IEEE C62 43-2005 en Guide for the Application of Surge Protectors Used in Low-Voltage (Equal to or Less than 1000 V rms or 1200 V DC) Data Communications and Si.pdf
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1、IEEE Std C62.43-2005(Revision ofIEEE Std C62.43-1999)IEEE Guide for the Application ofSurge Protectors Used in Low-Vo l t a g e(Equal to or Less than 1000 V, rms, or1200 V, dc) Data, Communications,and Signaling CircuitsI E E E3 Park Avenue New York, NY 10016-5997, USA23 November 2005IEEE Power Engi
2、neering SocietySponsored by theSurge Protective Devices CommitteeThe Institute of Electrical and Electronics Engineers, Inc.3 Park Avenue, New York, NY 10016-5997, USACopyright 2005 by the Institute of Electrical and Electronics Engineers, Inc.All rights reserved. Published 10 November 2005. Printed
3、 in the United States of America.IEEE is a registered trademark in the U.S. Patent +1 978 750 8400. Permission to photocopy portions of any individual standard for educational classroom use can also be obtained through the Copyright Clearance Center. Copyright 2005 IEEE. All rights reserved. iiiIntr
4、oductionThis application guide was developed to assist the users of IEEE Std C62.36TM-2000. The surge protectorscovered are multiple-component series or parallel combinations of linear or nonlinear elements packaged forthe purpose of limiting surge voltages, currents, or both. Some tests are not sui
5、table for all surge protectors as the test methods and criteria given apply to surgeprotectors with different functions and environmental performance. This guide will help manufacturers andusers to decide which tests apply to a surge protector intended for a specific application and how to set upand
6、 run those tests.The need for this application guide originated because of the following industry trends: A loss of expertise in protection of equipment connected to data, communications, or signalingcircuits Decreasing awareness of the historical data and rationale on which standards have been base
7、d Increased use of sensitive electronic circuits that require surge protectionThis substantially revised edition of the application guide now includes informative annexes coveringapplications as well as updated descriptions of protective devices. In addition, this revision comprehends thechanges mad
8、e to C62.36 in the 2000 edition. These changes include Tests for insertion loss and return loss, which were changed to use network analyzers in high-frequencyapplications A new test for measuring the degree of coupling between ports of a multiport surge protector A pulse mask testNotice to usersErra
9、taErrata, if any, for this and all other standards can be accessed at the following URL: http:/standards.ieee.org/reading/ieee/updates/errata/index.html. Users are encouraged to check this URL forerrata periodically.InterpretationsCurrent interpretations can be accessed at the following URL: http:/s
10、tandards.ieee.org/reading/ieee/interp/index.html.PatentsAttention is called to the possibility that implementation of this guide may require use of subject mattercovered by patent rights. By publication of this standard, no position is taken with respect to the existence orvalidity of any patent rig
11、hts in connection therewith. The IEEE shall not be responsible for identifyingpatents or patent applications for which a license may be required to implement an IEEE standard or forconducting inquiries into the legal validity or scope of those patents that are brought to its attention.This introduct
12、ion is not part of IEEE Std C62.43-2005, IEEE Guide for the Application of Surge Protectors Usedin Low-Voltage (Equal to or Less than 1000 V, rms, or 1200 V, dc) Data, Communications, and Signaling Circuits.iv Copyright 2005 IEEE. All rights reserved.ParticipantsAt the time this guide was completed,
13、 the C62.43 Working Group had the following membership:Bill Curry, ChairAlbert Martin, Vice Chair, Secretary, and EditorMichael Maytum, Figures EditorDee Unterweger, Editor EmeritusThe following members of the individual balloting committee voted on this guide. Balloters may have votedfor approval,
14、disapproval, or abstention.When the IEEE-SA Standards Board approved this guide on 10 May 2005, it had the following membership:Don Wright, ChairSteve M. Mills, Vice ChairJudith Gorman, Secretary*Member EmeritusJack CawleyNisar ChaudhryChrysanthos ChrysanthouErnie GalloWilliam GoldbachDavid Hutchins
15、Philip JonesBogey KlobassaCarl LindquistMark LynnesWolfgang OertelMichael ParenteBrian PriceDavid RawlingsAlan RebeckDon TurnerMark BushnellJames CaseChrysanthos ChrysanthouTommy CooperBill CurryR. DaubertStephen DareByron DavenportRandall DotsonCharles DrexlerAmir El-SheikhGary EngmannJames FunkeEr
16、nie GalloWilliam GoldbachRandall GrovesKen HanusEdward Horgan, Jr.David JacksonPhilip JonesJancauskas JosephWilhelm KappYuri KhersonskyJoseph L. KoepfingerSaumen KunduCarl LaPlaceBenny LeeJason LinCarl LindquistAl MaguireAhmad MahinFallahAlbert MartinJesus MartinezMichael MaytumNigel McQuinGary Mich
17、elCharles NgetheFrederick OKeefeWolfgang OertelMichael ParenteRalph Philbrook IIIRobert A. ResauliJohannes RickmanMichael RobertsJames RuggieriKoenraad RutgersKeith StumpDon TurnerJames WilsonChuck AdamsStephen BergerMark D. BowmanJoseph A. BruderBob DavisRoberto de Marca BoissonJulian Forster*Arnol
18、d M. GreenspanMark S. HalpinRaymond HapemanRichard J. HollemanRichard H. HulettLowell G. JohnsonJoseph L. Koepfinger*Hermann KochThomas J. McGeanDaleep C. MohlaPaul NikolichT. W. OlsenRonald C. PetersenGary S. RobinsonFrank StoneMalcolm V. ThadenDoug ToppingJoe D. WatsonCopyright 2005 IEEE. All righ
19、ts reserved. vAlso included are the following nonvoting IEEE-SA Standards Board liaisons:Satish K. Aggarwal, NRC RepresentativeRichard DeBlasio, DOE RepresentativeAlan Cookson, NIST RepresentativeMichael D. FisherIEEE Standards Project Editorvi Copyright 2005 IEEE. All rights reserved.Contents1. Ove
20、rview 11.1 Scope 11.2 Purpose. 21.3 Electrical environment. 22. Normative references . 23. General theory of operation . 33.1 General description 33.2 General theory of operation . 43.3 Two-terminal basic configuration 53.4 Three-terminal basic configuration 53.5 Three-terminal theory of operation 6
21、3.6 Four-terminal basic configuration . 73.7 Four-terminal theory of operation 73.8 Five-terminal basic configuration 83.9 Five-terminal theory of operation 94. Protector characteristics: nonsurge performance tests. 104.1 Rated voltage test. 104.2 Rated current test . 104.3 DC series resistance test
22、 114.4 Standby current and insulation resistance test . 114.5 Capacitance test . 124.6 Inductance test . 124.7 Insertion loss test . 134.8 Phase shift test . 134.9 Return loss test. 144.10 Longitudinal balance test . 144.11 Pulse mask test. 154.12 Rise and decay time test. 154.13 Bit-error rate test
23、 155. Protector characteristics: active performance tests 165.1 DC-limiting voltage test. 165.2 Impulse-limiting voltage test . 165.3 Transition current test 175.4 Current response time test 185.5 Impulse reset test . 195.6 Current reset test 205.7 AC life test . 215.8 Impulse life test 215.9 Maximu
24、m single-impulse discharge test . 225.10 Multiport coupling test. 23Copyright 2005 IEEE. All rights reserved. vii6. Application of surge protectors used in low-voltage data, communications, and signaling circuits . 236.1 Operational compatibility 246.2 Voltage limiting . 246.3 Grounding and bonding
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