IEEE C37 114-2014 en Guide for Determining Fault Location on AC Transmission and Distribution Lines《交流传输线和分配线的故障部位测定指南》.pdf

《IEEE C37 114-2014 en Guide for Determining Fault Location on AC Transmission and Distribution Lines《交流传输线和分配线的故障部位测定指南》.pdf》由会员分享，可在线阅读，更多相关《IEEE C37 114-2014 en Guide for Determining Fault Location on AC Transmission and Distribution Lines《交流传输线和分配线的故障部位测定指南》.pdf（76页珍藏版）》请在麦多课文档分享上搜索。

1、 IEEE Guide for Determining Fault Location on AC Transmission and Distribution Lines Sponsored by the Power System Relaying Committee IEEE 3 Park Avenue New York, NY 10016-5997 USA IEEE Power and Energy Society IEEE Std C37.114-2014 (Revision of IEEE Std C37.114-2004) IEEE Std C37.114-2014 (Revision

2、 of IEEE Std C37.114-2004) IEEE Guide for Determining Fault Location on AC Transmission and Distribution Lines Sponsor Power System Relaying Committee of the IEEE Power and Energy Society Approved 10 December 2014 IEEE-SA Standards Board Abstract: Electrical faults on transmission and distribution l

3、ines are detected and isolated by system protective devices. Once the fault has been cleared, outage times can be reduced if the location of the fault can be determined more quickly. The techniques and application considerations for determining the location of a fault on ac transmission and distribu

4、tion lines are outlined in this guide. Traditional approaches and the primary measurement techniques used in modern devices are reviewed: one- and two-terminal impedance-based methods and traveling-wave methods. Application considerations include: two- and three-terminal lines, series-compensated li

5、nes, parallel lines, untransposed lines, underground cables, fault resistance effects, and other power system conditions, including those unique to distribution systems. Keywords: fault location, IEEE C37.114, relays, synchrophasor, system protection, travelling waves The Institute of Electrical and

6、 Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright 2015 by The Institute of Electrical and Electronics Engineers, Inc. All rights reserved. Published 30 January 2015. Printed in the United States of America. IEEE is a registered trademark in the U.S. Patent fitness fo

7、r a particular purpose; non-infringement; and quality, accuracy, effectiveness, currency, or completeness of material. In addition, IEEE disclaims any and all conditions relating to: results; and workmanlike effort. IEEE standards documents are supplied “AS IS” and “WITH ALL FAULTS.” Use of an IEEE

8、standard is wholly voluntary. The existence of an IEEE standard does not imply that there are no other ways to produce, test, measure, purchase, market, or provide other goods and services related to the scope of the IEEE standard. Furthermore, the viewpoint expressed at the time a standard is appro

9、ved and issued is subject to change brought about through developments in the state of the art and comments received from users of the standard. In publishing and making its standards available, IEEE is not suggesting or rendering professional or other services for, or on behalf of, any person or en

10、tity nor is IEEE undertaking to perform any duty owed by any other person or entity to another. Any person utilizing any IEEE Standards document, should rely upon his or her own independent judgment in the exercise of reasonable care in any given circumstances or, as appropriate, seek the advice of

11、a competent professional in determining the appropriateness of a given IEEE standard. IN NO EVENT SHALL IEEE BE LIABLE FOR ANY DIRECT, INDIRECT, INCIDENTAL, SPECIAL, EXEMPLARY, OR CONSEQUENTIAL DAMAGES (INCLUDING, BUT NOT LIMITED TO: PROCUREMENT OF SUBSTITUTE GOODS OR SERVICES; LOSS OF USE, DATA, OR

12、 PROFITS; OR BUSINESS INTERRUPTION) HOWEVER CAUSED AND ON ANY THEORY OF LIABILITY, WHETHER IN CONTRACT, STRICT LIABILITY, OR TORT (INCLUDING NEGLIGENCE OR OTHERWISE) ARISING IN ANY WAY OUT OF THE PUBLICATION, USE OF, OR RELIANCE UPON ANY STANDARD, EVEN IF ADVISED OF THE POSSIBILITY OF SUCH DAMAGE AN

13、D REGARDLESS OF WHETHER SUCH DAMAGE WAS FORESEEABLE. Translations The IEEE consensus development process involves the review of documents in English only. In the event that an IEEE standard is translated, only the English version published by IEEE should be considered the approved IEEE standard. Off

14、icial statements A statement, written or oral, that is not processed in accordance with the IEEE-SA Standards Board Operations Manual shall not be considered or inferred to be the official position of IEEE or any of its committees and shall not be considered to be, or be relied upon as, a formal pos

15、ition of IEEE. At lectures, symposia, seminars, or educational courses, an individual presenting information on IEEE standards shall make it clear that his or her views should be considered the personal views of that individual rather than the formal position of IEEE. Comments on standards Comments

16、for revision of IEEE Standards documents are welcome from any interested party, regardless of membership affiliation with IEEE. However, IEEE does not provide consulting information or advice pertaining to IEEE Standards documents. Suggestions for changes in documents should be in the form of a prop

