ANSI IEEE C62.42-2005 Guide for the Application of Component Surge-Protective Devices for Use in Low-Voltage (Equal to or Less than 1000 V (ac) or 1200 V (dc)) Circuits《合成电涌保护装置低压下.pdf

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1、IEEE Std C62.42-2005(Revision of IEEE C62.42-1992)IEEE Guide for the Application ofComponent Surge-Protective Devicesfor Use in Low-Voltage Equal to orLess than 1000 V (ac) or 1200 V (dc)CircuitsI E E E3 Park Avenue New York, NY 10016-5997, USA31 May 2006IEEE Power Engineering SocietySponsored by th

2、eSurge Protective Devices CommitteeRecognized as an IEEE Std C62.42-2005 American National Standard (ANSI) (Revision of IEEE Std C62.42-1992) IEEE Guide for the Application of Component Surge-Protective Devices for Use in Low-Voltage Equal to or Less than 1000 V (ac) or 1200 V (dc) Circuits Sponsor

3、Surge Protective Devices Committee of the IEEE Power Engineering Society Approved 4 May 2006 American National Standards Institute Approved 7 December 2005 IEEE-SA Standards Board The working group thanks Littelfuse, Inc. for permission to reproduce Figure 11, Figure 12, Figure 13, Figure 14, Figure

4、 15, Figure 16, Figure 18, Figure 20, Figure 22, Figure 23, Figure C.1, Figure C.4, Figure C.5, Figure C.6, Figure C.7, Figure C.9, and Figure C.10. All such extracts are copyright of Littlefuse, Inc., Des Plaines, IL, USA. All rights reserved. Further information on Littlefuse is available from Li

5、ttelfuse has no responsibility for the placement and context in which the extracts and contents are reproduced by the author, nor is Littelfuse in any way responsible for the other content or accuracy therein. Abstract: Assistance in selecting the most appropriate type of low-voltage component surge

6、-protective device (gas tube, air gap, metal-oxide varistor, or avalanche junction semiconductor) for a particular application is provided. Evaluation of the characteristics of each device to meet specific service requirements is also given. Keywords: air gap surge arrester, avalanche junction semic

7、onductor, breakdown voltage, communication circuits, gas tube surge arrester, metal-oxide varistor, power circuits, SPD, surge, surge-protective device, surge protector _ The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright 2006 by the Ins

8、titute of Electrical and Electronics Engineers, Inc. All rights reserved. Published 31 May 2006. Printed in the United States of America. IEEE is a registered trademark in the U.S. Patent +1 978 750 8400. Permission to photocopy portions of any individual standard for educational classroom use can a

9、lso be obtained through the Copyright Clearance Center. iii Copyright 2006 IEEE. All rights reserved. Introduction This introduction is not part of IEEE Std C62.42-2005, IEEE Guide for the Application of Component Surge-Protective Devices for Use in Low-Voltage Equal to or Less than 1000 V (ac) or 1

10、200 V (dc) Circuits. This guide is a revision of IEEE Std C62.42-1992 and has been rewritten to include metal oxide varistor (MOV) and avalanche junction semiconductor component surge-protective devices in addition to gas tube and air gap arresters, which were the subjects of the previous document.

11、This guide supplements IEEE Std C62.31-1987a,b, IEEE Std C62.32-1981, IEEE Std C62.33-1982, and IEEE Std C62.35-1987. The purpose of this guide is to assist in selecting the most appropriate type of device for a particular application, and in evaluating the characteristics of devices to meet specifi

12、c service requirements. IEEE Std C62.42-2005 includes an explanation of the electrical environment in which component surge-protective devices shall operate, a comparison of the major difference among the four types of devices considered. It also includes a description and the theory of operation of

13、 gas tube, air gap, MOV and avalanche junction semiconductor devices, as well as guidance in applying and interpreting the respective test specifications for the arrester characteristics. Notice to users Errata Errata, if any, for this and all other standards can be accessed at the following URL: ht

14、tp:/ standards.ieee.org/reading/ieee/updates/errata/index.html. Users are encouraged to check this URL for errata periodically. Interpretations Current interpretations can be accessed at the following URL: http:/standards.ieee.org/reading/ieee/interp/ index.html. Patents Attention is called to the p

15、ossibility that implementation of this guide may require use of subject matter covered by patent rights. By publication of this guide, no position is taken with respect to the existence or validity of any patent rights in connection therewith. The IEEE shall not be responsible for identifying patent

16、s or patent applications for which a license may be required to implement an IEEE standard or for conducting inquiries into the legal validity or scope of those patents that are brought to its attention. aThe IEEE standards or products referred to in this introduction are trademarks of the Institute

17、 of Electrical and Electronics Engineers, Inc. bIEEE publications are available from the Institute of Electrical and Electronics Engineers, Inc., 445 Hoes Lane, P.O. Box 1331, Piscataway, NJ 08855-1331, USA (http:/standards.ieee.org/). iv Copyright 2006 IEEE. All rights reserved. Participants At the

