BS EN 100014-1988 Harmonized system of quality assessment for electronic components - Basic specification CECC assessed process average procedure (60% confidence limit)《电子元器件质量评定协调.pdf

《BS EN 100014-1988 Harmonized system of quality assessment for electronic components - Basic specification CECC assessed process average procedure (60% confidence limit)《电子元器件质量评定协调.pdf》由会员分享，可在线阅读，更多相关《BS EN 100014-1988 Harmonized system of quality assessment for electronic components - Basic specification CECC assessed process average procedure (60% confidence limit)《电子元器件质量评定协调.pdf（16页珍藏版）》请在麦多课文档分享上搜索。

1、BRITISH STANDARD BS EN 100014:1992 Incorporating Amendment No. 1 Harmonized system ofquality assessment forelectronic components Basicspecification: CECC assessed processaverage procedure(60% confidence limit) The European Standard EN 100014:1991 has the status of a British StandardBSEN100014:1992 T

2、his British Standard, having been prepared under the directionof the Electronic Components Standards Committee, was published underthe authority of the BoardofBSI and comes into effect on 29 February 1988 BSI 04-2000 The following BSI references relate to the work on this standard: Committee referen

3、ce ECL/- Draft for comment Special announcement in BSINews November 1987 ISBN 0 580 16444 6 Committees responsible for this British Standard The preparation of this British Standard was authorized by the Electronic Components Standards Committee (ECL/-) upon which the following bodies were represent

4、ed: Association of Control Manufacturers TACMA (BEAMA Ltd.) British Telecommunications plc. Department of Trade and Industry (Electronics Applications Divisions) Electronic Components Industry Federation Electronic Engineering Association Institution of Electronic and Radio Engineers Ministry of Def

5、ence National Supervising Inspectorate Society of British Aerospace Companies Limited Telecommunication Engineering and Manufacturing Association (TEMA) Amendments issued since publication Amd. No. Date of issue Comments 7195 October 1992 Indicated by a sideline in the marginBSEN100014:1992 BSI 04-2

6、000 i Contents Page Committees responsible Inside front cover National foreword ii Foreword iii Text of EN 100014 1 Publications referred to Inside back coverBSEN100014:1992 ii BSI 04-2000 National foreword This British Standard has been prepared under the direction of the Electronic Components Stan

7、dards Committee. It is identical with CENELEC Electronic Components Committee (CECC) 00014:1986 “Harmonized system of quality assessment for electronic components. Basic specification: CECC assessed process average procedure (60% confidence limit)”. This standard is a harmonized specification within

8、 the CECC system. In 1991 the CENELEC Electronic Components Committee (CECC) accepted CECC00014:1986 as European Standard EN100014:1991. Details of the national implementation of CECC standards is given in BS9000 “General requirements for a system for electronic components of assessed quality” Part

9、2 “Specification for national implementation of CECC basic rules and rules of procedure”. Terminology and conventions. The text of the CECC specification has been approved as suitable for publication as a British Standard without deviation. Some terminology and certain conventions are not identical

10、with those used in British Standards; attention is drawn especially to the following. The comma has been used as a decimal marker. In British Standards it is current practice to use a full point on the baseline as the decimal marker. The footnote toTable 1 refers to MIL-STD-690. This standard is pub

11、lished by the United States Department of Defense and is entitled “Failure rate sampling plans and procedures”. A British Standard does not purport to include all the necessary provisions of a contract. Users of British Standards are responsible for their correct application. Compliance with a Briti

12、sh Standard does not of itself confer immunity from legal obligations. Cross-references International Standard Corresponding British Standard CECC 00107-1:1982 a BS 9000 General requirements for a system for electronic components of assessed quality Part 1:1981 Specification of basic rules and proce

13、dures (Technically equivalent) a Referred to in the text as “RP 7-I”, which is the abbreviated title. Summary of pages This document comprises a front cover, an inside front cover, pagesi andii, theEN title page, page2, the CECC title page, pagesii toiv, pages1 to4, aninside back cover and a back co

14、ver. This standard has been updated (see copyright date) and may have had amendments incorporated. This will be indicated in the amendment table on the inside front cover.EUROPEAN STANDARD NORME EUROPENNE EUROPISCHE NORM EN 100014 October 1991 UDC: Descriptors: Quality, electronic components, assess

15、ed process average procedure English version Basic Specification: CECC assessed process average procedure (60% confidence limit) Spcification de Base: Estimation CECC de la qualit moyenne (la limite de confiance 60%) Grundspezifikation: CECC-besttigtes mittleres Fertigungsergebnis (60% Vertrauensgre

16、nze) This European Standard was approved by the CENELEC Electronic Components Committee (CECC) on 14 October 1991. The text of this standard consists of the text of CECC 00014 Issue 1 1986 of the corresponding CECC Specification. CENELEC members are bound to comply with CEN/CENELEC Internal Regulati

17、ons which stipulate the conditions for giving this European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the General Secretariat of the CECC or to any CENELEC me

18、mber. This European Standard exists in three official versions (English, French, German). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the CECC General Secretariat has the same status as the official versions.

