IEEE 1720-2012 en Recommended Practice for Near-Field Antenna Measurements《近场天线测量的IEEE推荐实施规程》.pdf

《IEEE 1720-2012 en Recommended Practice for Near-Field Antenna Measurements《近场天线测量的IEEE推荐实施规程》.pdf》由会员分享，可在线阅读，更多相关《IEEE 1720-2012 en Recommended Practice for Near-Field Antenna Measurements《近场天线测量的IEEE推荐实施规程》.pdf（102页珍藏版）》请在麦多课文档分享上搜索。

1、 IEEE Recommended Practice for Near-Field Antenna Measurements Sponsored by the Antenna Standards Committee IEEE 3 Park Avenue New York, NY 10016-5997 USA 5 December 2012 IEEE Antennas and Propagation Society IEEE Std 1720-2012 IEEE Std 1720-2012 IEEE Recommended Practice for Near-Field Antenna Meas

2、urements Sponsor Antenna Standards Committee of the IEEE Antennas and Propagation Society Approved 20 August 2012 IEEE-SA Standards Board Abstract: Near-field test practices for the measurement of antenna properties are described in this document and near-field measurement practices for the three pr

3、incipal geometries: cylindrical, planar, and spherical are recommended. Measurement practices for the calibration of probes used as reference antennas in near-field measurements are also recommended. Keywords: antenna measurements, antenna near-field measurements, cylindrical near-field measurements

4、, IEEE 1720, near-field measurements, planar near-field measurements, probe calibrations, spherical near-field measurements The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright 2012 by The Institute of Electrical and Electronics Engineers,

5、 Inc. All rights reserved. Published 05 December 2012. Printed in the United States of America. IEEE is a registered trademark in the U.S. Patent +1 978 750 8400. Permission to photocopy portions of any individual standard for educational classroom use can also be obtained through the Copyright Clea

6、rance Center. Copyright 2012 IEEE. All rights reserved. iv Notice to users Laws and regulations Users of IEEE Standards documents should consult all applicable laws and regulations. Compliance with the provisions of any IEEE Standards document does not imply compliance to any applicable regulatory r

7、equirements. Implementers of the standard are responsible for observing or referring to the applicable regulatory requirements. IEEE does not, by the publication of its standards, intend to urge action that is not in compliance with applicable laws, and these documents may not be construed as doing

8、so. Copyrights This document is copyrighted by the IEEE. It is made available for a wide variety of both public and private uses. These include both use, by reference, in laws and regulations, and use in private self-regulation, standardization, and the promotion of engineering practices and methods

9、. By making this document available for use and adoption by public authorities and private users, the IEEE does not waive any rights in copyright to this document. Updating of IEEE documents Users of IEEE Standards documents should be aware that these documents may be superseded at any time by the i

10、ssuance of new editions or may be amended from time to time through the issuance of amendments, corrigenda, or errata. An official IEEE document at any point in time consists of the current edition of the document together with any amendments, corrigenda, or errata then in effect. In order to determ

11、ine whether a given document is the current edition and whether it has been amended through the issuance of amendments, corrigenda, or errata, visit the IEEE-SA Website at http:/standards.ieee.org/index.html or contact the IEEE at the address listed previously. For more information about the IEEE St

12、andards Association or the IEEE standards development process, visit IEEE-SA Website at http:/standards.ieee.org/index.html. Errata Errata, if any, for this and all other standards can be accessed at the following URL: http:/standards.ieee.org/findstds/errata/index.html. Users are encouraged to chec

13、k this URL for errata periodically. Copyright 2012 IEEE. All rights reserved. v Patents Attention is called to the possibility that implementation of this standard may require use of subject matter covered by patent rights. By publication of this standard, no position is taken by the IEEE with respe

14、ct to the existence or validity of any patent rights in connection therewith. If a patent holder or patent applicant has filed a statement of assurance via an Accepted Letter of Assurance, then the statement is listed on the IEEE-SA Website at http:/standards.ieee.org/about/sasb/patcom/patents.html.

15、 Letters of Assurance may indicate whether the Submitter is willing or unwilling to grant licenses under patent rights without compensation or under reasonable rates, with reasonable terms and conditions that are demonstrably free of any unfair discrimination to applicants desiring to obtain such li

16、censes. Essential Patent Claims may exist for which a Letter of Assurance has not been received. The IEEE is not responsible for identifying Essential Patent Claims for which a license may be required, for conducting inquiries into the legal validity or scope of Patents Claims, or determining whethe

17、r any licensing terms or conditions provided in connection with submission of a Letter of Assurance, if any, or in any licensing agreements are reasonable or non-discriminatory. Users of this standard are expressly advised that determination of the validity of any patent rights, and the risk of infr

18、ingement of such rights, is entirely their own responsibility. Further information may be obtained from the IEEE Standards Association. Copyright 2012 IEEE. All rights reserved. vi Participants At the time this IEEE recommended practice was completed, the Near-Field Antenna Measurements Working Grou

