BS DD IEC TS 61994-3-2011 Piezoelectric dielectric and electrostatic devices and associated materials for frequency control selection and detection Glossary Piezoelectric and diele.pdf

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1、raising standards worldwideNO COPYING WITHOUT BSI PERMISSION EXCEPT AS PERMITTED BY COPYRIGHT LAWBSI Standards PublicationPiezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection GlossaryPart 3: Piezoelectric and dielectric oscillato

2、rsDD IEC/TS 61994-3:2011National forewordThis Draft for Development is the UK implementation of IEC/TS 61994-3:2011.The UK participation in its preparation was entrusted to Technical CommitteeEPL/49, Piezoelectric devices for frequency control and selection.A list of organizations represented on thi

3、s committee can be obtained onrequest to its secretary.This publication does not purport to include all the necessary provisions of acontract. Users are responsible for its correct application. BSI 2011ISBN 978 0 580 70836 7ICS 01.040.31; 31.140Compliance with a British Standard cannot confer immuni

4、ty fromlegal obligations.This Draft for Development was published under the authority of theStandards Policy and Strategy Committee on 31 August 2011.Amendments issued since publicationAmd. No. Date Text affectedDRAFT FOR DEVELOPMENTDD IEC/TS 61994-3:2011IEC/TS 61994-3 Edition 2.0 2011-07 TECHNICAL

5、SPECIFICATION Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection Glossary Part 3: Piezoelectric and dielectric oscillators INTERNATIONAL ELECTROTECHNICAL COMMISSION P ICS 31.140; 01.040.31 PRICE CODE ISBN 978-2-88912-556-2 Regi

6、stered trademark of the International Electrotechnical Commission DD IEC/TS 61994-3:2011 2 TS 61994-3 IEC:2011 CONTENTS FOREWORD . 3 1 Scope . 5 2 Normative references . 5 3 Terms and definitions . 5 Bibliography 16 Figure 1 Characteristics of an output waveform 6 Figure 2 Example of the use of freq

7、uency offset 8 Figure 3 Typical frequency fluctuation characteristics 10 Figure 4 Clock signal with phase jitter 11 DD IEC/TS 61994-3:2011TS 61994-3 IEC:2011 3 INTERNATIONAL ELECTROTECHNICAL COMMISSION _ PIEZOELECTRIC, DIELECTRIC AND ELECTROSTATIC DEVICES AND ASSOCIATED MATERIALS FOR FREQUENCY CONTR

8、OL, SELECTION AND DETECTION GLOSSARY Part 3: Piezoelectric and dielectric oscillators FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to

9、 promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports, Publicly Available Specifications (PAS) and Gu

10、ides (hereafter referred to as “IEC Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with may participate in this preparatory work. International, governmental and non-governmental organizations liaising with the IEC

11、 also participate in this preparation. IEC collaborates closely with the International Organization for Standardization (ISO) in accordance with conditions determined by agreement between the two organizations. 2) The formal decisions or agreements of IEC on technical matters express, as nearly as p

12、ossible, an international consensus of opinion on the relevant subjects since each technical committee has representation from all interested IEC National Committees. 3) IEC Publications have the form of recommendations for international use and are accepted by IEC National Committees in that sense.

13、 While all reasonable efforts are made to ensure that the technical content of IEC Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any misinterpretation by any end user. 4) In order to promote international uniformity, IEC National Committees undert

14、ake to apply IEC Publications transparently to the maximum extent possible in their national and regional publications. Any divergence between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in the latter. 5) IEC itself does not provide any attes

15、tation of conformity. Independent certification bodies provide conformity assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any services carried out by independent certification bodies. 6) All users should ensure that they have the latest edition o

16、f this publication. 7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and members of its technical committees and IEC National Committees for any personal injury, property damage or other damage of any nature whatsoever, whether direct o

17、r indirect, or for costs (including legal fees) and expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications. 8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is indispensable

18、for the correct application of this publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for identifying any or all such patent rights. The main task of IEC technical committees

19、is to prepare International Standards. In exceptional circumstances, a technical committee may propose the publication of a technical specification when the required support cannot be obtained for the publication of an International Standard, despite repeated efforts, or the subject is still under t

20、echnical development or where, for any other reason, there is the future but no immediate possibility of an agreement on an International Standard. Technical specifications are subject to review within three years of publication to decide whether they can be transformed into International Standards.

