ANSI IEEE 434-2006 Guide for Functional Evaluation of Insulation Systems for AC Electric Machines Rated 2300 V and Above《交流电机额定电压≥2300V的绝缘系统功能评估用指南》.pdf
《ANSI IEEE 434-2006 Guide for Functional Evaluation of Insulation Systems for AC Electric Machines Rated 2300 V and Above《交流电机额定电压≥2300V的绝缘系统功能评估用指南》.pdf》由会员分享,可在线阅读,更多相关《ANSI IEEE 434-2006 Guide for Functional Evaluation of Insulation Systems for AC Electric Machines Rated 2300 V and Above《交流电机额定电压≥2300V的绝缘系统功能评估用指南》.pdf(29页珍藏版)》请在麦多课文档分享上搜索。
1、IEEE Std 434-2006(Revision ofIEEE Std 434-1991)IEEE Guide for Functional Evaluationof Insulation Systems for AC ElectricMachines Rated 2300 V and AboveI E E E3 Park Avenue New York, NY 10016-5997, USA15 March 2007IEEE Power Engineering SocietySponsored by theElectric Machinery CommitteeIEEE Std 434-
2、2006(R2013) (Revision of IEEE Std 434-1991) IEEE Guide for Functional Evaluation of Insulation Systems for AC Electric Machines Rated 2300 V and Above Sponsor Electric Machinery Committee of the IEEE Power Engineering Society Approved 6 December 2006 IEEE-SA Standards Board Reaffirmed 6 February 201
3、3 IEEE-SA Standards Board Approved 26 April 2007 American National Standards Institute Reaffirmed 29 October 2013 American National Standards Institute Abstract: A procedure that may be used to evaluate and compare insulation systems used, or proposed for use, in large ac electric machines is descri
4、bed in this guide. Keywords: ac, accelerated aging, armature winding, electric machine, electrical insulation, electromechanical, functional evaluation, stator winding, thermal endurance, thermal expansion, thermomechanical, voltage endurance _ The Institute of Electrical and Electronics Engineers,
5、Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright 2007 by the Institute of Electrical and Electronics Engineers, Inc. All rights reserved. Published 15 March 2007. Printed in the United States of America. IEEE is a registered trademark in the U.S. Patent +1 978 750 8400. Permission to photo
6、copy portions of any individual standard for educational classroom use can also be obtained through the Copyright Clearance Center. Introduction This introduction is not part of IEEE Std 434-2006, IEEE Guide for Functional Evaluation of Insulation Systems for AC Electric Machines Rated 2300 V and Ab
7、ove. During operation, the electrical insulation of large ac machines is continuously subjected to electrical, thermal, mechanical, and environmental stresses. These stresses initiate aging mechanisms that cause irreversible changes in the electrical and physical properties of the insulation, eventu
8、ally leading to degradation and failure. To perform satisfactorily, an insulation system must retain an adequate level of electrical and physical strength throughout its expected service life. Manufacturers of large machines continually strive to develop and employ better materials, designs, and man
9、ufacturing processes to improve the performance and reduce the cost of their insulation systems. When changes are made to a service-proven insulation system, it is necessary to evaluate the effects of these changes. Functional tests provide a means of evaluating an insulation system by exposing it t
10、o factors of influence that simulate or are characteristic of actual service conditions. This guide establishes the basis for evaluating the aging of the electrical insulation system as a result of these influences. It is recognized that this guide does not describe all of the functional tests curre
11、ntly in use by manufacturers of large ac machines, and that additional tests may be required to achieve a complete evaluation and classification of a new insulation system. The functional tests described in this guide are, however, in widespread use. This revision of the guide updates the previous e
