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    AIR FORCE A-A-59684 A-2009 OPTICAL SPECTRUM ANALYZER《光谱分析仪》.pdf

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    AIR FORCE A-A-59684 A-2009 OPTICAL SPECTRUM ANALYZER《光谱分析仪》.pdf

    1、FSC 6625 INCH-POUND A-A-59684A 20 November 2009 Superseding A-A-59684 19 October, 2004 COMMERCIAL ITEM DESCRIPTION OPTICAL SPECTRUM ANALYZER The General Services Administration has authorized the use of this Commercial Item Description (CID) for all federal agencies. 1. SCOPE. This Commercial Item D

    2、escription (CID) describes an Optical Spectrum Analyzer in which only those manufacturers meeting or surpassing the following requirements are qualified per this CID. This instrument measures signals with a 10 pm resolution and a 20 pm wavelength accuracy in the 1.55 meter band. 2. SALIENT CHARACTER

    3、ISTICS. The equipment shall be capable of operation and bid sample testing, if so requested, within the accuracies, limits, and specifications herein. 2.1 Classification: Equipment covered by this CID may be commercially available equipment modified to the extent necessary to meet the following desc

    4、ription. The equipment shall be Class 4 in accordance with MIL-PRF-28800. 2.2 Safety and Environmental. The equipment shall meet all safety and environmental requirements as specified in MIL-PRF-28800 for the classification as stated herein. 2.3 Mean Time Between Failures (MTBF). The equipment Mean

    5、Time Between Failures (MTBF) shall be a minimum of 8,000 hours. 2.4 Calibration and Maintenance Adjustments. The design of the system shall provide for readily accessible calibration and maintenance adjustments. These adjustments shall be provided by variable value components, which are adjustable,

    6、by the use of simple means. The calibration by substitution of selected components or parts is unacceptable unless specifically approved. The calibration adjustments, wherever possible, shall be accessible without removal of the instrument case or modules. The calibration interval shall be a period

    7、of one year or greater, based on an operating time of 2000 hours per year. 2.5 Performance Characteristics. Beneficial comments, recommendations, additions, deletions, clarifications, etc. and any other data that may improve this document should be sent to WR-ALC/742 CBSG/GBEC, 460 Richard Ray Blvd,

    8、 Robins AFB, GA 31098-1611. Since contact information can change, you may want to verify the currency of this address information using the ASSIST Online database at http:/assist.daps.dla.mil . Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-A-A-5968

    9、4A 2 2.5.1 Salient Features. This instrument shall have the following salient features. 2.5.2 Measurement Range. This instrument shall have the following measurement range: 600 to 1700 nm. 2.5.3 Measurement Accuracy. This instrument shall have the following measurement accuracy, with a built in cali

    10、bration light source and the readings shall be taken at 23 C +/- 5C at 1 minimum repetition rate: +/- 20 pm. This specification applies to the 1530 nm to 1570 nm band. 2.5.4 Waveform Resolution. This instrument shall have the following waveform resolution settings: 10 pm, 20 pm, 50 pm, 100 pm, and 5

    11、00 pm. 2.5.5 Waveform Resolution Accuracy. This instrument shall have the following waveform resolution accuracy: +/- 3% (with a resolution of 50 pm over the 1530 nm to 1610 nm range). Alternately, this instrument shall have the following waveform resolution accuracy: +/- 2% (with a resolution of 10

    12、0 pm or greater over the 1530 nm to 1610 nm range). 2.5.6 Measurement Level Range. This instrument shall have the following measurement level range under the following two conditions: A) measurements taken at 10 C to 30 C B) with at least 100 pm resolution: -87 to +23 dBm (1250 nm to 1610 nm) and -7

    13、7 to +23 dBm (950 nm to 1250 nm). 2.5.7 Measurement Level Accuracy. This instrument shall have the following measurement level accuracy under the following two conditions A) at 23 C +/- 5 C and B) with at least 100 pm resolution: +/- 0.4 dB (at a wavelength of 1550 nm). 2.5.8 Measurement Level Linea

    14、rity. This instrument shall have the following measurement level linearity under the following condition A) measurements taken at 23 C +/- 5 C: ).05 dB (-50 to 10 dBm, at a wavelength of 1550 nm). 2.5.9 Measurement Level Scale. This instrument shall have the following measurement level scale: a line