18、 time this guide was completed, the 3.6.3 Working Group had the following membership: Donald Turner, Chair Ken Brown, Secretary William Bush Chrysanthos Chrysanthou Tom Conrad Ted Dhooge Ernie Gallo William Goldbach Randy Goodrich Jim Harrison Tom Hartman Ronald Hotchkiss Phillip Havens Wilhelm H. K

19、app Joseph L. Koepfinger Benny Lee Franois D. Martzloff Michael Maytum Pat McCurdy Richard Odenberg Hans-Wolfgang Oertel Bill TravisThe following members of the individual balloting committee voted on this guide. Balloters may have voted for approval, disapproval, or abstention. Mark Bushnell James

20、Case Chrysanthos Chrysanthou Bryan Cole Tommy Cooper Jerry Corkran R. Daubert Charles Drexler Gary Engmann Clifford Erven James Funke Ernie Gallo William Goldbach Randall Groves Ken Hanus Steven Hensley Raymond Hill Ronald Hotchkiss Jose Jarque Yuri Khersonsky Joseph Koepfinger Saumen Kundu Benny Le

21、e Antonio Lim Jason Lin Paul Lindemulder Carl Lindquist Al Maguire Ahmad MahinFallah William Majeski Albert Martin Michael Maytum Mark McGranaghan Nigel McQuin Bryan Melville G. Michel Rick OKeefe Hans-Wolfgang Oertel Joseph Osterhout Gary Peele Paul Pillitteri Johannes Rickmann Michael Roberts Thom

22、as Rozek Koenraad Rutgers Steven Sano John Stein Donald Turner Daniel Ward James Wilson When the IEEE-SA Standards Board approved this guide on 7 December 2005, it had the following membership: Steve M. Mills, Chair Richard H. Hulett, Vice Chair Don Wright, Past Chair Judith Gorman, Secretary Mark D

23、. Bowman Dennis B. Brophy Joseph Bruder Richard Cox Bob Davis Julian Forster* Joanna N. Guenin Mark S. Halpin Raymond Hapeman William B. Hopf Lowell G. Johnson Herman Koch Joseph L. Koepfinger* David J. Law Daleep C. Mohla Paul Nikolich T. W. Olsen Glenn Parsons Ronald C. Petersen Gary S. Robinson F

24、rank Stone Malcolm V. Thaden Richard L. Townsend Joe D. Watson Howard L. Wolfman *Member Emeritus v Copyright 2006 IEEE. All rights reserved. Also included are the following nonvoting IEEE-SA Standards Board liaisons: Satish K. Aggarwal, NRC Representative Richard DeBlasio, DOE Representative Alan H

25、. Cookson, NIST Representative Jennie Steinhagen IEEE Standards Project Editor vi Copyright 2006 IEEE. All rights reserved. Contents 1. Overview 1 1.1 Scope . 2 2. Normative references 2 2.1 IEEE standard test specifications for component surge-protective devices. 2 2.2 IEEE standard test specificat

26、ions for multiple component surge-protective devices. 2 2.3 General references . 3 3. Definitions 4 4. Electrical environment 4 4.1 Lightning and its effects 4 4.2 Low-energy static source. 8 4.3 Power interference. 8 4.4 Switching transients. 10 4.5 Electrostatic discharge. 10 4.6 Electromagnetic p

27、ulse 12 5. Comparison and selection of component surge-protective devices 12 5.1 Comparison between voltage switching and voltage limiting component SPDs. 12 6. Gas tubes 15 6.1 Description 15 6.2 Theory of operation . 16 6.3 Gas tube arrester test characteristics 19 6.4 Application of gas tube surg

28、e arresters (telecommunications) 23 7. Air gaps 28 7.1 Description 28 7.2 Theory of operation . 29 7.3 Air gap arrester test characteristics 29 7.4 Application of air gap surge arresters 32 7.5 Backup air gap surge arresters. 35 8. Component MOV surge-protective devices . 36 8.1 Description 36 8.2 T

29、heory of operation . 37 8.3 Varistor test characteristics 38 8.4 Application of varistor surge-protective device components. 50 vii Copyright 2006 IEEE. All rights reserved. 9. Component avalanche junction semiconductor surge-protective devices 58 9.1 Description 59 9.2 Theory of Operation 59 9.3 Av

30、alanche diode test characteristics 61 9.4 Application of avalanche diodes 68 Annex A (informative) Circuit behavior of gas tube arresters . 69 Annex B (informative) Circuit behavior of air gap arresters 74 Annex C (informative) Examples of applications of MOVs 78 Annex D (informative) Generic exampl

