IEEE C62 45-2002 en Recommended Practice on Surge Testing for Equipment Connected to Low-Voltage (1000 V and Less) AC Power Circuits《与低压交流电路连接的设备用电涌试验规程》.pdf

《IEEE C62 45-2002 en Recommended Practice on Surge Testing for Equipment Connected to Low-Voltage (1000 V and Less) AC Power Circuits《与低压交流电路连接的设备用电涌试验规程》.pdf》由会员分享，可在线阅读，更多相关《IEEE C62 45-2002 en Recommended Practice on Surge Testing for Equipment Connected to Low-Voltage (1000 V and Less) AC Power Circuits《与低压交流电路连接的设备用电涌试验规程》.pdf（94页珍藏版）》请在麦多课文档分享上搜索。

1、IEEE Std C62.45-2002(Revision of IEEE Std C62.45-1992)IEEE StandardsC62.45TMIEEE Recommended Practice on SurgeTesting for Equipment Connected toLow-Voltage (1000 V and Less) ACPower CircuitsPublished by The Institute of Electrical and Electronics Engineers, Inc.3 Park Avenue, New York, NY 10016-5997

2、, USA11 April 2003IEEE Power Engineering SocietySponsored by theSurge Protective Devices CommitteeIEEE StandardsPrint: SH95060PDF: SS95060Recognized as anAmerican National Standard (ANSI)IEEE Std C62.45-2002 (R2008)(Revision ofIEEE Std C62.45-1992)IEEE Recommended Practice on Surge Testing for Equip

3、ment Connected to Low-Voltage (1000 V and Less) ACPower CircuitsSponsorSurge Protective Devices Committeeof thePower Engineering SocietyApproved 10 March 2003American National Standards InstituteReaffirmed 10 December 2008Approved 11 November 2002IEEE-SA Standards BoardIEEE thanks the International

4、Electrotechnical Commission (IEC) for permission to reproduce informationfrom its International Standard, IEC 61000-4-4 (1995)Figure 18 and Figure 19. All such excerpts arecopyright of IEC, Geneva, Switzerland. All rights reserved. Further information on the IEC is available fromhttp:/www.iec.ch. IE

5、C has no responsibility for the placement and context in which the excerpts andcontents are reproduced by IEEE; nor is IEC in any way responsible for the other content or accuracytherein. Abstract: The scope of this recommended practice is the performance of surge testing on electricaland electronic

6、 equipment connected to low-voltage ac power circuits, specifically using therecommended test waveforms defined in IEEE Std C62.41.2-2002. Nevertheless, theserecommendations are applicable to any surge testing, regardless of the specific surges that may beapplied.Keywords: low-voltage ac power circu

7、it, surge testing, surge withstand levelThe Institute of Electrical and Electronics Engineers, Inc.3 Park Avenue, New York, NY 10016-5997, USACopyright 2003 by the Institute of Electrical and Electronics Engineers, Inc.All rights reserved. Published 11 April 2003. Printed in the United States of Ame

8、rica.National Electrical Code and NECare both registered trademarks owned by the National Fire Protection Association, Inc.Print: ISBN 0-7381-3485-6 SH95060PDF: ISBN 0-7381-3486-4 SS95060No part of this publication may be reproduced in any form, in an electronic retrieval system or otherwise, withou

9、t the prior written permission of the publisher.IEEE Standards documents are developed within the IEEE Societies and the Standards Coordinating Committees of theIEEE Standards Association (IEEE-SA) Standards Board. The IEEE develops its standards through a consensusdevelopment process, approved by t

10、he American National Standards Institute, which brings together volunteers representingvaried viewpoints and interests to achieve the final product. Volunteers are not necessarily members of the Institute andserve without compensation. While the IEEE administers the process and establishes rules to

11、promote fairness in theconsensus development process, the IEEE does not independently evaluate, test, or verify the accuracy of any of theinformation contained in its standards.Use of an IEEE Standard is wholly voluntary. The IEEE disclaims liability for any personal injury, property or otherdamage,

12、 of any nature whatsoever, whether special, indirect, consequential, or compensatory, directly or indirectly resultingfrom the publication, use of, or reliance upon this, or any other IEEE Standard document.The IEEE does not warrant or represent the accuracy or content of the material contained here

13、in, and expressly disclaimsany express or implied warranty, including any implied warranty of merchantability or fitness for a specific purpose, or thatthe use of the material contained herein is free from patent infringement. IEEE Standards documents are supplied “AS IS.”The existence of an IEEE St

14、andard does not imply that there are no other ways to produce, test, measure, purchase, market,or provide other goods and services related to the scope of the IEEE Standard. Furthermore, the viewpoint expressed at thetime a standard is approved and issued is subject to change brought about through d

15、evelopments in the state of the art andcomments received from users of the standard. Every IEEE Standard is subjected to review at least every five years forrevision or reaffirmation. When a document is more than five years old and has not been reaffirmed, it is reasonable toconclude that its conten

