BS CECC 30401-1985 Specification for harmonized system of quality assessment for electronic components - Blank detail specification fixed metallized polyethylene terephthalate film.pdf

《BS CECC 30401-1985 Specification for harmonized system of quality assessment for electronic components - Blank detail specification fixed metallized polyethylene terephthalate film.pdf》由会员分享，可在线阅读，更多相关《BS CECC 30401-1985 Specification for harmonized system of quality assessment for electronic components - Blank detail specification fixed metallized polyethylene terephthalate film.pdf（16页珍藏版）》请在麦多课文档分享上搜索。

1、BRITISH STANDARD BS CECC 30401:1985 Specification for Harmonized system of quality assessment for electronic components Blankdetail specification: fixed metallized polyethylene terephthalate film dielectric d.c. capacitorsBSCECC30401:1985 BSI10-1999 ISBN 0 580 35640 X Amendments issued since publica

2、tion Amd. No. Date CommentsBSCECC30401:1985 BSI 10-1999 i Contents Page National foreword ii Foreword iii Text of CECC 30401 1BSCECC30401:1985 ii BSI 10-1999 National foreword This British Standard has been prepared under the direction oftheElectronic Components Standards Committee. It is identical

3、with CENELEC Electronic Components Committee(CECC)30401:1985 “Harmonized system of quality assessment for electronic components. Blank detail specification: Fixed metallized polyethylene terephthalate film dielectric d.c. capacitors”. This standard is a harmonized specification within the CECC Syste

4、m. Terminology and conventions. The text of the CECC specification has been approved as suitable for publication as a British Standard without deviation. Some terminology and certain conventions are not identical with those used in British Standards; attention is especially drawn to the following. T

5、he comma has been used as a decimal marker. In British Standards it is current practice to use a full point on the baseline as the decimal marker. Cross-references. The British Standard which implements CECC00100 is BS9000: General requirements for a system for electronic components of assessed qual

6、ity Part2:1983“Specification for national implementation of the CECC basic rules and rules of procedure”. Scope. This standard lists the ratings, characteristics and inspection requirements which shall be included as mandatory requirements in accordance with BS CECC30400. Detail specification layout

7、. In the event of conflict between the requirements of this specification and the provisions of BS9000 the latter shall take precedence except that the front page layout will be in accordance with BS9000 Circular Letter No.15. A British Standard does not purport to include all the necessary provisio

8、ns of a contract. Users of British Standards are responsible for their correct application. Compliance with a British Standard does not of itself confer immunity from legal obligations. International Standard Corresponding British Standard CECC30000:1983 BS CECC30000:1984. Harmonized system of quali

9、ty assessment for electronic components: Generic specification for fixed capacitors (Identical) CECC30400:1984 BS CECC30400:1985. Harmonized system of quality assessment for electronic components. Sectional specification: Fixed metallized polyethylene-terephthalate film dielectric capacitors for dir

10、ect current (Identical) IEC384-2-1:Part 2:1982 BS9930-04.01:1984. Fixed capacitors for use in electronic equipment. Blank detail specification: Fixed metallized polyethylene-terephthalate film dielectric d.c.capacitors. Assessment level E (Identical) IEC410:1973 BS6001:1972. Sampling procedures and

11、tables for inspection by attributes (Technically equivalent) Summary of pages This document comprises a front cover, an inside front cover, pagesi andii, theCECC title page, pages ii to iv, pages1 to7 and a back cover. This standard has been updated (see copyright date) and may have had amendments i

12、ncorporated. This will be indicated in the amendment table on the inside front cover.BSCECC30401:1985 ii BSI 07-1999 Contents Foreword iii 1 General data 1 2 Inspection requirements 2 Table 1 1 Table 2 Values of capacitance related to voltages and case sizes 1 Table 3 Other characteristics 2 Table 4

