ANSI TIA EIA 455-8-2000 Measurement of Splice or Connector Loss and Reflectance Using an OTDR《使用OTDR的反射和分裂或连结损失的测量》.pdf
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1、 TIA/EIASTANDARDFOTP-8Measurement of Splice or ConnectorLoss and Reflectance Using an OTDRTIA/EIA-455-8MAY 2000TELECOMMUNICATIONS INDUSTRY ASSOCIATIONRepresenting the telecommunications industry inassociation with the Electronic Industries Alliance ANSI/TIA/EIA-455-8-2000Approved: April 25, 2000TIA/
2、EIA-455-8Copyright Telecommunications Industry Association Provided by IHS under license with EIANot for ResaleNo reproduction or networking permitted without license from IHS-,-,-NOTICETIA/EIA Engineering Standards and Publications are designed to serve the public interestthrough eliminating misund
3、erstandings between manufacturers and purchasers, facilitatinginterchangeability and improvement of products, and assisting the purchaser in selecting andobtaining with minimum delay the proper product for his particular need. Existence of suchStandards and Publications shall not in any respect prec
4、lude any member or nonmember ofTIA/EIA from manufacturing or selling products not conforming to such Standards andPublications, nor shall the existence of such Standards and Publications preclude their voluntaryuse by those other than TIA/EIA members, whether the standard is to be used either domest
5、icallyor internationally.Standards and Publications are adopted by TIA/EIA in accordance with the American NationalStandards Institute (ANSI) patent policy. By such action, TIA/EIA does not assume any liabilityto any patent owner, nor does it assume any obligation whatever to parties adopting the St
6、andardor Publication.This Standard does not purport to address all safety problems associated with its use or allapplicable regulatory requirements. It is the responsibility of the user of this Standard toestablish appropriate safety and health practices and to determine the applicability of regulat
7、orylimitations before its use.(From Standards Proposal No. 2828-A and 2828-A-1, formulated under the cognizance of the TIAFO-6.6 Subcommittee on Fibers and Materials.)Published byTELECOMMUNICATIONS INDUSTRY ASSOCIATION 2000Standards and Technology Department2500 Wilson BoulevardArlington, VA 22201PR
8、ICE: Please refer to current Catalog ofEIA ELECTRONIC INDUSTRIES ALLIANCE STANDARDS and ENGINEERING PUBLICATIONS or call Global Engineering Documents, USA and Canada(1-800-854-7179) International (303-397-7956)All rights reservedPrinted in U.S.A.Copyright Telecommunications Industry Association Prov
9、ided by IHS under license with EIANot for ResaleNo reproduction or networking permitted without license from IHS-,-,-PLEASE!DONT VIOLATETHELAW!This document is copyrighted by the TIA and may not be reproduced withoutpermission.Organizations may obtain permission to reproduce a limited number of copi
10、esthrough entering into a license agreement. For information, contact:Global Engineering Documents15 Inverness Way EastEnglewood, CO 80112-5704 or callU.S.A. and Canada 1-800-854-7179, International (303) 397-7956Copyright Telecommunications Industry Association Provided by IHS under license with EI
11、ANot for ResaleNo reproduction or networking permitted without license from IHS-,-,-Copyright Telecommunications Industry Association Provided by IHS under license with EIANot for ResaleNo reproduction or networking permitted without license from IHS-,-,-TIA/EIA-455-8iFOTP-8Measurement of splice or
12、connectorloss and reflectance using an OTDRContentsPageSectionContents iForeword iii1 Introduction 12 Normative References . 13 Apparatus . 24 Sampling and specimens . 25 Procedure 26 Calculation or interpretation of results 67 Documentation 78 Specification information . 8Figure1 Schematic OTDR Tra
13、ce for a fiber lengthcontaining various types of discontinuities 42 Schematic OTDR close-up trace fora reflective splice or connector . 4AnnexA Features of an OTDR . 9B Comparison between FOTP-8and IEC and ITU requirements 12Copyright Telecommunications Industry Association Provided by IHS under lic
14、ense with EIANot for ResaleNo reproduction or networking permitted without license from IHS-,-,-TIA/EIA-455-8ii This page left blank. Copyright Telecommunications Industry Association Provided by IHS under license with EIANot for ResaleNo reproduction or networking permitted without license from IHS
15、-,-,-TIA/EIA-455-8iiiFOTP-8Measurement of splice or connectorloss and reflectance using an OTDRForeword(This foreword is informative and is not a part of this standard.)This document comes from TIA Standards Proposal No. 2828A, formulated under the cognizanceof TIA FO-6.3, Subcommittee on Fiber Opti
16、c Interconnecting Devices. It has not been previouslypublished.This FOTP is part of the series of test procedures included within Recommended StandardTIA/EIA-455.There are two Annexes, one normative, the other informative.Key words: splice, connector, reflectance, OTDRCopyright Telecommunications In
17、dustry Association Provided by IHS under license with EIANot for ResaleNo reproduction or networking permitted without license from IHS-,-,-TIA/EIA-455-8ivThis page left blank.Copyright Telecommunications Industry Association Provided by IHS under license with EIANot for ResaleNo reproduction or net
18、working permitted without license from IHS-,-,-TIA/EIA-455-81FOTP-8Measurement of splice or connectorloss and reflectance using an OTDR1 Introduction1.1 IntentThis procedure describes the use of an optical time-domain reflectometer (OTDR) to indirectlymeasure the loss and reflectance of a splice or
19、connector.1.2 Other methodsLoss or reflectance measurements may be obtained also by using FOTP-34 or FOTP-107. Thelatter values will be accepted as correct in the event of a dispute.1.3 Trace defectsSome OTDR/fiber combinations appear to give “noisy” traces that may be repeatable for a givenOTDR but
20、 not against other OTDRs with the same fiber. These appear to be related topolarization and coherence effects, and are being studied in FO-6.6. Some OTDR manufacturersoffer noise filters, internal or external to the OTDR, and care shall be taken that these do not mask“true” artifacts of the trace. M
21、oreover, parts of the trace that are noisy due to low signal-to-noiseratio shall not be used.2 Normative referencesFOTP-34 (TIA/EIA/-455-34A) Interconnection device insertion loss testFOTP-57 (TIA/EIA-455-57B) Optical fiber end preparation and examinationFOTP-60 (TIA/EIA-455-60A) Measurement of fibe
22、r or cable length using an OTDRFOTP-77 (EIA/TIA-455-77) Fabricating and qualifying a higher-order mode filter forsingle-mode fiber measurementsCopyright Telecommunications Industry Association Provided by IHS under license with EIANot for ResaleNo reproduction or networking permitted without license
23、 from IHS-,-,-TIA/EIA-455-82FOTP-78 (EIA/TIA-455-78A) Spectral attenuation cutback measurement for single-modefibersFOTP-107 (EIA/TIA-455-107A) Return loss for fiber optic componentsIEC 86(Secretariat)49, revised Calibration of optical time-domain reflectometers3 ApparatusSee Annex A.4 Sampling and
24、specimens4.1 Specimens are one or more splices or connectors within a fiber on a reel, within a cable,or under a condition specified in the Detail Specification. Care should be taken so that thewinding does not introduce artificial loss or reflection. The measurement may be performed in thefactory o
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- ANSITIAEIA45582000MEASUREMENTOFSPLICEORCONNECTORLOSSANDREFLECTANCEUSINGANOTDR 使用 OTDR 反射 分裂 连结 损失 测量

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