IEEE 1671-2010 en Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML《通过可扩展标记语言(XML)交换自动化试验设备和信息用自动试验标记语言.pdf

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1、 IEC 61671 Edition 1.0 2012-06 INTERNATIONAL STANDARD Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML IEC 61671:2012(E)IEEE Std1671-2010IEEE Std 1671THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright 2010 IEEE All rights reserved. IEEE is a r

2、egistered trademark in the U.S. Patent 35.060 PRICE CODEISBN 978-2-83220-104-6Warning! Make sure that you obtained this publication from an authorized distributor. IEEE Std 1671IEC 61671:2012 ii IEEE Std 1671-2010 Published by IEC under license from IEEE. 2010 IEEE. All rights reserved. Contents 1.

3、Overview 1 1.1 General 1 1.2 Scope . 2 1.3 Purpose 2 1.4 Application 3 1.5 Conventions used in this document . 4 2. Normative references 6 3. Definitions, acronyms, and abbreviations. 7 3.1 Definitions . 7 3.2 Acronyms and abbreviations . 10 4. Automatic test system (ATS) architecture 12 4.1 Automat

4、ic test equipment (ATE) . 12 4.2 Test program set (TPS) 15 4.3 Automatic diagnosis and testing 18 5. Automatic test markup language (ATML) . 19 5.1 ATS architecture elements addressed by ATML . 20 6. The ATML framework . 22 6.1 External interfaces . 22 6.2 Internal models 23 6.3 Services 23 7. ATML

5、specification techniques . 25 7.1 ATML common element partitioning 25 7.2 ATML XML schemas 28 7.3 XML schemas and their use in ATML 28 7.4 UML models 28 8. The ATML framework subdomains . 29 8.1 The ATML framework and ATML family component standards . 29 8.2 ATML subdomains 29 9. ATML XML schema nam

6、es and locations . 36 10. ATML XML schema extensibility . 39 11. Conformance 40 11.1 ATML family XML schemas 40 11.2 The ATML framework 40 Annex A (normative) XML schema style guidelines . 46 A.1 Naming conventions . 46 A.2 XML declaration . 48 A.3 ATML namespaces . 48 A.4 Versioning. 50 A.5 Documen

7、tation 51 A.6 Design . 52 IEC 61671:2012 IEEE Std 1671-2010 iii Published by IEC under license from IEEE. 2010 IEEE. All rights reserved. Annex B (normative) ATML common element schemas . 55 B.1 Common element schemaCommon.xsd 55 B.2 Common element schemaHardwareCommon.xsd 136 B.3 Common element sch

8、emaTestEquipment.xsd 227 Annex C (normative) ATML internal model schemas . 258 C.1 ATML internal model schemaCapabilities.xsd . 258 C.2 ATML internal model schemaWireLists.xsd 260 Annex D (normative) ATML runtime services 267 D.1 Messages . 267 D.2 Executive system service 267 D.3 Example WSDL servi

9、ce definition . 268 Annex E (informative) Pins, ports, connectors, and wire lists in ATML . 269 E.1 Introduction . 269 E.2 Overview of the base types . 270 E.3 Using ports, pins, and connectors together 273 E.4 Ports, pins, and capabilities . 275 E.5 Wire lists . 278 Annex F (informative) ATML capab

10、ilities . 283 F.1 Introduction . 283 F.2 Overview . 285 F.3 Describing instrument capabilities 289 F.4 Describing ATS capabilities 328 F.5 Capability information in ATML Test Description . 332 Annex G (informative) IEEE download Web site material associated with this document . 339 Annex H (informat

11、ive) ATS architectures 340 H.1 ATS architectures utilization of published standards 340 H.2 ATS architectural relationships to IEEE SCC20-based standards 343 H.3 ATS architectural ATML subdomain relationship to SIMICA standards. 343 Annex I (informative) Architecture examples 347 I.1 Instruments . 3

12、47 I.2 Test descriptions . 348 I.3 Complete testing scenario 350 I.4 Integrated ATML system . 363 Annex J (informative) UML models 367 J.1 Generic ATS testing of a UUT . 367 J.2 ATML XML schema relationships 369 Annex K (informative) Glossary 372 Annex L (informative) Bibliography 375 Annex M (infor

13、mative) IEEE List of Participants . 380 IEC 61671:2012 iv IEEE Std 1671-2010 Published by IEC under license from IEEE. 2010 IEEE. All rights reserved. Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML FOREWORD 1) The International Electrotechn

14、ical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this

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31、validity of any patent rights, and the risk of infringement of such rights, is entirely their own responsibility. IEC 61671:2012 IEEE Std 1671-2010 v Published by IEC under license from IEEE. 2010 IEEE. All rights reserved. International Standard IEC 61671/ IEEE Std 1671-2010 has been processed thro

