BS ISO IEC 18745-2-2016 Information technology Test methods for machine readable travel documents (MRTD) and associated devices Test methods for the contactless interface《.pdf

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1、BS ISO/IEC 18745-2:2016 Information technology Test methods for machine readable travel documents (MRTD) and associated devices Part 2: Test methods for the contactless interface BSI Standards Publication WB11885_BSI_StandardCovs_2013_AW.indd 1 15/05/2013 15:06BS ISO/IEC 18745-2:2016 BRITISH STANDAR

2、D National foreword This British Standard is the UK implementation of ISO/IEC 18745-2:2016. The UK participation in its preparation was entrusted to Technical Committee IST/17, Cards and personal identification. A list of organizations represented on this committee can be obtained on request to its

3、secretary. This publication does not purport to include all the necessary provisions of a contract. Users are responsible for its correct application. The British Standards Institution 2016. Published by BSI Standards Limited 2016 ISBN 978 0 580 81550 8 ICS 35.240.15 Compliance with a British Standa

4、rd cannot confer immunity from legal obligations. This British Standard was published under the authority of the Standards Policy and Strategy Committee on 31 August 2016. Amendments/corrigenda issued since publication Date T e x t a f f e c t e dBS ISO/IEC 18745-2:2016 Information technology Test m

5、ethods for machine readable travel documents (MRTD) and associated devices Part 2: Test methods for the contactless interface Technologies de linformation Mthodes dessai pour les documents de voyage lisibles par machine (MRTD) et dispositifs associs Partie 2: Mthodes dessai de linterface sans contac

6、t INTERNATIONAL STANDARD ISO/IEC 18745-2 Reference number ISO/IEC 18745-2:2016(E) First edition 2016-08-15 ISO/IEC 2016 BS ISO/IEC 18745-2:2016ii ISO/IEC 2016 All rights reserved COPYRIGHT PROTECTED DOCUMENT ISO/IEC 2016, Published in Switzerland All rights reserved. Unless otherwise specified, no p

7、art of this publication may be reproduced or utilized otherwise in any form or by any means, electronic or mechanical, including photocopying, or posting on the internet or an intranet, without prior written permission. Permission can be requested from either ISO at the address below or ISOs member

8、body in the country of the requester. ISO copyright office Ch. de Blandonnet 8 CP 401 CH-1214 Vernier, Geneva, Switzerland Tel. +41 22 749 01 11 Fax +41 22 749 09 47 copyrightiso.org www.iso.org ISO/IEC 18745-2:2016(E)BS ISO/IEC 18745-2:2016ISO/IEC 18745-2:2016(E)Foreword v Introduction vi 1 Scope .

9、 1 2 Normative references 1 3 T erms and definition 1 4 Symbols and abbreviated terms . 2 5 Test methods for eMRTD 2 5.1 General test conditions 2 5.1.1 Test setup . 3 5.1.2 Values unless otherwise specified 3 5.1.3 Test report . 4 5.1.4 Applicant declaration . 5 5.2 Test of ISO/IEC 14443-1 paramete

10、rs 6 5.2.1 “Class 1” verification test (optional) . 6 5.2.2 Static electricity test . 6 5.2.3 Alternating magnetic field test 7 5.3 Test of ISO/IEC 14443-2 parameters 7 5.3.1 eMRTD transmission 7 5.3.2 Operating field strength. 8 5.3.3 eMRTD reception . 9 5.3.4 eMRTD resonance frequency (optional) .