19、CENELEC members are the national electrotechnical committees of Austria, Belgium, Denmark, Finland, France, Germany, Greece, Iceland, Ireland, Italy, Luxembourg, Netherlands, Norway, Portugal, Spain, Sweden, Switzerland, and United Kingdom. The membership of the CECC is identical, with the exception

20、 of the national electrotechnical committees of Greece, Iceland and Luxembourg. CECC European Committee for Electrotechnical Standardization Comit Europen de Normalisation Electrotechnique Europisches Komitee fr Elektrotechnische Normung Central Secretariat: rue de Stassart 35, B-1050 Brussels 1991

21、Copyright reserved to CENELEC members Ref. No. EN 100014:1991 E2 blankEN100014:1991 ii BSI 04-2000 Contents Page Foreword 2 Preface 2 1 General 1 2 Procedure 1 Table 1 Limit of accessibility of APA 3EN100014:1991 BSI 04-2000 iii Foreword The CENELEC Electronic Components Committee (CECC) is composed

22、 of those member countries of the European Committee for Electrotechnical Standardization (CENELEC) who wish to take part in a harmonized System for electronic components of assessed quality. The object of the System is to facilitate international trade by the harmonization of the specifications and

23、 quality assessment procedures for electronic components, and by the grant of an internationally recognized Mark, or Certificate, of Conformity. The components produced under the System are thereby accepted by all member countries without further testing. At the date of printing of this specificatio

24、n, the member countries of the CECC are Austria, Belgium, Denmark, Finland, France, Germany, Ireland, Italy, the Netherlands, Norway, Portugal, Spain, Sweden, Switzerland and the UnitedKingdom. Preface This Basic Specification was prepared by CECC WG “Assessment Techniques”. The text of this specifi

25、cation was circulated to the CECC for voting in the document indicated below and was ratified by the President of the CECC for printing as a CECC Specification. Document Date of Voting Report on the Voting CECC(Secretariat)1810 December 1985 CECC(Secretariat)1875iv blankEN100014:1991 BSI 04-2000 1 1

26、 General 1.1 The procedure detailed hereafter is directed primarily at large scale production and is additional to what is prescribed in specifications. It is applicable, on a voluntary basis, when a manufacturer wishes, within the limits of a given level of confidence, to give information on the “a

27、ssessed process average” of his production, concerning non-operative devices. 1.2 Non-operative devices are those which are unusable. The relevant specification should give a precise definition. Structural similarity, as defined in the relevant generic specification, is applicable. 1.3 When a manufa

28、cturer uses this procedure, he may declare the results obtained either in the Certified Test Records (RCE) or in the Certificate of Conformity, if used, or in a separate document, provided that he refers to the “CECC assessed process average” and follows all the requirements of the procedure. 1.4 Th

29、ere is no need to include the provisions of this procedure in detail specifications, since the use of the procedure is left to the manufacturers decision. However, the National Supervising Inspectorate (ONS) concerned shall be informed of the decision, and shall be entitled to inspect the evidence,

30、as already applies to RCE. 2 Procedure 2.1 Results of inspection for non-operatives in every inspection lot, including rejected lots but not resubmitted lots, are accumulated over a sufficient number of lots to enter the operating part ofTable 1, with a minimum of three consecutive lots. The number

31、of non-operative devices found is compared with that given inTable 1 for the accumulated sample size and the declared assessed process average. The initial Assessed Process Average (APA) can only be determined by the manufacturer after the completion of tests on at least three lots. 2.2 The manufact

32、urer can declare the relevant assessed process average only when the accumulated number of non-operatives found is no more than the maximum number given inTable 1 for the accumulated sample. Assessment then proceeds on a continuing basis with an increasing number of permitted non-operatives, based o

33、n the accumulated number of tested devices (“accumulated sample size” inTable 1). 2.3 A manufacturer may always declare the lowest APA which is appropriate to the accumulated sample size and the accumulated number of non-operatives, provided that this total of non-operatives does not exceed10. When

34、the next non-operative(s) occur(s), bringing the total of non-operatives to11or more, the manufacturer shall discard all results preceding and including the earliest non-operative(s) the elimination of which will reduce the current total of non-operatives to10or less. He shall then determine the new

35、 APA value on the basis of the new total of non-operatives and accumulated sample size. If the APA deteriorates at any permitted number of non-operatives, the manufacturer shall declare a less severe APA (that is, to the left of the table), in accordance with the total of non-operatives and the accu

