ANSI INCITS 234-1993 Information Systems - Test Methods for Media Characteristics - 130-mm Rewritable Optical Disk Data Storage Cartridges with Continuous Composite Servo (CCS).pdf

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1、ANSI INCITS 234-1993 (R2003)(formerly ANSI X3.234-1993 (R1998)for Information Systems Test Methods for MediaCharacteristics 130-mm Rewritable OpticalDisk Data Storage Cartridgeswith Continuous CompositeServo (CCS)ANSIX3.234-1993American National Standardfor Information Systems Test Methods for Media

2、 Characteristics 130-mm Rewritable Optical Disk Data StorageCartridges with Continuous Composite Servo (CCS)SecretariatComputer and Business Equipment Manufacturers AssociationApproved November 2, 1993American National Standards Institute, Inc.AmericanNationalStandardApproval of an American National

3、 Standard requires review by ANSI that therequirements for due process, consensus, and other criteria for approval havebeen met by the standards developer.Consensus is established when, in the judgment of the ANSI Board of StandardsReview, substantial agreement has been reached by directly and mater

4、iallyaffected interests. Substantial agreement means much more than a simplemajority, but not necessarily unanimity. Consensus requires that all views andobjections be considered, and that a concerted effort be made toward theirresolution.The use of American National Standards is completely voluntar

5、y; their existencedoes not in any respect preclude anyone, whether he has approved the standardsor not, from manufacturing, marketing, purchasing, or using products, processes,or procedures not conforming to the standards.The American National Standards Institute does not develop standards and will

6、inno circumstances give an interpretation of any American National Standard.Moreover, no person shall have the right or authority to issue an interpretation ofan American National Standard in the name of the American National StandardsInstitute. Requests for interpretations should be addressed to th

7、e secretariat orsponsor whose name appears on the title page of this standard.CAUTION NOTICE: This American National Standard may be revised orwithdrawn at any time. The procedures of the American National StandardsInstitute require that action be taken periodically to reaffirm, revise, or withdrawt

8、his standard. Purchasers of American National Standards may receive currentinformation on all standards by calling or writing the American National StandardsInstitute.CAUTION: The developers of this standard have requested that holders of patents that may be required for theimplementation of the sta

9、ndard disclose such patents to the publisher. However, neither the developers nor the publisherhave undertaken a patent search in order to identify which, if any, patents may apply to this standard. As of the date ofpublication of this standard, following calls for the identification of patents that

10、 may be required for the implementation ofthe standard, notice of one or more such claims has been received. By publication of this standard, no position is takenwith respect to the validity of this claim or of any rights in connection therewith. The known patent holder(s) has (have),however, filed

11、a statement of willingness to grant a license under these rights on reasonable and nondiscriminatory termsand conditions to applicants desiring to obtain such a license. Details may be obtained from the publisher. No furtherpatent search is conducted by the developer or publisher in respect to any s

12、tandard it processes. No representation ismade or implied that this is the only license that may be required to avoid infringement in the use of this standard.Published byAmerican National Standards Institute11 West 42nd Street, New York, New York 10036Copyright 1994 by Information Technology Indust

13、ry Council (ITI)All rights reserved.No part of this publication may be reproduced in anyform, in an electronic retrieval system or otherwise,without prior written permission of ITI, 1250 Eye Street NW,Washington, DC 20005.Printed in the United States of AmericaiForeword .ii1 Scope and purpose12 Norm

14、ative references.13 Definitions .24 Testing environment 25 Test items36 Test conditions 37 Test methods.6Tables1 List of test items 42 Read characteristics 19Figures1 Particle size distribution .52 Mechanical test system block diagram63 Typical servo system control loop.74 Actuator signal method blo

15、ck diagram 85 Error signal test method block diagram.96 Optical system with position sensor107 Position sensor method block diagram .108 Resolution .129 Write power repeatability1510 Read power repeatability1511 Amplitude vs. frequency .1612 Cross-track signal 19AnnexesA Optical system for measuring

16、 write, read, and erase characteristics20B Signal imbalance and Figure of Merit definitions .22C Write pulse definitions23D Preformat definitions 24E 1500-Hz filter implementation.25F Bibliography.26ContentsPageiiForeword (This foreword is not part of American National Standard X3.234-1993.)This sta

17、ndard presents test methods for 130-mm rewritable optical diskcartridges with continuous composite servo (CCS). These methods are tobe used for information interchange among processing systems, communi-cation systems, and associated equipment utilizing a standard code forinterchange. This standard d

18、eals with methods and procedures for testingmedia characteristics.The TC X3B11 Subcommittee on optical digital data disk cartridges, whichdeveloped this standard, consists of experienced and qualified specialists inrecording digital information on optical media. In the development of thisstandard, c

19、areful consideration was given to current practices and existingequipment and supplies with the broadest possible acceptance, and to pro-vide a basis for future improvements in the use of this cartridge medium.This standard contains six annexes. Annexes AD are normative and areconsidered part of thi

