IEEE C57 113-2010 en Recommended Practice for Partial Discharge Measurement in Liquid-Filled Power Transformers and Shunt Reactors《充液电力变压器和并联电抗器局部放电测量的IEEE推荐性操作.pdf

《IEEE C57 113-2010 en Recommended Practice for Partial Discharge Measurement in Liquid-Filled Power Transformers and Shunt Reactors《充液电力变压器和并联电抗器局部放电测量的IEEE推荐性操作.pdf》由会员分享，可在线阅读，更多相关《IEEE C57 113-2010 en Recommended Practice for Partial Discharge Measurement in Liquid-Filled Power Transformers and Shunt Reactors《充液电力变压器和并联电抗器局部放电测量的IEEE推荐性操作.pdf（47页珍藏版）》请在麦多课文档分享上搜索。

1、g44g40g40g40g3g54g87g71g3g38g24g26g17g20g20g22g140g16g21g19g20g19g11g53g72g89g76g86g76g82g81g3g82g73g44g40g40g40g3g54g87g71g3g38g24g26g17g20g20g22g16g20g28g28g20g12g3g44g40g40g40g3g53g72g70g82g80g80g72g81g71g72g71g3g51g85g68g70g87g76g70g72g3g73g82g85g51g68g85g87g76g68g79g3g39g76g86g70g75g68g85g74g72

2、g3g48g72g68g86g88g85g72g80g72g81g87g3g76g81g47g76g84g88g76g71g16g41g76g79g79g72g71g3g51g82g90g72g85g3g55g85g68g81g86g73g82g85g80g72g85g86g3g68g81g71g54g75g88g81g87g3g53g72g68g70g87g82g85g86g3g44g40g40g40g3g51g82g90g72g85g3g9g3g40g81g72g85g74g92g3g54g82g70g76g72g87g92g3g54g83g82g81g86g82g85g72g71g3g6

3、9g92g3g87g75g72g55g85g68g81g86g73g82g85g80g72g85g86g3g38g82g80g80g76g87g87g72g72g3g44g40g40g40g22g3g51g68g85g78g3g36g89g72g81g88g72g3g49g72g90g3g60g82g85g78g15g3g49g60g3g20g19g19g20g25g16g24g28g28g26g15g3g56g54g36g3g3g21g19g3g36g88g74g88g86g87g3g21g19g20g19g38g24g26g17g20g20g22g55g48IEEE Std C57.113

4、-2010 (Revision of IEEE Std C57.113-1991) IEEE Recommended Practice for Partial Discharge Measurement in Liquid-Filled Power Transformers and Shunt Reactors Sponsor Transformers Committee of the IEEE Power +1 978 750 8400. Permission to photocopy portions of any individual standard for educational c

5、lassroom use can also be obtained through the Copyright Clearance Center. Introduction This introduction is not part of IEEE Std C57.113-2010, IEEE Recommended Practice for Partial Discharge Measurement in Liquid-Filled Power Transformers and Shunt Reactors. The detection of partial discharges (PDs)

6、 was introduced for quality assurance tests of high-voltage (HV) apparatus at the beginning of 1960. Originally this technique was based on the measurement of radio interference voltages (RIV) in terms of microvolts (V) as recommended by NEMA TR1-1974 B112, NEMA 107-1964 B113, and CISPR 16-1-1993 B4

7、2.aThis quantity, however, is weighted according to the acoustical noise impression of the human ear, which is not a measure of the PD activity in the insulation of HV apparatus. As a consequence, Technical Committee No. 42 of IEC decided to prepare a separate standard for PD measurements associated

8、 with the apparent charge, which was first published in 1968. Since that time, this technology is considered as an indispensable tool for an enhancement of the reliability of HV apparatus. IEEE Std C57.113-2010 covers the wideband method for apparent charge measurements in compliance with the third

9、edition of IEC 60270, published in 2000.bNotice to users Laws and regulations Users of these documents should consult all applicable laws and regulations. Compliance with the provisions of this standard does not imply compliance to any applicable regulatory requirements. Implementers of the standard

