ARMY MIL-S-55389 (2)-1978 SUPPRESSOR ELECTRICAL TRANSIENT MX-7778A GRC《MX-7778A GRC型电涌抑制器》.pdf
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1、NIL-S-55387 (2) 57 W 7777706 0075737 T /I - 1/44 MIL-S-55389 ( EL) AMENEMENT 2 AMENDMENT 1 9 April 1975 MILITAY SPECFICATION SUPPHESSOR, EUCTRICAL TRANSIENT, MX-7778A/GRC This amendment forms a part of Military s,pecification MIL-S-55389(pL), dated 30 March 1973. PAGE 1 n 2.1, List of FEDERAL SPECIF
2、ICATIOKS: Delete and substitute: T-T-871 NN-P- 71 Q Q- S - 7 81 PPP- E- 2 o PPP-B- 585 PPP-3-601 PPP- E 621 PPP-B-636 PPP-E640 PPP-F-320 PPP- S- 760 PPP-T- 97 Tdne, Cotton, tirapping Pallets, Material Handling, Wood, Stringer Construction, 2-!.:ay and 4-way (Partial) Strapping, Steel, and Sealti Bag
3、, Cotton, Mailing Boxes, k!ood, Virebound Boxes, biood, Cleated Piywood Boxes, Wood, Nailed and Lack-Corner Boxes, Shipping, Fiberboard Boxes, Fiberboard, Corrugated Triplewall Fiberboard; Corrugated and Solid, Sheet Stock Strapping, Nonmetallic, (And Connectors) Tape; Pressure-Sensitive Adhesive, F
4、ilament (Container Grade) and Cut Shapes Reinforced“ FSC 5915 Copyright Communications - Electronics Command Provided by IHS under license with CRAINot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-S-55389 (2) 57 ,777770b 0075738 2 1-s-s5389( EL) AMENDMENT 2 I PA
5、GE 2 * 2.1, List of MILITARY SPECIFICTIONS: Delete and substitute: WLITARY MIL-P-116 MICE117 MILT- 152 KIGV- 17 3 MIL-P-11268 MIEl413231 ML-F-14072 Preservation-Psckagi ng, Methods of Bags, Sleeves and Tubing-Interior Treatment, Moisture and Fungus Packaging Resistant., of Communications, Elec- tron
6、ic and associated Electrical Equipment, hquipment ) Parts, Materials, And Processes Used In Electronic Equipment, Marking of Electronic Items Finishes for Ground Electronic Plastic Molding Material (Polystyrene Polyurethane Foam, FZigid or Flexible, Varnish, Moisture-And-Fungus-Resistant . (for Elec
7、tronic And Associated Equipment Fom, Expanded Bead) For Fackaging“ u 2.1, List of MLITMY STAEAPXS: Celete an subst-itut,e: WILI T ArLY MIL-STC-129 MIL-STD-147 MIGSTD-253 MIL-STD-LSli MICSTD- 810 MIL-STD-1188 MIL-STD-lL72 Sampling, Procedures and Tables for Marking for Shipment- and Storage Palletize
8、d and Containerized Unit Inspection by Attributes Laads, 40 Inch x i18 Inch Pallets, Skids, Runners or Pallet Type Base Classification of Visual and Mechanj.ca1 Defects For Equipment, Electronic, Mired, ami Other devices Electronic Equipment Standard General Requi-rements For Environmental Test Meth
9、ods Conmercial Packaging of Supplies Human Engineering Design Criteria for and Equipment Military Systems, Equipment and Facilities“ Page 2 of 11 Copyright Communications - Electronics Command Provided by IHS under license with CRAINot for ResaleNo reproduction or networking permitted without licens
10、e from IHS-,-,-MIL-S-55387 (2) 57 m 7977906 0075937 3 m PIIL- s- 55 389( EL) MIE;rDPIEI!T 2 PAGE 3 * 3.4.2, Celete and substitute: It3.4.2 Voltage Limitation. With the output of the transient suppressor open circuited and the input voltage adjusted such that the zener diode draws 1 2 0.1 amperes at
11、two (2) seconds of this voltage application, the maximum allowable output voltage shall be within a range of 33 to 36 volts referred to a zener case temperature of 86 + 5.5 degrees F (sbtract 17.2 mV per degree F from the output vol- tage for a lower zener case temperature and add 17.2 mV per degree
12、 F to the output boltage for a higher zener case temperature). (See b.7.l)ff PAGE 6 +t Ifwithstand immersiontt . 3.5.7, line 2: Delete Itbe capable of being immersedtt and substitute PAGE 7 n * spec 3.7.2, line 2 : Delete irX2408/it and substitute tt24087lf PAGE 9 4.2, Delete and substitute: 114.2 C