13、A Lot-by-lot inspection (Group A and B) 3 Table 4B Periodic Tests 4BSCECC30401:1985 BSI 10-1999 iii Foreword The CENELEC Electronic Components Committee (CECC) is composed of those member countries of the European Committee for Electrotechnical Standardization (CENELEC) who wish to take part in a ha

14、rmonized System for electronic components of assessed quality. The object of the System is to facilitate international trade by the harmonization of the specifications and quality assessment procedures for electronic components, and by the grant of an internationally recognized Mark, or Certificate,

15、 of Conformity. The components produced under the System are thereby accepted by all member countries without further testing. This blank detail specification has been formally approved by the CECC, and has been prepared for those countries taking part in the System who wish to issue national harmon

16、ized specifications for FIXED METALLIZED POLYETHYLENE-TEREPHTHALATE FILM DIELECTRIC CAPACITORS FOR DIRECT CURRENT. It should be read in conjunction with the current regulations for the CECC System. Preface This blank detail specification was prepared by CECC Working Group3: “Capacitors”, and it is a

17、n editorially revised version of CECC30401Issue1. It is one of a series of blank detail specifications all relating to the sectional specification CECC30400, Issue2. It is based, wherever possible, on the Publications of the International Electrotechnical Commission and in particular on IEC384-2-1-2

18、: Blank detail specification: Fixed metallized polyethylene- terephthalate film dielectric d.c.capacitors. Assessment level E. The text of this blank detail specification was circulated to the CECC for voting in the documents indicated below and was ratified by the President of the CECC for printing

19、 as a CECC Specification. Key for pageiv The numbers between square brackets on pageiv correspond to to the following indications which should be given: Identification of the harmonized detail specification Identification of the capacitor Document Voting date Report on the voting CECC (Secretariat)1

20、369 May1983 CECC (Secretariat)1511 This second issue of CECC30401 shall become effective for all new qualification approvals on1April1985. Issue1 will continue to remain effective to cover all past approvals. 1 The name of National Standards Organization under whose authority the detail specificatio

21、n is drafted 2 The CECC Symbol and the number allotted by the CECC General Secretariat to the completed detail specification 3 The number and issue number of the national generic and sectional specifications 4 The national number of the detail specification, date of issue and any further information

22、 required by the national system. 5 A short description of the type of capacitor 6 Information on typical construction (see examples given on pageiv) 7 Outline drawing with main dimensions which are of importance for interchangeability and/or reference to the national or international documents for

23、outlines. 8 Level of quality assessment 9 Quick reference dataBSCECC30401:1985 iv BSI 07-1999Specification available from: (National Standards Organization) 1 CECC number and mark 2 (National number of detail specification, date of issue, National type number, if any) 4 ELECTRONIC COMPONENTS OF ASSE

24、SSED QUALITYDETAIL SPECIFICATION IN ACCORDANCE WITH: (Number of national generic and sectional specification) 3 Outline and dimensions: (first angle projection) 7 DETAIL SPECIFICATION FOR FIXED METALLIZED POLYETHYLENE-TEREPHTHALATE FILM DIELECTRIC D.C. CAPACITORS 5 TYPICAL CONSTRUCTION: (Examples) c

25、ylindrical/rectangular non metallic/metallic case insulated/non insulated axial/radial terminations 6 Assessment level E 8 QUICK REFERENCE DATA: Rated capacitance range, capacitance tolerance, d.c. rated voltage range, climatic category, performance grade 9 Information about manufacturers who have c

26、omponents qualified to this detail specification is available in the current CECC00200: Qualified products List.BSCECC30401:1985 BSI 10-1999 1 1 General data 1.1 Recommended method of mounting See1.4.2 of CECC30400, Issue2. 1.2 Dimensions Table 1 NOTE 1When there is no case size reference, Table 1 m

