ARMY MIL-T-63264 (2)-1989 TEST SET ELECTRONIC SYSTEMS M92《M92电子系统测试装置》.pdf
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1、+!/-o 3 MIL-T-63264 (2) 47 777770b 0252677 1 MIL-T-63264 (AR) AMENDMENT 2 S UP E RSE D I NG AMENDMENT 1 .UN- 11 October 1979 MILITARY SPECIFICATION TEST, SET, ELECTRONICS SYSTEMS: M92 This amendment forms a part of Military Specification MIL-T-63264 (AR), dated 3 May 1978, and is approved for use by
2、 the US Army Armament, Munitions and Chemical Command and is available for use by all Departments and Agencies of the Department of Defense. PAGE 1 Under “Military Standards“ : Delete the following: “MIL-STD-331 -Fuze and Fuze Components, Environmental and Performance Tests For“. * Add : “MIL-STD-20
3、2 -Test Methods For Electronic and Electrical Component Parts“. PAGE 3 3.4, Delete: “except for temperature humidity which is contained in MIL-STD-331“. 3.4.1, Add to end of paragraph: “using curve AW of Figure 514.2-7“. 3.4.2: Delete “Test 105.1 of MIL-STD-331 .I and substitute “Method 507.1, Proce
4、dure I“. * 3.5: Delete “MIL-STD-1460, except that para. 4.1.3 does not apply“ and add “MIL-S-45743 and MIL-S-46844“. AMSC N/A I of 3 FSC 4925 DISTRIBUTION STATEMENT A. Approved for public release; distribution is unlimited. Provided by IHSNot for ResaleNo reproduction or networking permitted without
5、 license from IHS-,-,-* * * MIL-T-63 2 64 (AR) AMENDMENT 2 PAGE 5 TABLE I, line 2, Transportation Vibration: Add i(a)ts in Add to Notes: I (a) Order of tested as listed“. examination or test column. PAGE 7 4.4.2.1: Delete Minor Defect 201. PAGE 10 4.4.2.4, under Examination or Test column: Specify M
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