IEEE 475-2000 en Measurement Procedure for Field Disturbance Sensors 300 MHz to 40 GHz《300 MHz-40 GHz场干扰传感器的测量程序》.pdf
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1、IEEE Std 475-2000(R2012)(Revision of IEEE Std 475-1983) IEEE Standard Measurement Procedure for Field Disturbance Sensors 300 MHz to 40 GHz Sponsor Standards Development Committee of the IEEE Electromagnetic Compatibility Society Approved 30 March 2000 Reaffirmed 8 June 2012 IEEE-SA Standards Board
2、Abstract: Test procedures for microwave field disturbance sensors to measure radio frequency (RF) radiated field strength of the fundamental frequency, harmonic frequencies, near field power flux density, and nonharmonic spurious emissions of sensors operating within the frequency range of 300 MHz t
3、o 40 GHz are defined. Keywords: field disturbance sensors, field strength measurements, measurement instrumentation, spurious emissions, test sites, test reports The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright 2000 by the Institute of
4、 Electrical and Electronics Engineers, Inc. All rights reserved. Published 31 May 2000. Printed in the United States of America. Print: ISBN 0-7381-2492-3 SH94855 PDF: ISBN 0-7381-2493-1 SS94855 No part of this publication may be reproduced in any form, in an electronic retrieval system or otherwise
5、, without the prior written permission of the publisher. IEEE Standardsdocuments are developed within the IEEE Societies and the Standards Coordinating Com-mittees of the IEEE Standards Association (IEEE-SA) Standards Board. Members of the committees servevoluntarily and without compensation. They a
6、re not necessarily members of the Institute. The standardsdeveloped within IEEE represent a consensus of the broad expertise on the subject within the Institute aswell as those activities outside of IEEE that have expressed an interest in participating in the development ofthe standard.Use of an IEE
7、E Standard is wholly voluntary. The existence of an IEEE Standard does not imply that thereare no other ways to produce, test, measure, purchase, market, or provide other goods and services related tothe scope of the IEEE Standard. Furthermore, the viewpoint expressed at the time a standard is appro
8、ved andissued is subject to change brought about through developments in the state of the art and commentsreceived from users of the standard. Every IEEE Standard is subjected to review at least every five years forrevision or reaffirmation. When a document is more than five years old and has not be
9、en reaffirmed, it is rea-sonable to conclude that its contents, although still of some value, do not wholly reflect the present state ofthe art. Users are cautioned to check to determine that they have the latest edition of any IEEE Standard.Comments for revision of IEEE Standards are welcome from a
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11、s theyrelate to specific applications. When the need for interpretations is brought to the attention of IEEE, theInstitute will initiate action to prepare appropriate responses. Since IEEE Standards represent a consensus ofall concerned interests, it is important to ensure that any interpretation ha
12、s also received the concurrence of abalance of interests. For this reason, IEEE and the members of its societies and Standards CoordinatingCommittees are not able to provide an instant response to interpretation requests except in those cases wherethe matter has previously received formal considerat
13、ion. Comments on standards and requests for interpretations should be addressed to:Secretary, IEEE-SA Standards Board445 Hoes LaneP.O. Box 1331Piscataway, NJ 08855-1331USAIEEE is the sole entity that may authorize the use of certification marks, trademarks, or other designations toindicate complianc
14、e with the materials set forth herein.Authorization to photocopy portions of any individual standard for internal or personal use is granted by theInstitute of Electrical and Electronics Engineers, Inc., provided that the appropriate fee is paid to CopyrightClearance Center. To arrange for payment o
15、f licensing fee, please contact Copyright Clearance Center, Cus-tomer Service, 222 Rosewood Drive, Danvers, MA 01923 USA; (978) 750-8400. Permission to photocopyportions of any individual standard for educational classroom use can also be obtained through the Copy-right Clearance Center.Note: Attent
16、ion is called to the possibility that implementation of this standard mayrequire use of subject matter covered by patent rights. By publication of this standard,no position is taken with respect to the existence or validity of any patent rights inconnection therewith. The IEEE shall not be responsib
17、le for identifying patents forwhich a license may be required by an IEEE standard or for conducting inquiries intothe legal validity or scope of those patents that are brought to its attention.Copyright 2000 IEEE. All rights reserved.iiiIntroduction(This introduction is not part of IEEE Std 475-2000
18、, IEEE Standard Measurement Procedure for Field Disturbance Sen-sors 300 MHz to 40 GHz.)This standard describes a test procedure for measurement of radio frequency (RF) emissions from micro-wave field disturbance sensors to assist manufacturers, standard laboratories, and test engineers in determin-
19、ing compliance with established technical specifications.The IEEE Standards Association (IEEE-SA) Standards Board authorized the IEEE Electromagnetic Com-patibility Society Standards Committee to update IEEE Std 475-1983 for consistency with other standardsand regulatory requirements.This revision w
20、as prepared by an appointed subcommittee of the Standards Development Committee of theElectromagnetic Compatibility Society. The members of this subcommittee were:Hugh W. Denny,ChairThe following members of the balloting committee voted on this standard:When the IEEE-SA Standards Board approved this
21、 standard on 30 March 2000, it had the followingmembership:Donald N. Heirman,ChairJames T. Carlo,Vice ChairJudith Gorman,Secretary*Member emeritusAlso included are the following nonvoting IEEE-SA Standards Board liaisons:Alan Cookson, NIST RepresentativeDonald R. Volzka, TAB RepresentativeNoelle D.
22、HumenickIEEE Standards Project EditorEdwin L. BronaughJoseph E. ButlerFranz GisinDonald N. HeirmanJohn D. OsburnArt WallH. Stephen BergerEdwin L. BronaughJoseph E. ButlerHugh W. DennyAndrew DrozdDonald N. HeirmanDaniel D. HoolihanJohn G. KraemerRisaburo SatoRalph M. ShowersDonald L. SweeneyDavid L.
23、TraverSatish K. AggarwalMark D. BowmanGary R. EngmannHarold E. EpsteinH. Landis FloydJay Forster*Howard M. FrazierRuben D. GarzonJames H. GurneyRichard J. HollemanLowell G. JohnsonRobert J. KennellyJoseph L. Koepfinger*Peter H. LipsL. Bruce McClungDaleep C. MohlaJames W. MooreRobert F. MunznerRonald
24、 C. PetersenGerald H. PetersonJohn B. PoseyGary S. RobinsonAkio TojoDonald W. ZipseivCopyright 2000 IEEE. All rights reserved.Contents1. Overview 11.1 Scope 11.2 Applications . 11.3 Description. 12. References 23. Definitions 34. Measurement instrumentation 34.1 General. 34.2 Receiver monitoring. 44
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