21、 DD IEC/TS 61994-3:2011 4 TS 61994-3 IEC:2011 IEC 61994-3, which is a technical specification, has been prepared by IEC technical committee 49: Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection. This second edition of IEC 6199

22、4-3 cancels and replaces the first edition published in 2004. This edition constitutes a technical revision. The main changes with respect to the previous edition are listed below: definitions updated, terminology given in orderly sequence, new terminologies are added, drawings inserted for easier u

23、nderstanding. The text of this technical specification is based on the following documents: Enquiry draft Report on voting 49/928/DTS 49/949/RVC Full information on the voting for the approval of this technical specification can be found in the report on voting indicated in the above table. This pub

24、lication has been drafted in accordance with the ISO/IEC Directives, Part 2. A list of all parts of the IEC 61994 series, under the general title Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection Glossary, can be found on the

25、IEC website. NOTE Future standards in this series will carry the new general title as cited above. Titles of existing standards in this series will be updated at the time of next edition. The committee has decided that the contents of this publication will remain unchanged until the stability date i

26、ndicated on the IEC web site under “http:/webstore.iec.ch“ in the data related to the specific publication. At this date, the publication will be transformed into an International standard, reconfirmed, withdrawn, replaced by a revised edition, or amended. DD IEC/TS 61994-3:2011TS 61994-3 IEC:2011 5

27、 PIEZOELECTRIC, DIELECTRIC AND ELECTROSTATIC DEVICES AND ASSOCIATED MATERIALS FOR FREQUENCY CONTROL, SELECTION AND DETECTION GLOSSARY Part 3: Piezoelectric and dielectric oscillators 1 Scope This part of IEC 61994 specifies the terms and definitions for piezoelectric dielectric oscillators represent

28、ing the state-of-the-art, which are intended for use in the standards and documents of IEC TC 49. 2 Normative references Void 3 Terms and definitions For the purposes of this document, the following terms and definitions apply. 3.1 adjustment frequency frequency to which an oscillator must be adjust

29、ed, under a particular combination of operating conditions, in order to meet the frequency tolerance specification over the specified range of operating conditions, i.e. adjustment frequency = nominal frequency + frequency offset IEC 60679-1: 2007, 3.2.10 3.2 Allan variance of fractional frequency f

30、luctuation unbiased estimate of the preferred definition in the time domain of the short-term stability characteristic of the oscillator output frequency: ( )( )=+11212112MkkkyYYMwhere are the average fractional frequency fluctuations obtained sequentially, with no systematic dead time between measu

31、rements; is the sample time over which measurements is averaged; is the number of measurements. NOTE The confidence of the estimate improves as M increases. IEC 60679-1: 2007, 3.2.23, modified 3.3 amplitude modulation distortion non-linear distortion in which the relative magnitudes of the spectral

32、components of the modulating signal waveform are modified YkMDD IEC/TS 61994-3:2011 6 TS 61994-3 IEC:2011 NOTE This amplitude modulation distortion is also commonly known as frequency distortion, amplitude distortion and amplitude/frequency distortion. IEC 60679-1: 2007, 3.2.28, modified 3.4 crystal

33、 cut orientation of the crystal element with respect to the crystallographic axes of the crystal NOTE This definition is included as it may be desirable to specify the cut (and hence the general form of the frequency/temperature performance) of a crystal unit used in an oscillator application. The c

34、hoice of the crystal cut will imply certain attributes of the oscillator which may not otherwise appear in the detail specification. IEC 60679-1: 2007, 3.2.3 3.5 decay time fall time time interval required for the trailing edge of a waveform to change between two defined levels NOTE These two define

35、d levels may be the logic levels VOH and VOLbeing at 90 % and 10 %, respectively, of the maximum amplitude (equaling VHI- VLO) of the waveform, or any other ratio as defined in the detail specification (see Figure 1), where VOLis the low level output voltage; VOHis the high level output voltage; VHI