27、ay be omitted and the dimensions shall be given in Table 2, which then becomes Table 1. NOTE 2The dimensions shall be given as maximum dimensions or as nominal dimensions with a tolerance. 1.3 Ratings and characteristics Table 2 Values of capacitance related to voltages and case sizes 1.4 Related do

28、cuments 1.5 Marking The marking of the capacitor and the packing shall be in accordance with the requirements of1.5 of CECC30400, Issue2. NOTEThe details of the marking of the component and packing shall be given in full in the detail specification. 1.6 Ordering information Orders for capacitors cov

29、ered by this specification shall contain, in clear or in coded form, the following minimum information: 1) Rated capacitance 2) Tolerance on rated capacitance 3) Rated d.c. voltage 4) Number and issue reference of the detail specification and style reference. Case size reference Dimensions (inmm) L

30、H d . Capacitance range Tolerance on rated capacitance Rated voltage Category voltage (if applicable) Climatic category Rated temperature Max.a.c. voltage (if applicable) Max.pulse load (if applicable) Tangent of loss angle Insulation resistance (See Table 2) (See Table 2) (See Table 2) Rated voltag

31、e Category voltage (1) Rated capacitance (in nF and/or 4F) Case size Case size Case size Case size (1) If different from the rated voltage. Generic specification : CECC30000 (Issue3) Sectional specification : CECC30400 (Issue2)BSCECC30401:1985 2 BSI 10-1999 1.7 Certified test records Required/not re

32、quired. 1.8 Additional information (not for inspection purposes) 1.9 Additional or increased severities or requirements to those specified in the generic and/or sectional specification NOTEAdditions or increased requirements should be specified only when essential. Table 3 Other characteristics 2 In

33、spection requirements 2.1 Procedures 2.1.1 For Qualification Approval the procedures shall be in accordance with3.4 of CECC30400, Issue2. 2.1.2 For Quality Conformance Inspection the test schedule (Table 4) includes sampling, periodicity, severities and requirements. The formation of inspection lots

34、 is covered by3.5.1 of CECC30400, Issue2. This table is to be used for defining characteristics which are additional to or tighter than those given in the sectional specification. Notes to Table 4A and Table 4B NOTE 1Clause numbers of tests and performance requirements refer to CECC30400, Issue2. NO

35、TE 2Inspection Levels (IL) and Acceptable Quality Levels (AQL) are selected from IEC410. NOTE 3In Table 4A and Table 4B : P=periodicity (in months) n=sample size c=acceptance criterion (permitted number of defectives) D=destructive ND=non-destructiveBSCECC30401:1985 BSI 10-1999 3 Table 4A Lot-by-lot

36、 inspection (Group A and B) Clause number and test (1) D or ND (3) Conditions of test (1) IL (2) AQL % (2) Performance requirements (1) Sub-Group A1 ND S4 2,5 4.1 4.1 Visual examination Dimensions (gauging) As in4.1 Legible marking as specified in1.5 of this specification As specified in Table 1 of

37、this specification Sub-Group A2 ND II 1,0 4.2.2 4.2.3 4.2.1 4.2.4 Capacitance Tangent of loss angle Voltage proof (measuring point 1a) Insulation resistance (Measuring point1a) Within specified tolerance as in4.2.3(2) No breakdown or flashover (selfhealing breakdown allowed) as in4.2.4(2) Sub-Group

38、B1 ND (4) S3 2,5 4.5 Solderability Without ageing Method: Good tinning as evidenced by free flowing of the solder with wetting of the terminations or soldering times, as applicable (1),(2) and(3): See page2 (4) Provided that requirements of Sub-Group A1 are met after testing.BSCECC30401:1985 4 BSI 1

39、0-1999 Table 4B Periodic Tests Clause number and test D or ND Condition of test P n c Performance requirements (1) (3) (1) (3) (3) (3) (1) Sub-Group C1A D 6 9 1 4.1 4.3.1 4.3 4.4 4.4.2 Dimensions (Detail) Initial measurements Robustness of terminations Resistance to soldering heat Final measurements