13、lassification of inspection. The inspection requirements fied herein are classified as .follows.: a. First article inspection. (See 4.3) Does not include Packaging. b. Inspection covered by subsidiary documents (See 4.4) c. Quality Conformance inspection: (1) Quality conformance inspection of equipm
14、ent before packaging. (See 4.5) (See 4.11) (2) Quality conformance inspection of Packaging. Page 3 of 11 Copyright Communications - Electronics Command Provided by IHS under license with CRAINot for ResaleNo reproduction or networking permitted without license from IHS-,-,-flIL-S-553q (2) 57 9999906
15、 00759LIO T MIL-S-553 89 ( EL) ANEAEMENT 2 PAGE 10 n Table I: Delete and substitute: TABLE I FIRST ARTICLE INSPECTION INSPECTIONS TEST UNIT UNIT UNIT PARA. PARA . 1 2 3 Inspections covered by subsidiary documents Bounce, Preconditioning GROUP A Inspection GROUP B Inspection Environmental Lo11 Temper
16、ature High Temperature Orientation Humidity( Moisture Altitude Salt Fog Immersion Sand and Dust Vibration, Resonance Hesistance) 4.4 3.3 4.5.4 (See Table II) (See Txble III) 3.5.1.2 1i.6.1.2 3.5.1.1 4.6.1.1 3.5.8 4.6.8 3.5.2 4.6.2 3.5.3 lr.6.3 3.5.7 4.6.7 3.5.6 4.6.6 3.5.4.1 4.6.4.1 3 a5.9 -.4,6NljM
17、ENT 2 PAGE 12 * Table III: Add as last inspection: AQL - “INSPECTION . REQ PARA INSP PARA Immersion 3.5.7 4.6.7 i. NOTE: Special Inspection Level is Sfioup III Pulse Circuit Test 3.b.h.i 4.7.3.1 NOTE E This test shall be performed on a separate smple.fl Page 5 of 11 Copyright Communications - Electr
18、onics Command Provided by IHS under license with CRAINot for ResaleNo reproduction or networking permitted without license from IHS-,-,- MIL-S-55387 (2) 57 = 777770b 0075742 3 MIS-55389( EL) AMFADFG3NT 2 * 4.5.3.1.1: Delete and substitute: 114.S.3.l.l Subgroups IA, lB, lC, Trble IV. - Two uni-s shal
19、l be selected at random from each 3000 equipments produced, or 2 every 6 months if less than 3000 units are produced in a 6 month period, and subjected to each inspection specified. selected at the start of the contract from the First Quality Conformance Inspection Lot.I The first sample shall be PA
20、GE 14 * 4.5.3.1.2: Delete and substitute: 11L.5.3.1.2 Subgroups IIA and IIB, Table IV. - Two units shall be selected at the stsrt of the contract from the First Quality Con- formance Inspection Production Lot and 2 units from the first 50 units following the midpoint production quantity shall be sel
21、ected. subsequent Group C inspection for the tests in these subgroups will be required. No * 4.5.3.1.3: Delete and substitute: lI4.S.3.1.3 Subgroup III, Table IV. - The pulse circuit test shall be performed once for esch 1ix)O equipments produced.“ * 4.5.3.1.3.1: Delete in its entirety. PAGE 18 9 4.
22、10: Delete and substitute: 114.1 Rough handling test (Packaging). - When the rough handling test in accordaxe with MIL-P-116 is required by contract (See 6.2( j), the unit shall be subjected to the-tests o? 4.7.1 thru 4.7.7 to determine freedom from malfunction caused by the rough handling.“ * 4.11:
23、 Delete and substitute: llb.l Quality Conformance inspection of Packaging. - Packaging shall be inspected in accordance with MIL-P-116 to determine conformance to the requirements of section 5.11 Page 6 of 11 /- LI I Copyright Communications - Electronics Command Provided by IHS under license with C
24、RAINot for ResaleNo reproduction or networking permitted without license from IHS-,-,-i, MIL-S-55389 (2) 59 W 9999906 00759V3 5 = MIL -sS389( EL) AMENDMENT 2 PAGE 19 +F 5. PrthPARATION FOR DELIVERY: Delete and substitute: f f P ACK AG I LUG I 5.1 Preservation. Preservation shall be level A, B or com
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