ARMY MIL-C-14871-1970 CIRCUIT CARD ASSEMBLY 10559205 (INDICATOR COMMAND DISPLAY)《10559205(指令指标显示器) 电路卡装配》.pdf

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1、f MIL-C-347L 32 7777906 0277773 O MIL-C-i4871(MU) 2 March 1970 MILITARY SPECIFICATION CIRCUIT CARD ASSEMBLY: 10559205 (INDICATOR, COMMAND, DISPLAY) 1. SCOPE 1. 1 known as Circuit Card Assembly: 10559205, (Indicator, Command, Display) (see 6. 1). 2. APPLICABLE DOCUMENTS This specification covers one

2、type of electronic assembly 2. 1 The following documents of the issue in effect on date of invitation for bids or request for proposal, form a part of this speci- fication to the extent specified herein. SPECIFICATIONS Mili tar y MIL- F- 13 926 MIL-P- 14232 MIL - I- 4 5 6 O 7 STANDARDS Militar y MIL

3、-STD- 105 MIL-STD- 109 MIL-STD-810 DRAWINGS Fire Control Materiel; General Specification Cove rning the Manufacture and Inspection of Parts, Equipment and Tools for Army Materiel: Packaging and Packing of Inspe c t ion Equipment and Maintenance of Supply Sampling Procedures and Tables for Inspection

4、 by Attributes Quality Assurance Terms and Definitions Environmental Te s t Methods U. S. Army, Frankford Arsenal F10559205 Circuit Card Assembly- Indicator , Command , Display FSC 1240 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL- C- 14871 (M

5、U) PACKAGING DATA SHEET ITEM t 10559205 CONDITION CHARACTERISTIC CONNECTIONS - Packaging of Circuit Card Assembly: 10559205 1. 1. 1 (Copies of specifications, standards, drawings, and packaging data sheets required by suppliers in connection with specific procurement functions should be obtained fro

6、m the procuring activity or as directed by the contracting officer. ) Loads : Resistor and bias 620 ohms t570, Connected in series 1/2W and T15 t5 Vdc between P1- 13 and P1- J with negative return to - P1- J 3. REQUIREMENTS 3. 1 Fabrication. - The circuit card assembly shall be manu- factured in acc

7、ordance with Drawing F10559205 and drawings pertaining thereto. 3.2 General specification, - The circuit card assembly shall meet the following requirements, where applicable, of MIL- F- 13926: (a) Order of precedence (b) Dimensions and tolerances (c) Part identification and marking 3.2.1 Electronic

8、 workmanship. - The circuit card assembly shall meet the workmanship requirements of Drawing F10559205 and drawings pe rtaning there to. 3. 3 Performance. - Unless otherwise specified, the circuit card assembly shall meet the performance requirements of this speci- fication at standard ambient tempe

9、ratures between 60 degrees Fahren- heit (OF) and 90F. 3. 3.1 Loadc,power and signals. - The circuit card assembly shall perform as specified herein when the loads, power, and signals of Table I are applied as specified. TABLE I 2 Provided by IHSNot for ResaleNo reproduction or networking permitted w

10、ithout license from IHS-,-,-TEM 1.2 - 2. 2.1 2.2 2.3 3. 3.1 FU BE v1 v2 MIL-C-l4871(MU) TABLE I (continued) TERMINAL P1-K 1 O NA V1 Readout No. O 5 NA Pl-11 101 P1- 10 110 Pi-9 111 CONDITION Resistor and bias Power sources: 5 Vdc 15 Vdc 220 Vdc Signal sour ces : Digital type- A CHARACTERISTIC 200 oh

11、ms t5%, 2w and t15 tr5 Vdc - Tolerance: t2 Vdc Ripple : 25 m-V p-p maximum Tolerance: t.0.5 Vdc Ripple: 25 m-Vp-p maximum Tolerance: t10 Vdc Ripple: 100 mV p-p maximum Logical one: 4.0 t1 Vdc Logicai zero: 2 - t0.2 Vdc TABLE II CONNE C TIONS Connected in series between P1-P and P 1 - J with negative

