BS ISO 8769-2016 Reference sources Calibration of surface contamination monitors Alpha- beta- and photon emitters《对照源 表面污染监测仪的校准 α发射体 β发射体和光子发射体》.pdf
《BS ISO 8769-2016 Reference sources Calibration of surface contamination monitors Alpha- beta- and photon emitters《对照源 表面污染监测仪的校准 α发射体 β发射体和光子发射体》.pdf》由会员分享,可在线阅读,更多相关《BS ISO 8769-2016 Reference sources Calibration of surface contamination monitors Alpha- beta- and photon emitters《对照源 表面污染监测仪的校准 α发射体 β发射体和光子发射体》.pdf(26页珍藏版)》请在麦多课文档分享上搜索。
1、BSI Standards Publication BS ISO 8769:2016 Reference sources Calibration of surface contamination monitors Alpha-, beta- and photon emittersBS ISO 8769:2016 BRITISH STANDARD National foreword This British Standard is the UK implementation of ISO 8769:2016. It supersedes BS ISO 8769:2010 which is wit
2、hdrawn. The UK participation in its preparation was entrusted to Technical Committee NCE/2, Radiation protection and measurement. A list of organizations represented on this committee can be obtained on request to its secretary. This publication does not purport to include all the necessary provisio
3、ns of a contract. Users are responsible for its correct application. The British Standards Institution 2016. Published by BSI Standards Limited 2016 ISBN 978 0 580 83093 8 ICS 17.240 Compliance with a British Standard cannot confer immunity from legal obligations. This British Standard was published
4、 under the authority of the Standards Policy and Strategy Committee on 31 January 2016. Amendments/corrigenda issued since publication Date T e x t a f f e c t e dBS ISO 8769:2016 ISO 2016 Reference sources Calibration of surface contamination monitors Alpha-, beta- and photon emitters Sources de rf
5、rence talonnage des contrleurs de contamination de surface metteurs alpha, bta et photoniques INTERNATIONAL STANDARD ISO 8769 Third edition 2016-01-15 Reference number ISO 8769:2016(E)BS ISO 8769:2016ISO 8769:2016(E)ii ISO 2016 All rights reserved COPYRIGHT PROTECTED DOCUMENT ISO 2016, Published in
6、Switzerland All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized otherwise in any form or by any means, electronic or mechanical, including photocopying, or posting on the internet or an intranet, without prior written permission. Permission can
7、be requested from either ISO at the address below or ISOs member body in the country of the requester. ISO copyright office Ch. de Blandonnet 8 CP 401 CH-1214 Vernier, Geneva, Switzerland Tel. +41 22 749 01 11 Fax +41 22 749 09 47 copyrightiso.org www.iso.orgBS ISO 8769:2016ISO 8769:2016(E)Foreword
8、iv Introduction v 1 Scope . 1 2 Normative references 1 3 T erms and definitions . 1 4 Traceability of reference sources 2 5 Specification of standar d sour c es . 3 5.1 General . 3 5.2 Class 1 reference sources . 4 5.2.1 General requirements 4 5.2.2 Activity and surface emission rate . 5 5.2.3 Unifo
9、rmity . 5 5.2.4 Radionuclides . 6 5.3 Class 2 reference sources . 7 5.3.1 General requirements 7 5.3.2 Activity and surface emission rate . 8 5.3.3 Uniformity . 8 5.3.4 Radionuclides . 8 5.4 Working sources 8 5.4.1 General requirements 8 5.4.2 Activity and surface emission rate . 9 5.4.3 Uniformity
10、. 9 5.4.4 Radionuclides . 9 6 Reference transfer instruments . 9 6.1 Reference transfer instrument for alpha-sources and beta-sources 9 6.2 Reference transfer instrument for photon sources . 9 6.3 Calibration 9 Annex A (informative) Particular considerations for reference sources emitting electrons
11、of energy less than 0,15 MeV and photons of energy less than 1,5 MeV . .11 Bibliography .13 ISO 2016 All rights reserved iii Contents PageBS ISO 8769:2016ISO 8769:2016(E) Foreword ISO (the International Organization for Standardization) is a worldwide federation of national standards bodies (ISO mem
12、ber bodies). The work of preparing International Standards is normally carried out through ISO technical committees. Each member body interested in a subject for which a technical committee has been established has the right to be represented on that committee. International organizations, governmen
13、tal and non-governmental, in liaison with ISO, also take part in the work. ISO collaborates closely with the International Electrotechnical Commission (IEC) on all matters of electrotechnical standardization. The procedures used to develop this document and those intended for its further maintenance
14、 are described in the ISO/IEC Directives, Part 1. In particular the different approval criteria needed for the different types of ISO documents should be noted. This document was drafted in accordance with the editorial rules of the ISO/IEC Directives, Part 2 (see www.iso.org/directives). Attention
15、is drawn to the possibility that some of the elements of this document may be the subject of patent rights. ISO shall not be held responsible for identifying any or all such patent rights. Details of any patent rights identified during the development of the document will be in the Introduction and/
16、or on the ISO list of patent declarations received (see www.iso.org/patents). Any trade name used in this document is information given for the convenience of users and does not constitute an endorsement. For an explanation on the meaning of ISO specific terms and expressions related to conformity a
17、ssessment, as well as information about ISOs adherence to the WTO principles in the Technical Barriers to Trade (TBT) see the following URL: Foreword - Supplementary information. The committee responsible for this document is ISO/TC 85, Nuclear energy, Subcommittee SC 2, Radiological protection. Thi
18、s third edition cancels and replaces the second edition (ISO 8769:2010), which has been technically revised.iv ISO 2016 All rights reservedBS ISO 8769:2016ISO 8769:2016(E) Introduction Radioactive contamination of surfaces can result from spilling, splashing, or leakage from unsealed sources, or bre
19、akage or loss of integrity of sealed sources and can give rise to the following health hazards: a) external exposure to parts of the body in proximity to the contaminated surface; b) internal exposure through incorporation of radioactive material released from the surface. The need for effective mon
20、itoring of surface contamination has long been recognized, see Reference 1. Surface contamination is quantified in terms of activity per unit area, the quantity which is normally used to specify “derived limits”, i.e. maximum limits of surface contamination. These limits are based on radiological pr
21、otection considerations and have been derived from the dose equivalent or intake limits recommended by the International Commission on Radiological Protection (ICRP), see References 2 and 3. Derived limits are incorporated into numerous national and international regulatory documents which relate sp
22、ecifically to surface contamination monitoring. The requirement for this International Standard originated from the need for standard calibration sources in those International Standards dealing with the calibration of surface contamination monitors. While regulatory documents refer to surface conta
23、mination in terms of activity per unit area, the response of monitoring instruments is related directly to the radiation emitted from the surface rather than to the activity contained upon or within the surface. Due to variations in the absorptive and scattering properties of real surfaces, it canno
24、t be assumed, in general, that there is a simple, known relationship between surface emission rate and activity. Thus, there emerges a clear need for calibration sources that are specified primarily in terms of surface emission rate, as well as activity. The manner in which these sources are used an
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