40、 Capacitance Tangent of loss angle: forC R 14F:at1kHz For C R k 14F: at10kHz Visual examination Method: Visual examination Capacitance Tangent of loss angle See detail specification No visible damage No visible damage k2%of the value measured initially Increase of tan : k 0,003Ck 14F Grade1 k 0,002C

41、14F Grade1 k 0,005Ck 14F Grade2 k 0,003C14F Grade2 compared to values measured in4.3.1. Sub-Group C1B D 6 18 1 4.6.1 4.6 4.7 Initial measurements Rapid change of temperature Vibration Capacitance Tangent of loss angle: ForC R 14F: at1kHz For C Rk 14F: at10kHz T A =Lower category temperature T B =Upp

42、er category temperature Five cycles Duration t=30min Visual examination Method of mounting: See1.1 of this spec. Procedure B4 Frequency range: .Hzto.Hz Amplitude0,75mm or acceleration98m/s 2 (whichever is the less severe) Total duration:6h Visual examination No visible damage No visible damage (1)an

43、d(3): See page2 %C C -BSCECC30401:1985 BSI 10-1999 5 Table 4B Periodic Tests Clause number and test D or ND Condition of test P n c Performance requirements (1) (3) (1) (3) (3) (3) (1) 4.8 4.9 Bump (or shock see4.9) Shock (or bump see4.8) Method of mounting: see1.1 of this spec. Number of bumps: . A

44、cceleration: . m/s 2 Duration of pulse: ms Method of mounting: see1.1 of this spec. Acceleration:.m/s 2 Duration of pulse:ms 4.8.3 or4.9.3 Final measurements Visual examination Capacitance Tangent of loss angle Insulation resistance No visible damage k 5% of value measured in 4.6.1 Increase of tan :

45、 k 0,003Ck 14F Grade1 k 0,002C14F Grade1 k 0,005Ck 14F Grade2 k 0,003C14F Grade2 compared to values measured in4.6.1 U 50%of values in 4.2.4(2) Sub-Group C1 D 6 27 2 4.10 4.10.2 4.10.3 4.10.4 4.10.5 4.10.5 (3) Climatic sequence Dry heat Damp heat, cyclic, test Db, first cycle Cold Low air pressure (

46、if required by the detail spec.) Intermediate measurements Temperature: Upper category temperature Duration:16h Temperature: Lower category temperature Duration:2h Airpressure:8,5kPa (85mbar) Visual examination No permanent breakdown, flashover or harmful deformation of the case (1)and(3): See page2

47、 %C C -BSCECC30401:1985 6 BSI 10-1999 Table 4B Periodic Tests Clause number and test D or ND Condition of test P n c Performance requirements (1) (3) (1) (3) (3) (3) (1) 4.10.6 4.10.6 (2) Damp heat, cyclic, test Db, remaining cycles Final measurements Visual examination Capacitance Tangent of loss a

48、ngle Insulation resistance No visible damage Legible marking k 5% of value measured in 4.4.2 4.8.3 or4.9.3 as applicable Increase of tan : k 0,005Ck 14F Grade1 k 0,003C14F Grade1 k 0,008Ck 14F Grade2 k 0,005C14F Grade2 compared to values measured in4.3.1 or4.6.1 as applicable U 50%of values in4.2.4(

49、2) Sub-Group C2 D 6 15 1 4.11 4.11.1 4.11.2 4.11.3 Damp heat, steady state Initial measurements Voltage proof Final measurement Capacitance Tangent of loss angle: at1kHz Within15min after removal from test chamber with U R Visual examination Capacitance Tangent of loss angle Insulation resistance See4.2.1 No visible damage Legible markingk 5% of value measured in 4.11.1 Increase of tan : k 0,005 compared to the value measured in4.11.1 U 50%of values in4.2.4(2) Sub-Group C3 D 3 21 1 4.12 Enduranc