16、ts, although still of some value, do not wholly reflect the present state of the art. Users are cautionedto check to determine that they have the latest edition of any IEEE Standard.In publishing and making this document available, the IEEE is not suggesting or rendering professional or other servic

17、es for,or on behalf of, any person or entity. Nor is the IEEE undertaking to perform any duty owed by any other person or entity toanother. Any person utilizing this, and any other IEEE Standards document, should rely upon the advice of a competentprofessional in determining the exercise of reasonab

18、le care in any given circumstances.Interpretations: Occasionally questions may arise regarding the meaning of portions of standards as they relate to specificapplications. When the need for interpretations is brought to the attention of IEEE, the Institute will initiate action to prepareappropriate

19、responses. Since IEEE Standards represent a consensus of concerned interests, it is important to ensure that anyinterpretation has also received the concurrence of a balance of interests. For this reason, IEEE and the members of itssocieties and Standards Coordinating Committees are not able to prov

20、ide an instant response to interpretation requestsexcept in those cases where the matter has previously received formal consideration. Comments for revision of IEEE Standards are welcome from any interested party, regardless of membership affiliation withIEEE. Suggestions for changes in documents sh

21、ould be in the form of a proposed change of text, together with appropriatesupporting comments. Comments on standards and requests for interpretations should be addressed to:Secretary, IEEE-SA Standards Board445 Hoes LaneP.O. Box 1331Piscataway, NJ 08855-1331USAAuthorization to photocopy portions of

22、 any individual standard for internal or personal use is granted by the Institute ofElectrical and Electronics Engineers, Inc., provided that the appropriate fee is paid to Copyright Clearance Center. Toarrange for payment of licensing fee, please contact Copyright Clearance Center, Customer Service

23、, 222 Rosewood Drive,Danvers, MA 01923 USA; +1 978 750 8400. Permission to photocopy portions of any individual standard for educationalclassroom use can also be obtained through the Copyright Clearance Center.Note: Attention is called to the possibility that implementation of this standard may requ

24、ire use of subject mat-ter covered by patent rights. By publication of this standard, no position is taken with respect to the existence orvalidity of any patent rights in connection therewith. The IEEE shall not be responsible for identifying patentsfor which a license may be required by an IEEE st

25、andard or for conducting inquiries into the legal validity orscope of those patents that are brought to its attention.ivCopyright 2003 IEEE. All rights reserved.Introduction(This introduction is not part of IEEE Std C62.45-2002, IEEE Recommended Practice on Surge Testing for EquipmentConnected to Lo

26、w-Voltage (1000 V and Less) AC Power Circuits.)This recommended practice is the result of ten years of use as a guide, and it incorporates only minoradditions or updates of the original 1987 document, which was revised in 1992. These earlier versions werepublished independently, and not concurrently

27、 with their intended companion, IEEE Std C62.41-1991, withthe result that a “catch-up” situation was created as each document was separately updated.With the approval of the Surge-Protective Devices Committee, the companion IEEE Std C62.41-1991 wassplit into two separate documents, IEEE Std C62.41.1

28、-2002 and IEEE Std C62.41.2-2002. Together with thepresent recommended practice, the two IEEE Std C62.41.1-2002 and IEEE Std C62.41.2-2002 present a“Trilogy” concerning the occurrence, characterization, and testing of surges in low-voltage ac powercircuits, to be published concurrently and thus avoi

29、d the previous ambiguities of the catch-up updates.ParticipantsAt the time this recommended practice was completed, the Working Group on Surge Characterization onLow-Voltage Circuits had the following membership:Hans Steinhoff, ChairJames Funke, Co-ChairRaymond Hill, SecretaryFranois D. Martzloff, T

30、echnical EditorOther individuals who contributed review and comments in developing this recommended practice are:CAUTIONSurge testing of electrical equipment presents potentially hazardous situations forboth personnel and equipment. Safety directives promulgated by the laboratorywhere testing takes

31、place must be observed. Additional precautions are suggestedin 4.8 and 6.4.Rickard BentingerWilliam Bush Ernie Gallo Andrea Turner Haa Jim Harrison Michael Hopkins Deborah Jennings-ConnerPhilip JonesWilhem H. Kapp Joseph L. Koepfinger Richard OdenbergAlan W. RebeckMichael StringfellowMatt WakehamS.

