IEEE 998-2012 en Guide for Direct Lightning Stroke Shielding of Substations《变电站的直接防雷击遮避物用IEEE指南》.pdf

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1、 IEEE Guide for Direct Lightning Stroke Shielding of Substations Sponsored by the Substations Committee IEEE 3 Park Avenue New York, NY 10016-5997 USA 30 April 2013 IEEE Power and Energy SocietyIEEE Std 998-2012(Revision of IEEE Std 998-1996) IEEE Std 998-2012 (Revision of IEEE Std 998-1996) IEEE Gu

2、ide for Direct Lightning Stroke Shielding of Substations Sponsor Substations Committee of the IEEE Power and Energy Society Approved 5 December 2012 IEEE-SA Standards Board Grateful acknowledgements Figure 1 and Annex G, Copyright 2008 IEEE. Reprinted with permission from Orrell, J. T., “Direct Stro

3、ke Lightning Protection,” paper presented at EEI Electrical System and Equipment Committee Meeting, Washington, D.C., 25 Oct. 1988. Figure 2 adapted from Electrical Transmission and Distribution Reference Book, by Central Station Engineers of the Westinghouse Electric Corporation, 4th ed., East Pitt

4、sburgh, PA, 1964. Figures 6, 8, and 9 from MacGorman, D. R., M. W. Maier, and W. D. Rust, “Lightning Strike Density for the Contiguous United States from Thunderstorm Duration Record,” report no. NUREG/CR-3759, National Oceanic and Atmospheric Administration, Norman, OK, May 1984. Figure 7 from Mete

5、orological Division, Department of Transportation, Canada. Copyright Environment Canada, used with permission. The IEEE thanks the Vaisala, Inc. for permission to reproduce the Vaisala image: Graph of USA ground 3 flash density as shown in Figure 10. Figure 22 Copyright 1972 IEEE. Reprinted with per

6、mission from Sargent, M. A., “The Frequency Distribution of Current Magnitudes of Lightning Strokes to Tall Structures,” IEEE Transactions on Power Apparatus and Systems, vol. 91, no. 5, pp. 22242229, 1972. Figures 30 and 31 Copyright 1998 IEEE. Reprinted with permission from Mousa, A. M., “The Appl

7、icability of Lightning Elimination Devices to Substations and Power Lines,” IEEE Transactions on Power Delivery, vol. 13, pp. 11201127, 1998. Figure 32 Copyright 1987 IEEE. Reprinted with permission from Eriksson, A. J., “An Improved Electrogeometric Model for Transmission Line Shielding Analysis,”

8、IEEE Transactions on Power Delivery, vol. 2, no. 3, pp. 871886, July 1987. Figures 44 and 45 Copyright 1990 IEEE. Reprinted with permission from Dellera, L. Garbagnati E., “Lightning Stroke Simulation by Means of the Leader Progression Model. Part I. Description of the Model and Evaluation of Exposu

9、re of Free-Standing Structures,” IEEE Transactions on Power Delivery, vol. 5, pp. 200922, 1990. Figure 46 from CIGRE Task Force 33.01.03, “Lightning Exposure of Structures and Interception Efficiency of Air Terminals,” Paris: CIGRE, Technical Brochure 118, Oct. 1997. Figure 51 from the Journal of Ph

10、ysics D: Applied Physics, vol. 39, 2006, Becerra, M. and Cooray, V., “A Self-Consistent Upward Leader Propagation Model,” is reproduced by permission of IOP Publishing. All rights reserved. Figure C.1 reprinted with permission from Transmission Line Reference Book 345 kV and Above, Second Edition, R

11、evised. Copyright 1982, Electric Power Research Institute, Palo Alto, CA. Abstract: Design information for the methods historically and typically applied by substation designers to reduce direct lightning strokes to equipment and buswork within substations is provided. Two approaches, the classical

12、empirical method and the electrogeometric model, are presented in detail. A third approach, which involves the use of non-conventional lightning terminals and related design methods, is also reviewed. Keywords: collection volume method (CVM), direct stroke shielding, electro-geometric model (EGM), f

13、ield intensification factor method (FIFM), fixed angle, IEEE 998, leader inception theory (LIT), leader progression model (LPM), lightning stroke protection, self-consistent leader inception and propagation model (SLIM), substations empirical curves The Institute of Electrical and Electronics Engine

14、ers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright 2013 by The Institute of Electrical and Electronics Engineers, Inc. All rights reserved. Published 30 April 2013. Printed in the United States of America. IEEE is a registered trademark in the U.S. Patent +1 978 750 8400. Permission to

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21、 IEEE at the address listed previously. For more information about the IEEE Standards Association or the IEEE standards development process, visit IEEE-SA Website at http:/standards.ieee.org/index.html. Errata Errata, if any, for this and all other standards can be accessed at the following URL: htt