11、 9 5.3.5 eMRTD maximum loading effect .10 5.4 Test of ISO/IEC 14443-3 and ISO/IEC 14443-4 parameters 10 5.5 List of the test command sequences .10 5.5.1 Test commands for eMRTD without access control (plain) .10 5.5.2 Test commands for eMRTD supporting BAC .12 5.5.3 Test commands for eMRTD supportin

12、g PACE 15 5.6 Functionality check test .17 5.6.1 General.17 5.6.2 Optional procedure 1: Application functionality check test17 5.6.3 Optional procedure 2: Electrical functionality check test .18 6 Test methods for eMRTD reader .19 6.1 General test requirements .19 6.1.1 Test setup 19 6.1.2 Values un

13、less otherwise specified .19 6.1.3 Test report 20 6.1.4 Applicant declaration . .20 6.1.5 Definition of measurement points .21 6.2 Test of ISO/IEC 14443-1 parameters .21 6.2.1 Purpose .21 6.2.2 Test procedure 22 6.2.3 Test report 22 6.3 Test of ISO/IEC 14443-2 parameters .22 6.3.1 eMRTD reader field

14、 strength 22 6.3.2 Modulation index and waveform 22 6.3.3 Load modulation reception .23 6.4 Test of ISO/IEC 14443-3 and ISO/IEC 14443-4 parameters 24 6.5 List of test command sequences .24 6.5.1 Test commands sequence for scenarios without eMRTD reader chaining .24 6.5.2 Test commands sequence for s

15、cenarios dealing with eMRTD reader chaining .25 6.6 Measurement positions 25 7 Additional eMRTD test methods .27 ISO/IEC 2016 All rights reserved iii Contents PageBS ISO/IEC 18745-2:2016ISO/IEC 18745-2:2016(E)7.1 Test conditions .27 7.2 Test of ISO/IEC 14443-2 parameters for eMRTD .28 7.2.1 Operatin

16、g field strength for bit rates higher than fc/16 28 7.2.2 eMRTD reception for bit rates higher than fc/16 .29 7.2.3 eMRTD EMD level and low EMD time test (optional) .30 7.3 Test of ISO/IEC 14443-2 parameters for eMRTD reader . 31 7.3.1 eMRTD reader field strength for additional classes .31 7.3.2 Mod

17、ulation index and waveform for bit rates higher than fc/16 or additional classes .31 7.3.3 Load modulation reception for bit rates higher than fc/16 or additional classes 31 7.3.4 eMRTD reader EMD immunity test (optional) 32 7.3.5 eMRTD reader EMD recovery test (optional) 32 7.4 Additional tests of

18、ISO/IEC 14443-3 and ISO/IEC 14443-4 parameters for PICC 33 7.5 Additional tests of ISO/IEC 14443-3 and ISO/IEC 14443-4 parameters for PCD 33 8 Specific ac c ess c ontr ol t est sequenc es 33 8.1 General 33 8.2 List of the test command sequences with EAC for eMRTD 33 8.2.1 Test commands for eMRTD sup

19、porting EAC .33 8.2.2 Test commands for eMRTD supporting PACE and EAC .34 Bibliography .37 iv ISO/IEC 2016 All rights reservedBS ISO/IEC 18745-2:2016ISO/IEC 18745-2:2016(E) Foreword ISO (the International Organization for Standardization) and IEC (the International Electrotechnical Commission) form

20、the specialized system for worldwide standardization. National bodies that are members of ISO or IEC participate in the development of International Standards through technical committees established by the respective organization to deal with particular fields of technical activity. ISO and IEC tec

21、hnical committees collaborate in fields of mutual interest. Other international organizations, governmental and non-governmental, in liaison with ISO and IEC, also take part in the work. In the field of information technology, ISO and IEC have established a joint technical committee, ISO/IEC JTC 1.