12、 return to P1- J Connected be tween P1-2(t) and P1-J(-) Connected as specified in Items 1, 1 and 1, 2 Connected between P1-A(t) and P1-J(-) Applied as specified in Tables II and III INPUT :i: 3 NA NA $ Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-

13、MIL-C-14871 12 777770b 0277774 b m MIL- C- 14871 (MU) TABLE II (continued) TERM INAL INPUT YIXIE UBE v2 - 1 5 O 1 O 1 5 - - O 9 O 1 1 O 9 O 1 1 O 9 1 O O 1 O - - - - - 1 4 - 1 6 - O 8 - 1 O - 1 1 - 1 2 - 1 7 - 1 3 O O 1 1 3 O O 1 1 3 1 1 O O 3 - - Pl-8 V2 Readout No, P1- 7 -P1-6 P1-F Pl-E V3 Readout

14、 No. 1 O O 1 6 1 O O 1 6 O 1 1 O 6 - - - o O O 1 7 O O O 1 7 1 1 1 O 7 - - 7 1 1 1 O 8 1 1 1 O 8 O O O 1 8 - - - v3 P1-D P1-c P1-B P1- 1 V4 Readout No. 1 O 1 1 2 O 1 O O 2 - - O 1 O 1 5 1 O 1 O 5 - v4 P1-L P1-M P1- 12 P1-N V5 Readout No. O O O O O - 1 O O O 1 - O O 1 O 4 v5 Legend: 1 - Logical one,

15、type-A NA - Not applicable O - Logical zero, type-A All termin-als are referenced to PI-3 4 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-VIL-C-14871 12 W 7779906 0277795 W INPUT VOLTAGE AT PERFORMANCE TERMINALS OU TPU T TERMINALS CONDITION P1-R Pl

16、-14 P1-P P1- 13 1 O O 1.2 to. 7v: 1.2 - to. 7vs - 2 O 1 1.2 - tO.7Vhk 15.0 - tO.8V NA 15. 0 to. 8V 15. O +O. 8V 3 1 - - * 1.2 +O. 9V at the temperature extremes specified in 3r3.2.2. MIL-C-l4871(MU) TABLE III 3.3. 1. 1 Readout selection logic. - The readout numbers for nixie tubes V1, V2, V3, V4, an

17、d V5 shall be as specified in Table II when the digital type-A signal of Table I is applied as indicated in Table II. 3. 3. 1.2 Indicator logic. - The voltages at the output terminals shall be as specified in Table III when the digital type-A signal of Table I is applied as indicated in Table III. 3

18、. 3. 2 Environmental. 3. 3.2. 1 Storage temperature. - The circuit card assembly shall meet the requirements of 3.3.1 at ambient temperature (600F to 90F) after exposure and thermal stabilization at - 80F and+160F. 3. 3.2.2 Operating temperatures. - The circuit card assembly shall meet the requireme

19、nts of 3. 3. 1 while exposed to and thermally stabilized at -40F and +125OF, subsequent to which it shall meet the above requirements at ambient temperature (600F to 9OoF). 3. 3.2.3 Vibration, - The circuit card assembly shall show no physical failure and shall meet the requirements of 3. 3. 1 after

20、 being exposed to the following Vibratory conditions: (a) Amplitude: O. 5 inch maximum (b) Acceleration: 4 g maximum 5 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-C-14871 12 777770b 027777b T MIL- C- 14871 (MU) (c) Crossover frequency: 12.5 H

21、ertz (Hz) (d) Sweep time: 5 to 500 to 5 Hz in 15 minutes, Two sweeps in each of three mutually perpendicular axes 4. QUALITY ASSURANCE PROVISIONS 4. 1 Responsibility for inspection. - Unless otherwise speci- fied in the contract or purchase order, the supplier is responsible for the performance of a

