IEEE C37 083-1999 en Guide for Synthetic Capacitive Current Switching Tests of AC High-Voltage Circuit Breakers《交流高压电路断路器的合成电容电路开关试验指南》.pdf

《IEEE C37 083-1999 en Guide for Synthetic Capacitive Current Switching Tests of AC High-Voltage Circuit Breakers《交流高压电路断路器的合成电容电路开关试验指南》.pdf》由会员分享，可在线阅读，更多相关《IEEE C37 083-1999 en Guide for Synthetic Capacitive Current Switching Tests of AC High-Voltage Circuit Breakers《交流高压电路断路器的合成电容电路开关试验指南》.pdf（25页珍藏版）》请在麦多课文档分享上搜索。

1、The Institute of Electrical and Electronics Engineers, Inc.3 Park Avenue, New York, NY 10016-5997, USACopyright 1999 by the Institute of Electrical and Electronics Engineers, Inc.All rights reserved. Published 8 September 1999. Printed in the United States of America.Print: ISBN 0-7381-1785-4 SH9477

2、6PDF: ISBN 0-7381-1786-2 SS94776No part of this publication may be reproduced in any form, in an electronic retrieval system or otherwise, without the prior written permission of the publisher.IEEE Std C37.083-1999 (R2007)IEEE Guide for Synthetic Capacitive Current Switching Tests of AC High-Voltage

3、 Circuit BreakersSponsorSwitchgear Committeeof theIEEE Power Engineering SocietyReaffirmed 21 March 2007Approved 26 June 1999IEEE-SA Standards BoardAbstract: As an aid in testing circuit breakers under conditions of switching capacitive currents syn-thetic test circuits may be used. The design of th

4、e circuit should simulate the stress of actual serviceconditions as closely as possible. A number of circuits are given as examples. The limitation of theuse of synthetic test methods is that the breaker under test must not display evidence of reignitionor restriking. The known circuits do not prope

5、rly represent the interaction between the source andthe capacitive load under this condition. Such breakers must be tested using direct circuits.Keywords: capacitive current switching, closing phenomena, opening phenomena, synthetic cir-cuits, testing circuit breakersIEEE Standardsdocuments are deve

6、loped within the IEEE Societies and the Standards Coordinating Com-mittees of the IEEE Standards Association (IEEE-SA) Standards Board. Members of the committees servevoluntarily and without compensation. They are not necessarily members of the Institute. The standardsdeveloped within IEEE represent

7、 a consensus of the broad expertise on the subject within the Institute aswell as those activities outside of IEEE that have expressed an interest in participating in the development ofthe standard.Use of an IEEE Standard is wholly voluntary. The existence of an IEEE Standard does not imply that the

8、reare no other ways to produce, test, measure, purchase, market, or provide other goods and services related tothe scope of the IEEE Standard. Furthermore, the viewpoint expressed at the time a standard is approved andissued is subject to change brought about through developments in the state of the

9、 art and commentsreceived from users of the standard. Every IEEE Standard is subjected to review at least every five years forrevision or reaffirmation. When a document is more than five years old and has not been reaffirmed, it is rea-sonable to conclude that its contents, although still of some va

10、lue, do not wholly reflect the present state ofthe art. Users are cautioned to check to determine that they have the latest edition of any IEEE Standard.Comments for revision of IEEE Standards are welcome from any interested party, regardless of membershipaffiliation with IEEE. Suggestions for chang

11、es in documents should be in the form of a proposed change oftext, together with appropriate supporting comments.Interpretations: Occasionally questions may arise regarding the meaning of portions of standards as theyrelate to specific applications. When the need for interpretations is brought to th

12、e attention of IEEE, theInstitute will initiate action to prepare appropriate responses. Since IEEE Standards represent a consensus ofall concerned interests, it is important to ensure that any interpretation has also received the concurrence of abalance of interests. For this reason, IEEE and the m

13、embers of its societies and Standards CoordinatingCommittees are not able to provide an instant response to interpretation requests except in those cases wherethe matter has previously received formal consideration. Comments on standards and requests for interpretations should be addressed to:Secret

14、ary, IEEE-SA Standards Board445 Hoes LaneP.O. Box 1331Piscataway, NJ 08855-1331USAAuthorization to photocopy portions of any individual standard for internal or personal use is granted by theInstitute of Electrical and Electronics Engineers, Inc., provided that the appropriate fee is paid to Copyrig

15、htClearance Center. To arrange for payment of licensing fee, please contact Copyright Clearance Center, Cus-tomer Service, 222 Rosewood Drive, Danvers, MA 01923 USA; (978) 750-8400. Permission to photocopyportions of any individual standard for educational classroom use can also be obtained through

16、the Copy-right Clearance Center.Note: Attention is called to the possibility that implementation of this standard mayrequire use of subject matter covered by patent rights. By publication of this standard,no position is taken with respect to the existence or validity of any patent rights inconnectio

17、n therewith. The IEEE shall not be responsible for identifying patents forwhich a license may be required by an IEEE standard or for conducting inquiries intothe legal validity or scope of those patents that are brought to its attention.Copyright 1999 IEEE. All rights reserved.iiiIntroduction(This i

