ARMY MIL-I-48634 (3)-1993 INTEGRATED CIRCUIT DIGITAL CMOS LOGIC ARRAY MONOLITHIC SILICON《铁制硅互补金属氧化物半导体制数字集成电路》.pdf
《ARMY MIL-I-48634 (3)-1993 INTEGRATED CIRCUIT DIGITAL CMOS LOGIC ARRAY MONOLITHIC SILICON《铁制硅互补金属氧化物半导体制数字集成电路》.pdf》由会员分享,可在线阅读,更多相关《ARMY MIL-I-48634 (3)-1993 INTEGRATED CIRCUIT DIGITAL CMOS LOGIC ARRAY MONOLITHIC SILICON《铁制硅互补金属氧化物半导体制数字集成电路》.pdf(5页珍藏版)》请在麦多课文档分享上搜索。
1、I INCH-POUND 1 MIL-1-48634 (AR) AMENDMENT 3 SUPERSE31 NG AMENDMENT 2 05 May 1993 20 February 1989 MILITARY SPECIFICATION INTEGRATED CIRCUIT, DIGITAL, CMOS LOGIC ARRAY MONOLITSIC SILICON This Amendment forms a part of Military Specification MIL-1-48634 (AR), dated 31 July 1986, and is approved for us
2、e within the rJ.S. Army Armament Munitions and Chemical Command, and is available for use by all Departments and Agencies of the Department of Defense. PAGE 1 1.1: Change “M718Ei/M741Elw to “M718A1/Y741AlW, 2.1.1: under Specification, MILITARY, Add MI-48078: Ammunition, standard Quality Assurance Pr
3、ovisions, General Specification For. PAGE 3 3.2.5: Delete in its entirety and suhstikute: “Pin Assignments. Pin assignments shall be as shown 7 in Figure 2. PAGE 5 FIGURE 2: Delete “GD“ and substitute “NC“ on Pin 4. PAGE 6 3.4.1: Change “OC“ to “OF“ under Unit. HEADER: Delete “MIL-1-48643 (AR)“ and
4、subst.itutt;. “MIL-1-48634 (AR)“. TABLE I: Delekt: “OF“ and substitute “OC“ under Unit. 3.4.3.2, third lint: down: Delete “VOD“ and substitute “JDD“. AMSC N/A 1 of 5 FSC 1375 DISTRIBUTION STATEMENT A. Approved for public release; distribution is unlimited. Provided by IHSNot for ResaleNo reproductio
5、n or networking permitted without license from IHS-,-,-* * MIL-1-48634 (3) 9999906 1856273 538 MIL-1-48634 (AR) AMENDMENT 3 PAGE 7 3.4.3.3, sixth line down: Delete “3 VDD“ and substitute “2 VDD“. PAGE a TABLE II: Delete in its entirety and add new TABLE II included. PAGE 6 3.3.3, Delete paragraph in
6、 its entirety. PAGE 41 3.5.2, last sentence: Delete “3.5.15“ and substitute “3.4.3.3“. PAGE 42 3.5.5, second line down: Delete “15 cycles“ and substitute “15 cycles“. Delete “3.5.15“ and substitute “3.4.3.3“. 3.5.6, last sentence: Delete “3.5.15“ arid substitute “3.4.3.3“. PAGE 43 4.3.5, last senten
7、ce: Delete “(see paragraph 5.3)“ and substitute “(see paragraph 5.3.1)“. PAGE 44 Add the following paragraph: “4.6 Screening. Screening shall be in accordance with MIL-STD-883, method 5004 with the exception of the following: Screen Burn-In Test Post Burn-In Method 1015 at 125OC for 160 hours 1015 a
8、t 25OC all electrical parameter per Table II. 4.4.28 last line, Delete “design activity“ and substitute “technical agency“. 2 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,- r, NIL-I-48b34 (3) 9999906 lt85bZ7V 474 O MIL-1-48634 (AR) AMENDMENT 3 TABL
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