    15、ar scale and a logarithmic scale of: 0.1, 0.2, 0.5, 1, 5 and 10 dB/division. 2.5.10 Measurement Level Repeatability. This instrument shall have the following measurement level repeatability taken under the following three conditions: A) measurements taken at 23 C +/- 5 C B) with at least 100 pm reso

    16、lution and C) measurements taken at a minimum repetition rate of 1: +/- 0.02 dB from 1530 to 1610 nm wavelengths. 2.5.11 Measurement Level Flatness. This instrument shall have the following measurement level flatness taken under the following condition: A) measurements shall be taken at 23 C +/- 5 C

    17、. This flatness shall be: +/- 0.2 dB from 1530 to 1610 nm wavelengths. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-A-A-59684A 3 2.5.12 Measurement Level Polarization Dependency. This instrument shall have the following measurement level polarizat

    18、ion dependency taken under the following two conditions: A) measurements shall be taken at 23 C +/- 5 C and B) measurements shall be taken with at least 100 pm resolution. This flatness shall be: +/- 0.05 dB from 1250 to 1610 nm wavelengths under conditions A) and B). 2.5.13 Measurement Level Dynami

    19、c Ranges. This instrument shall have the following measurement level dynamic ranges taken under the following two conditions: A) measurements shall be taken at 23 C +/- 5 C and B) measurements shall be taken with at least 10 pm resolution and at 1523 nm. This dynamic range shall be: 50 dB (+/- 0.1 n

    20、m from the peak wavelength under conditions A) and B). This dynamic range shall be: 60 dB (+/- 0.2 nm from the peak wavelength under conditions A) and B). This dynamic range shall also be: 67 dB (+/- 0.4 nm from the peak wavelength under conditions A) and B). 2.6 Sweep Characteristics Span. This ins

    21、trument shall have the following sweep span: 0.2 nm from full span to zero span. 2.6.1 Sweep Characteristics Number of Samples. This instrument shall have the following sweep span number of samples: 101, 201, 501, 1001, 2001, 5001 and 10001. 2.6.2 Sweep Characteristics Measurement Time. This instrum

    22、ent shall have the following sweep measurement times: 500 ms (with a span of 10 nm, in the normal mode, and 1550 nm, with an average of 1 time span and with 501 samples). 2.7 Pulsed Light Measurements Peak Holding Mode. This instrument shall have the following pulsed light measurements - Peak Holdin

    23、g Mode: The waiting time shall be set at every measurement point with a gate time of 1ms to 1 second. 2.7.1 Pulsed Light Measurements External Synchronization. This instrument shall have the following pulsed light measurements - External Synchronization: the ability to have a sync pulse at the exter

    24、nal input control the taking of a reading/measurement. It shall be a TTL logic high level of 3.5 volts with a TTL logic low level of 1.5 volts constituting a logic level low or inhibit function. 2.7.1.1 Pulsed Light Measurements External Synchronization (Sync Hi Mode). This instrument shall have the

    25、 following pulsed light measurements - External Synchronization: the ability to have a TTL logic high level of 3.5 volts with this TTL logic high level function causing sample timing to occur from the rising to falling pulse edge, and be set by the SYNC signal and ranges from 0 to 1,000 secs. 2.7.1.

    26、2 Pulsed Light Measurements External Synchronization (Sync Low Mode). This instrument shall have the following pulsed light measurements - External Synchronization: the ability to have a TTL logic low level of 1.5 volts level function be when sample timing occurs from the falling to rising pulse edg

    27、e, and be set by the SYNC signal and with the pulse width being 1,000 nanoseconds or greater. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-A-A-59684A 4 2.8 Internal Memory. This instrument shall have an Internal Memory in the form of RAM with a ca

    28、pacity, as a minimum, of 501 samples and at least 15 screen shots on the display. 2.9 Optical Input. This instrument shall have an optical input of an adapting fiber 9.5/125 meters of SM fiber with a grade-A connector. 2.9.1 Optical Input Reflective Attenuation. This instrument shall have an optical