18、ntroduction is not part of IEEE Std C37.083-1999, IEEE Guide for Synthetic Capacitive Current Switching Testsof AC High-Voltage Circuit Breakers.)This is a new guide developed to provide a basis for synthetic capacitive-current switching tests of circuitbreakers. It includes criteria for testing to

19、demonstrate the capacitor switching current rating of circuit break-ers on a single phase basis. The guide contains typical circuits for use in demonstrating capacitive current switching capabilities, butthese circuits are those in general use; they should not exclude the development or introduction

20、 of additionalcircuits.There are major changes taking place in standards development in the area of capacitor switching. Withinthe various standards organizations the following changes are known: IEEE Std 37.09-1999, IEEE Standard Test Procedure for AC High-Voltage Circuit Breakers Rated ona Symmetr

21、ical Current BasisPreferred Ratings and Related Capabilities is undergoing completerevision. A new IEEE standard, IEEE Std 1247-1998, IEEE Standard For Interrupter Switches for AlternatingCurrent Rated Above 1000 Volts was approved. IEC 60056 (1987-03), High-Voltage Alternating Current Circuit Break

22、ers, is also under completerevision. From what is known it is expected that the test requirements will be more statistical innature with additional contact conditioning before the start of the test series.The full impact of these revisions is not known at this time. The circuits and methods for test

23、ing shown inthis guide are expected to remain valid. There may be a future need for modification in the voltage levels forsome of the tests.The Standards Committee on Power Switchgear, C37, which reviewed and approved this standard, had thefollowing personnel at the time of approval:H. Melvin Smith,

24、ChairThe following members of the balloting committee voted on this standard:Anne BosmaDenis DufournetDave GaliciaHarold HessRobert JeanjeanGeorges MontilletEric RuossRoger SarkinenR. Kirkland SmithGuy St. JeanJohn TanneryRoy W. AlexanderBill W. J. BergmanAnne BosmaTed BurseJames F. ChristensenSteph

25、en P. ConradJames M. DalyAlexander DixonJ. J. DravisGary R. EngmannMarcel FortinRuben D. GarzonMietek GlinkowskiKeith I. GrayHarold L. HessEdward M. JankowichP. L. KolarikDavid G. KumberaStephen R. LambertAlfred LeiboldAlbert LivshitzGlenn J. LuzziDeepak MazumdarL. V. McCallNeil McCordNigel P. McQui

26、nYasin I. MusaJeffrey H. NelsonT. W. OlsenMiklos J. OroszDavid F. PeeloGordon O. PerkinsDavid N. ReynoldsHugh C. RossGerald SakatsLarry H. SchmidtDonald E. SeayH. Melvin SmithR. Kirkland SmithBodo SojkaGuy St. JeanAlan D. StormsWilliam M. StrangDavid SwindlerStan H. TelanderE. Rick VanattaCharles L.

27、 WagnerPeter G. H. WongLarry E. YonceivCopyright 1999 IEEE. All rights reserved.When the IEEE-SA Standards Board approved this standard on 26 June 1999, it had the followingmembership:Richard J. Holleman,ChairDonald N. Heirman,Vice ChairJudith Gorman,Secretary*Member EmeritusAlso included is the fol

28、lowing nonvoting IEEE-SA Standards Board liaison:Robert E. HebnerKim BreitfelderIEEE Standards Project EditorSatish K. AggarwalDennis BodsonMark D. BowmanJames T. CarloGary R. EngmannHarold E. EpsteinJay Forster*Ruben D. GarzonJames H. GurneyLowell G. JohnsonRobert J. KennellyE. G. “Al” KienerJoseph

29、 L. Koepfinger*L. Bruce McClungDaleep C. MohlaRobert F. MunznerLouis-Franois PauRonald C. PetersenGerald H. PetersonJohn B. PoseyGary S. RobinsonAkio TojoHans E. WeinrichDonald W. ZipseCopyright 1999 IEEE. All rights reserved.vContents1. Overview 11.1 Scope 11.2 Purpose. 22. References 23. Definitio

30、ns 24. Capacitive current switching process. 34.1 Closing phenomena 34.2 Opening phenomena 45. Basic principles of synthetic capacitive-current switching testing 46. Requirements for synthetic capacitive current switching 56.1 General conditions . 66.2 Test circuit requirements 66.3 Test voltage 77.

