ANSI N323C-2009 Radiation Protection Instrumentation Test and Calibration - Air Monitoring Instruments《辐射防护仪器测试和校准.大气监测仪器》.pdf

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11、3#23#23#23#23#23#23#23#23#23#23g49;#23#23#23#23#23#23#23#23#23#23#23#23#23#23#23#23#23#23#23#23#23#23;#23#23#23#23#23#23#23#23#23#23#23#23#23#23#23#23#23#23#23#23#23;#23#23#23#23#23#23#23#23#23#23#23#23#23#23#23#23#23#23#23#23#23#23g38Authorized licensed use limited to: IHS Stephanie Dejesus. Downlo

12、aded on November 20, 2009 at 05:07 from IEEE Xplore. Restrictions apply. Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEENot for ResaleNo reproduction or networking permitted without license from IHS-,-,-Authorized licensed use limited to:

13、 IHS Stephanie Dejesus. Downloaded on November 20, 2009 at 05:07 from IEEE Xplore. Restrictions apply. Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEENot for ResaleNo reproduction or networking permitted without license from IHS-,-,-ANSI

14、N323C-2009 American National Standard for Radiation Protection Instrumentation Test and Calibration Air Monitoring Instruments Sponsor National Committee on Radiation Instrumentation, N42 Accredited by the American National Standards Institute Secretariat Institute of Electrical and Electronics Engi

15、neers, Inc. Approved 21 May 2009 American National Standards Institute Authorized licensed use limited to: IHS Stephanie Dejesus. Downloaded on November 20, 2009 at 05:07 from IEEE Xplore. Restrictions apply. Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under

16、 license with IEEENot for ResaleNo reproduction or networking permitted without license from IHS-,-,-Abstract: Test and calibration requirements for air monitoring instruments used for the detection and measurement of airborne radioactive substances are established. Keywords: calibration, radioactiv

17、e air monitoring, tests The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright 2009 by the Institute of Electrical and Electronics Engineers, Inc. All rights reserved. Published 6 November 2009. Printed in the United States of America. IEEE

18、is a registered trademark in the U.S. Patent +1-978-750-8400. Permission to photocopy portions of any individual standard for educational classroom use can also be obtained through the Copyright Clearance Center. Authorized licensed use limited to: IHS Stephanie Dejesus. Downloaded on November 20, 2

19、009 at 05:07 from IEEE Xplore. Restrictions apply. Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEENot for ResaleNo reproduction or networking permitted without license from IHS-,-,-Introduction This introduction is not part of ANSI N323C-

20、2009, American National Standard for Radiation Protection Instrumentation Test and CalibrationAir Monitoring Instruments. This standard is the responsibility of the Accredited American Standards Committee on Radiation Instrumentation, N42. The standard was approved by N42 letter ballot. Notice to us

21、ers Laws and regulations Users of these documents should consult all applicable laws and regulations. Compliance with the provisions of this standard does not imply compliance to any applicable regulatory requirements. Implementers of the standard are responsible for observing or referring to the ap

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27、EE-SA Web site at http:/standards.ieee.org. Errata Errata, if any, for this and all other standards can be accessed at the following URL: http:/standards.ieee.org/reading/ieee/updates/errata/index.html. Users are encouraged to check this URL for errata periodically. v Copyright 2009 IEEE. All rights

28、 reserved. Authorized licensed use limited to: IHS Stephanie Dejesus. Downloaded on November 20, 2009 at 05:07 from IEEE Xplore. Restrictions apply. Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEENot for ResaleNo reproduction or networkin

29、g permitted without license from IHS-,-,-Interpretations Current interpretations can be accessed at the following URL: http:/standards.ieee.org/reading/ieee/interp/ index.html. Patents Attention is called to the possibility that implementation of this standard may require use of subject matter cover

30、ed by patent rights. By publication of this standard, no position is taken with respect to the existence or validity of any patent rights in connection therewith. The IEEE is not responsible for identifying Essential Patent Claims for which a license may be required, for conducting inquiries into th

31、e legal validity or scope of Patents Claims or determining whether any licensing terms or conditions provided in connection with submission of a Letter of Assurance, if any, or in any licensing agreements are reasonable or non-discriminatory. Users of this standard are expressly advised that determi

32、nation of the validity of any patent rights, and the risk of infringement of such rights, is entirely their own responsibility. Further information may be obtained from the IEEE Standards Association. vi Copyright 2009 IEEE. All rights reserved. Authorized licensed use limited to: IHS Stephanie Deje

33、sus. Downloaded on November 20, 2009 at 05:07 from IEEE Xplore. Restrictions apply. Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEENot for ResaleNo reproduction or networking permitted without license from IHS-,-,-vii Copyright 2009 IEEE.

