BS CECC 30401 033-1981 Harmonized detail specification for fixed metallized polyethylene terephthalate film dielectric d c capacitors (long-life grade) - Rectangular insulated non-.pdf

《BS CECC 30401 033-1981 Harmonized detail specification for fixed metallized polyethylene terephthalate film dielectric d c capacitors (long-life grade) - Rectangular insulated non-.pdf》由会员分享，可在线阅读，更多相关《BS CECC 30401 033-1981 Harmonized detail specification for fixed metallized polyethylene terephthalate film dielectric d c capacitors (long-life grade) - Rectangular insulated non-.pdf（16页珍藏版）》请在麦多课文档分享上搜索。

1、BRITISH STANDARD BS CECC 30401 033: 1981 Harmonized detail specification for fixed metallized polyethylene terephthalate film dielectric d.c. capacitors (long-life grade) Rectangular insulated non-metallic case, rigid radial terminations Full assessment level UDC 621.319.4:621.315.616.96:678.742.2BS

2、CECC30401033:1981 BSI 10-1999 Committee reference ECL/4 ISBN 0 580 12010 4 A British Standard does not purport to include all the necessary provisions of a contract. Users of British Standards are responsible for their correct application. Compliance with a British Standard does not of itself confer

3、 immunity from legal obligations. Summary of pages This document comprises a front cover, an inside front cover, pages i and ii, pages 1 to 11 and a back cover. This standard has been updated (see copyright date) and may have had amendments incorporated. This will be indicated in the amendment table

4、 on the inside front cover. Amendments issued since publication Amd. No. Date CommentsBSCECC30401033:1981 BSI 10-1999 i Contents Page 1 Specified method of mounting for vibration and bump 2 2 Ratings and characteristics 2 3 Additional information 3 4 Related documents 3 5 Marking 4 6 Ordering inform

5、ation 4 7 Qualification approval and quality conformance inspection 4 8 Certified test records 4 Table 1 Dimensions 2 Table 2 Values of capacitance and voltage related to case size 3 Table 3 Insulation resistance 3 Table 4 Test schedule 5ii blankBSCECC30401033:1981 BSI 10-1999 1 ELECTRONIC COMPONENT

6、S OF ASSESSED QUALITY DETAIL SPECIFICATION IN ACCORDANCE WITH MANUFACTURERS TYPE NUMBER See Table 1 overleaf See PD 9002 and CECC 00200 BS E9070:1975, BS CECC 30400:1978 For ordering information see clause 6 Outline and dimensions. First angle projection FIXED METALLIZED POLYETHYLENE TEREPHTHALATE F

7、ILM DIELECTRIC D.C. CAPACITORS TYPICAL CONSTRUCTION: RECTANGULAR NON-METALLIC CASE, INSULATED RIGID RADIAL TERMINATIONS INTENDED FOR PRINTED CIRCUITS FULL ASSESSMENT LONG LIFE GRADE (See Table 1 overleaf) All dimensions in millimetres Marking information, see clause 5 Refer to Qualified Product List

8、 PD 9002 and/or CECC 00200 for details of manufacturers approved to this specification.BSCECC30401033:1981 2 BSI 10-1999 Table 1 Dimensions 1 Specified method of mounting for vibration and bump For case sizes up to an including6 g the capacitors shall be pressed down firmly on to a rigid mounting su

9、rface and fixed by soldering the leads. For larger case sizes the capacitor shall be mounted in the same way and the body shall be clamped. 2 Ratings and characteristics Case size X (max.) Y (max.) Z (max.) S + 0.35 0.7 d Typical mass min. nom. max. mm mm mm mm mm mm mm g 1 13.5 10.5 5.0 10.16 0.75

10、0.80 0.88 0.8 2 13.5 11.5 6.5 10.16 0.75 0.80 0.88 1.0 3 19.0 12.5 7.0 15.24 0.75 0.80 0.88 2.0 4 19.0 15.0 9.0 15.24 0.75 0.80 0.88 3.0 5 27.0 20.0 10.0 22.86 0.75 0.80 0.88 4.0 6 27.0 20.5 10.5 22.86 0.75 0.80 0.88 6.0 7 32.0 23.0 13.0 27.94 0.75 0.80 0.88 13.0 8 32.0 22.5 13.5 27.94 0.75 0.80 0.8

11、8 13.0 NOTEThe capacitor shall be capable of seating firmly on the printed wiring board, and the body moulding shall not seal off the holes through which the capacitor leads pass. Capacitance range Capacitance tolerances: standard 10 % (K) special order 20 % (M), 5 % (J) Rated voltage See Table 2 Ca