22、p:/standards.ieee.org/findstds/errata/index.html. Users are encouraged to check this URL for errata periodically. Patents Attention is called to the possibility that implementation of this standard may require use of subject matter covered by patent rights. By publication of this standard, no positi

23、on is taken by the IEEE with respect to the existence or validity of any patent rights in connection therewith. If a patent holder or patent applicant has filed a statement of assurance via an Accepted Letter of Assurance, then the statement is listed on the IEEE-SA Website at http:/standards.ieee.o

24、rg/about/sasb/patcom/patents.html. Letters of Assurance may indicate whether the Submitter is willing or unwilling to grant licenses under patent rights without compensation or under reasonable rates, with reasonable terms and conditions that are demonstrably free of any unfair discrimination to app

25、licants desiring to obtain such licenses. Essential Patent Claims may exist for which a Letter of Assurance has not been received. The IEEE is not responsible for identifying Essential Patent Claims for which a license may be required, for conducting inquiries into the legal validity or scope of Pat

26、ents Claims, or determining whether any licensing terms or conditions provided in connection with submission of a Letter of Assurance, if any, or in any licensing agreements are reasonable or non-discriminatory. Users of this standard are expressly advised that determination of the validity of any p

27、atent rights, and the risk of infringement of such rights, is entirely their own responsibility. Further information may be obtained from the IEEE Standards Association. Participants At the time this IEEE guide was completed, the D5 Working Group had the following membership: Robert S. Nowell, Chair

28、 Sakis Meliopoulos, Vice Chair Radoslav Barac Thomas Barnes Hassein Bashirian Bryan Beske James Cain Bill Carman Kum S. Chan Koushik Chanda Randy Clelland Franco DAlessandro Dennis DeCosta W. Bruce Dietzman David Lane Garrett Keith Graham Joseph Gravelle Steve Greenfield Charles Haahr Thomas Harger

29、Martin Havelka Richard Keil Dave Kelley Cris Kramschuster Reginaldo Maniego Mark Morgan James T. Orrell Biren Patel Thomas Proios Donald Rogers Hamid Sharifnia Boris Shvartsberg David Stamm Ryan Stargel Brian Stephens Curtis Stidham Brian Story Keith Wallace Don Wengerter Alexander Wong Yaowu Zhang

30、The following members of the individual balloting committee voted on this guide. Balloters may have voted for approval, disapproval, or abstention. William Ackerman Michael Adams Stan Arnot Thomas Barnes George Becker Bryan Beske Steven Bezner Wallace Binder Thomas Blackburn William Bloethe Dale Bol

31、ing Paul Boman Dieter Braun Gustavo Brunello Mark Bushnell James Cain Thomas Callsen Giuseppe Carbone Michael Champagne Kum S. Chan Suresh Channarasappa William Chisholm Robert Christman Randy Clelland Richard Cohen Michael Comber John Crouse Chuanyou Dai Franco DAlessandro Dennis DeCosta W. Bruce D

32、ietzman Carlo Donati Gary Donner Michael Dood Douglas Dorr Randall Dotson Ernest Duckworth Donald Dunn Gary R. Engmann C. Erven James Fairris Louis Farquhar Jorge Fernandez Daher Michael Foley David Lane Garrett James Ghrist David Giegel David Gilmer Waymon Goch Jalal Gohari Edwin Goodwin James Grah

33、am Keith Graham Joseph Gravelle Steve Greenfield Randall Groves Charles Haahr Paul Hamer David Harris Martin Havelka Steven Hensley Lee Herron Gary Heuston Raymond Hill Werner Hoelzl Robert Hoerauf Philip Hopkinson Ronald Hotchkiss Stephen Humeniuk Andrew Jones Lars Juhlin Laszlo Kadar Donald Kane R

34、ichard Keil Dave Kelley Gael Kennedy Yuri Khersonsky Chad Kiger James Kinney Robert Kluge Hermann Koch Joseph L. Koepfinger Jim Kulchisky Saumen Kundu Donald Laird Chung-Yiu Lam Benjamin Lanz Thomas La Rose Paul Lindemulder Debra Longtin Federico Lopez Greg Luri Michael Maytum Omar Mazzoni William M

35、cBride John McDaniel Gary Michel Daleep Mohla Mark Morgan Copyright 2013 IEEE. All rights reserved. viAbdul Mousa Jerry Murphy Arun Narang Arthur Neubauer Michael S. Newman Joe Nims Gary Nissen Robert S. Nowell Hans-Wolf Oertel Carl Orde James T. Orrell Lorraine Padden Bansi Patel Biren Patel Shashi