31、es of surge problems that are solved by the application of avalanche junction semiconductor SPDs. 93 Annex E (informative) Bibliography 97 viii Copyright 2006 IEEE. All rights reserved. IEEE Guide for the Application of Component Surge-Protective Devices for Use in Low-Voltage Equal to or Less than

32、1000 V (ac) or 1200 V (dc) Circuits 1. a) b) c) d) Overview This guide is intended to provide assistance in selecting the most appropriate type of component surge-protective device, or combination of devices, for use in a surge protector, equipment, or system application. The following are examples

33、of those who can benefit from this guide: One who designs low-voltage surge protectors and desires an overview of the application of component surge-protective devices, or combination of component surge-protective devices used within surge protectors. One who designs low-voltage power, data, communi

34、cations, or signaling products or systems and desires guidance on selecting appropriate component surge-protective devices to be used directly within the product or system as part of the initial product/system design (i.e., protection designed as an integral part of the product or system). One who n

35、eeds to solve a surge protection problem in the field and seeks guidance on selecting and installing appropriate component surge-protective devices to solve the problem (e.g., consultants or field service personnel who need to provide ad hoc surge protection for a product or system in order to resol

36、ve a problem). One who desires to ensure appropriate surge protection of a system in the early stages of design and needs to gain an overall appreciation of the technology. This guide is divided into nine clauses. Clause 1 provides an overview and scope for this guide. Clause 2 lists references. Cla

37、use 3 lists definitions. Clause 4 describes the electrical environment. Clause 5 compares some of the major characteristics of component surge-protective devices. Clause 6, Clause 7, Clause 8, and Clause 9 give a description and theory of operation and guidance in applying and interpreting the respe

38、ctive test specifications for component gas tube (Clause 6), air gap (Clause 7), metal-oxide varistor (Clause 8), and avalanche junction semiconductor (Clause 9) surge-protective devices. This guide also contains five informative annexes, which provide examples of applications of component surge-pro

39、tective devices in surge protectors, equipment, and/or systems, and a bibliography. These informative annexes provide additional information for understanding and using this guide, but they are not part of the guide. 1 Copyright 2006 IEEE. All rights reserved. IEEE Std C62.42-2005 IEEE Guide for the

40、 Application of Component Surge-Protective Devices for Use in Low-Voltage Equal to or Less than 100 V (ac) or 1200 V (dc) Circuits Annex A, Annex B, Annex C, and Annex D illustrate examples of component gas tube, air gap, metal oxide varistor (MOV), and avalanche junction semiconductor surge-protect

41、ive devices, respectively, used either as single component surge protectors, or as individual components integral to the protected equipment or system. Annex E contains a bibliography of the sources used in developing this guide. 1.12. 2.12.2Scope This guide covers the application of component air g

42、aps, gas tubes, MOVs, and avalanche junction semiconductor surge-protective devices for use within surge protectors, equipment, or systems involving low-voltage power, data, communication, and/or signaling circuits. This guide is intended to be used with, or to complement, the related documents refe

43、rred to in 2.1. Normative references The following referenced documents are indispensable for the application of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments or corrigenda) applies

44、. This guide shall be used in conjunction with the publications listed in 2.1, 2.2, and 2.3. IEEE standard test specifications for component surge-protective devices The following test standards are used to characterize the surge-protective devices covered by this guide, either as component surge-pr

45、otective devices, or as single technology, packaged low-voltage surge protectors. NOTEThe definitions used in the following four standards and in this guide are the same with respect to terms that are common to both. IEEE Std C62.31-1987, IEEE Standard Test Specifications for Gas-Tube Surge-Protecti

46、ve Devices.1,2IEEE Std C62.32-1981, IEEE Standard Test Specifications for Low-Voltage Air Gap Surge-Protective Devices. IEEE Std C62.33-1982 (Reaff 1994), IEEE Standard Test Specifications for Varistor Surge-Protective Devices. IEEE Std C62.35-1987, IEEE Standard Test Specifications for Avalanche Ju

47、nction Semiconductor Surge-Protective Devices. IEEE standard test specifications for multiple component surge-protective devices The following test standards are used to characterize multiple component “black box“ surge protectors for use in low-voltage circuits, which constitute applications of the

48、 component surge-protective devices covered by this guide. IEEE Std C62.36-2000, IEEE Standard Test Methods for Surge Protectors Used in Low-Voltage Data, Communications, and Signaling Circuits. 1The IEEE standards or products referred to in this document are trademarks of the Institute of Electrica

49、l and Electronics Engineers, Inc. 2IEEE publications are available from the Institute of Electrical and Electronics Engineers, 445 Hoes Lane, P.O. Box 1331, Piscataway, NJ 08855-1331, USA (http:/standards.ieee.org/). 2 Copyright 2006 IEEE. All rights reserved. IEEE Std C62.42-2005 IEEE Guide for the Application of Component Surge-Protective Devices for Use in Low-Voltage Equal to or Less than 100 V (ac) or 1200 V (