AIR FORCE A-A-59684 A-2009 OPTICAL SPECTRUM ANALYZER《光谱分析仪》.pdf
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1、FSC 6625 INCH-POUND A-A-59684A 20 November 2009 Superseding A-A-59684 19 October, 2004 COMMERCIAL ITEM DESCRIPTION OPTICAL SPECTRUM ANALYZER The General Services Administration has authorized the use of this Commercial Item Description (CID) for all federal agencies. 1. SCOPE. This Commercial Item D
2、escription (CID) describes an Optical Spectrum Analyzer in which only those manufacturers meeting or surpassing the following requirements are qualified per this CID. This instrument measures signals with a 10 pm resolution and a 20 pm wavelength accuracy in the 1.55 meter band. 2. SALIENT CHARACTER
3、ISTICS. The equipment shall be capable of operation and bid sample testing, if so requested, within the accuracies, limits, and specifications herein. 2.1 Classification: Equipment covered by this CID may be commercially available equipment modified to the extent necessary to meet the following desc
4、ription. The equipment shall be Class 4 in accordance with MIL-PRF-28800. 2.2 Safety and Environmental. The equipment shall meet all safety and environmental requirements as specified in MIL-PRF-28800 for the classification as stated herein. 2.3 Mean Time Between Failures (MTBF). The equipment Mean
5、Time Between Failures (MTBF) shall be a minimum of 8,000 hours. 2.4 Calibration and Maintenance Adjustments. The design of the system shall provide for readily accessible calibration and maintenance adjustments. These adjustments shall be provided by variable value components, which are adjustable,
6、by the use of simple means. The calibration by substitution of selected components or parts is unacceptable unless specifically approved. The calibration adjustments, wherever possible, shall be accessible without removal of the instrument case or modules. The calibration interval shall be a period
7、of one year or greater, based on an operating time of 2000 hours per year. 2.5 Performance Characteristics. Beneficial comments, recommendations, additions, deletions, clarifications, etc. and any other data that may improve this document should be sent to WR-ALC/742 CBSG/GBEC, 460 Richard Ray Blvd,
8、 Robins AFB, GA 31098-1611. Since contact information can change, you may want to verify the currency of this address information using the ASSIST Online database at http:/assist.daps.dla.mil . Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-A-A-5968
9、4A 2 2.5.1 Salient Features. This instrument shall have the following salient features. 2.5.2 Measurement Range. This instrument shall have the following measurement range: 600 to 1700 nm. 2.5.3 Measurement Accuracy. This instrument shall have the following measurement accuracy, with a built in cali
10、bration light source and the readings shall be taken at 23 C +/- 5C at 1 minimum repetition rate: +/- 20 pm. This specification applies to the 1530 nm to 1570 nm band. 2.5.4 Waveform Resolution. This instrument shall have the following waveform resolution settings: 10 pm, 20 pm, 50 pm, 100 pm, and 5
11、00 pm. 2.5.5 Waveform Resolution Accuracy. This instrument shall have the following waveform resolution accuracy: +/- 3% (with a resolution of 50 pm over the 1530 nm to 1610 nm range). Alternately, this instrument shall have the following waveform resolution accuracy: +/- 2% (with a resolution of 10
12、0 pm or greater over the 1530 nm to 1610 nm range). 2.5.6 Measurement Level Range. This instrument shall have the following measurement level range under the following two conditions: A) measurements taken at 10 C to 30 C B) with at least 100 pm resolution: -87 to +23 dBm (1250 nm to 1610 nm) and -7
13、7 to +23 dBm (950 nm to 1250 nm). 2.5.7 Measurement Level Accuracy. This instrument shall have the following measurement level accuracy under the following two conditions A) at 23 C +/- 5 C and B) with at least 100 pm resolution: +/- 0.4 dB (at a wavelength of 1550 nm). 2.5.8 Measurement Level Linea
14、rity. This instrument shall have the following measurement level linearity under the following condition A) measurements taken at 23 C +/- 5 C: ).05 dB (-50 to 10 dBm, at a wavelength of 1550 nm). 2.5.9 Measurement Level Scale. This instrument shall have the following measurement level scale: a line
15、ar scale and a logarithmic scale of: 0.1, 0.2, 0.5, 1, 5 and 10 dB/division. 2.5.10 Measurement Level Repeatability. This instrument shall have the following measurement level repeatability taken under the following three conditions: A) measurements taken at 23 C +/- 5 C B) with at least 100 pm reso
16、lution and C) measurements taken at a minimum repetition rate of 1: +/- 0.02 dB from 1530 to 1610 nm wavelengths. 2.5.11 Measurement Level Flatness. This instrument shall have the following measurement level flatness taken under the following condition: A) measurements shall be taken at 23 C +/- 5 C
17、. This flatness shall be: +/- 0.2 dB from 1530 to 1610 nm wavelengths. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-A-A-59684A 3 2.5.12 Measurement Level Polarization Dependency. This instrument shall have the following measurement level polarizat
18、ion dependency taken under the following two conditions: A) measurements shall be taken at 23 C +/- 5 C and B) measurements shall be taken with at least 100 pm resolution. This flatness shall be: +/- 0.05 dB from 1250 to 1610 nm wavelengths under conditions A) and B). 2.5.13 Measurement Level Dynami
19、c Ranges. This instrument shall have the following measurement level dynamic ranges taken under the following two conditions: A) measurements shall be taken at 23 C +/- 5 C and B) measurements shall be taken with at least 10 pm resolution and at 1523 nm. This dynamic range shall be: 50 dB (+/- 0.1 n
20、m from the peak wavelength under conditions A) and B). This dynamic range shall be: 60 dB (+/- 0.2 nm from the peak wavelength under conditions A) and B). This dynamic range shall also be: 67 dB (+/- 0.4 nm from the peak wavelength under conditions A) and B). 2.6 Sweep Characteristics Span. This ins
21、trument shall have the following sweep span: 0.2 nm from full span to zero span. 2.6.1 Sweep Characteristics Number of Samples. This instrument shall have the following sweep span number of samples: 101, 201, 501, 1001, 2001, 5001 and 10001. 2.6.2 Sweep Characteristics Measurement Time. This instrum
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