22、ll inspection requirements as specified herein. Except as otherwise specified, the supplier may utilize his own or any other facilities suitable for the performance of the inspection require- ments specified herein, unless disapproved by the Government. Government reserves the right to perform any o

23、f the inspections set forth in the specification where such inspections are deemed necessary to assure supplies and services conform to prescribed requirements, The 4.1.1 General provisions. - The component and subassembly inspection requirements of MIL-F- 13926 form a part of the quality assurance

24、provisions of this specification. terms shall be as listed in MIL-STD-109, Definitions of inspection 4.2 First article (initial production) approval. - The. require- ment for first article approval and the responsibility (Government or contractor) for first article testing shall be as specified in t

25、he contract. The. sample for first article approval tests shall consist of three cir- cuit card assemblies. The sample shall be manufactured in the same manner, using the same materials, equipment, processes, and proce- dures as used in regular production. packaging and packing, shall be obtained fr

26、om the same source of supply as used in regular production. All parts and materials, including 4.2. 1 Government testing. - When the Government is respon- sible for conducting first article approval tests, the contractor, prior to submitting the sample to the Government, shall inspect the sample to

27、insure that it conforms to all the requirements of the contract and submit a record of this inspection with the sample, including certifi- cates of conformance for materials. 4.2.2 Contractor testing. - When the contractor is responsible for conducting first article approval tests, the sample shall

28、be in inspected by the contractor for all the requirements of the .contract. The sample and a record of this inspection, including certificates of conformance for materials, shall be submitted to the Government for The Government reserves the right to witness the contrac- tors inspection. -approval.

29、 6 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-flIL-C-I97L 12 9999906 0297777 L = MIL-C- 14871(MU) 4.3 InsDection Drovisions. 4,3. 1 Submission of product, - Unless otherwise specified by the contracting officer, inspection lot size, lot formatio

30、n and presen- tation of lots shall be in accordance with “Submission of Product“ pro- visions of MIL-STD-105. 4.3.2 Examination and tests. 4.3.2.1 Components and subassemblies. - All components and subassemblies shall be inspected in accordance with the inspection provisions contained in Supplementa

31、ry Quality Assurance Provisions (SQAP) listed in the technical data package (TDP). In the absence of SQAPs, the applicable Quality Assurance Provisions of MIL-F-13926 shall apply. 4.3.2.2 Final acceptance inspection, - Subsequent to first article approval, examination and tests related o Section 3 h

32、erein shall be performed on a single defect (individual characteristic) basis in accordance with MIL-STD-105 and the sampling plans specified in Tables IV, V, and VI herein. Examination and test for packaging and marking shall be in accordance with MIL-P-14232 and Section 5 herein, The tabulated cla

33、ssification of defects in Tables IV, V, and VI shall constitute the minimum inspection to be performed by the supplier after first article approval and prior to Government acceptance or rejection by item or lot. 4.3.2.3 Functional tests. - The requirements and tests in All examinations and Table IV

34、shall be inspected on a 100% basis. tests shall be conducted at the standard ambient temperature (600 to 90F). TABLE IV (100 percent inspection) CHARACTERISTIC REQUIREMENT TEST PROCEDURES 10 1. Readout selection logic 3.3.1.1 4.6.2 102. Indicator .logic 3.3. 1.2 4.6.3 4. 3. 3 Acceptanc and rejection

35、, - Rejected lots shall be screen- ed for all defective characteristics. Removal or correction of defec- tive units and resubmittance of rejected lots shall be in accordance with “Acceptance and Rejection“ as specified in MIL-STD- 105. 7 a Provided by IHSNot for ResaleNo reproduction or networking p

36、ermitted without license from IHS-,-,-NIL-C-L4871 12 9777906 0277798 3 = MIL-C- 14871 (MU) 4.4 Special sampling. 4.4. 1 General. - One circuit card assembly shall be selected at random by a Government representative as a control sample from each 100 produced. The control sample shall meet the requir