22、The procedures used to develop this document and those intended for its further maintenance are described in the ISO/IEC Directives, Part 1. In particular the different approval criteria needed for the different types of document should be noted. This document was drafted in accordance with the edit

23、orial rules of the ISO/IEC Directives, Part 2 (see www.iso.org/directives). Attention is drawn to the possibility that some of the elements of this document may be the subject of patent rights. ISO and IEC shall not be held responsible for identifying any or all such patent rights. Details of any pa

24、tent rights identified during the development of the document will be in the Introduction and/or on the ISO list of patent declarations received (see www.iso.org/patents). Any trade name used in this document is information given for the convenience of users and does not constitute an endorsement. F

25、or an explanation on the meaning of ISO specific terms and expressions related to conformity assessment, as well as information about ISOs adherence to the WTO principles in the Technical Barriers to Trade (TBT) see the following URL: Foreword - Supplementary information The committee responsible fo

26、r this document is ISO/IEC JTC 1, Information technology, SC 17, Cards and personal identification. ISO/IEC 18745 consists of the following parts, under the general title , Test methods for machine readable travel documents (MRTD) and associated devices: Part 1: Physical test methods for passport bo

27、oks (durability) Part 2: Test methods for the contactless interface ISO/IEC 2016 All rights reserved vBS ISO/IEC 18745-2:2016ISO/IEC 18745-2:2016(E) Introduction This part of ISO/IEC 18745 defines the test plan regarding contactless interface for eMRTDs and eMRTD associated readers compliant to ICAO

28、 Doc 9303.vi ISO/IEC 2016 All rights reservedBS ISO/IEC 18745-2:2016Information technology Test methods for machine readable travel documents (MRTD) and associated devices Part 2: Test methods for the contactless interface 1 Scope This part of ISO/IEC 18745 defines the test plan, based on ISO/IEC 10

29、373-6, for the contactless interface of eMRTDs and eMRTD associated readers compliant with ICAO Doc 9303. Application requirements for eMRTD and eMRTD reader are outside of the scope of this part of ISO/IEC 18745. 2 Normative references The following referenced documents are indispensable for the ap

30、plication of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. ISO/IEC 7810:2003/Amd 1:2009, Identification cards Physical characteristics ISO/IEC 10373-6:2016, Identification

31、 cards Test methods Part 6: Proximity cards 1) ISO/IEC 14443-1:2016, Identification cards Contactless integrated circuit cards Proximity cards Part 1: Physical characteristics 1) ISO/IEC 14443-2:2016, Identification cards Contactless integrated circuit cards Proximity cards Part 2: Radio frequency p

32、ower and signal interface 1) ISO/IEC 14443-3, Identification cards Contactless integrated circuit cards Proximity cards Part 3: Initialization and anticollision 1) ISO/IEC 14443-4:2016, Identification cards Contactless integrated circuit cards Proximity cards Part 4: Transmission protocol 1) ICAO Do

33、c 9303, Machine Readable Travel Documents Seventh Edition, 2015 3 T erms a nd definiti on For the purposes of this document, the following terms and definitions apply. 3.1 test method method for testing the characteristics of eMRTDs and eMRTD associated readers for the purpose of assessing their con

34、formance with International Standards 1) If ISO/IEC 10373 or ISO/IEC 14443 series are referred, read with replacing PICC with eMRTD and PCD with eMRTD associated reader. INTERNATIONAL ST ANDARD ISO/IEC 18745-2:2016(E) ISO/IEC 2016 All rights reserved 1BS ISO/IEC 18745-2:2016ISO/IEC 18745-2:2016(E) 3

35、.2 sample one piece of the total number of eMRTDs or eMRTD associated readers required and presented for testing according to this specification 3.3 room temperature convenient temperature within the range of 23 C 3 C (73 F 5 F) 4 Symbols and abbreviated terms For the purposes of this document, the

36、following abbreviations apply. AA active authentication BAC basic access control CVCA country verifying certification authority DV document verifier EAC extended access control (throughout this part of ISO/IEC 18745, the term EAC refers to EAC v1) IS inspection system LDS logical data structure PACE

37、 password authenticated connection establishment (throughout this part of ISO/IEC 18745, the term PACE refers to PACE v2) DUT device under test H min minimum field strength as defined in ISO/IEC 14443-2 H max maximum field strength as defined in ISO/IEC 14443-2 eMRTD electronic machine readable trav

