IEEE C63 12-2015 en Recommended Practice for Electromagnetic Compatibility Limits and Test Levels《电磁兼容性极限和测试等级的推荐性操作规程》.pdf

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1、 American National Standard Recommended Practice for Electromagnetic Compatibility Limits and Test Levels Accredited by the American National Standards Institute IEEE 3 Park Avenue New York, NY 10016-5997 USA Accredited Standards Committee C63Electromagnetic Compatibility ANSI C63.12-2015C63ANSI C63

2、.12-2015 (Revision of ANSI C63.12-1999) American National Standard Recommended Practice for Electromagnetic Compatibility Limits and Test Levels Accredited Standards Committee C63Electromagnetic Compatibility accredited by the American National Standards Institute Secretariat Institute of Electrical

3、 and Electronics Engineers, Inc. Approved 18 June 2015 American National Standards Institute Abstract: A rationale and recommendations for developing emission limits and immunity test levels are presented in this recommended practice. These limits and levels are representative of current practice an

4、d user needs. Emission limits are specified by national and international standards bodies. Emission limits for the most part are regulated and hence controlled, which is the case in the U.S. and Canada. Such regulatory limits take precedence, even if the limits are different from those considered i

5、n this document. For product immunity, while in some parts of the world this is regulated, for the U.S. and Canada, it is not regulated except for some types of safety equipment. In this way, adequate immunity is more a quality aspect of the product because it does not operate in its intended RF env

6、ironment, the user would deem it of poor design and quality. The immunity test levels described in this document are representative of common levels applied internationally. However, severe environments (in which levels of electromagnetic disturbance are high) require the consideration of applying h

7、igher test levels. This consideration is described in this recommended practice. Finally, it should be noted that the entire recommended practice does not contain normative requirements, as such practices remain optional. Keywords: ambient noise levels, ANSI C63.12, atmospheric noise, electromagneti

8、c compatibility (EMC), emissions, galactic noise, immunity, limits, man-made noise, test levels American National Standard The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright 2016 by The Institute of Electrical and Electronics Engineers,

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10、ce Center. Errata Users are encouraged to check the IEEE Errata URL (http:/standards.ieee.org/findstds/errata/index.html), and the one for ASC C63at (http:/www.c63.org/explanations_interpretations_request.htm, for errata periodically. Interpretations (ASC C63standards) Current interpretations are es

11、sential to the understanding of all ASC C63standards. To assist in the meanings of requirements, informative interpretations are available at the following URL: (http:/www.c63.org/standards_development.htm). Users are cautioned that, although interpretations do not and cannot change the requirements

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47、 obtained from the IEEE Standards Association. vii Copyright 2016 IEEE. All rights reserved. Participants At the time this recommended practice was published, Accredited Standards Committee C63Electromagnetic Compatibility had the following membership: Daniel Hoolihan, Chair Dan Sigouin, Vice Chair

48、Jerry Ramie, Secretary Sue Vogel, Secretariat Organization Represented Name of Representative AlcatelLucent Dheena Moongilan American Council of Independent Laboratories (ACIL) . Harry H. Hodes John Repella (Alt.) American Radio Relay League (ARRL) Edward F. Hare .Kermit Carlson (Alt.) Apple, Inc. .

49、 Manjit Walia Indrandil Sen (Alt.) Blackberry Corporation . Masud Attayi Daoud Attayi (Alt.) Bureau Veritas . Jonathan Stewart Cisco Systems Andy Griffin Dave Case (Alt.) Dell Inc. . Richard Worley ETS-Lindgren Zhong Chen . Michael Foegelle (Alt.) Federal Communications Commission (FCC) . William Hurst Steve Jones (Alt.) Food and Drug Administration (FDA) . Jeffrey L. Silberberg . Donald M. Witters (Alt.) Industry Canada .Jason Nixon . Horia Popovici (Alt.) Information Technology Industry Council (ITIC) John Hirvela Joshua Rosenberg (Alt.) IEEE-Electromagnetic Co