10、 are responsible for observing or referring to the applicable regulatory requirements. IEEE does not, by the publication of its standards, intend to urge action that is not in compliance with applicable laws, and these documents may not be construed as doing so. Copyrights This document is copyright

11、ed by the IEEE. It is made available for a wide variety of both public and private uses. These include both use, by reference, in laws and regulations, and use in private self-regulation, standardization, and the promotion of engineering practices and methods. By making this document available for u

12、se and adoption by public authorities and private users, the IEEE does not waive any rights in copyright to this document. aThe numbers in brackets correspond to those of the bibliography in Annex H. bInformation on references can be found in Clause 2. iv Copyright 2010 IEEE. All rights reserved. Up

13、dating of IEEE documents Users of IEEE standards should be aware that these documents may be superseded at any time by the issuance of new editions or may be amended from time to time through the issuance of amendments, corrigenda, or errata. An official IEEE document at any point in time consists o

14、f the current edition of the document together with any amendments, corrigenda, or errata then in effect. In order to determine whether a given document is the current edition and whether it has been amended through the issuance of amendments, corrigenda, or errata, visit the IEEE Standards Associat

15、ion web site at http:/ieeexplore.ieee.org/xpl/standards.jsp, or contact the IEEE at the address listed previously. For more information about the IEEE Standards Association or the IEEE standards development process, visit the IEEE-SA web site at http:/standards.ieee.org. Errata Errata, if any, for t

16、his and all other standards can be accessed at the following URL: http:/standards.ieee.org/reading/ieee/updates/errata/index.html. Users are encouraged to check this URL for errata periodically. Interpretations Current interpretations can be accessed at the following URL: http:/standards.ieee.org/re

17、ading/ieee/interp/ index.html. Patents Attention is called to the possibility that implementation of this recommended practice may require use of subject matter covered by patent rights. By publication of this recommended practice, no position is taken with respect to the existence or validity of an

18、y patent rights in connection therewith. The IEEE is not responsible for identifying Essential Patent Claims for which a license may be required, for conducting inquiries into the legal validity or scope of Patents Claims or determining whether any licensing terms or conditions provided in connectio

19、n with submission of a Letter of Assurance, if any, or in any licensing agreements are reasonable or non-discriminatory. Users of this recommended practice are expressly advised that determination of the validity of any patent rights, and the risk of infringement of such rights, is entirely their ow

20、n responsibility. Further information may be obtained from the IEEE Standards Association. v Copyright 2010 IEEE. All rights reserved. vi Copyright 2010 IEEE. All rights reserved. Participants At the time this recommended practice was submitted to the IEEE-SA Standards Board for approval, the Dielec

21、tric TestsTF on PD Measurement Working Group had the following membership: Bertrand Poulin, Chair Raymond Bartnikas Alain Bolliger Carl Bush Alan Darwin Reto Fausch Marcel Fortin John Harley Peter Heinzig Thang Hochanh Stephen Jordan Vladimir Khalin Eberhard Lemke Paul Millward Arthur Molden Martin

22、Navarro Ron Nicholas Mark Perkins Gustav Preininger Dirk Russwurm Hemchandra Shertukde Charles Sweetser Juan Luis Thierry Subash Tuli Dharam Vir Loren Wagenaar Hanxin Zhu Waldemar Ziomek Most of the work in writing this document was done by the TF Chair Eberhard Lemke and TF Members Marcel Fortin, J

23、ohn Harley, Thang Hochanh, Stephen Jordan, Vladimir Khalin, Mark Perkins, Bertrand Poulin, and Loren Wagenaar. The following members of the individual balloting committee voted on this recommended practice. Balloters may have voted for approval, disapproval, or abstention. Samuel H. Aguirre Stan Arn

24、ot Carlo Arpino Javier Arteaga Ali Al Awazi Martin Baur Barry Beaster Stephen Beattie W. J. Bill Bergman Steven Bezner Wallace Binder Thomas Blackburn Thomas Blair David Blew William Bloethe W. Boettger Paul Boman Harvey Bowles Jeffrey Britton Chris Brooks Kent Brown Carl Bush Donald Cash Yunxiang C