36、mulated sample size. 2.4 Each individual inspection lot shall be sampled on a continuing basis as specified in the detail specification for non-operative devices, but initially a larger size may be chosen by the manufacturer, who has to balance economic considerations against the time penalty if too

37、 small a sample is chosen. 2.5 It is necessary that the whole sample is tested, irrespective of the results for the release of the lot. For instance, if the Acceptable Quality Level (AQL) specified for non-operatives in the relevant specification is0,1% and the inspection lot is greater than10000, w

38、ith inspection level II this gives a sample of500with one defective allowed and rejection of the lot on two defectives; if two defectives are found after only part of the sample has been tested, the lot shall be rejected but all remaining specimens in the sample shall be tested so that the total num

39、ber of non-operatives actually found in the sample is recorded in the accumulated total. 2.6 All results shall be accumulated, with the exception of those from resubmitted lots (to avoid counting them twice) and from rogue lots. Rogue lots are defined as those where all of the following conditions a

40、pply: 1) The number of inoperatives in the lot makes it necessary to adjust the assessed process average by more than one column to the left inTable 1; and 2) a cause of rejection has been identified and appropriate corrective action has been taken; and 3) the production lot represented by the sampl

41、e is rejected; and 4) the preceding10lots were all in conformity with the assessed process average; andEN100014:1991 2 BSI 04-2000 5) a register is maintained of all rogue lots. This register shall contain, as a minimum the results of the samples which have been excluded the cause of rejection which

42、 has been determined the corrective action which has been taken. 2.7 Any non-operatives found during examination of the sample shall be retained for defect analysis. 2.8 Should the manufacturer fail to satisfy any requirements ofTable 1, corrective action shall be taken and recorded; release of lots

43、 may continue under the normal procedure of the detail specification, but no reference shall be made to the CECC assessed process average until the requirements of2.1 are again fulfilled. 2.9 This procedure applies while a stable approval situation exists. Any modification which is likely to bring t

44、he qualification approval into doubt will necessitate a suspension of the assessed process average procedure until a stable approval situation is reestablished for at least three consecutive lots (see RP7-I 7.6).EN100014:1991 BSI 04-2000 3 Table 1 Limit of accessibility of APA Accumulated sample siz

45、e Maximum permitted number of non operatives for assessed process average APA 60 of . %/. 10 6 0,150 0,100 0,065 0,040 0,025 0,015 0,010 0,0065 0,0040 0,0025 0,0015 0,0010 n U 1 500 1 000 650 400 250 150 100 65 40 25 15 10 1 000 0 1 500 1 0 2 500 2 1 0 3 000 3 2 1 0 3 500 4 2 1 0 4 200 5 3 1 0 5 000

46、 6 4 2 1 0 5 500 7 4 2 1 0 6 000 8 4 2 1 0 6 500 8 5 3 1 0 Insufficient number of results 7 000 9 5 3 1 0 7 500 9 6 3 1 0 8 000 10 7 4 2 1 0 9 000 7 4 2 1 0 10 000 8 5 3 1 0 11 200 9 6 3 1 0 12 500 10 7 4 2 0 14 000 8 4 2 1 0 16 000 9 5 3 1 0 18 000 10 6 3 1 0 20 000 6 4 2 1 0 22 500 7 4 2 1 0 25 00

47、0 8 5 2 1 0 28 000 9 5 3 1 0 31 500 10 6 3 2 1 0 35 000 7 4 2 1 0 40 000 8 5 3 1 0 45 000 9 5 3 1 0 50 000 10 6 4 2 1 0 56 000 7 4 2 1 0 63 000 8 5 3 1 0 71 000 9 6 3 1 0 80 000 10 7 4 2 1 0 90 000 7 4 2 1 0 100 000 8 5 3 1 0 112 000 9 6 3 1 0 125 000 10 7 4 2 0 140 000 8 4 2 1 0 160 000 9 5 3 1 0 1

48、80 000 10 6 3 1 0 200 000 6 4 2 1 224 000 7 4 2 1 250 000 8 5 2 1 280 000 9 5 3 1 315 000 10 6 3 2 350 000 400 000 7 4 2 450 000 8 5 3 500 000 9 5 3 560 000 10 6 4 7 4 630 000 710 000 8 5 800 000 9 6 900 000 10 7 1 000 000 8 9 1 120 000 1 250 000 10 1 400 000 1 600 000 1800 000 This table was calcul

49、ated from the values for 60% confidence limit in Table A-1 of MIL-STD-690. This is based on the exponential distribution law. The figures are slightly more severe than equivalent figures calculated from the Poisson distribution law. But this is of negligible influence, since the use of the R20 series as a basis for the accumulated sample size figures introduces larger deviations. The table is arranged in a way which avoids any severity weaker than 5%, below nominal. If a point more severe than nominal has been introduced, it is always less than half a