12、tegory voltage As rated voltage Rated temperature 85 C Insulation resistance See Table 3 Tangent of loss angle at 1 kHz C R 1 4 F: tan u 0.01 C Ru 1 4 F: tan u 0.008 Climatic category 40/085/21 Vibration severity BS 2011-2.1Fc, Procedure B4, 0.75 mm or 98 m/s 2(10 Hz to 500 Hz) Duration 6 h Bump 390

13、 m/s 2(40g n ) 1 000 bumps Solderability Solder bath method 230 C with heat screen Resistance to soldering heat 260 C Low air pressure 2 kPa (20 mbar a ) a 1 mbar = 10 2N/m 2= 100 Pa.BSCECC30401033:1981 BSI 10-1999 3 3 Additional information (not for inspection purposes) These capacitors have been d

14、esigned for wide general application in electrical and electronic circuits and are suitable for domestic, commercial and high grade professional use. These capacitors are not suitable for connection across supply mains. Table 2 Values of capacitance and voltage related to case size Table 3 Insulatio

15、n resistance 4 Related documents BS 2011, Basic environmental testing procedures (IEC 68). BS 2488, Schedule of preferred numbers for the resistance of resistors and the capacitance of capacitors for telecommunication equipment (IEC 63). BS 6001, Sampling procedures and tables for inspection by attr

16、ibutes. BS E9000, Specification for general requirements for electronic components of assessed quality harmonized with the CENELEC Electronic Components Committee system. BS CECC 30000, Harmonized system of quality assessment for electronic components. Generic specification for fixed capacitors. BS

17、CECC 30400, Specification for harmonized system of quality assessment for electronic components. Sectional specification: Fixed metalized polyethylene terephthalate film dielectric d.c. capacitors. Typical capacitance change as a function of temperature 40 C to + 20 C: 5.0% + 20 C to + 85 C: 3.0% Ca

18、pacitance 4F Rated voltage U R 63 V d.c. 100 V d.c. 250 V d.c. 400 V d.c. 630 V d.c. 0.01 0.015 0.022 0.033 0.047 0.068 0.1 0.15 0.22 0.33 0.47 0.68 1.0 1.5 2.2 3.3 4.7 6.8 10.0 1 1 1 2 2 3 3 4 4 5 5 6 7 1 1 1 2 2 3 3 4 4 5 5 6 7 8 1 1 1 2 2 3 3 4 5 5 5 7 7 8 1 1 1 2 3 3 4 4 5 5 5 7 8 8 1 2 2 3 4 4

19、5 5 5 7 8 8 Minimum RC product Minimum insulation resistance between the terminations Minimum insulation resistance between the terminations and case R = Insulation resistance between the terminations C = Rated capacitance s M7 M7 Rated capacitance 0.33 4F u 0.33 4F Rated voltage 100 V u 100 V 100 V

20、 u 100 V 10 000 5 000 30 000 15 000 30 000 NOTEThe capacitance values are within the E6 series (BS 2488).BSCECC30401033:1981 4 BSI 10-1999 PD 9002, BS 9000 component selection guide. CECC 00200, Qualified products list. 5 Marking The following information shall be given on the capacitor in accordanc

21、e with1.4 of BS CECC 30400: a) rated capacitance; b) rated voltage; c) tolerance on rated capacitance; d) manufacturers code. 6 Ordering information Orders for components complying with the requirements of this specification shall include the following minimum information: a) quantity; b) BS CECC sp

22、ecification number, issue number, i.e. BS CECC 30401 Issue 1; c) capacitance value and tolerance; d) rated voltage. 7 Qualification approval and quality conformance inspection 7.1 For qualification approval test and quality conformance inspection the test schedule, severities and requirements given

23、in the sectional specification BS CECC 30400 apply. 7.2 A complete schedule is given inTable 3. The details in7.2.1 to7.2.5 apply. 7.2.1 For qualification testing, see 3.3 of BS CECC30400, subgroups A1 and A2 are combined together to form group0. All subgroups of group C are required with numbers of

24、 samples and permissible defectives as shown in Table1 of BS CECC30400. 7.2.2 The samples required for qualification testing will be in accordance with3.3.1 of BS CECC30400. 7.2.3 Samples submitted to tests marked D shall not be accepted for release under BS E9000. 7.2.4 The requirement for visual e

25、xamination for intermediate or final measurement is as follows. There shall be no damage that will affect the usability of the capacitor for its intended purpose. 7.2.5 Drying in accordance with 4.2 of BS CECC30000 is not required. 8 Certified test records Certified test records shall be prepared in