25、hen Bill Chiu Craig Colopy Tommy Cooper Jerry Corkran John Crouse Alan Darwin John Densley Dieter Dohnal Randall Dotson Donald Dunn Fred Elliott Gary Engmann Donald Fallon Rabiz Foda Joseph Foldi Bruce Forsyth Marcel Fortin Saurabh Ghosh Jalal Gohari Eduardo Gomez-Hennig Edwin Goodwin James Graham R

26、andall Groves Bal Gupta Kenneth Hanus David Harris Robert Hartgrove Roger Hayes Peter Heinzig Gary Heuston James Huddleston III Wayne Johnson James Jones Stephen Jordan Lars Juhlin C. Kalra Gael Kennedy Sheldon Kennedy Vladimir Khalin Joseph L. Koepfinger Jim Kulchisky Saumen Kundu John Lackey Chung

27、-Yiu Lam Stephen Lambert Thomas La Rose Raymond Lings Maurice Linker Thomas Lundquist G. Luri Keith Malmedal J. Dennis Marlow John W. Matthews Joseph Melanson Gary Michel Daleep Mohla Daniel Mulkey Jerry Murphy Michael S. Newman Raymond Nicholas Miklos Orosz J. Patton Brian Penny Patrick Picher Paul

28、 Pillitteri Alvaro Portillo Bertrand Poulin Paulette Payne Powell Gustav Preininger Iulian Profir Pierre Riffon Michael Roberts Oleg Roizman Marnie Roussell Thomas Rozek Dinesh Sankarakurup Daniel Sauer Gregg Sauer Bartien Sayogo Hyeong Sim Tarkeshwar Singh Charles Smith James Smith Jerry Smith John

29、 Stein John Sullivan S. Thamilarasan James Thompson Subhash Tuli Joe Uchiyama John Vergis Jane Verner Loren Wagenaar Barry Ward Thomas Wier When the IEEE-SA Standards Board approved this recommended practice on 17 June 2010, it had the following membership: Robert M. Grow, Chair Richard H. Hulett, V

30、ice Chair Steve M. Mills, Past Chair Judith Gorman, Secretary Karen Bartleson Victor Berman Ted Burse Clint Chaplin Andy Drozd Alexander Gelman Jim Hughes Young Kyun Kim Joseph L. Koepfinger* John Kulick David J. Law Hung Ling Oleg Logvinov Ted Olsen Ronald C. Petersen Thomas Prevost Jon Walter Rosd

31、ahl Sam Sciacca Mike Seavey Curtis Siller Don Wright *Member Emeritus Also included are the following nonvoting IEEE-SA Standards Board liaisons: Satish K. Aggarwal, NRC Representative Richard DeBlasio, DOE Representative Michael Janezic, NIST Representative Don Messina IEEE Standards Program Manage

32、r, Document Development Matthew J. Ceglia IEEE Standards Program Manager, Technical Program Development vii Copyright 2010 IEEE. All rights reserved. Contents 1. Overview 1 1.1 Scope . 1 1.2 Purpose 1 2. Normative references 2 3. Definitions 2 4. Specification of PD measuring circuits 3 4.1 General

33、3 4.2 Coupling capacitor. 4 4.3 Measuring impedance 5 4.4 PD measuring instrument 5 4.5 PD calibrator 7 4.6 Maintaining the specified parameters of PD measuring circuits . 8 5. PD test procedure . 8 5.1 Calibration . 8 5.2 PD measurement 9 Annex A (informative) Design of PD coupling units. 12 Annex

34、B (informative) Response of PD measuring instruments 17 Annex C (informative) Calibration of PD measuring circuits 20 Annex D (informative) Basic sensitivity check 21 Annex E (informative) Bushing tap ratio measurement . 23 Annex F (informative) Noise identification . 24 Annex G (informative) PD pat