32、Frank Waterer Don WordenP. P. BarkerT. R. ConradC. DhoogeD. Dorr H. E. FoelkerW. GrafG. L. GoeddeP. Hasse T. S. KeyG. KohnJ. Levine A. Mansoor D. MessinaJ. E. NaneviczR. W. NorthropK. O. PhippsV. A. Rakov A. RousseauE. F. VanceS. Van VreedeS. G. Whisenant W. J. ZischankCopyright 2003 IEEE. All right

33、s reserved. vThe following members of the balloting committee voted on this standard. Balloters may have voted forapproval, disapproval, or abstention. At the time this document went to ballot, the Accredited Standards Committee on Surge Arresters, C62, hadthe following membership:Joseph L. Koepfing

34、er, ChairS. Choinski, SecretaryVacant, NEMA Co-SecretaryNaeem Ahmad, IEEE Co-SecretaryOrganization Represented Name of RepresentativeElectric Light the complexities of the real world need to be simplified to produce a manageable set ofstandard surge tests. To this end, a surge environment classifica

35、tion scheme is presented inIEEE Std C62.41.2-2002. This classification provides a practical basis for the selection of waveforms andamplitudes for surge-voltages and surge-currents that may be applied to evaluate the surge withstand level2capability of equipment connected to these power circuits. It

36、 is important to recognize that proper coordinationof equipment capability and environment characteristics is required: each environment and the equipment tobe protected have to be characterized and the two have to be reconciled.2See Annex B for complementary notes on items appearing in bold italics

37、 in the text.Figure 1Guiding considerations for surge testingIEEE Std C62.41.2-2002IEC 61000-4-xx series*Or other*See Annex D for bibliographic citations of several IEC standards on test methods.IEEEEQUIPMENT CONNECTED TO LOW-VOLTAGE (1000 V AND LESS) AC POWER CIRCUITS Std C62.45-2002Copyright 2003

38、IEEE. All rights reserved. 3Regardless of the particular surge specification, equipment connected to the power system have to be capableof satisfactory operation, or at least survival, under these surge voltages or surge currents, with or withoutadditional protection as the case may be. The assignme

39、nt of withstand level remains the prerogative andresponsibility of the users of this document. Surge testing is therefore required to demonstrate this capability.To illustrate the process of surge testing procedures, Figure 1 shows a flow diagram of the guidingconsiderations that are essential to ob

40、taining reliable test results while enhancing operator safety.Note that the assignment of withstand levels for equipment is not included in the scope of this recommendedpractice. Surge testing on signal or data interfaces is also not included in the scope of this recommendedpractice, but should not

41、be overlooked in the complete evaluation of specific equipment.2. ReferencesIn this document, two types of “references” are used: those that are directly related to the subject beingdiscussed and often necessary to consult when using this guidetrue referencesand those that providesupporting informat

42、ion to the subject being discussedbibliographic citations. For the convenience of thereader in not breaking the pace of reading to look up the citation, yet have some indication on what matter isbeing referenced, “references” and “citations” are briefly identified in the text as described below.The

43、first type, references, contains information that is implicitly adopted in the present document. Completeimplementation of any recommendations or validation of a statement made in this recommended practicewould require the reader to consult that reference for the details of the subject. This first t

44、ype is introduced inthe text as (Document identity), and the listing is provided below, in this clause.The second type, bibliographic citations, is not essential to implementation of a recommendation orcomprehensive validation, but it is provided for the use of readers seeking more detailed informat

45、ion orjustification. This second type is introduced in the text as (Author, date B#), and the listing is provided inAnnexD.This recommended practice shall be used in conjunction with the following publications. If the followingpublications are superseded by an approved revision, the revisions shall

46、apply.IEC 60060-2 (1994), High voltage test technologiesPart 2: Measuring systems.3IEEE Std 4-1995, Standard Techniques for High Voltage Testing.4, 5IEEE Std C62.41.1-2002, IEEE Guide on the Surge Environment in Low-Voltage (1000 V and Less) ACPower Circuits.IEEE Std C62.41.2-2002, IEEE Recommended

47、Practice on Characterization of Surges in Low-Voltage(1000 V and Less) AC Power Circuits.NFPA 70-1999, National Electrical Code.6UL Std 1449, Standard for SafetyTransient Voltage Surge Suppressors, Second Edition, 1996.73IEC publications are available from the Sales Department of the International E

48、lectrotechnical Commission, Case Postale 131, 3, ruede Varemb, CH-1211, Genve 20, Switzerland/Suisse (http:/www.iec.ch/). IEC publications are also available in the United Statesfrom the Sales Department, American National Standards Institute, 11 West 42nd Street, 13th Floor, New York, NY 10036, USA

49、.4The IEEE standards or products referred to in Clause 2 are trademarks owned by the Institute of Electrical and Electronics Engineers,Incorporated.5IEEE publications are available from the Institute of Electrical and Electronics Engineers, 445 Hoes Lane, P.O. Box 1331, Piscataway,NJ 08855-1331, USA (http:/standards.ieee.org/).6NFPA publications are published by the National Fire Protection Association, Batterymarch Park, Quincy, MA 02269, USA(http:/www.nfpa.org/).IEEEStd C62.45-2002 IEEE RECOMMENDED PRACTICE ON SURGE TESTING FOR4 Copyright 2003 IEEE. All