 18 20 Figure 19 21 Figure 20 22 Figure 21 23 Figure 22 24 Figure 23 Parallel excitation 25 Figure 24 Serial excitation 25 Figure 25 26EN190100:1993 iv BSI 10-1999 Foreword The CENELEC Electronic Components Committee (CECC) is composed of those member countries of the European Committ

37、ee for Electrotechnical Standardization (CENELEC) who wish to take part in a harmonized System for electronic components of assessed quality. The object of the System is to facilitate international trade by the harmonization of the specifications and quality assessment procedures for electronic comp

38、onents, and by the grant of an internationally recognized Mark, or Certificate, of Conformity. The components produced under the System are thereby accepted by all member countries without further testing. This specification has been formally approved by the CECC, and has been prepared for those cou

39、ntries taking part in the System who wish to issue national harmonized specifications for DIGITAL MONOLITHIC INTEGRATED CIRCUITS. It should be read in conjunction with the current regulations for the system. At the date of printing of this specification, the member countries of the CECC are Austria,

40、 Belgium, Denmark, Finland, France, Germany, Ireland, Italy, the Netherlands, Norway, Portugal, Spain, Sweden, Switzerland, and the UnitedKingdom. Preface This sectional specification (SS) was prepared by CECC WG 9 “Integrated circuits”. It is based, wherever possible, on the Publications of the Int

41、ernational Electrotechnical Commission, and in particular on IEC747: Semiconductor devices Discrete devices and integrated circuits. The text of this third issue consists of the text of CECC90100 Issue2(1983) amended in accordance with the ratified new material introduced by the documents listed bel

42、ow, and was ratified by the President of the CECC for printing as a CECC Specification.EN190100:1993 BSI 10-1999 v The text is published initially in French and English. The German version will follow as soon as it has been prepared. Effective date This Issue3 shall become effective for all new appl

43、ications for qualification approval from1June1986. For current qualifications a transition time of18months may be applied. Issue1 and Issue2 shall remain valid for existing qualification approval until further notice. Document Date of Voting Report of Voting Affected Clause CECC(Secretariat)1386 Jul

44、y 1983 CECC(Secretariat)1496 ) ) CECC(Secretariat)1571 June 1984 CECC(Secretariat)1678 CECC (Secretariat) 1678A ) ) 3.1 CECC(Secretariat)1387 July 1983 CECC (Secretariat) 1497 ) 4.1.3 ) CECC(Secretariat)1135 November 1981 CECC (Secretariat) 1189 ) ) 4.1.10 CECC(Secretariat)1269 December 1982 CECC(Se

45、cretariat)1339 ) ) CECC(Secretariat)1457 November 1983 CECC(Secretariat)1553 ) ) 4.2.2 CECC(Secretariat)1127 October 1981 CECC(Secretariat)1172 ) ) CECC(Secretariat)1284 January 1983 CECC(Secretariat)1363 ) 5.3.9 CECC(Secretariat)1186 April 1982 ) ) CECC(Secretariat)1186A May 1982 CECC(Secretariat)1

46、272 ) ) CECC(Secretariat)1388 July 1983 CECC(Secretariat)1494 ) ) 5.4 CECC(Secretariat)1389 July 1983 CECC(Secretariat)1495 ) ) CECC(Secretariat)1560 May 1984 CECC(Secretariat)1657 ) ) CECC(Secretariat)1561 May 1984 CECC(Secretariat)1652 )vi blankEN190100:1993 BSI 10-1999 1 1 Scope This specificatio

47、n applies to digital monolithic integrated circuits and shall be read in conjunction with CECC90000. It defines methods for: structural similarity electrical measurements electrical endurance measurements The common blank detail specification (BDS), contained in this SS, comprises those requirements

48、 which are common for all digital circuits. 2 General 2.1 Related documents In each case the latest issue of the document prior to the date of issue of this document is valid. IEC 148, Letter symbols for semiconductor devices and integrated microcircuits (Chapter X). IEC 617, Graphical symbols for d

49、iagrams. IEC 617-12, Part 12: Binary logic elements. IEC 747, Semiconductor devices Discrete devices and integrated circuits. IEC 747-1, Part 1: General. IEC 747-10, Part 10: Generic specification for discrete devices and integrated circuits. IEC 748, Semiconductor devices integrated circuits. IEC 748-1, Part 1: General. IEC 748-2, Part 2: Digital integrated circuits. CECC 90000, GS for monolithic integrated circuits. 2.2 Preferred voltages for digital monolithic integrated circuits Preferred values are: bipolar (other than ECL): 1,5; 5,0