20、s standard. Annexes E and F are informative and arenot considered part of this standard.Requests for interpretation, suggestions for improvements or addenda, ordefect reports are welcome. They should be sent to the X3 Secretariat,Computer and Business Manufacturers Association, 1250 Eye Street, NW,S

21、uite 200, Washington, DC 20005.This standard was developed in conjunction with the related 130-mmrewritable media standard, American National Standard for Informationsystems 130-mm rewritable optical disk cartridge for information inter-change, ANSI X3.212-1992, and was processed and approved for su

22、bmit-tal to ANSI by the Accredited Standards Committee on InformationTechnology, X3. Committee approval of this standard does not necessarilyimply that all committee members voted for its approval. At the time itapproved this standard, the X3 Committee had the following members:James D. Converse, Ch

23、airDonald C. Loughry, Vice-ChairJoanne Flanagan, SecretaryOrganization Represented Name of RepresentativeAmerican Nuclear SocietyGeraldine C. MainSally Hartzell (Alt.)AMP, Inc. Edward KellyCharles Brill (Alt.)Apple Computer, IncKaren HigginbottomAssociation of the Institute for Certification of Comp

24、uter Professionals (AICCP).Kenneth ZemrowskiAT Atsugi 243-01, Japan; 1989; Doc. No.5.2; IEEE/LEOS Optical Data Storage TopicalMeeting2)Observation of Thermo Magneto-Optical(TMO) Domain Reversal by Read during WriteTechniques, P. Bergthold, A. Mendez, R.Krenik; Los Angeles, CA; 1990; Doc. No. PD5,Opt

25、ical Society of America, Optical DataStorage Topical Meeting3)Statistical Process Control Manual, AutomotiveDivision, American Society for Quality Control,Milwaukee, WI, 1986, ISBN 0-87389-024-84)3 Definitions3.1 Kerr rotation: The rotation of the planeof polarization of an optical beam upon reflec-

26、tion from the recording layer. In the case ofelliptical polarization, the Kerr rotation is therotation of the major axis of the ellipse.3.2 polarization: The direction of polariza-tion of an optical beam is the direction of theelectric field vector of the beam. The plane ofpolarization is right-hand

27、ed; to an observerlooking in the direction from which the light iscoming, the end point of the electric vectorwould appear to describe an ellipse in theclockwise sense.3.3 prerecorded information: Nonalterableinformation that can be read from the disk butcannot be changed once the disk is manufac-tu

28、red.3.4 tilt: The angle between the normal tothe entrance surface and the normal to thedisk reference plane.ANSI X3.234-199322)Available from the authors at Fujitsu Laboratories, Ltd., 10-1, Morinisato-Wakamiya, Atsugi 243-01, Japan.3)Available from the authors at Komag, Inc., 275 South Hillview Dri

29、ve, Milpitas, CA 95035.4)Available from the American Society for Quality Control, 310 West Wisconsin Ave., Milwaukee, Wl 53203.ANSI X3.234-19934.2.3 EraseThe erase power is the power required toerase marks written at a specific rotation fre-quency and radial position. The erase powerfor erasing cond

30、itions shall be specified in thecontrol tracks. The actual erase power shallbe within 10% of that specified in the controltracks. Testing shall be carried out at either: DC power given in bytes 4547 of theSFP; or constant pulse width and a pulse powerappropriate to the radius, given in bytes3840 of

31、the SFP; or constant pulse power and pulse widthappropriate to the radius, given in bytes4547 of the SFP.The required power shall not exceed 10 mWin case of DC erasing, or shall not exceed:where Tpis the pulse width from 10 to 70 ns.For pulse widths exceeding 70 ns, the erasepower shall not exceed 1

32、0 mW. The magneticfield intensity shall be between 18 000 A/mand 32 000 A/m. The erase magnetic shall benormal to the recording surface. The directionof the magnetic field shall be from the record-ing layer to the entrance surface. The residualsignal after erasure shall be less than 40 dBrelative to

33、 the original signal level of the writ-ten marks.4.2.4 WriteWritten marks shall be made by optical powersuperimposed upon a specific bias power of1.5 mW 10%. The pulse shape is defined inannex C. Testing shall be carried out at either: constant pulse width and power appro-priate to the radius given

34、in bytes 2224 or2527 or 2830 of the SFP zone; or constant pulse power given in byte 31and a pulse width appropriate to the radiusgiven in bytes 3234 of the SFP zone.For radii other than 30, 45, or 60 mm, the val-ues shall be determined by linear interpreta-751Tp+1TpmWtion. The actual power and pulse

35、 width shallbe within 5% of those selected. Therequired power shall not exceed:The pulse width shall be between 1070 ns. Fora pulse width exceeding 70 ns, the power shallnot exceed 10 mW. The magnetic field intensityshall be between 18 000 A/m and 32 000 A/m.The write field shall be normal to the re