34、 All rights reserved. Participants At the time it approved this standard, the Accredited Standards Committee on Radiation Instrumentation, N42, had the following membership: Michael P. Unterweger, Chair Louis Costrell, Deputy Chair William Ash, Administrative Secretary Organization Represented.Name

35、of Representative Bartlett Services . Morgan Cox Canberra .Markku Koskelo Chew, M.H . Jack M. Selby Commerce Dept, U.S. NIST.Michael P. Unterweger .Louis Costrell (Alt.) Consultant Frank X. Masse Department of Homeland Security.Peter Shebell Entergy-ANO . Ron Schwartz Health Physics Society .Sandy P

36、erle IEEE . Louis Costrell Anthony Spurgin (Alt.) Michael P. Unterweger (Alt.) International Medcom Don Sythe Lawrence Berkeley National Laboratory.Edward J. Lampo Lawrence Livermore National Laboratory Gary Johnson NASA, GSFC R. Sachidananda Babu Nuclear Regulatory Commission Cynthia Jones Nuclear

37、Standards Unlimited Al N. Tschaeche Oak Ridge National Laboratory Peter J. Chiaro, Jr. . Charles Britton (Alt.) ORTEC Ronald M. Keyser Pacific Northwest National Laboratory. Richard Kouzes Swinth AssociatesKenneth L. Swinth U.S. Army Edward Groeber U.S. Nuclear Regulatory Commission. Cynthia G. Jone

38、s Members-At-LargeErnesto Corte . Joseph C. McDonald Paul L. Phelps . Joseph Stencel Lee J. Wagner Authorized licensed use limited to: IHS Stephanie Dejesus. Downloaded on November 20, 2009 at 05:07 from IEEE Xplore. Restrictions apply. Copyright The Institute of Electrical and Electronics Engineers

39、, Inc. Provided by IHS under license with IEEENot for ResaleNo reproduction or networking permitted without license from IHS-,-,-At the time this standard was approved, Subcommittee N42.RPI had the following membership: Morgan Cox, Co-Chair Jack M. Selby, Co-Chair Dru Carson Peter J. Chiaro, Jr. Jac

40、k Cooley Leo Faust Edward Groeber Jerry Hiatt Mark D. Hoover Ron Keyser J. C. McDonald Robert Murphy Cheryl Olson Scott Rogers Michael P. Unterweger Ed Walker Chuan-Fu Wu At the time this standard was approved, the ANSI N323C Working Group had the following members: Michelle L. Johnson, Co-Chair Mar

41、k D. Hoover, Co-Chair L. Bryan Belvin Brent Blunt Morgan Cox Stephen A. Epperson Michael S. Ford Robert J. Ford John A. Glissmeyer Robert A. Kellner Timothy Martinson George J. Newton John C. Rodgers Johnafred M. Thomas James T. Voss viii Copyright 2009 IEEE. All rights reserved. Authorized licensed

42、 use limited to: IHS Stephanie Dejesus. Downloaded on November 20, 2009 at 05:07 from IEEE Xplore. Restrictions apply. Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEENot for ResaleNo reproduction or networking permitted without license fr

43、om IHS-,-,-Contents 1. Overview 1 1.1 Scope . 1 1.2 Purpose 2 1.3 Special word usage 2 2. Relationship to other standards. 2 3. Definitions 3 4. Program elements . 6 4.1 Type testing . 6 4.2 Acceptance testing. 6 4.3 Initial calibration 7 4.4 Functional checks 7 4.5 Maintenance and recalibration. 8

44、4.6 Performance tests. 9 5. Air flow rate calibrations 10 6. Instrument calibrations . 10 6.1 Pre-calibration inspection 10 6.2 As-found readings 11 6.3 Electronic calibration. 11 6.4 Meters and chart recorders. 11 6.5 Background response verification . 12 6.6 Calibration of background subtraction 1

45、3 6.7 Alarm circuit verification. 13 6.8 Radiological calibration. 13 7. Additional calibration requirements for particulate and noble gas monitors 13 7.1 Alpha and beta particulate monitors 14 7.2 Keep-alive sources. 14 7.3 Noble gas monitors 14 8. Calibration for special conditions. 15 9. Faciliti

46、es, conditions, and equipment . 16 9.1 Calibration facility. 16 9.2 Test and calibration conditions 16 9.3 Calibration standards . 17 9.4 Maintenance of standards 17 9.5 Check sources 18 10. Documentation . 18 10.1 Facility documentation 18 10.2 Instrument documentation . 19 ix Copyright 2009 IEEE.

47、All rights reserved. Authorized licensed use limited to: IHS Stephanie Dejesus. Downloaded on November 20, 2009 at 05:07 from IEEE Xplore. Restrictions apply. Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEENot for ResaleNo reproduction or

48、 networking permitted without license from IHS-,-,-x Copyright 2009 IEEE. All rights reserved. Annex A (informative) Summary of a life-cycle approach to instrument development and application 20 Annex B (informative) Flow rate meter calibrations 22 Annex C (informative) Bibliography 23 Authorized li

49、censed use limited to: IHS Stephanie Dejesus. Downloaded on November 20, 2009 at 05:07 from IEEE Xplore. Restrictions apply. Copyright The Institute of Electrical and Electronics Engineers, Inc. Provided by IHS under license with IEEENot for ResaleNo reproduction or networking permitted without license from IHS-,