12、dition mainly to clarify the intent and performance of the different functional tests. Future revisions are contemplated to include additional functional tests, and details of test procedures and analysis of results. Notice to users Errata Errata, if any, for this and all other standards can be acce
13、ssed at the following URL: http:/ standards.ieee.org/reading/ieee/updates/errata/index.html. Users are encouraged to check this URL for errata periodically. Interpretations Current interpretations can be accessed at the following URL: http:/standards.ieee.org/reading/ieee/interp/ index.html. Patents
14、Attention is called to the possibility that implementation of this guide may require use of subject matter covered by patent rights. By publication of this guide, no position is taken with respect to the existence or validity of any patent rights in connection therewith. The IEEE shall not be respon
15、sible for identifying patents or patent applications for which a license may be required to implement an IEEE standard or for conducting inquiries into the legal validity or scope of those patents that are brought to its attention. iv Copyright 2007 IEEE. All rights reserved. Participants This guide
16、 was originally developed by a working group of the Insulation Subcommittee of the IEEE Rotating Machinery Committee. The working group had the following membership: E. A. Boulter, Chair V. S. McFarlin, Secretary J. C. Botts J. M. Brown A. W. W. Cameron E. M. Fort M. M. Fromm J. L. Kuehlthau P. Lons
17、eth C. V. Maughan J. A. Oliver P. Richardson C. C. Sargeant E. S. Yates At the time this guide was completed, the 434 Working Group had the following membership: Lori Rux, Chair Stefano Bomben, Vice Chair Sabir Azizi-Ghannad Ray Bartnikas Kevin Becker Sudhakar Cherukupalli Douglas Conley Shawn Filli
18、ben George Gao Jim Grant Vince Green Bal Gupta Guy Halldorson Gary Heuston Claude Hudon Thomas Kluk Thomas Laird Jim Lau Lou Little Bill McDermid Hal Miller Glenn Mottershead Beant Nindra Howard Sedding Greg Stone Meredith Stranges Jim Timperley Joe Williams Chuck Wilson Karim Younsi Hugh Zhu Deceas
19、ed The following members of the individual balloting committee voted on this guide. Balloters may have voted for approval, disapproval, or abstention. Michael W. Adams Paul A. Anderson Saber Azizi-Ghannad Martin Baur, Thomas H. Bishop Thomas H. Blair Steven R. Brockschink Andrew J. Brown Carl L. Bus
20、h Antonio Cardoso Jorge E. Fernandez Daher Ronald L. Daubert Matthew T. Davis Gary L. Donner Donald G. Dunn James H. Dymond Gary R. Engmann Marcel Fortin Rostyslaw J. Fostiak N. K. Ghai Randall C. Groves James H Gurney David A. Horvath Dennis Horwitz David W. Jackson Innocent Kamwa J. L. Koepfinger
21、Maurice Linker William E. Lockley William Lumpkins G. L. Luri Omar S. Mazzoni William M. McDermid Nigel P. McQuin Gary L. Michel Jerry R. Murphy Krste Najdenkoski Robert J. Nelson Arthur S. Neubauer Michael S. Newman Lorraine K. Padden Ralph E. Patterson Howard W. Penrose Michael A. Roberts Gregory
22、C. Stone S. Thamilarasan James W. Wilson, Jr. v Copyright 2007 IEEE. All rights reserved. When the IEEE-SA Standards Board approved this guide on 6 December 2006, it had the following membership: Steve M. Mills, Chair Richard H. Hulett, Vice Chair Don Wright, Past Chair Judith Gorman, Secretary Mark
23、 D. Bowman Dennis B. Brophy William R. Goldbach Arnold M. Greenspan Robert M. Grow Joanna N. Guenin Julian Forster* Mark S. Halpin Kenneth S. Hanus William B. Hopf Joseph L. Koepfinger* David J. Law Daleep C. Mohla T. W. Olsen Glenn Parsons Ronald C. Petersen Tom A. Prevost Greg Ratta Robby Robson A
24、nne-Marie Sahazizian Virginia Sulzberger Malcolm V. Thaden Richard L. Townsend Walter Weigel Howard L. Wolfman *Member Emeritus Also included are the following nonvoting IEEE-SA Standards Board liaisons: Satish K. Aggarwal, NRC Representative Richard DeBlasio, DOE Representative Alan H. Cookson, NIS
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