ANSI ASTM D1830-1999 Standard Test Method for Thermal Endurance of Flexible Sheet Materials Used for Electrical Insulation by the Curved Electrode Method《弧形电极法测定电绝缘挠性薄片材料耐热性的试验方法(1.pdf
《ANSI ASTM D1830-1999 Standard Test Method for Thermal Endurance of Flexible Sheet Materials Used for Electrical Insulation by the Curved Electrode Method《弧形电极法测定电绝缘挠性薄片材料耐热性的试验方法(1.pdf》由会员分享,可在线阅读,更多相关《ANSI ASTM D1830-1999 Standard Test Method for Thermal Endurance of Flexible Sheet Materials Used for Electrical Insulation by the Curved Electrode Method《弧形电极法测定电绝缘挠性薄片材料耐热性的试验方法(1.pdf(5页珍藏版)》请在麦多课文档分享上搜索。
1、Designation: D1830 99 (Reapproved 2012)Standard Test Method forThermal Endurance of Flexible Sheet Materials Used forElectrical Insulation by the Curved Electrode Method1This standard is issued under the fixed designation D1830; the number immediately following the designation indicates the year ofo
2、riginal adoption or, in the case of revision, the year of last revision. A number in parentheses indicates the year of last reapproval. Asuperscript epsilon () indicates an editorial change since the last revision or reapproval.This standard has been approved for use by agencies of the U.S. Departme
3、nt of Defense.1. Scope1.1 This test method provides a procedure for evaluatingthermal endurance of flexible sheet materials by determiningdielectric breakdown voltage at room temperature after agingin air at selected elevated temperatures. Thermal endurance isexpressed in terms of a temperature inde
4、x.1.2 This test method is applicable to such solid electricalinsulating materials as coated fabrics, dielectric films, compos-ite laminates, and other materials where retention of flexibilityafter heat aging is of major importance (see Note 4).1.3 This test method is not intended for the evaluation
5、ofrigid laminate materials nor for the determination of thermalendurance of those materials which are not expected orrequired to retain flexibility in actual service.1.4 The values stated in acceptable metric units are to beregarded as the standard. The values in parentheses are forinformation only.
6、1.5 This standard does not purport to address all of thesafety concerns, if any, associated with its use. It is theresponsibility of the user of this standard to establish appro-priate safety and health practices and determine the applica-bility of regulatory limitations prior to use. For a specific
7、hazard statement, see 10.1.2. Referenced Documents2.1 ASTM Standards:2D149 Test Method for Dielectric Breakdown Voltage andDielectric Strength of Solid Electrical Insulating Materialsat Commercial Power FrequenciesD374 Test Methods for Thickness of Solid Electrical Insu-lation (Metric) D0374_D0374MD
8、5423 Specification for Forced-Convection Laboratory Ov-ens for Evaluation of Electrical Insulation2.2 Institute of Electrical and Electronics Engineers Publi-cations:3IEEE No. 1 General Principles for Temperature Limits in theRating of Electrical EquipmentIEEE No. 101A Guide for the Statistical Anal
9、ysis of Ther-mal Life Test Data (including Appendix A)2.3 IEC Publications:IEC 216 Guide for the Determination of Thermal EnduranceProperties of Electrical Insulating Materials (Parts 1 and2)43. Terminology3.1 Definitions:3.1.1 temperature index, na number which permits com-parison of the temperatur
10、e/time characteristics of an electricalinsulating material, or a simple combination of materials, basedon the temperature in degrees Celsius which is obtained byextrapolating the Arrhenius plot of life versus temperature to aspecified time, usually 20 000 h.3.1.2 thermal life, nthe time necessary fo
11、r a specificproperty of a material, or simple combination of materials, todegrade to a defined end point when aged at a specifictemperature.3.1.3 thermal life curve, na graphical representation ofthermal life at a specified aging temperature in which the valueof a property of a material, or a simple
12、 combination ofmaterials, is measured at room temperature and the valuesplotted as a function of time.3.2 Definitions of Terms Specific to This Standard:3.2.1 thermal endurance grapha straight-line plot of thelogarithm of thermal life in hours versus the reciprocal of theabsolute aging temperature i
13、n kelvins (also known as theArrhenius plot).1This test method is under the jurisdiction of ASTM Committee D09 onElectrical and Electronic Insulating Materials and is the direct responsibility ofSubcommittee D09.01 on Electrical Insulating ProductsCurrent edition approved Jan. 1, 2012. Published Janu
14、ary 2012. Originallyapproved in 1961. Last previous edition approved in 2005 as D1830 99 (2005).DOI: 10.1520/D1830-99R12.2For referenced ASTM standards, visit the ASTM website, www.astm.org, orcontact ASTM Customer Service at serviceastm.org. For Annual Book of ASTMStandards volume information, refe
15、r to the standards Document Summary page onthe ASTM website.3Available from Institute of Electrical and Electronics Engineers, Inc. (IEEE),445 Hoes Ln., P.O. Box 1331, Piscataway, NJ 08854-1331.4Available from American National Standards Institute (ANSI), 25 W. 43rd St.,4th Floor, New York, NY 10036
16、.Copyright ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959. United StatesThis international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for theDevelopment of Inte
17、rnational Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.14. Summary of Test Method4.1 Specimens are aged in air at a minimum of threetemperatures above the expected use temperature of the mate-rial. Dielectric breakdown volta
18、ge tests in air at room tempera-ture are periodically made to determine the time of aging ateach test temperature required to reduce the breakdown voltageto a value of 12 kV/mm (300 V/mil) of original thickness.These thermal life values are used to construct a thermalendurance graph by means of whic
19、h temperature indices maybe estimated corresponding to a thermal life as specified in thematerial specification or as agreed upon between the user andthe supplier.NOTE 1This test method is not applicable to materials having aninitial dielectric breakdown voltage of less than 12 kV/mm (300 V/mil) ofo
20、riginal thickness unless lower endpoint values are agreed upon orindicated in the applicable material specifications.5. Significance and Use5.1 Amajor factor affecting the life of insulating materials isthermal degradation. Other factors, such as moisture andvibration, may cause failures after the m
21、aterial has beenweakened by thermal degradation.5.2 Electrical insulation is effective in electrical equipmentonly as long as it retains its physical and electrical integrity.Thermal degradation may be characterized by weight change,porosity, crazing, and generally a reduction in flexibility, and is
22、usually accompanied by an ultimate reduction in dielectricbreakdown voltage.6. Apparatus6.1 Electrode Test FixtureThe fixture shall be in accor-dance with the dimensions shown in Fig. 1 and Fig. 2.Electrodes shall be of polished brass, with the upper electrodehaving a mass of 1.8 6 0.05 kg (4.0 6 0.
23、1 lb).6.2 Dielectric Breakdown Test SetThe set shall meet therequirements of Test Method D149.6.3 OvensOvens shall meet the requirements of Specifi-cation D5423 Type II.Insulation Thickness Dimension R Dimension H Dimension Dmm in. mm in. mm in. mm in.0.18 0.007 4.55 0.179 8.15 0.321 8.71 0.3440.25
24、0.010 6.48 0.255 6.22 0.245 2.45 0.4900.30 0.012 7.77 0.306 4.93 0.194 4.94 0.588Tolerance for R and D = 60.03 mm (0.001 in.)Tolerance for H = 60.05 mm (0.002 in.)FIG. 1 Curved Electrode DetailsFIG. 2 Curved Electrode and HolderD1830 99 (2012)26.4 MicrometerThe micrometer shall be of the dead-weight
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