IEEE 400 3-2006 en IEEE Guide for Partial Discharge Testing of Shielded Power Cable Systems in a Field Environment《现场环境屏蔽电缆系统局部放电测实施指南》.pdf
《IEEE 400 3-2006 en IEEE Guide for Partial Discharge Testing of Shielded Power Cable Systems in a Field Environment《现场环境屏蔽电缆系统局部放电测实施指南》.pdf》由会员分享,可在线阅读,更多相关《IEEE 400 3-2006 en IEEE Guide for Partial Discharge Testing of Shielded Power Cable Systems in a Field Environment《现场环境屏蔽电缆系统局部放电测实施指南》.pdf(46页珍藏版)》请在麦多课文档分享上搜索。
1、IEEE Std 400.3-2006IEEE Guide for Partial DischargeTesting of Shielded Power CableSystems in a Field EnvironmentI E E E3 Park Avenue New York, NY 10016-5997, USA5 February 2007IEEE Power Engineering SocietySponsored by theInsulated Conductors CommitteeIEEE Std 400.3TM-2006 IEEE Guide for Partial Dis
2、charge Testing of Shielded Power Cable Systems in a Field Environment Sponsor Insulated Conductors Committee of the IEEE Power Engineering Society Approved 15 September 2006 IEEE-SA Standards Board Abstract: This guide covers the diagnostic testing of new or service-aged installed shielded power cab
3、le systems, which include cable, joints, and terminations, using partial discharge (PD) detection, measurement, and location. Partial discharge testing, which is a useful indicator of insulation degradation, may be carried out on-line or off-line by means of an external voltage source. This guide do
4、es not include the testing of compressed gas insulated systems or continuous on-line monitoring at normal service voltage. Keywords: cable system testing, cable testing, diagnostic testing, off-line partial discharge testing, on-line partial discharge testing, partial discharge testing _ The Institu
5、te of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright 2007 by the Institute of Electrical and Electronics Engineers, Inc. All rights reserved. Published 5 February 2007. Printed in the United States of America. National Electrical Safety Code and NESC
6、 are registered trademarks in the U.S. Patent +1 978 750 8400. Permission to photocopy portions of any individual standard for educational classroom use can also be obtained through the Copyright Clearance Center. iv Copyright 2007 IEEE. All rights reserved. Introduction This introduction is not par
7、t of IEEE Std 400.3-2006, IEEE Guide for Partial Discharge Testing of Shielded Power Cable Systems in a Field Environment. Cable systems need to be tested after installation, periodically during their service life, occasionally after frequent failures in specific types of cables or accessories, and
8、whenever a decision needs to be made about cable repair or replacement. The main purpose of testing is to provide a high degree of service reliability in the most economic fashion. To guarantee optimum performance of the power cable system, standards and guidelines have been developed that address t
9、he specific testing requirements for newly installed and service-aged extruded and laminated dielectic insulation. This guide was prepared by working group C-19W of the IEEE Insulated Conductors Committee. Notice to users Errata Errata, if any, for this and all other standards can be accessed at the
10、 following URL: http:/ standards.ieee.org/reading/ieee/updates/errata/index.html. Users are encouraged to check this URL for errata periodically. Interpretations Current interpretations can be accessed at the following URL: http:/standards.ieee.org/reading/ieee/interp/ index.html. Patents Attention
11、is called to the possibility that implementation of this standard may require use of subject matter covered by patent rights. By publication of this standard, no position is taken with respect to the existence or validity of any patent rights in connection therewith. The IEEE shall not be responsibl
