IEEE 99-2007 en Recommended Practice for the Preparation of Test Procedures for the Thermal Evaluation of Insulation Systems for Electric Equipment《电气设备用绝缘系统热评估.pdf

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1、IEEE Std 99-2007(Revision of IEEE Std 99-1980) IEEE Recommended Practice for thePreparation of Test Procedures forthe Thermal Evaluation of InsulationSystems for Electrical Equipment IEEE3 Park Avenue New York, NY 10016-5997, USA27 February 2008IEEE Standards Coordinating Committee 4Sponsored by the

2、IEEE Standards Coordinating Committee 4 on Electrical Insulation99TMIEEE Std 99-2007 (Revision of IEEE Std 99-1980) IEEE Recommended Practice for the Preparation of Test Procedures for the Thermal Evaluation of Insulation Systems for Electrical Equipment Sponsor Standards Coordinating Committee 4 on

3、 Electrical Insulation Approved 27 September 2007 IEEE-SA Standards Board Abstract: A general form is provided for the preparation of test procedures. Points to be considered by technical committees in the preparation of specific instructions for the thermal evaluation of insulation systems for elec

4、tric equipment are suggested. The test procedures involve accelerated thermal aging of insulation systems and specify tests that the committees deem pertinent, based on conditions of use. The objective of the procedures is to provide for the functional evaluation, by test, of insulation systems for

5、electric equipment. Keywords: diagnostic factor, EIS (electrical insulation system), insulation system, test procedures, test specimen, thermal aging, thermal endurance, thermal evaluation _ The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyr

6、ight 2008 by The Institute of Electrical and Electronics Engineers, Inc. All rights reserved. Published 27 February 2008. Printed in the United States of America. IEEE is a registered trademark in the U.S. Patent +1 978 750 8400. Permission to photocopy portions of any individual standard for educat

7、ional classroom use can also be obtained through the Copyright Clearance Center. Introduction This introduction is not part of IEEE Std 99-2007, IEEE Recommended Practice for the Preparation of Test Procedures for the Thermal Evaluation of Insulation Systems for Electrical Equipment.The previous ver

8、sion, IEEE Std 99-1980, had been revised substantially to coordinate with IEC 60611:1978, Guide for the Preparation of Test Procedures for Evaluating the Thermal Endurance of Electrical Insulation Systems, which has since been withdrawn. This revision has been coordinated with referenced IEEE and IE

9、C standards. Notice to users Laws and regulations Users of these documents should consult all applicable laws and regulations. Compliance with the provisions of this standard does not imply compliance to any applicable regulatory requirements. Implementers of the standard are responsible for observi

10、ng or referring to the applicable regulatory requirements. IEEE does not, by the publication of its standards, intend to urge action that is not in compliance with applicable laws, and these documents may not be construed as doing so. Copyrights This document is copyrighted by the IEEE. It is made a

11、vailable for a wide variety of both public and private uses. These include both use, by reference, in laws and regulations, and use in private self-regulation, standardization, and the promotion of engineering practices and methods. By making this document available for use and adoption by public au

12、thorities and private users, the IEEE does not waive any rights in copyright to this document. Updating of IEEE documents Users of IEEE standards should be aware that these documents may be superseded at any time by the issuance of new editions or may be amended from time to time through the issuanc

13、e of amendments, corrigenda, or errata. An official IEEE document at any point in time consists of the current edition of the document together with any amendments, corrigenda, or errata then in effect. In order to determine whether a given document is the current edition and whether it has been ame

14、nded through the issuance of amendments, corrigenda, or errata, visit the IEEE Standards Association Web site at http:/ieeexplore.ieee.org/xpl/standards.jsp, or contact the IEEE at the address listed previously. For more information about the IEEE Standards Association or the IEEE standards developm

15、ent process, visit the IEEE-SA Web site at http:/standards.ieee.org. Errata Errata, if any, for this and all other standards can be accessed at the following URL: http:/standards.ieee.org/reading/ieee/updates/errata/index.html. Users are encouraged to check this URL for errata periodically. iv Copyr

16、ight 2008 IEEE. All rights reserved. Interpretations Current interpretations can be accessed at the following URL: http:/standards.ieee.org/reading/ieee/interp/ index.html. Patents Attention is called to the possibility that implementation of this recommended practice may require use of subject matt

17、er covered by patent rights. By publication of this recommended practice, no position is taken with respect to the existence or validity of any patent rights in connection therewith. The IEEE is not responsible for identifying Essential Patent Claims for which a license may be required, for conducti

18、ng inquiries into the legal validity or scope of Patents Claims or determining whether any licensing terms or conditions provided in connection with submission of a Letter of Assurance, if any, or in any licensing agreements are reasonable or non-discriminatory. Users of this recommended practice ar