36、is the upper flat voltage of the pulse waveform; VLOis the low flat voltage of the pulse waveform. IEC 60679-1: 2007, 3.2.34, modified VOHupper limit 90 % Arithmetic mean of limit VOLLower limit 10 % Decay time Rise time Pulse duration (t2) (space) Pulse duration (t1) (mark) VoltageTime VHIVLOIEC 44

37、7/07 Figure 1 Characteristics of an output waveform 3.6 electrostatic discharge ESD transfer of electric charge between bodies having different electrostatic potentials in proximity or through direct contact DD IEC/TS 61994-3:2011TS 61994-3 IEC:2011 7 IEC 60050-161:1990, 161-01-22 3.7 frequency adju

38、stment range range over which the oscillator frequency may be varied by means of some variable element, for the purpose of: a) setting the frequency to a particular value, or b) to correct the oscillator frequency to a prescribed value after deviation due to ageing, or other changed conditions IEC 6

39、0679-1: 2007, 3.2.11 3.8 frequency/load coefficient fractional change in output frequency resulting from an incremental change in electrical load impedance, other parameters remaining unchanged IEC 60679-1: 2007, 3.2.20 3.9 frequency offset frequency difference, positive or negative, which should be

40、 added to the specified nominal frequency of the oscillator, when adjusting the oscillator frequency under a particular set of operating conditions in order to minimise its deviation from nominal frequency over the specified range of operating conditions IEC 60679-1: 2007, 3.2.9 NOTE In order to min

41、imize the frequency deviation form nominal over the entire temperature range, a frequency offset may be specified for adjustment at the reference temperature (see Figure 2). DD IEC/TS 61994-3:2011 8 TS 61994-3 IEC:2011 Adjustment temperature F(T) with zero offset F1Nominal frequency 20 C 25 C 70 C F

42、(T) with offset =F1at 25 C Frequencyoffset20 C 25 C 70 C Operating temperature during adjustment F1F10 FrequencyOperating temperature IEC 445/07 Figure 2 Example of the use of frequency offset 3.10 frequency tolerance maximum permissible deviation of the oscillator frequency from a specified nominal

43、 value when operating under specified conditions IEC 60679-1: 2007, 3.2.8 NOTE Frequency tolerances are often assigned separately to specified ambient effects, namely electrical, mechanical and environmental. When this approach is used, it is necessary to define the values of other operating paramet

44、ers as well as the range of the specified variable, that is to say: deviation from the frequency at the specified reference temperature due to operation over the specified temperature range, other conditions remaining constant; deviation from the frequency at the specified supply voltage due to supp

45、ly voltage changes over the specified range, other conditions remaining constant; deviation from the initial frequency due to ageing, other conditions remaining constant; deviation from the frequency with specified load conditions due to changes in load impedance over the specified range, other cond

46、itions remaining constant. In some cases, an overall frequency tolerance may be specified, due to any/all combinations of operating parameters, during a specified lifetime. DD IEC/TS 61994-3:2011TS 61994-3 IEC:2011 9 3.11 frequency/voltage coefficient fractional change in output frequency resulting

47、from an incremental change in supply voltage, other parameters remaining unchanged IEC 60679-1: 2007, 3.2.19 NOTE In the case of OCXOs, a considerable time may elapse before the full effect of a supply voltage change is observed, as the temperature of the oven may drift gradually to a new value foll

48、owing the voltage perturbation 3.12 harmonic distortion non-linear distortion characterised by the generation of undesired spectral components harmonically related to the desired signal frequency NOTE Each harmonic component is usually expressed as a power (in decibels) relative to the output power

49、of the desired signal. IEC 60679-1: 2007, 3.2.30, modified 3.13 incidental frequency modulation optional measure of the frequency stability in the frequency domain, best described in terms of the spectrum of the resultant base-band signal obtained by applying the oscillator signal to an ideal discriminator circuit of specified characteristics NOTE If the detection bandwidth is adequately specified, the incide