ANSI TIA EIA 455-157-1994 Measurement of Polarization Dependent Loss (PDL) of Single-Mode Fiber Optic Components《单模光纤组分的相关偏振损耗的测量》.pdf
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1、TINEIA STANDARD ANSI/TIA/EIA-455-157-1994 Approved: December 5, 1994 Reaffirmed: mly 18, 2000 FOTP-157 Measurement of Polarization Dependent Loss (PDL) of SingleMode Fiber Optic Components TINEIA-455457 MAY 1995 - TELECOMMUNICATIONS INDUSTRY ASSOCIATION /- Representing the tekcommuuimions indoniy in
2、 iuoci11i0rI wiIh the ElecImnic IndusInes Aiinnec Elartionic Industrisa Alliance Copyright Electronic Industries Alliance Provided by IHS under license with EIANot for ResaleNo reproduction or networking permitted without license from IHS-,-,-NOTICE TLAIEL4 Engineering Standards and Publications are
3、 designed to serve the public interest through eliminating misunderstandings between manufacturers and purchasers, facilitating interchangeability and improvement of products, and assisting the purchaser in selecting and obtaining with minimum delay the proper product for his particular need. Existe
4、nce of such Standards and Publications shall not in any respect preclude any member or nonmember of TINEIA from manufacturing or selling products not conforming to such Standards and Publications, nor shall the existence of such Standards and Publications preclude their voluntary use by those other
5、than TINEIA members, whether the standard is to be used either domestically or internationally. Standards and Publications are adopted by TINEIA in accordance with the American National Standards Institute (ANSI) patent policy. By such action, TIAEIA does not assume any liability to any patent owner
6、, nor does it assume any obligation whatever to parties adopting the Standard or Publication. This Standard does not purport to address all safety problems associated with its use or all applicable regulatory requirements. It is the responsibility of the user of this Standard to establish appropriat
7、e safety and health practices and to determine the applicability of regulatory limitations before its use. (From Standards Proposal No. 4639, formulated under the cognizance of the TIA FO-6.3 Subcommittee on Fiber Optic Interconnecting Devices.) This Document was reaffirmed by the American National
8、Standards Institute (ANSI) on July 18,2000, and by the TIA. Published by TELECOMMUNICATIONS INDUSTRY ASSOCIATION 1994 Standards and Technology Department 2500 Wilson Boulevard Arlington, VA 22201 PRICE: Please refer to current Catalog of PUBLICATIONS or call Global Engineering Documents, USA and Can
9、ada (1-800-854-7179) International (303-397-7956) EIA ELECTRONIC INDUSTRIES ALLIANCE STANDARDS and ENGINEERING All rights reserved Printed in U.S.A. Copyright Electronic Industries Alliance Provided by IHS under license with EIANot for ResaleNo reproduction or networking permitted without license fr
10、om IHS-,-,-PLEASE! DONT VIOLATE THE LAW! This document is copyrighted by the TIA and may not be reproduced without obtah permission to reproduce a limited number of copies a license agreement. For kiformation, contact: U.S.A. ational(303) 397-79 Copyright Electronic Industries Alliance Provided by I
11、HS under license with EIANot for ResaleNo reproduction or networking permitted without license from IHS-,-,-Copyright Electronic Industries Alliance Provided by IHS under license with EIANot for ResaleNo reproduction or networking permitted without license from IHS-,-,-TINEIA-455-1 57 FOTP-157 Measu
12、rement of polarization dependent loss (PDL) of single-mode fiber optic components Contents Foreword . introduction Applicable documents . Apparatus . Sampling and specimens . Procedure Calculations or interpretation of results . Documentation . Specification information Annex A . Comparison between
13、FOTP-157 and IEC. ISO. and ITU requirements iii 1 2 3 6 6 10 11 11 12 i Copyright Electronic Industries Alliance Provided by IHS under license with EIANot for ResaleNo reproduction or networking permitted without license from IHS-,-,-TINEIA-455-1 57 This page left blank. ii Copyright Electronic Indu
14、stries Alliance Provided by IHS under license with EIANot for ResaleNo reproduction or networking permitted without license from IHS-,-,-TINEIA-455-1 57 FOTP-I 57 Measurement of polarization dependent loss (PDL) of single-mode fiber optic components Foreword (This Foreword is informative only and is
15、 not part of this Standard.) This test procedure is from TIA Standards Proposal No. 3099, formulated under the cognizance of TIA FO-6.3, Subcommittee on Interconnecting Devices) This FOTP forms a part of the series of test procedures included within Recommended Standard EIATIA-455. There is one anne
16、x, which is informative. Key words: polarization dependent loss, polarization, all states, linear. iii Copyright Electronic Industries Alliance Provided by IHS under license with EIANot for ResaleNo reproduction or networking permitted without license from IHS-,-,-TINEIA-455-1 57 This page left blan
17、k. iv Copyright Electronic Industries Alliance Provided by IHS under license with EIANot for ResaleNo reproduction or networking permitted without license from IHS-,-,-TINEIA-455-1 57 1 Introduction 1.1 Intent The intent of this test is to determine the sensitivity of single-mode fiber optic compone
18、nts to changes in polarization. 1.2 Scope This procedure can be applied to any single-mode passive component, including connectors, splices, couplers, attenuators, isolators and switches. It is used to measure the total range of insertion loss, da, due. to changes in polarization of the launch state
19、. This procedure can also be used to measure the polarization dependence of isolated ports. For branching devices, it can also be used to measure the total range of coupling ratio, ACR(i). It cannot be used to measure polarization maintaining components or to measure the polarization dependence of r
20、eturn loss. Two methods for measuring the polarization dependence are described. Method A will determine the maximum polarization sensitivity over all possible polarization states including linear, circular and elliptical. Method B will determine the maximum polarization sensitivity over all linearl
21、y polarized launch states. Method A is preferred, particularly for any device in which the polarization state of light passing through the device is changed. If Method 6 is used, characterization using all polarization states is recommended to ensure that it is adequate for a particular component. M
22、ethod B will generally understate the polarization sensitivity of devices which are not dependent on linearly polarized light. Therefore, it is not recommended for tests where the device under test (DUT) has not been characterized to be sensitive to purely linear polarized light. 1.3 Description 1.3
23、.1 Method A Light is launched into the input port of the device under test such that linear, circular, and elliptical states of polarization with different axes of orientation can be adjusted while the power from the output port is monitored. The input power is also monitored by tapping some of the
24、power through a polarization- independent branching device. By adjusting for the maximum and minimum power through the component, the polarization sensitivity of the insertion loss can be obtained. For branching devices, it can also be used to measure the total range of coupling ratio. 1 Copyright E
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