19、e expressly advised that determination of the validity of any patent rights, and the risk of infringement of such rights, is entirely their own responsibility. Further information may be obtained from the IEEE Standards Association. v Copyright 2008 IEEE. All rights reserved. Participants At the tim

20、e this recommended practice was submitted to the IEEE-SA Standards Board for approval, the Thermal Evaluation - Insulation Systems Working Group had the following membership: Paulette Payne Powell, Chair Jerry L. Corkran Richard P. Marek Lewis Powell Ed VanVooren Loren B. WagenaarThe following membe

21、rs of the individual balloting committee voted on this recommended practice. Balloters may have voted for approval, disapproval, or abstention. Paul A. Anderson Stan Arnot Gary E. Arntson Ali Al Awazi Barry L. Beaster Thomas E. Blackburn Chris Brooks Michael G. Brown Nissen M. Burstein James S. Case

22、 C. Clair Claiborne Meredith K. Clark Tommy Cooper Jerry L. Corkran John R. Densley Dieter Dohnal Gary L. Donner Charles R. Drexler Dana S. Dufield James H. Dymond Gary Engmann Keith Flowers Rabiz N. Foda Joseph Foldi Marcel Fortin Rostyslaw J. Fostiak Waymon P. Goch Randall C. Groves Michael E. Haa

23、s Wolfgang B. Haverkamp Hamidreza Heidarisafa Gary A. Heuston Werner Hoelzl David A. Horvath R. Jackson James Jones Haran C. Karmaker Robert J. Keefe J. L. Koepfinger Robert L. Konnik Jim Kulchisky Saumen K. Kundu Chung-Yiu Lam Richard S. Lancaster John G. Leach Yeou Song Lee Albert Livshitz William

24、 E. Lockley R. W. Long William Lumpkins G. Luri Richard P. Marek Frank W. Mayle William M. Mcdermid Don G. Mclaren Nigel Mcquin Joseph P. Melanson Jeffrey D. Merryman Gary L. Michel G. Harold Miller Avygdor Moise Randolph Mullikin Jerry Murphy Michael Newman James Parello Bansi R. Patel J. Patton Se

25、rge Pelissou Howard W. Penrose Donald W. Platts Alvaro Portillo Paulette Payne Powell Gustav H. Preininger Tom Prevost Iulian E. Profir Timothy Robirds Oleg Roizman Thomas J. Rozek Daniel M. Sauer Bartien Sayogo Gil Shultz James E. Smith Jerry Smith Gregory C. Stone S. Thamilarasan James A. Thompson

26、 John Vergis Loren B. Wagenaar Daniel J. Ward James W. Wilson Larry E. Yonce Oren Yuen Kipp J. Yule Theodore C. Zeiss Waldemar Ziomek Ahmed F. Zobaavi Copyright 2008 IEEE. All rights reserved. When the IEEE-SA Standards Board approved this recommended practice on 27 September 2007, it had the follow

27、ing membership: Steve M. Mills, Chair Robert M. Grow, Vice Chair Don Wright, Past Chair Judith Gorman, Secretary Richard DeBlasio Alex Gelman William R. Goldbach Arnold M. Greenspan Joanna N. Guenin Kenneth S. Hanus William B. Hopf Richard H. Hulett Hermann Koch Joseph L. Koepfinger* John Kulick Dav

28、id J. Law Glenn Parsons Ronald C. Petersen Tom A. Prevost Narayanan Ramachandran Greg Ratta Robby Robson Anne-Marie Sahazizian Virginia C. Sulzberger Malcolm V. Thaden Richard L. Townsend Howard L. Wolfman *Member Emeritus Also included are the following nonvoting IEEE-SA Standards Board liaisons: S

29、atish K. Aggarwal, NRC Representative Michael H. Kelley, NIST Representative Lorraine Patsco IEEE Standards Program Manager, Document Development Bill Ash IEEE Standards Program Manager, Technical Program Development vii Copyright 2008 IEEE. All rights reserved. Contents 1. Overview 1 1.1 Scope . 1

30、1.2 Purpose 1 2. Normative references 2 3. Definitions 2 4. Identification of insulation systems 3 5. Test procedures. 3 6. Test objects. 4 7. Thermal aging. 4 7.1 Choice and control of temperatures. 4 7.2 Influence of associated materials and products of decomposition. 5 7.3 Environments. 5 8. Choi

31、ce of aging mode: cyclic or continuous 5 8.1 Thermal aging test cycle 5 8.2 Length of aging time 5 9. Diagnostic factors. 6 9.1 Mechanical stress. 6 9.2 Stress caused by extreme temperatures . 7 9.3 Humidification. 7 9.4 Electrical stress 7 10. End-point criteria 7 11. Interpretation of thermal endu

32、rance data 8 Annex A (informative) Bibliography 9 viii Copyright 2008 IEEE. All rights reserved. IEEE Recommended Practice for the Preparation of Test Procedures for the Thermal Evaluation of Insulation Systems for Electrical Equipment IMPORTANT NOTICE: This standard is not intended to assure safety

33、, security, health, or environmental protection in all circumstances. Implementers of the standard are responsible for determining appropriate safety, security, environmental, and health practices or regulatory requirements. This IEEE document is made available for use subject to important notices a

34、nd legal disclaimers. These notices and disclaimers appear in all publications containing this document and may be found under the heading “Important Notice” or “Important Notices and Disclaimers Concerning IEEE Documents.” They can also be obtained on request from IEEE or viewed at http:/standards.