36、cordingsurface and shall be in the direction from theentrance surface to the recording layer.4.2.5 Disk rotationThe rotation frequency of the optical disk shallbe 30.0 Hz + 0.3 Hz. The direction of rotationshall be counterclockwise when viewed fromthe objective lens.5 Test itemsTable 1 shows a list

37、of test items. The lastcolumn denotes subclauses of this document.The first column represents the associatedsubclauses of the media standard, ISO/IEC10090. The third column indicates whether aparticular item is an accepted industry prac-tice; no test procedure for those characteris-tics will be incl

38、uded in this document.6 Test conditions6.1 Testing environment Air cleanliness100 000Classification of air cleanliness is based onparticulate count with maximum allowablenumber of minimum sized particles per unitvolume and on statistical average particle sizedistribution.Class 100 000 is defined in

39、Federal Standard209D.5)In summary, it states that there shallbe no more than 100 000 particles of 0.5micrometers in size per cubic foot and nomore than 700 particles of 5.0 micrometers insize per cubic foot. See figure 1751Tp+1TpmW35)For more information on this standard, see annex F, Bibliography.A

40、NSI X3.234-19934Table 1 List of test itemsSubclauses ofISO|IEC 10090 Test itemsAccepted industrypractice (A.I.P.)Relevantsubclauses of TestMethod Standard,ANSI X3.23411.3 Moment of inertia X 7.111.4 Imbalance X 7.211.5 Axial deflection 7.311.6 Axial acceleration 7.411.7 Dynamic radial runout 7.511.8

41、 Radial acceleration 7.611.9 Tilt X 7.712.0 Drop test 7.814.1 Refractive index X 7.914.2 Thickness X 7.1015.2 Reflectance 7.1115.3.1 Resolution 7.1215.3.2 Imbalance of themagneto-optic signal7.1315.1.4 Erase characteristics 7.1415.1.3 Write characteristics 7.1515.1.2 Read characteristics 7.1615.3.3

42、Figure of merit 7.1715.3.4 Narrow-band signal-to-noise ratio7.1815.3.5 Cross-talk 7.1916.4.2 PEP Cross-track loss 7.2117.1.2 Prerecordedcharacteristics7.20ANSI X3.234-19936.2 Storage environment Air cleanliness(normal office environment)Normal office environment is an extrapolationof U.S. air cleanl

43、iness class when measuredin units per cubic foot (see Federal StandardNo. 209D).6.3 Measurement setup6.3.1 General test equipmentTest methods for 130-mm optical media con-tain setup parameters that are listed for boththe tester and the support equipment.The test equipment should be of high repro-duc

44、ibility and repeatability and shall conform tothe following description of the PerformanceTolerance Ratio (P/T) where:P/T = 6 SD/TOLERANCE 2k Hz Phase margin 40Lens actuatorLens movement sensorObjective lensBeamOptical systemLens displacement2nd derivativeBand pass filter30 Hz 1.5 kHzAxial deflectio

45、n Dynamic radial runoutAxial/radial accelerationDiskGeGsGaGpsXsr + eixANSI X3.234-1993b) Filter the acceleration with a high-passfilter. Choose a high-pass filter with charac-teristics such that the lower frequency limitis 40 Hz, when taken in series with the natu-ral frequency characteristics of th

46、e actuator.Unlike the upper specified frequency limit of1500 Hz, the lower frequency limits are notcritical at all (in fact, it may be shown that adisk is significantly more than the runoutspecification (at 40 Hz) to exceed the 40-Hzacceleration specification).7.4.2.2 Calibration and procedureSee 7.

47、3.3.2 and 7.3.3.3.7.4.2.3 1500-Hz filter characteristic require-mentsSee 7.3.2.4.7.4.3 Position sensor method7.4.3.1 IntroductionSee 7.3.4.1.7.4.3.2 Calibration and procedureSee 7.3.4.2.7.4.3.3 1500-Hz filter characteristic require-mentsSee 7.3.2.4.7.5 Test method 5 Dynamic radialrunoutSee 7.3 for t

48、he detailed test method description.7.6 Test method 6 Radial accelerationSee 7.4 for the detailed test method description.7.7 Test method 7 Tilt A.I.P8)7.8 Test method 8 Drop testThe optical disk cartridge shall withstand drop-ping on each surface and on each corner from aheight of 760 mm onto a con

49、crete floor coveredwith a 2-mm-thick vinyl layer. Each surface andcorner shall withstand such an impact withoutany functional failure that cannot be repaired inthe field by the customer, or a field service engi-neer, without the use of special tools.NOTE Shutter detachment, shutter lock deforma-tion, write inhibit disarrangement, and spring detach-ment are examples of such a functional failure.7.9 Test method 9 Refractive indexA.I.P.8)7.10 Test method 10 Thickness A.I.P.8)7.11 Test method 11 Baseline reflect-ance and r