19、p had the following membership: Michael H. Francis, Chair Lars Jacob Foged, Secretary Donald Bodnar Martin Boettcher John Cable Francesco DAgostino Justin Dobbins Jeffrey Fordham Dayel Garneski Claudio Gennarelli Jeffrey Guerrieri Doren Hess Kevin Higgins Daniel Janse van Rensburg Frank Jensen Edwar

20、d Joy Gerard Matyas Scott McBride Josef Migl Zachary Newbold Allen Newell Sergey Pivnenko Yahya Rahmat-Samii Carlo Rizzo Luis Rolo Luca Salghetti-Drioli Manuel Sierra-Castaer Leili Shafai Hans Steiner Ivan Stonich Hulean Tyler Jeffrey Way Mark Winebrand Ronald Wittmann During preparation of this rec

21、ommended practice, the following people made substantial contributions: Aksel Frandsen Shantnu Mishra Giovanni Riccio The following members of the individual balloting committee voted on this recommended practice. Balloters may have voted for approval, disapproval, or abstention. William Byrd Keith

22、Chow Justin Dobbins Carlo Donati Lars Foged Jeffrey Fordham Michael Francis Avraham Freedman Randall Groves Timothy Harrington Doren Hess Werner Hoelzl Efthymios Karabetsos Greg Luri Ahmad Mahinfallah Wayne Manges Edward McCall Michael S. Newman Nick S. A. Nikjoo Satoshi Oyama R. K. Rannow Robert Ro

23、binson Bartien Sayogo Gil Shultz Thomas Starai Walter Struppler John Vergis Jeffrey Way Mark Winebrand Ronald Wittmann Copyright 2012 IEEE. All rights reserved. vii When the IEEE-SA Standards Board approved this recommended practice on 20 August 2012, it had the following membership: Richard H. Hule

24、tt, Chair John Kulick, Vice Chair Robert M. Grow, Past Chair Konstantinos Karachalios, Secretary Satish Aggarwal Masayuki Ariyoshi Peter Balma William Bartley Ted Burse Clint Chaplin Wael Diab Jean-Philippe Faure Alex Gelman Paul Houz Jim Hughes Young Kyun Kim Joseph L. Koepfinger* David J. Law Thom

25、as Lee Hung Ling Oleg Logvinov Ted Olsen Gary Robinson Jon Rosdahl Mike Seavey Yatin Trivedi Phil Winston Yu Yuan*Member Emeritus Also included are the following nonvoting IEEE-SA Standards Board liaisons: Richard DeBlasio, DOE Representative Michael Janezic, NIST Representative Patrick Gibbons IEEE

26、 Standards Program Manager, Document Development Michael Kipness IEEE Standards Program Manager, Technical Program Development Copyright 2012 IEEE. All rights reserved. viii Introduction This introduction is not part of IEEE Std 1720TM-2012, IEEE Recommended Practice for Near-Field Antenna Measureme

27、nts. When IEEE Std 149TM-1979 (IEEE Standard Test Procedures for Antennas) was first developed, near-field antenna measurement was in its infancy. In the mid-1980s, the use of near-field methods for measuring antennas started becoming more widespread, especially for testing communication satellite a

28、ntennas. Today, more than 200 facilities worldwide employ near-field methods for measuring antenna parameters. Many believe the time had come to develop a set of recommended practices for these measurements. This document lays out recommended practices for near-field measurements for the three princ

29、ipal geometries: cylindrical, planar, and spherical. It also indicates recommended measurement practices for the calibration of probes used as reference antennas in near-field measurements. Copyright 2012 IEEE. All rights reserved. ix Contents 1. Overview 1 1.1 Scope . 1 1.2 Purpose 1 2. Normative r

30、eferences 2 3. Background 2 3.1 Antenna patterns 2 3.2 Basic near-field measurement theory 4 3.3 Far-field versus near-field measurements 6 3.4 Executive summary . 6 4. Measurements systems . 7 4.1 Mechanical scanning subsystems 7 4.2 Typical RF subsystem.11 4.3 Typical data collection subsystem 12

31、4.4 Data processing.14 4.5 Measurement accuracy .14 4.6 Correction schemes .17 5. Planar near-field scanning measurements .20 5.1 Introduction 20 5.2 Summary of theory .22 5.3 Implementation .24 6. Cylindrical near-field scanning measurements 34 6.1 Introduction 34 6.2 Summary of the basic theory 34

32、 6.3 Implementation .37 7. Spherical near-field scanning 40 7.1 Introduction 40 7.2 Summary of spherical near-field theory .40 7.3 Implementation .45 8. Probes 52 8.1 Probe properties 53 8.2 Description and classification of probe antennas 55 8.3 Probe parameters 58 8.4 Probe characterization 58 8.5