32、ugh IEC technical committee 93: Design automation, under the IEC/IEEE Dual Logo Agreement. The text of this standard is based on the following documents: IEEE Std FDIS Report on voting IEEE Std 1671-2010 93/323/FDIS 93/330/RVDFull information on the voting for the approval of this standard can be fo

33、und in the report on voting indicated in the above table. The IEC Technical Committee and IEEE Technical Committee have decided that the contents of this publication will remain unchanged until the stability date indicated on the IEC web site under “http:/webstore.iec.ch“ in the data related to the

34、specific publication. At this date, the publication will be g135 reconfirmed, g135 withdrawn, g135 replaced by a revised edition, or g135 amended. IEC 61671:2012 vi IEEE Std 1671-2010 Published by IEC under license from IEEE. 2010 IEEE. All rights reserved. IEEE Std 1671-2010 (Revision of IEEE Std 1

35、671-2006) IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML Sponsor IEEE Standards Coordinating Committee 20 on Test and Diagnosis for Electronic Systems Approved 30 September 2010 IEEE-SA Standards Board IEC 61671:2012 IEEE

36、Std 1671-2010 vii Published by IEC under license from IEEE. 2010 IEEE. All rights reserved. Abstract: This document specifies a framework for the automatic test markup language (ATML) family of standards. ATML allows automatic test system (ATS) and test information to be exchanged in a common format

37、 adhering to the extensible markup language (XML) standard. Keywords: ATE description, ATE test results, ATML, ATS, automatic test equipment, automatic test markup language, automatic test system, interface test adapter, ITA, SI, synthetic instrumentation, test configuration, unit under test, UUT de

38、scription, UUT maintenance, XML instance document, XML schemag120IEEE is a registered trademark in the U.S. Patent isRef (1) indicates that it is a reference. The term “final #all” Is an XML property that prevents all derivation. Used by the Complex Type c:Extension. The use of “” in tables Indicate

39、s that no information is associated with this table cell or, with respect to attribute usage, implies optional. The term “content simple” Indicates that the XML element is not allowed to have attributes or subelements. The term “content complex” Indicates that a new complex data type is being define

40、d, which can be used to declare elements to accept attributes and/or subelements. The use of italics Represents a XML element defined outside the subclause. The use of “g20g3g171g3g146” and “g19g3g171g3g146” in tables Represents the number of times an XML element may appear in an XML instance docume

41、nt. i.e., either one to infinity times or zero to infinity times. XML snippets of XML instance documents Are given in the Courier type font. The XML attribute “xsi:type” Explicitly declares the XML element type. The use of “|” in XML simple types descriptions Indicates a logical OR. This document us

42、es the vocabulary and definitions of relevant IEEE standards. In case of conflict of definitions, except for the portions quoted from standards, the following precedence shall be observed: (1) Clause 3, (2) Annex K, and (3) The IEEE Standards Dictionary: Glossary of Terms in other words, the item is

43、 functioning as it was designed to operate. An ATS includes the following: a) ATE hardware and its operating software. b) TPSs, which include the hardware, software, and documentation required to interface with, and test, individual component items. The associated software development environments r

44、equired to produce the TPS are also included. c) Automatic diagnostics and testing. 4.1 Automatic test equipment (ATE) ATE refers to the test hardware and its accompanying software. ATE utilizes one or more computers to control test instruments such as digital voltmeters, waveform analyzers, signal

45、generators, and switching assemblies. This equipment operates under control of test software to provide a stimulus to a particular circuit or component in the UUT and then measure the output at various pins, ports, or connections to determine whether the UUT has performed to its specifications. The

46、basic definition of ATE, then, is computer-controlled stimulus and measurement. ATE is widely used in the electronic manufacturing industry to test electronics components and systems, both before and after they are fabricated. These electronic components and systems include (but are not limited to)

47、avionics systems on commercial and military aircraft, electronic modules in automobiles, and electronic medical devices. An ATE can be configured to test: a) Simple components (resistors, capacitors, and inductors). b) Integrated circuits (ICs). c) Printed circuit boards (PCBs). PCBs can also be ref

48、erred to as either shop replaceable units (SRUs) or shop replaceable assemblies (SRAs). d) Black boxes sometimes called either line replaceable units (LRUs) or weapons replaceable assemblies (WRAs). e) “All Up Round” weapons and weapon sections. f) Other related electronic components or modules. 4.1

49、.1 ATE hardware The hardware architecture of an ATS will depend on its planned use, e.g., research and development (R on budget and development-time constraints; existing expertise; and measurement throughput requirements. 7Concepts described in this clause have, in part, been derived from the DOD ATS Handbook B5. IEC 61671:2012 IEEE Std 1671-2010 13 Published by IEC under license from IEEE. 2010 IEEE. All rights reserved. In R&D, for example, parametric tests are performed but will not be repeated on hundreds of UUTs. In high-vol