IEEE 1776-2008 en Recommended Practice for Thermal Evaluation of Unsealed or Sealed Insulation Systems for AC Electric Machinery Employing Form- Wound Pre-Insul.pdf
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1、IEEE Std 1776-2008IEEE Recommended Practice for Thermal Evaluation of Unsealed or Sealed Insulation Systems for AC Electric Machinery Employing Form-Wound Pre-Insulated Stator Coils for Machines Rated 15 000 V and BelowIEEE3 Park Avenue New York, NY 10016-5997, USA13 February 2009 IEEE Power +1 978
2、750 8400. Permission to photocopy portions of any individual standard for educational classroom use can also be obtained through the Copyright Clearance Center. iv Copyright 2009 IEEE. All rights reserved. Introduction This introduction is not part of IEEE Std 1776-2008, IEEE Recommended Practice fo
3、r Thermal Evaluation of Unsealed or Sealed Insulation Systems for AC Electric Machinery Employing Form-Wound Pre-Insulated Stator Coils for Machines Rated 15 000 V and Below. This recommended practice is intended to provide an evaluation of the thermal capability of an unsealed or sealed insulation
4、system. Other aging factors; electrical, mechanical, and environmental are also known to be important. Test procedures for evaluating those factors, both individually and in combination with each other, will be pursued by other working groups. Notice to users Laws and regulations Users of these docu
5、ments should consult all applicable laws and regulations. Compliance with the provisions of this standard does not imply compliance to any applicable regulatory requirements. Implementers of the standard are responsible for observing or referring to the applicable regulatory requirements. IEEE does
6、not, by the publication of its standards, intend to urge action that is not in compliance with applicable laws, and these documents may not be construed as doing so. Copyrights This document is copyrighted by the IEEE. It is made available for a wide variety of both public and private uses. These in
7、clude both use, by reference, in laws and regulations, and use in private self-regulation, standardization, and the promotion of engineering practices and methods. By making this document available for use and adoption by public authorities and private users, the IEEE does not waive any rights in co
8、pyright to this document. Updating of IEEE documents Users of IEEE standards should be aware that these documents may be superseded at any time by the issuance of new editions or may be amended from time to time through the issuance of amendments, corrigenda, or errata. An official IEEE document at
9、any point in time consists of the current edition of the document together with any amendments, corrigenda, or errata then in effect. In order to determine whether a given document is the current edition and whether it has been amended through the issuance of amendments, corrigenda, or errata, visit
10、 the IEEE Standards Association web site at http:/ieeexplore.ieee.org/xpl/standards.jsp, or contact the IEEE at the address listed previously. For more information about the IEEE Standards Association or the IEEE standards development process, visit the IEEE-SA web site at http:/standards.ieee.org.
11、v Copyright 2009 IEEE. All rights reserved. Errata Errata, if any, for this and all other standards can be accessed at the following URL: http:/standards.ieee.org/reading/ieee/updates/errata/index.html. Users are encouraged to check this URL for errata periodically. Interpretations Current interpret
12、ations can be accessed at the following URL: http:/standards.ieee.org/reading/ieee/interp/ index.html. Patents Attention is called to the possibility that implementation of this recommended practice may require use of subject matter covered by patent rights. By publication of this recommended practi
13、ce, no position is taken with respect to the existence or validity of any patent rights in connection therewith. The IEEE is not responsible for identifying Essential Patent Claims for which a license may be required, for conducting inquiries into the legal validity or scope of Patents Claims or det
14、ermining whether any licensing terms or conditions provided in connection with submission of a Letter of Assurance, if any, or in any licensing agreements are reasonable or non-discriminatory. Users of this recommended practice are expressly advised that determination of the validity of any patent r
15、ights, and the risk of infringement of such rights, is entirely their own responsibility. Further information may be obtained from the IEEE Standards Association. vi Copyright 2009 IEEE. All rights reserved. Participants At the time this recommended practice was completed, this Working Group of the
16、Materials subcommittee of the Electric Machinery committee had the following membership: Chuck Wilson, Chair Nancy Frost, Secretary Dana Arndt Ray Bartnikas Kevin Becker Andrew Brown Weijen Chen Ian Culbert Paul Gaberson George Gao Bal K. Gupta Gary Heuston Richard Huber Jeff Hudson Aleksandra Jerem
17、ic Brandy LaBanca Lou Little David McKinnon Charles Millet Howard Penrose Lon Rux Meredith Stranges Ed Van Vooren Roger Wicks Joseph Williams Hugh Zhu The following members of the individual balloting committee voted on this recommended practice. Balloters may have voted for approval, disapproval, o
18、r abstention. Gabriele F. D. Alleva Anderson Paul Michael Bayer Thomas Bishop William Bloeth Andrew Brown Weijen Chen Roger Daugherty Matthew Davis John Densley Gary L. Donner Donald Dunn James Dymond Gary Engmann William Finley Rostyslaw Fostiak Carl Fredericks Nancy Frost Paul Gaberson J. Travis G
19、riffith Randall Groves Bal K. Gupta Gary Heuston Scott Hietpas Werner Hoelzl David Horvath Jeffrey Hudson Richard Hulett Innocent Kamwa Joeseph L. Koepfinger Brandy LaBanca Chung-Yiu Lam William Lockley Kevin Loving William McBride David McKinnon James Michalec Gary Michel G. Harold Miller Charles M
20、illet Glenn Mottershead Jerry Murphy Marcie Muzzey Paul Myers Arthur Neubauer Michael S. Newman Howard Penrose Christopher Petrola Alvaro Portillo Iulian Profir Madan Rana Gregory Stone Meredith Stranges S. Thamilarasan John Vergis Kenneth White Joseph Williams Chuck Wilson Hugh Zhu When the IEEE-SA
21、 Standards Board approved this recommended practice on 10 December 2008, it had the following membership: Robert M. Grow, Chair Thomas Prevost, Vice Chair Steve M. Mills, Past Chair Judith Gorman, Secretary Victor Berman Richard DeBlasio Andy Drozd Mark Epstein Alexander Gelman William Goldbach Arni
22、e Greenspan Ken Hanus Jim Hughes Richard Hulett Young Kyun Kim Joseph L. Koepfinger* John Kulick David J. Law Glenn Parsons Ron Petersen Chuck Powers Narayanan Ramachandran Jon Walter Rosdahl Anne-Marie Sahazizian Malcolm Thaden Howard Wolfman Don Wright vii Copyright 2009 IEEE. All rights reserved.
23、 *Member Emeritus Also included are the following nonvoting IEEE-SA Standards Board liaisons: Satish K. Aggarwal, NRC Representative Michael Janezic, NIST Representative Michelle Turner IEEE Standards Program Manager, Document Development Soo H. Kim IEEE Standards Program Manager, Technical Program
24、Development viii Copyright 2009 IEEE. All rights reserved. Contents 1. Overview 1 1.1 Scope . 1 1.2 Purpose 2 1.3 General conditions. 2 1.4 Methods of evaluation . 2 2. Normative references 3 3. Definitions 3 4. Test models. 4 4.1 General 4 4.2 Construction of test models . 4 5. Text exposure . 8 5.
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