37、ements and tests in Table V. TABLE V CONTROL TEST REQUIREMENT TEST PROCEDURES 30 1 Fabrication 3.1 Applicable drawings - Visual Visual 302. General specification 3.2 MIL-F-13926 - 4.4. 2 Environmental. - Three circuit card assemblies shall be selected at random by a Government representative as a co

38、ntrol sam- ple from each 50 produced or from each months production, whichever occurs first. tests in Table VI. The control samples shall meet the requirements and TABLE VI CONTROL TEST REQUIREMENT TEST PROCEDURES 303. Storage temperature 3. 3. 2. 1 304. Operating temperature 3. 3. 2. 2 305. Vibrati

39、on 3. 3. 2. 3 4. 6.4. 1 4. 6.4. 1 4. 6.4.2 4.4. 3 Failure of sample. - Should any one item of a special sampling fail to meet the specified test requirements, acceptance of the product shall be suspended by the Government until necessary cor- rections have been made by the contractor and the resubmi

40、tted item has been approved (see 4. 3. 3). 4. 5 Inspection equipment. - Except as otherwise provided for by the contract, the contractor shall supply and maintain inspection equipment in accordance with the applicable requirements of MIL-I- 45607. 4. 5.1 Government furnished inspection equipment. -

41、Where the contract provides for Government furnished test equipment, supply - = and maintenance of test equipment shall be in accordance- with the ap- plicable requirements specified in MIL - 1-45 60 7. 8 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,

42、-,-MIL-C-lt47L 12 7999706 0277779 5 MIL- C- 1487 1 (MU) 4. 5.2 Contractor furnished inspection equipment. 4. 5.2. 1 Government design. - Unless otherwise specified in the contract, all inspection equipment specified by drawing number in specifications or SQAP forming a part of the contract shall be

43、supplied by the contractor in accordance with applicable technical data listed in the technical data package (TDP). 4. 5.2.2 Contractor design. - The contractor shall design and supply inspection equipment compatible with the “Test Methods and Procedures“ specified in 4.6 of this specification and w

44、ith the compo- nent inspection procedures specified in Examination and “Test Faci- lities“ requirements of MIL-F- 13926. is normally considered to be within 10?0 of the product tolerance for which it is intended, this inherent error in the test equipment design must be considered as part of the pres

45、cribed product tolerance limit. Thus, concept, construction, materials, dimensions, and tolerances . used in the design of test equipment shall be so selected and controlled as to insure that the test equipment will reliably indicate acceptability of a product which does not exceed 90% of the prescr

46、ibed tolerance limit and permit positive rejection when non- conforming. shall be such as to facilitate routine calibration of test equipment. Since tolerance of test equipment Construction 4. 5.3 Test equipment. - In conjunction with 4. 5.2, the standard test equipment listed in Table VI1 shall be

47、utilized in performing the applicable test of 4.6. TABLE VI1 NOMENCLATURE DESCRIPTION Plus 5 +0,2v, 1. D-C Power Supply - 2. D- C Power Supply Plus 220 tlOV, 3. D-C Power Supply - Ripple: 25 mV p-p maximum Ripple: 1O mV p-p maximum Plus 15 +O. 5V, Ripple: 25 mV p-p maximum Accuracy of ti% 4. D-C Vol

48、tmeter Range of O to 30V, 5. Signal Source Capable of providing a d-c level of amplitude specified in item 3. 1, Table I. 9 Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-MIL-C-LLI87L 12 9777706 0277800 MIL- C- 14871(MU) 4.6 Test methods and procedu

49、res. 4.6.1 Test conditions, - Unless otherwise specified, the test conditions shall be in accordance with the “Test Facilities“ require- ments of MIL-F- 13926. 4.6. 1. 1 Initial conditions, - Connect the loads and power to the circuit card assembly as specified in Table I. 4.6.2 Readout selection logic.- (a) (b) Apply the initial conditions of 4.6, 1. 1. Apply the dig