26、 accordance with3.2 of BSCECC30400. Attributes information shall be given for subgroups C1, C2, C3 and C4 without reference to the parameter with which a defect occurred. Variables information for the change in capacitance, in the tangent of loss angle, and in the insulation resistance after the end

27、urance test (subgroup C3) and after the charge and discharge tests (subgroup C4).BSCECC30401033:1981 BSI 10-1999 5 Table 4 Test schedule Groups A and B inspection (lot-by-lot): Full assessment level Examination or test D/ND BS CECC 30400 Ref. Test method and severity IL a AQL b Performance requireme

28、nts Group A inspection To be applied on a sampling basis, lot-by-lot (7.2.1) Subgroup A1 ND S4 2.5 See 7.2.4 of this standard Visual examination 4.2 Marking See clause 5 Dimensions As Table 1 Subgroup A2 (7.2.1) Voltage proof (test point A1.1) ND 4.3 1.6U R II 1.0 No breakdown or flashover. Self-hea

29、ling is permitted Capacitance 4.4 Within the specified selection tolerance Tangent of loss angle 4.5 C Ru 1 4F u 0.008 C R 1 4F u 0.01 Insulation resistance (test point A1.1 only) 4.6 C R 0.33 4F U R 100 V U Ru 100 V RC W 10 000 s RC W 5 000 s C Ru 0.33 4F U R 100 V U Ru 100 V R insW 30 000 M7 R ins

30、 ins W 15 000 M7 Group B inspection To be applied on a sampling basis, lot-by-lot Subgroup B1 S-3 2.5 Solderability ND 4.9.2 Test Ta, solder bath method with heat screen depth of immersion as in4.9.2 of BS CECC 30400 3.2.3 of test Ta a IL = Inspection level. b AQL = Acceptance quality level.BSCECC30

31、401033:1981 6 BSI 10-1999 Group C inspection, periodic tests (7.2.1): Full assessment level Examination or test D/ND BS CECC 30400 Ref. Test method and severity p a n b c c Performance requirements Group C inspection To be conducted on a sampling basis plus periodically at the monthly interval shown

32、 in column p Subgroup C1 Initial measurements 4.8.1 Capacitance D 4.4 6 27 2 Within the specified selection tolerance Tangent of loss angle 4.5 C Ru 1 4F; u 0.008 at 1 kHz record reading for information at10kHz Solderability 4.9.2 Test Ta, solder bath method with heat screen. Depth of immersion as i

33、n 4.9.2 of BS CECC 30400 3.2.3 of test Ta Subgroup C1a Part of sample Robustness of terminations D 4.8.2 Test Ua, Tensile 10 N/10 s 6 9 1 Visual examination 4.2 See 7.2.4 of this standard Resistance to soldering heat 4.8.3 Test Tb, method 1A 260 C with heat screen a p = periodicity (months). b n = s

34、ample size. c c = permissible defectives.BSCECC30401033:1981 BSI 10-1999 7 Examination or test D/ND BS CECC 30400 Ref. Test method and severity p a n b c c Performance requirements Subgroup C1a (contd) Final measurements 4.8.4 Visual examination 4.2 See 7.2.4 of this standard Capacitance 4.4 %C u 2%

35、 Tangent of loss angle 4.5 Increase of tan C R 1 4F; u 0.002 at1 kHz C Ru 1 4F; u 0.003 at10 kHz Subgroup C1b Other part of sample 6 18 1 Rapid change of temperature D 4.9.3 Test Na, 5 cycles of 30min at 40 C and 30 min at 85 C. Period of recovery not less than1 h Visual examination 4.2 See 7.2.4 of

36、 this standard Vibration 4.9.4 Test Fc, procedure B410 Hz to 500 Hz. Duration 6 h. For method of mounting, see clause 1 Visual examination 4.2 See 7.2.4 of this standard Bump 4.9.5 Test Eb, 390 m/s 2(40g n ) 1000 bumps. For method of mounting, see clause 1 a p = periodicity (months). b n = sample si

37、ze. c c = permissible defectives.BSCECC30401033:1981 8 BSI 10-1999 Examination or test D/ND BS CECC 30400 Ref. Test method and severity p a n b c c Performance requirements Subgroup C1b (contd) Final measurements 4.9.6 Visual examination 4.2 See 7.2.4 of this standard Capacitance 4.4 %C u 5% Tangent