33、 Probe arrays 59 9. Uncertainty analysis 62 9.1 Introduction 62 9.2 Initial system adjustment and tests .65 9.3 Methods for estimating and expressing uncertainties of individual terms 65 9.4 Methods of evaluation of each term for planar, cylindrical, and spherical near-field measurements .66 9.5 Com

34、bining uncertainties .78 10. Special topics .78 10.1 Effective isotropic radiated power 78 Copyright 2012 IEEE. All rights reserved. x 10.2 Saturating flux density 79 10.3 Pulsed-mode measurement techniques .79 10.4 Phase retrieval methods 80 10.5 Back projections .80 10.6 Probe-position correction

35、81 10.7 Truncation mitigation .82 10.8 Time gating in near-field antenna measurements .82 11. Summary .82 Annex A (informative) Bibliography 83 Copyright 2012 IEEE. All rights reserved. 1 IEEE Recommended Practice for Near-Field Antenna Measurements IMPORTANT NOTICE: IEEE Standards documents are not

36、 intended to ensure safety, health, or environmental protection, or ensure against interference with or from other devices or networks. Implementers of IEEE Standards documents are responsible for determining and complying with all appropriate safety, security, environmental, health, and interferenc

37、e protection practices and all applicable laws and regulations. This IEEE document is made available for use subject to important notices and legal disclaimers. These notices and disclaimers appear in all publications containing this document and may be found under the heading “Important Notice” or

38、“Important Notices and Disclaimers Concerning IEEE Documents.” They can also be obtained on request from IEEE or viewed at http:/standards.ieee.org/IPR/disclaimers.html. 1. Overview 1.1 Scope This document describes near-field test practices for the measurement of antenna properties. It provides inf

39、ormation on developments in near-field measurements that have occurred since the writing of IEEE Std 149-1979 (IEEE Standard Test Procedures for Antennas). This document recommends near-field measurement practices for the three principal geometries: cylindrical, planar, and spherical, and also recom

40、mends measurement practices for the calibration of probes used as reference antennas in near-field measurements. 1.2 Purpose The purpose of this recommended practice document is to provide practical guidance to those who are planning to do near-field measurements. This document also specifies capabi

41、lities required of a near-field measurement system. IEEE Std 1720-2012 IEEE Recommended Practice for Near-Field Antenna Measurements Copyright 2012 IEEE. All rights reserved. 2 2. Normative references The following referenced documents are indispensable for the application of this document (i.e., th

42、ey must be understood and used, so each referenced document is cited in text and its relationship to this document is explained). For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments or corrigenda) appli

43、es. IEEE Std 145, IEEE Standard Definitions of Terms for Antennas.1,2IEEE Std 149, IEEE Standard Test Procedures for Antennas. IEEE Antennas and Propagation Society, “Special Issue on Near-Field Scanning Techniques,” IEEE Transactions on Antennas and Propagation, vol. 36, no. 6, pp. 727901, 1988. 3.

44、 Background 3.1 Antenna patterns We consider an ( )tiexp time dependence with frequency )2/( =f , wave number /2=k , and wavelength . Note that modern receivers generally use the ( )exp jt+time dependence. However much of the early theory and current software uses the ( )tiexp convention. The practi

45、tioner needs to be aware of the potential conflict. A minus sign needs to be added to the phase of a receiver using the +jt convention to get the proper result from software using the it convention. Sufficiently distant from a radiating antenna, the electric field is transverse and is given by the e

46、xpression 0)(exp)()( aikrikrrtrtrE(1) () 0=rt r . (2) In any direction, the transmitting function ()tr is characterized by amplitude and phase (or real and imaginary part) and complex polarization. Equation (1) embodies the linear relation between the radiated field and the excitation0a . The power

47、accepted by the transmitting antenna is 2201 0(1 | | ) | |tPK a= , (3) where t is the impedance reflection coefficient, looking into the transmitting antenna 1K is an arbitrary constant. 1The IEEE standards or products referred to in this clause are trademarks of The Institute of Electrical and Elec

48、tronics Engineers, Inc. 2IEEE publications are available from the Institute of Electrical and Electronics Engineers (http:/standards.ieee.org/). IEEE Std 1720-2012 IEEE Recommended Practice for Near-Field Antenna Measurements Copyright 2012 IEEE. All rights reserved. 3 Once 1K is fixed, 0P determine

49、s 0a , and hence )(rt , up to an arbitrary (and unimportant) overall phase factor. A common rule of thumb states that Equation (1) is valid in the far-field region frr (e.g., IEEE Std 145, IEEE Standard Definitions of Terms for Antennas) where 22 ,10 , 10 ,fDr D or (4) whichever is greatest. D is the diameter of the smallest sphere that encloses the radiating parts of the antenna. Larger values of frmay be needed depending on antenna type or accuracy requirements. Consider an incident plane wave )exp(2)(0rkErE = ii(5) 00=Ek