IEEE C57 113-2010 en Recommended Practice for Partial Discharge Measurement in Liquid-Filled Power Transformers and Shunt Reactors《充液电力变压器和并联电抗器局部放电测量的IEEE推荐性操作.pdf
《IEEE C57 113-2010 en Recommended Practice for Partial Discharge Measurement in Liquid-Filled Power Transformers and Shunt Reactors《充液电力变压器和并联电抗器局部放电测量的IEEE推荐性操作.pdf》由会员分享,可在线阅读,更多相关《IEEE C57 113-2010 en Recommended Practice for Partial Discharge Measurement in Liquid-Filled Power Transformers and Shunt Reactors《充液电力变压器和并联电抗器局部放电测量的IEEE推荐性操作.pdf(47页珍藏版)》请在麦多课文档分享上搜索。
1、g44g40g40g40g3g54g87g71g3g38g24g26g17g20g20g22g140g16g21g19g20g19g11g53g72g89g76g86g76g82g81g3g82g73g44g40g40g40g3g54g87g71g3g38g24g26g17g20g20g22g16g20g28g28g20g12g3g44g40g40g40g3g53g72g70g82g80g80g72g81g71g72g71g3g51g85g68g70g87g76g70g72g3g73g82g85g51g68g85g87g76g68g79g3g39g76g86g70g75g68g85g74g72
2、g3g48g72g68g86g88g85g72g80g72g81g87g3g76g81g47g76g84g88g76g71g16g41g76g79g79g72g71g3g51g82g90g72g85g3g55g85g68g81g86g73g82g85g80g72g85g86g3g68g81g71g54g75g88g81g87g3g53g72g68g70g87g82g85g86g3g44g40g40g40g3g51g82g90g72g85g3g9g3g40g81g72g85g74g92g3g54g82g70g76g72g87g92g3g54g83g82g81g86g82g85g72g71g3g6
3、9g92g3g87g75g72g55g85g68g81g86g73g82g85g80g72g85g86g3g38g82g80g80g76g87g87g72g72g3g44g40g40g40g22g3g51g68g85g78g3g36g89g72g81g88g72g3g49g72g90g3g60g82g85g78g15g3g49g60g3g20g19g19g20g25g16g24g28g28g26g15g3g56g54g36g3g3g21g19g3g36g88g74g88g86g87g3g21g19g20g19g38g24g26g17g20g20g22g55g48IEEE Std C57.113
4、-2010 (Revision of IEEE Std C57.113-1991) IEEE Recommended Practice for Partial Discharge Measurement in Liquid-Filled Power Transformers and Shunt Reactors Sponsor Transformers Committee of the IEEE Power +1 978 750 8400. Permission to photocopy portions of any individual standard for educational c
5、lassroom use can also be obtained through the Copyright Clearance Center. Introduction This introduction is not part of IEEE Std C57.113-2010, IEEE Recommended Practice for Partial Discharge Measurement in Liquid-Filled Power Transformers and Shunt Reactors. The detection of partial discharges (PDs)
6、 was introduced for quality assurance tests of high-voltage (HV) apparatus at the beginning of 1960. Originally this technique was based on the measurement of radio interference voltages (RIV) in terms of microvolts (V) as recommended by NEMA TR1-1974 B112, NEMA 107-1964 B113, and CISPR 16-1-1993 B4
7、2.aThis quantity, however, is weighted according to the acoustical noise impression of the human ear, which is not a measure of the PD activity in the insulation of HV apparatus. As a consequence, Technical Committee No. 42 of IEC decided to prepare a separate standard for PD measurements associated
8、 with the apparent charge, which was first published in 1968. Since that time, this technology is considered as an indispensable tool for an enhancement of the reliability of HV apparatus. IEEE Std C57.113-2010 covers the wideband method for apparent charge measurements in compliance with the third
9、edition of IEC 60270, published in 2000.bNotice to users Laws and regulations Users of these documents should consult all applicable laws and regulations. Compliance with the provisions of this standard does not imply compliance to any applicable regulatory requirements. Implementers of the standard
10、 are responsible for observing or referring to the applicable regulatory requirements. IEEE does not, by the publication of its standards, intend to urge action that is not in compliance with applicable laws, and these documents may not be construed as doing so. Copyrights This document is copyright
11、ed by the IEEE. It is made available for a wide variety of both public and private uses. These include both use, by reference, in laws and regulations, and use in private self-regulation, standardization, and the promotion of engineering practices and methods. By making this document available for u