38、el document “XY” hexadecimal notation, equal to XY in base 16 5 Test methods for eMRTD 5.1 General test conditions The test methods defined in Clause 5 are in line with the test methods defined in ISO/IEC 10373- 6:2001/Amd 7:2010, but updated in accordance with ISO/IEC 10373-6:2016. Test conditions

39、and procedures in this Clause are based on ISO/IEC 10373-6 taking into account specific needs of eMRTD application. Clause 7 addresses only requirements introduced by amendments on ISO/IEC 10373-6:2011 published after 2011 and integrated in the third edition of ISO/IEC 10373-6: ISO/IEC 10373-6:2011/

40、Amd.1:2012; ISO/IEC 10373-6:2011/Amd.2:2012; ISO/IEC 10373-6:2011/Amd.3:2012;2 ISO/IEC 2016 All rights reservedBS ISO/IEC 18745-2:2016ISO/IEC 18745-2:2016(E) ISO/IEC 10373-6:2011/Amd.4:2012; ISO/IEC 10373-6:2011/Amd.5:2015; 2) ISO/IEC 10373-6:2011/Amd.6:2015; 2) ISO/IEC 10373-6:2011/Amd.7:2015. 2) T

41、he following subclauses specify the different test setups, the values used for the tests, and a recommendation for the format of the test report. Depending on the implementation statement of the applicant, Type A or Type B tests shall be performed. For tests of ISO/IEC 14443-1 and ISO/IEC 14443-2 pa

42、rameters, the minimum number of samples provided for testing is three, unless explicitly defined otherwise. The applicant may request that a larger number of samples are tested. The samples provided by the applicant should be personalized and marked each with a unique serial number. Serial numbers s

43、hall be reported in the test report. It is not mandatory to use the same samples to run all the tests defined in this standard. For example, an applicant can provide: 3 samples for static electricity test; 3 samples for alternating magnetic field test; 3 samples for ISO/IEC 14443-2 parameters; 1 sam

44、ple for ISO/IEC 14443-3 and ISO/IEC 14443-4 parameters. For tests where mandatory field strength values are specified, a transition period for eMRTD requiring higher field strength may apply. 5.1.1 Test setup The Test PCD assembly that is defined in ISO/IEC 10373-6 is the basis for the physical and

45、electrical tests. The matching network defined in ISO/IEC 10373-6:2016, A.2.2 is used together with the Test PCD assembly. The Test PCD assembly shall be adapted to carry an eMRTD with the additional ability to center an ID-1 sized antenna of an eMRTD in the Test PCD assembly. Some of the following

46、tests are assuming an antenna size within ID-1 outline. If antenna is greater than ID-1 size, those tests might not generate accurate results. 5.1.2 V alues unless otherwise specified The values defined in Table 1 are typical values for communication parameters. Unless otherwise specified, the follo

47、wing environmental parameters and values defined in Table 1 shall be used. T a b l e 1 V a l u e s u n l e s s o t h e r w i s e s p e c i f i e d Parameter Value To be applied to Parameters applicable for all bit rates Environment temperature room temperature Type A and Type B Relative humidity 25

48、% to 75 % a Type A and Type B aAny convenient relative humidity within the specified range. 2) Not published but integrated in the third revision of ISO/IEC 10373-6. ISO/IEC 2016 All rights reserved 3BS ISO/IEC 18745-2:2016ISO/IEC 18745-2:2016(E) Parameter Value To be applied to Start Of Frame timin

49、g (SOF) 10 etu “0” followed by 2 etu “1” Type B End Of Frame timing (EOF) 10 etu “0” Type B Extra Guard Time (EGT) 0 etu Type B Maximum Frame Size Code in ATTRIB 8 Type B FSDI 8 Type A Parameters applicable for eMRTD reader to eMRTD bit rate fc/128 Modulation 100 % Type A t 1 40/fc Type A t 2 7/fc Type A t 3 12/fc Type A t 4 6/fc Type A Overshoot 0 % Type A and Type B Modulation index m 12 % Type B Rise time, t r , fall time,