    29、 input Reflective Attenuation of 35 dB. 2.10 Optical Data Input/Output. This instrument shall have an optical data input/output of a GPIB IEEE-488 standard, as well as a D-SUB 25 pin ESC/P, ESC/P-R, and PCL standards. 2.11 Light Source for Wavelength Calibration. This instrument shall have an optica

    30、l light source for wavelength calibration of any technology as long as there is an output level of at least 45 dBm/nm at a wavelength of 1550 nm. 2.12 Manuals. The equipment shall be delivered with operator, maintenance, illustrated parts, and calibration manuals. Format and quantity shall be as spe

    31、cified in the contract or order. Level of maintenance philosophy, as defined in MIL-PRF-28800, shall be as specified in the contract or order. 3 REGULATORY REQUIREMENTS. 3.1 Recycled, recovered, or environmentally preferable materials. Recycled, recovered, or environmentally preferable materials sho

    32、uld be used to the maximum extent possible provided that the material meets or exceeds the operational and maintenance requirements, and promotes economically advantageous life cycle costs. The offeror/contractor is encouraged to use recovered materials to the maximum extent practicable, in accordan

    33、ce with paragraph 23.403 of the Federal Acquisition Regulation (FAR). 3.2 Green Procurement Program. Green Procurement Program (GPP) is a mandatory federal acquisition program that focuses on the purchase and use of environmentally preferable products and services. GPP requirements apply to all acqu

    34、isitions using appropriated funds, including services and new requirements. FAR 23.404(b) applies and states the GPP requires 100% of EPA designated product purchase that are included in the Comprehensive Procurement Guidelines list that contains recovered materials, unless the item cannot be acquir

    35、ed: a) competitively within a reasonable timeframe; b) meet appropriate performance standards, or c) subcontractors comply with this requirement. 4. PRODUCT CONFORMANCE PROVISIONS. 4.1 Product Conformance. The products provided shall meet the salient characteristics of this CID, conform to the produ

    36、cers own drawings, specifications, standards and quality assurance practices, and be the same product offered for sale in the commercial market. The government reserves the right to require proof of such conformance. Provided by IHSNot for ResaleNo reproduction or networking permitted without licens

    37、e from IHS-,-,-A-A-59684A 5 4.2 Metric Products. Products manufactured to metric dimensions will be considered on an equal basis with those manufactured using inch-pound units, provided they fall within the specified tolerances using conversion tables contained in the latest revision of Federal Stan

    38、dard No. 376, and all other requirements of this CID are met. If a product manufactured to metric dimensions exceeds the tolerances specified in the inch/pound units, a request should be made to the contracting officer to determine if the product is acceptable. 4.3 The contracting officer has the op

    39、tion of accepting or rejecting the product. 5. PACKAGING. Preservation, packing, and marking shall be as specified in the contract or order. 6. NOTES. 6.1 Sources of documents. 6.1.1 Military Specifications, Standards, and Handbooks referenced herein may be obtained at http:/assist.daps.dla.mil or a

    40、vailable from the Standardization Documents Order Desk, 700 Robbins Ave, Bldg 4, Section D, Philadelphia, PA 19111-5094. 6.1.2 FAR and DFARS may be obtained from the Superintendent of Documents, P.O. Box 371954, Pittsburgh, PA 15250-7954. Electronic copies of the FAR may be obtained from http:/www.a

    41、rnet.gov/far. Electronic copies of the DFARS may be obtained from http:/www.acq.osd.mil/dpap/dars/dfars/index.htm . 6.1.3 Institute of Electrical and Electronics Engineers (IEEE) standards products may be obtained at http:/www.ieee.org or available from IEEE Operations Center. Phone: (800)678-IEEE.

    42、Mail: IEEE Operations Center, Sales Office, 445 Hoes Lane, PO Box 1331, Piscataway, NJ, 08855-1331, USA. 6.2 Key Words. Class 4 Linear scale Logarithmic scale Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-A-A-59684A 6 MILITARY INTEREST Custodian: P

    43、reparing activity: Air Force 99 Air Force - 84 Agent: Air Force - 99 (Project 6625-2010-003) NOTE: The activities listed above were interested in this document as of the date of this document. Since organizations and responsibilities can change, you should verify the currency of the information above using the ASSIST Online database at http:/assist.daps.dla.mil. Provided by IHSNot for ResaleNo reproduction or networking permitted without license from IHS-,-,-


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