31、 Examples of synthetic capacitance current switching test circuits 77.1 Test circuit with ac sources and capacitive branches. 77.2 Test circuit with ac sources and an inductive branch 87.3 Test circuit with one ac source and a tuned circuit current branch 97.4 Test circuit with tuned circuit voltage

32、 branch 107.5 Test circuit not utilizing ac sources . 118. Parameters, test procedures, and tolerances. 128.1 High-current interval 138.2 Recovery voltage interval 139. Voltage regulation and transients. 139.1 High-impedance source . 139.2 Forced current zero 1410. Closing (making) tests . 1510.1 Ma

33、king without current interruption 1510.2 Making with current interruption. 1511. Circuit breakers equipped with opening resistors 1611.1 Direct test circuit 1611.2 Two part synthetic test circuits 16viCopyright 1999 IEEE. All rights reserved.12. Test duties 1712.1 Test duties 1A and 1B 1712.2 Other

34、test duties . 1813. Test records 1813.1 General. 1813.2 Recording of test results. 1813.3 Data reporting modifications . 19Copyright 1999 IEEE. All rights reserved.1IEEE Guide for Synthetic Capacitive Current Switching Tests of AC High-Voltage Circuit Breakers1. OverviewThis guide gives requirements

35、 for the synthetic testing of circuit breakers under conditions of switchingcapacitive currents. This is accomplished by simulating, as closely as possible, the stress conditions that mayexist in actual service.The phenomena of restriking and reignition causes interactions between the source and the

36、 capacitive loadwhich, at present, cannot be simulated reliably by synthetic testing circuits described herein. Therefore, thesynthetic method may only validate performance if there are no instances of restrikes. In the case of a circuitbreaker that restrikes, direct tests would be required. See an

37、alternative test method procedure in IEEE StdC37.09-1999.1The phenomena of prestriking during making tests allows the possibility of interruption of high-frequencycurrent during the closing operation. Such an interruption may cause reignition and would indicate that thecircuit breaker may require di

38、rect testing.Isolated bank and cable switching making duties are provided by direct short-circuit making tests. There-fore, no separate tests are required.Due to cost considerations, synthetic circuits are not generally used to demonstrate making capabilities forback-to-back capacitive current switc

39、hing and open wire line charging. Direct testing methods should beused to demonstrate these capabilities.1.1 ScopeThis guide provides a basis for synthetic capacitive current switching tests (see IEEE Std C37.04-1999) andto establish guidelines for testing to demonstrate the capacitive switching rat

40、ing of circuit breakers on a sin-gle phase basis.1Information on references can be found in Clause 2.IEEEStd C37.083-1999 IEEE GUIDE FOR SYNTHETIC CAPACITIVE CURRENT SWITCHING TESTS2Copyright 1999 IEEE. All rights reserved.The guide contains typical circuits for demonstrating capacitive current swit

41、ching capability. These circuitsare those in general use and their inclusion should not exclude the development of additional circuits to dem-onstrate specific capabilities.1.2 PurposeThe purpose of this guide is to establish criteria for synthetic capacitive current switching tests and for theprope

42、r evaluation of results. Such criteria will establish validity of the test method without imposingrestraints on innovation and improvement of test circuitry.2. ReferencesANSI C37.06-1997, American National Standard for SwitchgearAC High-Voltage Circuit Breakers Ratedon a Symmetrical Current BasisPre

43、ferred Ratings and Related Capabilities.2IEEE Std C37.04-1999, IEEE Standard Rating Structure for AC High-Voltage Circuit Breakers Rated on aSymmetrical Current Basis.3IEEE Std C37.09-1999, IEEE Standard Test Procedure for AC High-Voltage Circuit Breakers Rated on aSymmetrical Current Basis.IEEE Std

44、 C37.012-1979 (Reaff 1988), IEEE Application Guide for Capacitance Current Switching for ACHigh-Voltage Circuit Breakers Rated on a Symmetrical Current Basis.IEEE Std C37.081-1981 (Reaff 1988), IEEE Guide for Synthetic Fault Testing of AC High-Voltage CircuitBreakers Rated on a Symmetrical Current B

45、asis.3. Definitions 3.1 auxiliary circuit breaker:The circuit breaker used to disconnect the current circuit from direct connec-tion with the test circuit breaker.3.2 current circuit:That part of the synthetic test circuit from which the major part of the power frequencycurrent is obtained.3.3 curre

46、nt injection method:A synthetic test method in which the voltage circuit is applied to the test cir-cuit breaker before power frequency current zero.3.4 direct test: A test in which the applied voltage, current, and recovery voltage are obtained from a singlepower source, which may be comprised of g

47、enerators, transformers, networks, or combinations of these.3.5 distorted current:The current through the test circuit breaker that is influenced by the arc voltage ofboth the test and auxiliary circuit breakers during the high-current interval.3.6 injected current: The current that flows through th

48、e test circuit breaker from the voltage source of a cur-rent injection circuit when this circuit is applied to the test circuit breaker.3.7 injected-current frequency: The frequency of the injected current.2ANSI publications are available from the Sales Department, American National Standards Instit

49、ute, 11 West 42nd Street, 13th Floor,New York, NY 10036, USA (http:/www.ansi.org/).3IEEE publications are available from the Institute of Electrical and Electronics Engineers, 445 Hoes Lane, P.O. Box 1331, Piscataway,NJ 08855-1331, USA (http:/www.standards.ieee.org/).IEEEOF AC HIGH-VOLTAGE CIRCUIT BREAKERS Std C37.083-1999Copyright 1999 IEEE. All rights reserved.33.8 injection time: The time with respect to the power frequency current zero when the voltage circuit isapplied.3.9 prestrike: The initiation of current between the contacts during a closing operation befo