IEEE C63 16-2016 en American National Standard Guide for Electrostatic Discharge Test Methodologies and Criteria for Electronic Equipment.pdf

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1、 American National Standard Guide for Electrostatic Discharge Test Methodologies and Acceptance Criteria for Electronic Equipment Accredited by the American National Standards Institute IEEE 3 Park Avenue New York, NY 10016-5997 USA Accredited Standards Committee C63Electromagnetic Compatibility ANS

2、I C63.16-2016(Revision ofANSI C63.16-1993) C63ANSI C63.16-2016 (Revision of ANSI C63.16-1993) American National Standard Guide for Electrostatic Discharge Test Methodologies and Acceptance Criteria for Electronic Equipment Accredited Standards Committee C63Electromagnetic Compatibility accredited by

3、 the American National Standards Institute Secretariat Institute of Electrical and Electronics Engineers, Inc Approved 1 February 2016 American National Standards Institute Copyrights and permissions ANSI C63 and the IEEE thank the International Electrotechnical Commission (IEC) for permission to re

4、produce Information (Figure 1, Figure 2, Figure 3, Figure 4, and Figure 6 of this standard) from its International Standard IEC 61000-4-2 ed. 2.0 (2008). All such extracts are copyright of IEC, Geneva, Switzerland. All rights reserved. Further information on the IEC is available from www.iec.ch. IEC

5、 has no responsibility for the placement and context in which the extracts and contents are reproduced by the author, nor is IEC in any way responsible for the other content or accuracy therein. Abstract: Expanded explanations, best practices, and guidance for avoiding the pitfalls associated with e

6、lectrostatic discharge (ESD) testing to IEC and other international ESD standards are provided and should be considered a supplement to these standards, rather than a replacement. Unique ESD test procedures related to connecting charged peripherals to equipment in use are also included. Keywords: ai

7、r discharge, ANSI C63.16, contact discharge, coupling plane, direct discharge, electrostatic discharge (ESD), ESD event, ESD immunity, ESD simulator, ESD test criteria, indirect discharge The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyrigh

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45、r information may be obtained from the IEEE Standards Association. Copyright 2016 IEEE. All rights reserved. vii Participants At the time this guide was published, Accredited Standards Committee C63Electromagnetic Compatibility had the following membership: Daniel Hoolihan, Chair Dan Sigouin, Vice C

46、hair Jerry D. Ramie, Secretary Sue Vogel, Secretariat Organization Represented Name of Representative AlcatelLucent Dheena Moongilan American Council of Independent Laboratories (ACIL) . Harry H. Hodes . John Repella (Alt.) American Radio Relay League (ARRL) Edward F. Hare . Kermit Carlson (Alt.) Ap

47、ple, Inc. Manjit Walia Indrandil Sen (Alt.) Blackberry Corporation . Masud Attayi Daoud Attayi (Alt.) Bureau Veritas . Jonathan Stewart Cisco Systems . Andy Griffin Dave Case (Alt.) Dell Inc. . Richard Worley Ericsson AB Vladimir Bazhanov . Kenth Skoglund (Alt.) ETS-Lindgren Zhong Chen Michael Foege

48、lle (Alt.) Federal Communications Commission (FCC) William Hurst . Steve Jones (Alt.) Food and Drug Administration (FDA) Jeffrey L. Silberberg Donald M. Witters (Alt.) Industry Canada . Jason Nixon . Horia Popovici (Alt.) Information Technology Industry Council (ITIC) John Hirvela . Joshua Rosenberg

49、 (Alt.) IEEE-Electromagnetic Compatibility Society (EMCS) . John Norgard Henry Benitez (Alt.) Liberty Labs Mike Howard Brandt Langer (Alt.) Motorola Mobility Tom Knipple Motorola Solutions Deanna Zakharia National Institute of Standards and Technology (NIST) . William Young Jason Coder (Alt.) Northwest EMC Dean Ghizzone . Greg Kiemel (Alt.) PCTEST Engineering Laboratory Greg Snyder Dennis Ward (Alt.) Qualcomm Technologies, Inc. John Forrester Mark Klerer (Alt.) Society of Automotive Engineers (SAE) Rick Lombardi Poul Andersen (Alt.) Telecommunication Certification Body