36、 Patel David Peelo Emanuel Petrache Christopher Petrola Thomas Phipps Donald Platts Percy Pool Alvaro Portillo Douglas Proctor Farhad Rachidi Reynaldo Ramos John Randolph Marc Ressler William Rison Farouk A. M. Rizk Michael Roberts Charles Rogers Marnie Roussell Thomas Rozek Bartien Sayogo Dennis Sc

37、hlender Robert Schlesinger Hamid Sharifnia Devki Sharma Soorya Shrestha Gil Shultz Hyeong Sim Douglas Smith James Smith Jerry Smith Rusty Soderberg John Spare David Stamm Ryan Stargel Brian Stephens Gary Stoedter Brian Story K. B. Stump Paul Sullivan Antony Surtees Leroy Taylor David Tepen William T

38、hompson John Toth Harold VanSickle III Luis Vargas Raul Velazquez John Vergis Keith Wallace David Wallach Daniel Ward Joe Watson Yingli Wen Donald Wengerter Kenneth White James Wilson Alexander Wong Larry Young Roland Youngberg Jian Yu Luis ZambranoWhen the IEEE-SA Standards Board approved this guid

39、e on 5 December 2012, it had the following membership: Richard H. Hulett, Chair John Kulick, Vice Chair Robert M. Grow, Past Chair Konstantinos Karachalios, Secretary Satish Aggarwal Masayuki Ariyoshi Peter Balma William Bartley Ted Burse Clint Chaplin Wael William Diab Jean-Philippe Faure Alexander

40、 Gelman Paul Houz Jim Hughes Joseph L. Koepfinger* David J. Law Thomas Lee Hung Ling Oleg Logvinov Ted Olsen Gary Robinson Jon Walter Rosdahl Sam Sciacca Mike Seavey Yatin Trivedi Phil Winston Don Wright *Member Emeritus Also included are the following nonvoting IEEE-SA Standards Board liaisons: Ric

41、hard DeBlasio, DOE Representative Michael Janezic, NIST Representative Don Messina IEEE Standards Program Manager, Document Development Erin Spiewak IEEE Standards Program Manager, Technical Program Development Copyright 2013 IEEE. All rights reserved. viiIntroduction This introduction is not part o

42、f IEEE Std 998TM-2012, IEEE Guide for Direct Lightning Stroke Shielding of Substations. Work on the original guide began in 1973 and many former members made contributions toward its completion. Working Group D5 of the IEEE PES Substations Committee began updating the guide in 2008. This guide provi

43、des information about various shielding methodologies to estimate and design direct lightning stroke shielding for outdoor substations. Calculation details, design estimates, and generally accepted practices for substation shielding designs are provided. This guide can be beneficial for engineers in

44、 evaluating direct lightning stroke shielding design for outdoor substations. Dedication This revision of IEEE Std 998 is dedicated to the memory of Gary R. Engmann. Gary through his membership in this working group and many others was always in the forefront with his statement “that the purpose of

45、a guide is to disseminate information to practicing engineers.” Gary had a long association and leadership with the IEEE Substations Committee, NESC, IEEE-SA, and many other Technical Committees and Working Groups. He did not back away from tasks whether controversial or not. His leadership of the I

46、EEE 998 “Bucket Brigade” was an insightful contribution to the development of this revision. His knowledge, humor, and keen insight into the day-to-day needs of all of us will be sorely missed. Copyright 2013 IEEE. All rights reserved. viiiContents 1. Overview 1 1.1 Scope . 1 1.2 Purpose 2 2. Defini

47、tions 2 3. Lightning phenomena. 4 3.1 Charge formation in clouds . 4 3.2 Stroke formation 5 3.3 Striking distance 7 3.4 First negative return stroke current magnitude 9 3.5 Keraunic level 11 3.6 Ground flash density 13 3.7 Lightning detection networks 15 4. The design problem 15 5. Empirical design

48、methods 16 5.1 Fixed angles. 16 5.2 Origin of empirical curves. 18 5.3 Application of empirical curves. 19 5.4 Areas protected by lightning masts 24 5.5 Effect of hillsides. 26 6. The electrogeometric model (EGM). 26 6.1 History . 26 6.2 Mousas EGM 28 6.3 Application of the EGM by the rolling sphere

49、 method 31 6.4 Application of Mousas EGM . 38 6.5 Erikssons EGM 39 6.6 Calculation of failure probability. 48 7. Alternative models of lightning interception 48 7.1 Leader propagation models and methods for substation shielding 48 7.2 Importance of air terminal geometry . 67 7.3 Active lightning terminals . 67 Annex A (informative) Empirical shielding curves 69 Annex B (informative) Sample calculations. 73 B.1 Introduction. 73 B.2 Fixed-angle method 76 B.3 Empirical method 83 B.4 Electrogeometric modelrolling sphere method . 93 B.5 The Eriksson EGM