35、tern recognition 27 Annex H (informative) Bibliography . 29 viii Copyright 2010 IEEE. All rights reserved. 1 Copyright 2010 IEEE. All rights reserved. IEEE Recommended Practice for Partial Discharge Measurement in Liquid-Filled Power Transformers and Shunt Reactors IMPORTANT NOTICE: This standard is

36、 not intended to ensure safety, security, health, or environmental protection. Implementers of the standard are responsible for determining appropriate safety, security, environmental, and health practices or regulatory requirements. This IEEE document is made available for use subject to important

37、notices and legal disclaimers. These notices and disclaimers appear in all publications containing this document and may be found under the heading “Important Notice” or “Important Notices and Disclaimers Concerning IEEE Documents.” They can also be obtained on request from IEEE or viewed at http:/s

38、tandards.ieee.org/IPR/disclaimers.html. 1. Overview 1.1 Scope This recommended practice describes the test procedure for the detection and measurement by the wideband apparent charge method of partial discharges (PDs) occurring in liquid-filled power transformers and shunt reactors during dielectric

39、 tests, where applicable. 1.2 Purpose PD measurements in transformers and shunt reactors should preferably be made on the basis of measurement of the apparent charge. Relevant measuring systems are classified as narrowband or wideband systems. Both systems are recognized and widely used. Without giv

40、ing preference to one or the other, it is the object of this document to describe the wideband method. General principles of PD measurements, including the narrowband method, are covered in IEC 60270 and IEC 60076-3 B71.1,21Information on references can be found in Clause 2. 2The numbers in brackets

41、 correspond to those of the bibliography in Annex H. IEEE Std C57.113-2010 IEEE Recommended Practice for Partial Discharge Measurement in Liquid-Filled Power Transformers and Shunt Reactors 2. Normative references The following referenced documents are indispensable for the application of this docum

42、ent (i.e., they must be understood and used, so each referenced document is cited in text and its relationship to this document is explained). For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments or corr

43、igenda) applies. IEC 60270, High-voltage test techniquesPartial discharge measurements.3IEEE Std 4, IEEE Standard Techniques for High Voltage Testing.4,5IEEE Std C57.12.00, IEEE Standard General Requirements for Liquid-Immersed Distribution, Power, and Regulating Transformers (ANSI) IEEE Std C57.12.

44、90, IEEE Standard Test Code for Liquid-Immersed Distribution, Power, and Regulating Transformers IEEE Std C57.19.00, IEEE Standard Requirements and Test Procedures for Power Apparatus Bushings. 3. Definitions For the purposes of this document, the following terms and definitions apply. The IEEE Stan

45、dards Dictionary: Glossary of Terms see Annex A. If the bushing tap coupling mode according to Figure 1 is used, the measuring impedance, Zm, consists of the parallel connection of a resistor, Rm, and an inductor, Lm. Both elements are additionally shunted by the capacitance between bushing tap and

46、grounded bushing flange, C2; see Annex A. Moreover, passive and active elements could be utilized for PD signal filtering and overvoltage protection. All these elements are usually integrated in a terminating box, referred to in IEC 60270 as a coupling device, Dc. Due to the high-pass filter charact

47、eristics of the series connection of either Ckor C1with the measuring impedance, Zm, care should be taken that the specified lower limit frequency, f1, of the complete PD measuring circuit is not substantially affected by the parameters of the PD coupling unit; see Annex A. WARNING In order to minim

48、ize any danger for the operator and the instrumentation, as well as to ensure an optimum signal transmission, the coupling device should always be located inside the HV test area. The coupling device shall be attached physically as close as possible to the bushing tap or to the coupling capacitor. 4

49、.4 PD measuring instrument For measuring the apparent charge, either the analog or the digital signal processing can be utilized. Independent from the measuring principle applied, the instrumentation is generally equipped with the following major units: Attenuator, to adjust the magnitude of the input PD pulses Band-pass filter amplifier, to amplify and integrate the captured PD pulses Peak detector, to evaluate the apparent charge level To ensure comparable and reproducible PD test results, both the frequency response and the pulse train response of PD m