IEEE 515-2011 en The Testing Design Installation and Maintenance of Electrical Resistance Trace Heating for Industrial Applications《工业用电阻热示踪的试验、设计、安装及维护》.pdf
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1、g3g3g3IEEE Standard for the Testing, Design,Installation, and Maintenance of Electrical Resistance Trace Heatingfor Industrial Applications g3Sponsored by thePetroleum +1 978 750 8400. Permission to photocopy portions of any individual standard for educational classroom use can also be obtained thro
2、ugh the Copyright Clearance Center. iv Copyright 2011 IEEE. All rights reserved. Introduction This introduction is not part of IEEE Std 515-2011, IEEE Standard for the Testing, Design, Installation, and Maintenance of Electrical Resistance Trace Heating for Industrial Applications. The scope of this
3、 standard includes specific testing requirements for qualifying electrical resistance heating cables and heating devices for use in industrial applications, as well as a basis for electrical and thermal design. Applications include unclassified and both Division and Zone classified areas. This docum
4、ent was first published as a recommended practice in 1983. In 1989, it was elevated to a standard, and Division 1 heating cables were added. In 1997, this standard was expanded to include American classified zone heaters. A 32-week benchmark test was added to provide a thermal shock cycling test. Th
5、is test established a minimum performance criteria for new products, offered a system to validate product temperature ratings claimed by manufacturers, and provided a minimum acceptable level of quality/performance by the heating devices. The 2004 revision added a 12-week temperature cycling test as
6、 an alternative to the 32-week benchmark test. This revision also aligned the tolerance on sheath temperature for T-rating with the IEC 60079-30 5 K and 10 K tolerances (IEC 60079-30-1:2007 B15aand IEC 60079-30-2:2007 B16). This revision includes subsequent harmonization with international standards
7、 and has expanded the sections on maximum sheath temperature determination and design. Notice to users Laws and regulations Users of these documents should consult all applicable laws and regulations. Compliance with the provisions of this standard does not imply compliance to any applicable regulat
8、ory requirements. Implementers of the standard are responsible for observing or referring to the applicable regulatory requirements. IEEE does not, by the publication of its standards, intend to urge action that is not in compliance with applicable laws, and these documents may not be construed as d
9、oing so. Copyrights This document is copyrighted by the IEEE. It is made available for a wide variety of both public and private uses. These include both use, by reference, in laws and regulations, and use in private self-regulation, standardization, and the promotion of engineering practices and me
10、thods. By making this document available for use and adoption by public authorities and private users, the IEEE does not waive any rights in copyright to this document. aThe numbers in brackets correspond to those of the bibliography in Annex A. v Copyright 2011 IEEE. All rights reserved. Updating o
11、f IEEE documents Users of IEEE standards should be aware that these documents may be superseded at any time by the issuance of new editions or may be amended from time to time through the issuance of amendments, corrigenda, or errata. An official IEEE document at any point in time consists of the cu
12、rrent edition of the document together with any amendments, corrigenda, or errata then in effect. In order to determine whether a given document is the current edition and whether it has been amended through the issuance of amendments, corrigenda, or errata, visit the IEEE Standards Association web
13、site at http:/ieeexplore.ieee.org/xpl/standards.jsp, or contact the IEEE at the address listed previously. For more information about the IEEE Standards Association or the IEEE standards development process, visit the IEEE-SA web site at http:/standards.ieee.org. Errata Errata, if any, for this and
14、all other standards can be accessed at the following URL: http:/standards.ieee.org/reading/ieee/updates/errata/index.html. Users are encouraged to check this URL for errata periodically. Interpretations Current interpretations can be accessed at the following URL: http:/standards.ieee.org/reading/ie
15、ee/interp/ index.html. Patents Attention is called to the possibility that implementation of this standard may require use of subject matter covered by patent rights. By publication of this standard, no position is taken with respect to the existence or validity of any patent rights in connection th
16、erewith. The IEEE is not responsible for identifying Essential Patent Claims for which a license may be required, for conducting inquiries into the legal validity or scope of Patents Claims or determining whether any licensing terms or conditions provided in connection with submission of a Letter of
17、 Assurance, if any, or in any licensing agreements are reasonable or non-discriminatory. Users of this standard are expressly advised that determination of the validity of any patent rights, and the risk of infringement of such rights, is entirely their own responsibility. Further information may be
18、 obtained from the IEEE Standards Association. vi Copyright 2011 IEEE. All rights reserved. Participants At the time this IEEE standard was originally completed, the Electrical Resistance Heat Tracing for Industrial Applications Working Group had the following membership: Richard H. Hulett, Co-Chair
19、 Dusty Brown, Co-Chair Wolfgang Dlugas Ben Johnson Andrew Lozinski Jason OConnor Satish Parikh Rudolf Pomm Peter Schmidt Robert Seitz Larry Stehling Erik Stephens John E. Turner Wayne WilliamsThe following members of the individual balloting committee voted on this standard. Balloters may have voted
20、 for approval, disapproval, or abstention. William Bloethe Dusty Brown Keith Chow Matthew Davis Wolfgang Dlugas Gary Donner Donald Dunn Gary Engmann Carl Fredericks Manjinder Gill James Gleason Pamela Gold Ron Greenthaler Randall Groves David Horvath Paul House Richard H. Hulett Ben Johnson Robert K
21、onnik Jim Kulchisky Saumen Kundu Chung-Yiu Lam Duane Leschert Greg Luri William McBride Gary Michel Jerry Murphy Paul Myers Michael S. Newman David Nichols Lorraine Padden David Parman Christopher Petrola Rudolf Pomm Nicholas R. Rafferty Bartien Sayogo Peter Schmidt Robert Seitz Thomas Shaw Gil Shul
22、tz James Smith Jeremy Smith Larry Stehling Erik Stephens Gary Stoedter S. Thamilarasan John E. Turner John Vergis Kenneth White Wayne Williams vii Copyright 2011 IEEE. All rights reserved. When the IEEE-SA Standards Board approved this standard on 16 June 2011, it had the following membership: Richa
23、rd H. Hulett, Chair John Kulick, Vice Chair Robert Grow, Past Chair Judith Gorman, Secretary Masayuki Ariyoshi William Bartley Ted Burse Clint Chaplin Wael Diab Jean-Philippe Faure Alex Gelman Paul Houz Jim Hughes David Law Thomas Lee Hung Ling Oleg Logvinov Ted Olsen Gary Robinson Jon Rosdahl Sam S
24、ciacca Mike Seavey Curtis Siller Phil Winston Howard Wolfman Don Wright *Member Emeritus Also included are the following nonvoting IEEE-SA Standards Board liaisons: Satish Aggarwal, NRC Representative Richard DeBlasio, DOE Representative Michael Janezic, NIST Representative Catherine Berger IEEE Sta
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