ANSI N42.20-2003 Performance Criteria for Active Personnel Radiation Monitors《个人放射性辐射监视仪的性能标准》.pdf
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1、ANSI N42.20-2003(Revision ofANSI N42.20-1995)IEEE StandardsN42.20American National StandardPerformance Criteria for ActivePersonnel Radiation MonitorsPublished by The Institute of Electrical and Electronics Engineers, Inc.3 Park Avenue, New York, NY 10016-5997, USA2 February 2004Accredited by the Am
2、erican National Standards InstituteSponsored by theNational Committee on Radiation Instrumentation, N42IEEE StandardsPrint: SH95185PDF: SS95185Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEENot for ResaleNo reproduction or networking perm
3、itted without license from IHS-,-,-The Institute of Electrical and Electronics Engineers, Inc.3 Park Avenue, New York, NY 10016-5997, USACopyright 2004 by the Institute of Electrical and Electronic Engineers, Inc.All rights reserved. Published 2 February 2004. Printed in the United States of America
4、.Print:ISBN 0-7381-3861-4 SH95185PDF:ISBN 0-7381-3862-2 SS95185No part of this publication may be reproduced in any form, in an electronic retrieval system or otherwise, without the prior written permission from the publisher.ANSI N42.20-2003(Revision ofANSI N42.20-1995)American National Standard Pe
5、rformance Criteria for Active Personnel Radiation MonitorsSponsorNational Committee on Radiation Instrumentation, N42Accredited by the American National Standards InstituteSecretariatThe Institute of Electrical and Electronics Engineers, Inc.Approved 22 August 2003American National Standards Institu
6、teAbstract:Performance and design criteria are provided in this standard for monitors that are wornon the trunk of the body to measure the personal dose equivalent, or the dose equivalent rate fromexternal sources, of ionizing radiation.This is a revision of ANSI N42.20-1995.Keywords:design criteria
7、, ionizing radiation, monitors, performance criteria, personnel radiationmonitors, radiation, radiation instrumentation, radiation monitorsCopyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEENot for ResaleNo reproduction or networking permitte
8、d without license from IHS-,-,-American National StandardAn American National Standard implies a consensus of those substantially concerned with its scope and pro-visions. An American National Standard is intended as a guide to aid the manufacturer, the consumer, andthe general public. The existence
9、 of an American National Standard does not in any respect preclude any-one, whether he has approved the standard or not, from manufacturing, marketing, purchasing, or usingproducts, processes, or procedures not conforming to the standard. American National Standards are subjectto periodic reviews an
10、d users are cautioned to obtain the latest editions.CAUTION NOTICE:This American National Standard may be revised or withdrawn at any time. The pro-cedures of the American National Standards Institute require that action be taken to affirm, revise, or with-draw this standard no later than five years
11、 from the date of publication. Purchasers of American NationalStandards may receive current information on all standards by calling or writing the American NationalStandards Institute.Authorization to photocopy portions of any individual standard for internal or personal use is granted by theInstitu
12、te of Electrical and Electronics Engineers, Inc., provided that the appropriate fee is paid to CopyrightClearance Center. To arrange for payment of licensing fee, please contact Copyright Clearance Center, Cus-tomer Service, 222 Rosewood Drive, Danvers, MA 01923 USA; +1-978-750-8400. Permission to p
13、hoto-copy portions of any individual standard for educational classroom use can also be obtained through theCopyright Clearance Center.Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEENot for ResaleNo reproduction or networking permitted wi
14、thout license from IHS-,-,-Copyright 2004 IEEE. All rights reserved.iiiIntroduction(This introduction is not part of ANSI N42.20-2003, American National Standard Performance Criteria for Active Per-sonnel Radiation Monitors.)This standard is the responsibility of the Accredited American Standards Co
15、mmittee on Radiation Instru-mentation, N42. Committee N42 delegated development of this standard to Subcommittee N42.RPI. Draftswere reviewed by Committee N42, Subcommittee N42.RPI, and other interested parties, and the commentsreceived were utilized in producing the standard as finally approved. Pa
16、rticipantsAt the time it approved this standard, the Accredited Standards Committee on Radiation Instrumentation,N42 had the following membership:Louis Costrell,ChairMichael P. Unterweger,Vice ChairSue Vogel,Administrative SecretaryOrganization Represented Name of RepresentativeAmerican Conference o
17、f Governmental Industrial Hygienists. Jesse LiebermanBartlett Services.Morgan CoxBicron.Joseph G. BellianChew, M.H. Jack M. SelbyCommerce Dept., U.S. NIST .Michael P. UnterwegerLouis Costrell (Alt.)Eberline Instruments Mitchell TruittEntergy-ANO Ron SchwartzFemo-TECH Inc Richard StraubGamma Metrics
18、Inc. Ernesto A. CorteGeneral Activities Inc Karl ReinitzHealth Physics Society Joseph R. StencelInstitute of Electrical and Electronics Engineers, Inc. Louis CostrellJulian Forster (Alt.)Anthony J. Spurgin (Alt.)Lawrence Berkeley National Laboratory. Edward J. LampoLawrence Livermore National Labora
19、tory. Gary JohnsonMassachusetts Institute of Technology, Bates Linear Accelerator Center, RPO .Frank X. MasseNASA, GFSC.H. Sachidananda BabuNuclear Standards Unlimited.Al N. TschaecheOak Ridge National Laboratory Charles L. BrittonPeter J. Chiaro, Jr. (Alt.)ORTEC.Ronald M. KeyserOverhoff Technology
20、Corporation Mario W. OverhoffPacific Northwest Lab. Joseph C. McDonald Swinth Associates Kenneth L. SwinthTennelec .Larry DarkenTennessee, University of William W. BuggThermo-electron.Richard P. OxfordTranslucent.G. Laurie MillerU.S. Army Edward GroeberWisconsin Public Service Group Timothy Martinso
21、nMembers-at-Large. Paul L. PhelpsLee J. WagnerCopyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEENot for ResaleNo reproduction or networking permitted without license from IHS-,-,-ivCopyright 2004 IEEE. All rights reserved.At the time this st
22、andard was approved, Subcommittee N42.RPI had the following membership:Jack M. Selby,ChairAt the time this standard was approved, the Working Group had the following membership:Joseph C. McDonald, Chair and Project LeaderJoseph G. Bellian Peter J. Chairo, Jr. Morgan Cox Henry FongRobert Ford Mark M.
23、 Hoover Joseph G. Johnson Michelle L. JohnsonR. L. Kathren Michael J. Lantz Sergio Lopez Jimmy LittleJoseph C. McDonald Richard P. Oxford Carl R. Siebentritt Al N. TschaecheEd Walker Chuan-Fu WuPeter J. Chiaro, Jr.Morgan CoxMichael W. Lantz Sergio LopezJack M. SelbyCopyright The Institute of Electri
24、cal and Electronics Engineers, Inc. Provided by IHS under license with IEEENot for ResaleNo reproduction or networking permitted without license from IHS-,-,-Copyright 2004 IEEE. All rights reserved.vContents1. Overview . 11.1 Purpose. 11.2 Scope 11.3 Relationship to international standards 22. Refe
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