ANSI AIIM MS9-1987 Method for Measuring Thickness of Buildup Area on Unitized Microfilm Carriers (Aperture Camera Copy and Image Cards)《缩微胶片整体传送器(包括缝隙、相机、拷贝、图像卡)安装区域厚度.测量方法》.pdf
《ANSI AIIM MS9-1987 Method for Measuring Thickness of Buildup Area on Unitized Microfilm Carriers (Aperture Camera Copy and Image Cards)《缩微胶片整体传送器(包括缝隙、相机、拷贝、图像卡)安装区域厚度.测量方法》.pdf》由会员分享,可在线阅读,更多相关《ANSI AIIM MS9-1987 Method for Measuring Thickness of Buildup Area on Unitized Microfilm Carriers (Aperture Camera Copy and Image Cards)《缩微胶片整体传送器(包括缝隙、相机、拷贝、图像卡)安装区域厚度.测量方法》.pdf(9页珍藏版)》请在麦多课文档分享上搜索。
1、AIIM IS9 87 3032348 0503L49 532 W MIM 1996 Addendum ANSIIAIIM MS9-I987 Method for Measuring Thickness of Buildup Area on Unitized Microfilm Carriers (Aperture, Camera, Copy, and Image Cards) Approved as an addendum to an American National Standard: February 16,1996 Purpose The purpose of this addend
2、um is to provide updated information for ANSI/MIMMS9-1987, Method for Measuring Thickness of Buildup Area on Unitked Microfilm Camers (Aperture, Camera, Copy, and Image Cards). Clauses that include changes are the Foreword (Clause O), References (Clause 2), and Annex A. Please note that the new Anne
3、x A is informative. Refer to ANSYAIiM MS9-1987 for information not updated in this addendum. Foreword - new Standards Board Suggestions for improvement of this Standard Recommended Practice are welcome. They should be sent to the Chair of the AIIM Standards Board, Association for Information and ima
4、ge Management, 1100 Wayne Avenue, Suite 1100, Silver Spring, MD 20910-5603. The AIIM Standards Board had the following members at the time it approved this addendum: Name of Representative Oreanization Represented Judy Kilpatrick, Chair Association for information and Image Management Thomas C. Bagg
5、 National Institute of Standards and Technology Jewel M. Drass Bell and Howell John C. Gale information Workstation Bruce A. Holroyd Group Eastman Kodak Company Roy M. Pierce Xerox Corporation Charles A. Plesums USAA Fernando Podio National Institute of Foreword - new committee Thissianardwasorigina
6、liyapprovedbytheAIIMCommittee C11 in 1987.C11 hassinceeencombinedwithC4andC7to fom C23, Micrographics Technologies. C23 had the hliowing members at the time it approved this addendum: Name of Representative OrEanization Represented Avedon, Don M., Chair Anderson, Carl J. 3M Company Badal, Michael J.
7、 Badal Associates Avedon Associates, hc. Bagg, Thomas C. Bramley, Richard Breslawski, Robert Case, Scott E. Dorfman, Harold H. Erickson, Eric Frey, Henry C. Fujinuma, Tony Gass, W. Camden Gershbock, Richard Jones, Virginia A Kurokawa, Masanobu Lundquist, Carl D. Mauitsby, Theresa Merritt, Tucker Nea
8、le, William Cru.=, Larry NiST Microseal Corporation Boeing Computer Services University of California Dorfman Associates Genealogical Society of Utah AT PCAM Card Preparation, Engineering Data Microreproduction System; General Requirements for, Preparation of, MIL-M-3876/lA, 1977. 3. DEFINITIONS in
9、Glossary of Micrographics, AIIM TR2-1980. Definitions of terms used in this standard may be found 4. APP-TUS 4.1 General. Micrometers shall be as described in TAPPI Standard T4i os-1984. This standard provides that: “They shall be dead weight motor dial type. Lowering speed should be approximately 0
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