17、osed change of text, together with appropriate supporting comments. Since IEEE standards represent a consensus of concerned interests, it is important that any responses to comments and questions also receive the concurrence of a balance of interests. For this reason, IEEE and the members of its soc

18、ieties and Standards Coordinating Committees are not able to provide an instant response to comments or questions except in those cases where the matter has previously been addressed. For the same reason, IEEE does not respond to interpretation requests. Any person who would like to participate in r

19、evisions to an IEEE standard is welcome to join the relevant IEEE working group. Comments on standards should be submitted to the following address: Secretary, IEEE-SA Standards Board 445 Hoes Lane Piscataway, NJ 08854 USA Laws and regulations Users of IEEE Standards documents should consult all app

20、licable laws and regulations. Compliance with the provisions of any IEEE Standards document does not imply compliance to any applicable regulatory requirements. Implementers of the standard are responsible for observing or referring to the applicable regulatory requirements. IEEE does not, by the pu

21、blication of its standards, intend to urge action that is not in compliance with applicable laws, and these documents may not be construed as doing so. Copyrights IEEE draft and approved standards are copyrighted by IEEE under U.S. and international copyright laws. They are made available by IEEE an

22、d are adopted for a wide variety of both public and private uses. These include both use, by reference, in laws and regulations, and use in private self-regulation, standardization, and the promotion of engineering practices and methods. By making these documents available for use and adoption by pu

23、blic authorities and private users, IEEE does not waive any rights in copyright to the documents. Photocopies Subject to payment of the appropriate fee, IEEE will grant users a limited, non-exclusive license to photocopy portions of any individual standard for company or organizational internal use

24、or individual, non-commercial use only. To arrange for payment of licensing fees, please contact Copyright Clearance Center, Customer Service, 222 Rosewood Drive, Danvers, MA 01923 USA; +1 978 750 8400. Permission to photocopy portions of any individual standard for educational classroom use can als

25、o be obtained through the Copyright Clearance Center. Updating of IEEE Standards documents Users of IEEE Standards documents should be aware that these documents may be superseded at any time by the issuance of new editions or may be amended from time to time through the issuance of amendments, corr

26、igenda, or errata. An official IEEE document at any point in time consists of the current edition of the document together with any amendments, corrigenda, or errata then in effect. Every IEEE standard is subjected to review at least every ten years. When a document is more than ten years old and ha

27、s not undergone a revision process, it is reasonable to conclude that its contents, although still of some value, do not wholly reflect the present state of the art. Users are cautioned to check to determine that they have the latest edition of any IEEE standard. In order to determine whether a give

28、n document is the current edition and whether it has been amended through the issuance of amendments, corrigenda, or errata, visit the IEEE-SA Website at http:/ieeexplore.ieee.org/xpl/standards.jsp or contact IEEE at the address listed previously. For more information about the IEEE SA or IEEEs stan

29、dards development process, visit the IEEE-SA Website at http:/standards.ieee.org. Errata Errata, if any, for all IEEE standards can be accessed on the IEEE-SA Website at the following URL: http:/standards.ieee.org/findstds/errata/index.html. Users are encouraged to check this URL for errata periodic

30、ally. Patents Attention is called to the possibility that implementation of this standard may require use of subject matter covered by patent rights. By publication of this standard, no position is taken by the IEEE with respect to the existence or validity of any patent rights in connection therewi

31、th. If a patent holder or patent applicant has filed a statement of assurance via an Accepted Letter of Assurance, then the statement is listed on the IEEE-SA Website at http:/standards.ieee.org/about/sasb/patcom/patents.html. Letters of Assurance may indicate whether the Submitter is willing or unw

32、illing to grant licenses under patent rights without compensation or under reasonable rates, with reasonable terms and conditions that are demonstrably free of any unfair discrimination to applicants desiring to obtain such licenses. Essential Patent Claims may exist for which a Letter of Assurance

33、has not been received. The IEEE is not responsible for identifying Essential Patent Claims for which a license may be required, for conducting inquiries into the legal validity or scope of Patents Claims, or determining whether any licensing terms or conditions provided in connection with submission

34、 of a Letter of Assurance, if any, or in any licensing agreements are reasonable or non-discriminatory. Users of this standard are expressly advised that determination of the validity of any patent rights, and the risk of infringement of such rights, is entirely their own responsibility. Further inf

35、ormation may be obtained from the IEEE Standards Association. Participants At the time this IEEE guide was completed, the Fault Location Working Group had the following membership: Joe Mooney, Chair Randall Cunico, Vice Chair Michael Agudo George Bartok Gabriel Benmouyal Brian Boysen Sukumar Brahma

36、Patrick T. Carroll Arvind Chaudhary Normann Fischer Fred Friend Rafael Garcia Yanfeng Gong Mansour Jalali Meyer Kao Mladen Kezunovic Ashish Kulshresthra Tony Napikoski Damier Novosel Jim OBrien Donald Parker Simon Richards Daniel Sabin Tony Seegers Steve Turner Jun Verzosa Liancheng Wang Ray Young Z