38、 of loss angle 4.5 Increase of tan C R 1 4F; u 0.002 at 1 kHz C Ru 1 4F; u 0.003 at 10 kHz Insulation resistance 4.6 Within initial limit Subgroups C1a and C1b combined Climatic sequence 4.10 6 27 2 Dry heat 4.10.2 Test Ba, issue 4, 16 h. While still at the upper category temperature (85 C) and at t

39、he end of the period of high temperature conduct the following tests: Capacitance 4.4 %C u 5% Insulation resistance 4.6 Test point A1.1 C R 0.33 4F U R 100 V U Ru 100 V RC W 100 s RC W 50 s C Ru 0.33 4F U R 100 V U Ru 100 V R insW 300 M7 Rins W 150 M7 Test point B1.2 R insW 300 M7 Damp heat, cyclic,

40、 first cycle 4.10.3 Test Db Capacitance 4.4 Reference value Cold 4.10.4 Test Aa, 2 h. While still at the lower category temperature ( 40 C) and at the end of the period of low temperature the capacitance shall be measured Capacitance 4.4 %C u 7% a p = periodicity (months). b n = sample size. c c = p

41、ermissible defectives.BSCECC30401033:1981 BSI 10-1999 9 Examination or test D/ND BS CECC 30400 Ref. Test method and severity p a n b c c Performance requirements Subgroups C1a and C1b combined (contd) Low air pressure 4.10.5 Test M, 20 mbar. The test shall be carried out at a temperature of15 C to 3

42、5 C, duration 1 h. U Rto be applied, test point A1.1 part of sample and test point B1.2 of other part of sample, during the last 5 min No breakdown or flashover. Selfhealing is permitted Visual examination 4.2 See 7.2.4 of this standard Damp heat, cyclic, remaining cycles 4.10.6 Test Db, 1 cycle. U

43、Rto be applied, test point A1.1 for 1 min within15 min after removal Final measurements 4.10.7 Visual examination 4.2 See 7.2.4 of this standard Capacitance 4.4 %C 1 4F, 50% of the initial limit Subgroup C2 D 6 15 1 Initial measurements 4.11.1 Capacitance 4.4 Within the specified selection tolerance

44、 Tangent of loss angle 4.5 C Ru 1 4F u 0.008 at1 kHz C R 1 4F u 0.01 at1kHz a p = periodicity (months). b n = sample size. c c = permissible defectives.BSCECC30401033:1981 10 BSI 10-1999 Examination or test D/ND BS CECC 30400 Ref. Test method and severity p a n b c c Performance requirements Subgrou

45、p C2 (contd) Damp heat, steady state 4.11 Test ca, issue 3, 21days. No applied voltage Voltage proof 4.11.2 4.3 U Rwith 15 min after removal from the chamber. Recovery 1 h to 2 h No breakdown or flashover. Selfhealing is permitted Final measurements 4.11.3 Within 2 h after recovery Visual examinatio

46、n 4.2 See 7.2.4 of this standard Capacitance 4.4 % C u 5% Tangent of loss angle 4.5 Increase of tan u 0.005 Insulation resistance 4.6 50% of the initial limit Subgroup C3 D 3 21 1 Initial measurements 4.12.1 Capacitance 4.4 Within the specified selection tolerance Tangent of loss angle 4.5 C Ru 1 4F

47、; u 0.008 at1 kHz record reading for information at 10 kHz C RW 1 4F; u 0.01 at1kHz Endurance 4.12 Duration 2000 h. The sample shall be divided in two parts, 1part 1.25U cto be applied at 85 C. 1part 2 V d.c. to be applied at 85 C a p = periodicity (months). b n = sample size. c c = permissible defe

48、ctives.BSCECC30401033:1981 BSI 10-1999 11 Examination or test D/ND BS CECC 30400 Ref. Test method and severity p a n b c c Performance requirements Subgroup C3 (contd) Final measurements 4.12.5 Visual examination 4.2 See 7.2.4 of this standard Capacitance 4.4 %C u 5% Tangent of loss angle 4.8.1 Incr

49、ease of tan C R 14F; u 0.002 at 1kHz C Ru 1 4F; u 0.003 at10 kHz Insulation resistance 4.6 50% of the initial limit Subgroup C4 D 3 9 1 Initial measurements 4.13.1 Capacitance 4.4 Within the specified selection tolerance Tangent of loss angle 4.5 C Ru 1 4F; u 0.008 at1kHz record reading at10 kHz C R 1 4F; u 0.01 at1kHz Charge and discharge 4.13 Final measurements 4.13.3 Capacitance 4.4 %C u 3% Tangent of loss angle 4.5 Increase of tan C R 14F; u 0.002 at1kHz C Ru 1 4F; u 0.003 at10