12、se and adoption by public authorities and private users, the IEEE does not waive any rights in copyright to this document. aThe numbers in brackets correspond to those of the bibliography in Annex H. bInformation on references can be found in Clause 2. iv Copyright 2010 IEEE. All rights reserved. Up
13、dating of IEEE documents Users of IEEE standards should be aware that these documents may be superseded at any time by the issuance of new editions or may be amended from time to time through the issuance of amendments, corrigenda, or errata. An official IEEE document at any point in time consists o
14、f the current edition of the document together with any amendments, corrigenda, or errata then in effect. In order to determine whether a given document is the current edition and whether it has been amended through the issuance of amendments, corrigenda, or errata, visit the IEEE Standards Associat
15、ion web site at http:/ieeexplore.ieee.org/xpl/standards.jsp, or contact the IEEE at the address listed previously. For more information about the IEEE Standards Association or the IEEE standards development process, visit the IEEE-SA web site at http:/standards.ieee.org. Errata Errata, if any, for t
16、his and all other standards can be accessed at the following URL: http:/standards.ieee.org/reading/ieee/updates/errata/index.html. Users are encouraged to check this URL for errata periodically. Interpretations Current interpretations can be accessed at the following URL: http:/standards.ieee.org/re
17、ading/ieee/interp/ index.html. Patents Attention is called to the possibility that implementation of this recommended practice may require use of subject matter covered by patent rights. By publication of this recommended practice, no position is taken with respect to the existence or validity of an
18、y patent rights in connection therewith. The IEEE is not responsible for identifying Essential Patent Claims for which a license may be required, for conducting inquiries into the legal validity or scope of Patents Claims or determining whether any licensing terms or conditions provided in connectio
19、n with submission of a Letter of Assurance, if any, or in any licensing agreements are reasonable or non-discriminatory. Users of this recommended practice are expressly advised that determination of the validity of any patent rights, and the risk of infringement of such rights, is entirely their ow
20、n responsibility. Further information may be obtained from the IEEE Standards Association. v Copyright 2010 IEEE. All rights reserved. vi Copyright 2010 IEEE. All rights reserved. Participants At the time this recommended practice was submitted to the IEEE-SA Standards Board for approval, the Dielec
21、tric TestsTF on PD Measurement Working Group had the following membership: Bertrand Poulin, Chair Raymond Bartnikas Alain Bolliger Carl Bush Alan Darwin Reto Fausch Marcel Fortin John Harley Peter Heinzig Thang Hochanh Stephen Jordan Vladimir Khalin Eberhard Lemke Paul Millward Arthur Molden Martin
22、Navarro Ron Nicholas Mark Perkins Gustav Preininger Dirk Russwurm Hemchandra Shertukde Charles Sweetser Juan Luis Thierry Subash Tuli Dharam Vir Loren Wagenaar Hanxin Zhu Waldemar Ziomek Most of the work in writing this document was done by the TF Chair Eberhard Lemke and TF Members Marcel Fortin, J
23、ohn Harley, Thang Hochanh, Stephen Jordan, Vladimir Khalin, Mark Perkins, Bertrand Poulin, and Loren Wagenaar. The following members of the individual balloting committee voted on this recommended practice. Balloters may have voted for approval, disapproval, or abstention. Samuel H. Aguirre Stan Arn
24、ot Carlo Arpino Javier Arteaga Ali Al Awazi Martin Baur Barry Beaster Stephen Beattie W. J. Bill Bergman Steven Bezner Wallace Binder Thomas Blackburn Thomas Blair David Blew William Bloethe W. Boettger Paul Boman Harvey Bowles Jeffrey Britton Chris Brooks Kent Brown Carl Bush Donald Cash Yunxiang C
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