37、hiying Zhang Sergio L. Zimath Karl Zimmerman The following members of the individual balloting committee voted on this guide. Balloters may have voted for approval, disapproval, or abstention. William Ackerman Ali Al Awazi George Bartok Philip Beaumont Robert Beresh Wallace Binder William Bloethe Br

38、ian Boysen Gustavo Brunello William Byrd Paul Cardinal Arvind Chaudhary Stephen Conrad James Cornelison Luis Coronado Randall Crellin Randall Cunico Alla Deronja Gary Donner Gearold O. H. Eidhin Fred Friend Rafael Garcia Frank Gerleve Jalal Gohari Stephen Grier Randall Groves Ajit Gwal Keith Harley

39、Roger Hedding David Horvath Yi Hu Relu Ilie Brian Johnson Innocent Kamwa John Kay James Kinney Gary Kobet Joseph L. Koepfinger Boris Kogan Ljubomir Kojovic Jim Kulchisky Paneendra KumarBl Chung-Yiu Lam Raluca Lascu Theo Laughner Michael Lauxman Roger Lawrence Albert Livshitz Federico Lopez Om P. Mal

40、ik Omar Mazzoni Dean Miller John Miller Daleep Mohla Joe Mooney Jerry Murphy R. Jay Murphy Michael Newman Gary Nissen Jim OBrien Lorraine Padden Mirko Palazzo Donald Parker Michael Roberts Charles Rogers Daniel Sabin Bartien Sayogo Thomas Schossig Tony Seegers Sepehr Sefidpour Robert Seitz Charles S

41、immons Veselin Skendzic Jerry Smith Gary Smullin James Swank Michael Thompson Demetrios Tziouvaras Joe Uchiyama Eric Udren John Vergis Jun Verzosa Ilia Voloh Liancheng Wang Kenneth White James Wilson Philip Winston Ray Young Jian Yu Luis Zambrano Copyright 2015 IEEE. All rights reserved. vi When the

42、 IEEE-SA Standards Board approved this guide on 10 December 2014, it had the following membership: John Kulick, Chair Jon Walter Rosdahl, Vice-Chair Richard H. Hulett, Past Chair Konstantinos Karachalios, Secretary Peter Balma Farooq Bari Ted Burse Clint Chaplain Stephen Dukes Jean-Philippe Faure Ga

43、ry Hoffman Michael Janezic Jeffrey Katz Joseph L. Koepfinger* David Law Hung Ling Oleg Logvinov T. W. Olsen Glenn Parsons Ron Peterson Adrian Stephens Peter Sutherland Yatin Trivedi Phil Winston Don Wright Yu Yuan *Member Emeritus Also included are the following non-voting IEEE-SA Standards Board li

44、aisons: Richard DeBlasio, DOE Representative Michael Janezic, NIST Representative Patrick Gibbons IEEE-SA Content Production and Management Erin Spiewak IEEE-SA Technical Program Operations Copyright 2015 IEEE. All rights reserved. vii Introduction This introduction is not part of IEEE Std C37.114-2

45、014, IEEE Guide for Determining Fault Location on AC Transmission and Distribution Lines. This guide outlines the techniques and application considerations for determining the location of a fault on ac transmission and distribution lines. The guide reviews traditional approaches and the primary meas

46、urement techniques used in modern devices: one- and two-terminal impedance-based methods and traveling-wave methods. Application considerations include: two- and three-terminal lines, series-compensated lines, parallel lines, untransposed lines, underground cables, fault resistance effects, and othe

47、r power system conditions, including those unique to distribution systems. Copyright 2015 IEEE. All rights reserved. viii Copyright 2015 IEEE. All rights reserved. ixContents 1. Overview 1 1.1 Scope . 1 1.2 Purpose 1 1.3 Techniques and requirements for fault-locating devices . 2 1.4 How to determine

48、 line parameters . 2 2. Definitions, acronyms, and abbreviations 4 2.1 Definitions . 4 2.2 Acronyms and abbreviations . 5 3. One-ended impedance-based measurement techniques 5 3.1 Background 5 3.2 Implementation: data and equipment required 6 3.3 Determination of measurement error . 7 3.4 Error due

49、to reactance effect 8 3.5 Algorithms . 11 4. Two-terminal data methods 13 4.1 Background 13 4.2 Implementation requirements 14 4.3 System parameters . 15 4.4 Algorithms . 15 5. Other fault location applications . 22 5.1 Three-terminal lines . 22 5.2 Series-compensated lines . 23 5.3 Parallel lines 27 5.4 Tapped lines . 28 5.5 Distribution system faults 28 5.6 Locating faults on underground cables and paralleled cable circuits . 38 5.7 Automatic reclosing effects on fault locating 40 5.8 Effect of tapped load 40 5.9 Phase selection, fault identification, sequential faults .