35、ieee.org/IPR/ disclaimers.html. 1. 1.11.2Overview Scope This recommended practice provides criteria for the preparation of test procedures for accelerated thermal aging of insulation systems and for the specification of tests based on conditions of use. The objective of these test procedures is to p

36、rovide for the functional evaluation, by test, of insulation systems for electrical equipment. The evaluation of insulating materials and simple combinations thereof is provided for by a separate material test guide, IEEE Std 98-2002.1For a detailed discussion of the principles on which this recomme

37、nded practice and IEEE Std 98-2002 are based, see IEEE Std 1-2000. Tests based on IEEE Std 98-2002 may be considered as preliminary tests for insulation system evaluation, but should not be used as accepted tests for the classification of systems. Purpose This recommended practice provides a general

38、 form for the preparation of test procedures and suggests the points to be considered by technical committees in the preparation of specific instructions for the thermal evaluation of insulation systems for equipment. 1For information on references, see Clause 2. 1 Copyright 2008 IEEE. All rights re

39、served. IEEE Std 99-2007 IEEE Recommended Practice for the Preparation of Test Procedures for the Thermal Evaluation of Insulation Systems for Electrical Equipment The thermal evaluation of an insulation system involves the following thermal factors of influence: a) Exposure temperature b) Ambient t

40、emperature c) Temperature gradient d) Rate of temperature change 2. 3.Normative references The following referenced documents are indispensable for the application of this document (i.e., they must be understood and used, so each referenced document is cited in text and its relationship to this docu

41、ment is explained). For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments or corrigenda) applies. IEC 60505:2004, Evaluation and Qualification of Electrical Insulation Systems2. IEEE Std 1-2000, IEEE Reco

42、mmended PracticeGeneral Principles for Temperature Limits in the Rating of Electrical Equipment and for the Evaluation of Electrical Insulation3, 4. IEEE Std 98-2002, IEEE Standard for the Preparation of Test Procedures for the Thermal Evaluation of Solid Electrical Insulating Materials. IEEE Std 10

43、1-1987, IEEE Guide for the Statistical Analysis of Thermal Life Test Data. Definitions For the purposes of this recommended practice, the following terms and definitions apply. The Authoritative Dictionary of IEEE Standards B35, should be referenced for terms not defined in this clause. 3.1 accepted

44、 test: A test on a system or model system that simulates the thermal aging occurring in service and correlates with service experience. 3.2 diagnostic tests: Tests that are applied to determine if thermal degradation has occurred, but in themselves should cause little, if any, degradation. 3.3 exper

45、ience: Successful operation for a long time under actual operating conditions of the equipment, designed with temperature rise at or near the temperature rating limit. 3.4 insulation system: An assembly of insulating materials in a particular type, and sometimes size, of equipment. 3.5 specimen life

46、 (insulation system): Specified at the test temperature, is the total test temperature exposure time minus one half of the exposure time of the cycle during which failure occurred. 2IEC publications are available from the Sales Department of the International Electrotechnical Commission, Case Postal

47、e 131, 3, rue de Varemb, CH-1211, Genve 20, Switzerland/Suisse (http:/www.iec.ch/). IEC publications are also available in the United States from the Sales Department, American National Standards Institute, 11 West 42nd Street, 13th Floor, New York, NY 10036, USA. 3The IEEE standards or products ref

48、erred to in this clause are trademarks of the Institute of Electrical and Electronics Engineers, Inc. 4IEEE publications are available from the Institute of Electrical and Electronics Engineers, 445 Hoes Lane, Piscataway, NJ 08854, USA (http:/standards.ieee.org/). 5The numbers in brackets correspond

49、 to those of the bibliography in Annex A. 2 Copyright 2008 IEEE. All rights reserved. IEEE Std 99-2007 IEEE Recommended Practice for the Preparation of Test Procedures for the Thermal Evaluation of Insulation Systems for Electrical Equipment 4.Table 1Identification of insulation systems Similar insulation systems may be used in different equipment and under varying exposure conditions. It is imperative for the sake of clarity that the test results be identified with the conditions of use and failure criteria as well as the temperature