IEEE 1696-2013 en Terminology and Test Methods for Circuit Probes《电路探测器试验方法和术语的IEEE标准》.pdf

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1、 IEEE Standard for Terminology and Test Methods for Circuit Probes Sponsored by the Waveform Generation, Measurement, and Analysis Technical Committee IEEE 3 Park Avenue New York, NY 10016-5997 USA IEEE Instrumentation and Measurement SocietyIEEE Std 1696-2013IEEE Std 1696-2013 IEEE Standard for Ter

2、minology and Test Methods for Circuit Probes Sponsor Waveform Generation, Measurement, and Analysis Technical Committee of the IEEE Instrumentation and Measurement Society Approved 11 December 2013 IEEE-SA Standards Board Abstract: Currently, no defined, industry-accepted method exists for character

3、izing the performance of electrical circuit probes. Each vendor has its own proprietary methods for characterization, leaving probe customers and users without a valid means of comparing probe performance and/or of understanding the circuit-loading effect of the probe. Methods for measuring paramete

4、rs indicative of a probes or probe systems performance and guidance on the design and use of a test fixture for measuring probe performance are provided by this standard. An industry-accepted, unbiased means for characterizing probe performance is given by these methods. High-impedance voltage probe

5、s that are used to measure the performance of electrical circuits are considered by this standard. The probe systems may include waveform acquisition hardware and software and signal/waveform analysis software. The probe will include the mechanism by which the circuit is contacted. This method and s

6、tandard will be applicable to all individual probes having one signal conductor and one ground conductor or two signal conductors, and having an input impedance at least five times greater than the impedance of the circuit under test. Keywords: common mode, frequency response, gain, IEEE 1696TM, inp

7、ut resistance, linearity, offset error, offset range, probe, probe-only, probe system, scattering parameters, test fixture, text methods, time response, transfer function The Institute of Electrical and Electronics Engineers, Inc. 3 Park Avenue, New York, NY 10016-5997, USA Copyright 2014 by The Ins

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37、reserved. Participants At the time this IEEE standard was completed, the Subcommittee on Probe Standards (IM/WM that is, they should not generate electromagnetic interference that affects the performance of other instruments or components in the system. External disturbance or interference can come

38、from computers, radio frequency (RF) devices, communication signals, and so on. The user of the standard should verify that the test system is not affected by external disturbances. The user should also be aware of possible damage to sensitive electronics by electrostatic discharge. Consequently, th

39、e test instrumentation and device under test should be placed on antistatic surfaces that are connected to earth ground and have a surface resistance greater than 106. The operator of the instruments should be connected to earth ground using wrist straps or similar devices. 1.3.3 Test equipment The

40、performance of the test equipment used for these tests should significantly exceed the desired performance of the circuit probe under test. How significantly more the performance of the test equipment must exceed that of the probe under test is dependent on user requirements for accuracy and uncerta

41、inty. Testing labs should be compliant with ISO/IEC 17025 to ensure quality of measurement results. In particular, traceability of instrumental calibration to a known standard is important. The test equipment required to perform the tests given in this standard are described in Clause 4. 1.3.4 Test

42、selection The test methods given in this standard are suggested methods for measuring the parameters that are indicative of probe performance. These test methods, although general, provide a logical process in which to acquire parameter information. To provide subsequent comparability with other mea

43、surements of the same parameter, deviation from the methods described in this standard should be noted by the user. IEEE Std 1696-2013 IEEE Standard for Terminology and Test Methods for Circuit Probes 3 Copyright 2014 IEEE. All rights reserved. 1.4 Manufacturer-supplied information 1.4.1 General inf

44、ormation To measure the performance of a probe satisfactorily, the manufacturer shall supply the following general information: a) Probe part number b) Physical characteristics: dimensions, packaging, and pinouts c) Power requirements (if applicable) d) Environmental conditions: safe operating, nono

45、perating, and specified performance temperature range; altitude limitations; humidity limits, operating and storage; vibration tolerance; and compliance with applicable electromagnetic interference specifications e) Any special or peculiar characteristics f) Compliance with other specifications g) C

46、ontrol signal characteristics (if applicable) 1.4.2 Important performance specifications The manufacturer shall provide the following specifications (see Clause 3 for definitions): a) Analog bandwidth, 3 dB b) Nominal attenuation c) Direct current (dc) input resistance (each side and/or differential

47、) d) Alternating current (ac) input impedance e) Equivalent input noise (root-mean-square rms voltage or spectral density) f) Input signal full-scale range with nominal reference signal levels (minimum, maximum, and/or typical) 2. Normative references The following referenced documents are indispens

48、able for the application of this document (i.e., they must be understood and used, so each referenced document is cited in text and its relationship to this document is explained). For dated references, only the edition cited applies. For undated references, the latest edition of the referenced docu

49、ment (including any amendments or corrigenda) applies. IEEE Std 181TM-2011, IEEE Standard for Transitions, Pulses, and Related Waveforms.1, 2IEEE Std 1057TM-2007, IEEE Standard for Digitizing Waveform Recorders. ISO/IEC 17025, General requirements for the competence of testing and calibration laboratories.31This publication is available from The Institute of Electrical and Electronics Engineers (http:/standards.ieee.org/). 2The IEEE standards or products referred to in this clause are trademarks of The Institute of Electrical and Electronics Engineers, Inc. 3ISO/IEC public