12、e for identifying patents or patent applications for which a license may be required to implement an IEEE standard or for conducting inquiries into the legal validity or scope of those patents that are brought to its attention. v Copyright 2007 IEEE. All rights reserved. Participants At the time thi
13、s guide was completed, the C-19W Working Group had the following membership: Matthew S. Mashikian, Chair Willem Boone, Vice Chair Nezar Ahmed Lawrence W. Bobb Steven A. Boggs Arvid J. Braun John R. Densley Swapan K. Dey Craig Goodwin Edward Gulski Richie Harp Stanley V. Heyer John Hinkle William Lar
14、zelere Rachel I. Mosier Ralph E. Patterson Johannes Rickmann Dirk Russworm Lawrence Salberg Albert Spear William A. ThueThe following members of the individual balloting committee voted on this guide. Balloters may have voted for approval, disapproval, or abstention. Roy W. Alexander Butch Anton Ali
15、 Al Awazi Saber Azizi-Ghannad Michael P. Baldwin Earle C. Bascom III Martin Baur Michael G. Bayer Steven A. Boggs Kenneth E. Bow Chris Brooks Kent W. Brown William A. Byrd Jim Y. Cai Mark S. Clark John H. Cooper Tommy P. Cooper Jorge E. Fernandez Daher J. P. Disciullo Gary L. Donner Randall L. Dotso
16、n Dana S. Dufield Donald G. Dunn Gary R. Engmann Robert B. Fisher Rabiz N. Foda Marcel Fortin Carl J. Fredericks Edgar O. Galyon R. B. Gear Jr. David L. Gilmer Steven N. Graham Randall C. Groves Ajit K. Gwal Adrienne M. Hendrickson Lauri J. Hiivala Ajit K. Hiranandani David A. Horvath Dennis Horwitz
17、 David W. Jackson A. S. Jones James H. Jones Gael Kennedy Joseph L. Koepfinger Jim Kulchisky Saumen K. Kundu Thomas W. La Rose Solomon Lee Maurice Linker William E. Lockley Lisardo Lourido William Lumpkins G. L. Luri Glenn J. Luzzi Eric P. Marsden Matthew S. Mashikan William M. McDermid Nigel P. McQ
18、uin John E. Merando Jr. Gary L. Michel Rachel I. Mosier Jerry R. Murphy Shantanu Nandi Michael S. Newman Joe W. Nims Ralph E. Patterson Allan D. St. Peter Johannes Rickmann Michael A. Roberts Robert L. Seitz David Singleton Michael J. Smalley James E. Smith S. Thamilarasan James E. Timperley Joseph
19、J. Vaschak Waldemar G. Von Miller Edward E. Walcott Carl T. Wall Mark D. Walton William D. Wilkens James W. Wilson Jr. Luis E. Zambrano Donald W. Zipsevi Copyright 2007 IEEE. All rights reserved. When the IEEE-SA Standards Board approved this application guide on 15 September 2006, it had the follow
20、ing membership: Steve M. Mills, Chair Richard H. Hulett, Vice Chair Don Wright, Past Chair Judith Gorman, Secretary Mark D. Bowman Dennis B. Brophy Joseph Bruder Richard Cox Bob Davis Julian Forster* Joanna N. Guenin Mark S. Halpin Raymond Hapeman William B. Hopf Lowell G. Johnson Herman Koch Joseph
21、 L. Koepfinger* David J. Law Daleep C. Mohla Paul Nikolich T. W. Olsen Glenn Parsons Ronald C. Petersen Gary S. Robinson Frank Stone Malcolm V. Thaden Richard L. Townsend Joe D. Watson Howard L. Wolfman *Member Emeritus Also included are the following nonvoting IEEE-SA Standards Board liaisons: Sati
22、sh K. Aggarwal, NRC Representative Richard DeBlasio, DOE Representative Alan H. Cookson, NIST Representative Catherine Berger IEEE Standards Project Editor Angela Ortiz IEEE Standards Program Manager, Technical Program Development vii Copyright 2007 IEEE. All rights reserved. Contents 1. Overview 1
23、1.1 Scope . 2 1.2 Purpose 2 1.3 Background 2 2. Normative references 3 3. Definitions, acronyms, and abbreviations 3 3.1 Definitions . 3 3.2 Acronyms and abbreviations . 4 4. Partial discharge data interpretation . 5 4.1 Type and location of defects 8 4.2 Insulating materials 12 4.3 Operating condit
24、ions 12 5. Partial discharge detection 13 5.1 General test setup. 14 5.2 Partial discharge detection methods 15 5.3 Partial discharge detection sensitivity 16 5.4 Partial discharge location. 16 5.5 Test limitations 19 6. Voltage sources 20 6.1 Sinusoidal power-frequency voltage sources. 20 6.2 Alter
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