IEEE 1366-2012 en Guide for Electric Power Distribution Reliability Indices《配电可靠性指数IEEE指南》.pdf

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1、 IEEE Guide for Electric Power Distribution Reliability Indices Sponsored by the Transmission and Distribution Committee IEEE 3 Park Avenue New York, NY 10016-5997 USA 31 May 2012 IEEE Power +1 978 750 8400. Permission to photocopy portions of any individual standard for educational classroom use ca

2、n also be obtained through the Copyright Clearance Center. Copyright 2012 IEEE. All rights reserved. ivNotice to users Laws and regulations Users of IEEE Standards documents should consult all applicable laws and regulations. Compliance with the provisions of any IEEE Standards document does not imp

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4、ese documents may not be construed as doing so. Copyrights This document is copyrighted by the IEEE. It is made available for a wide variety of both public and private uses. These include both use, by reference, in laws and regulations, and use in private self-regulation, standardization, and the pr

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9、/errata/index.html. Users are encouraged to check this URL for errata periodically. Patents Attention is called to the possibility that implementation of this standard may require use of subject matter covered by patent rights. By publication of this standard, no position is taken by the IEEE with r

10、espect to the existence or validity of any patent rights in connection therewith. If a patent holder or patent applicant has filed a statement of assurance via an Accepted Letter of Assurance, then the statement is listed on the IEEE-SA Website at http:/standards.ieee.org/about/sasb/patcom/patents.h

11、tml. Letters of Assurance may indicate whether the Submitter is willing or unwilling to grant licenses under patent rights without compensation or under reasonable rates, with reasonable terms and conditions that are demonstrably free of any unfair discrimination to applicants desiring to obtain suc

12、h licenses. Copyright 2012 IEEE. All rights reserved. vEssential Patent Claims may exist for which a Letter of Assurance has not been received. The IEEE is not responsible for identifying Essential Patent Claims for which a license may be required, for conducting inquiries into the legal validity or

13、 scope of Patents Claims, or determining whether any licensing terms or conditions provided in connection with submission of a Letter of Assurance, if any, or in any licensing agreements are reasonable or non-discriminatory. Users of this standard are expressly advised that determination of the vali

14、dity of any patent rights, and the risk of infringement of such rights, is entirely their own responsibility. Further information may be obtained from the IEEE Standards Association. Copyright 2012 IEEE. All rights reserved. viParticipants At the time this IEEE guide was completed, the Distribution

15、Reliability Working Group had the following membership: Rodney Robinson*, Chair (2011-present) Cheryl A. Warren*, Chair (1991-2011) John McDaniel*, Vice Chair Val Werner, Secretary John Ainscough Razon Alvin Daniel Arden Greg Ardrey Ignacio Ares Dave Asgharian John Banting Philip Barker Bill Becia R

16、oy Billinton Chantal Bitton David Blankenheim James D. Bouford* James Bundren James Burke Thomas Callsen Mark Carr Patrick Carroll Heide Caswell Bill Chisholm Richard D. Christie* Rob Christman G. Larry Clark Mike Clodfelder James Cole Larry Conrad Betsy Coppock Ed Cortez Herve Delmas Chuck DeNardo

17、Frank Doherty April Dornbrook R. Clay Doyle Jeff Duff Charlie Fijnvandratt Fredric Friend Keith Frost Anish Gaikwad David Gilmer Manuel Gonzalez John Goodfellow Tom Grisham Tom Gutwin Donald Hall Keith Harley Harry Hayes Charles Heising Richard Hensel James Hettrick Ray Hisayasu Alex Hoffman Tao Hon

18、g Ian Hoogendan Mike Hyland Cindy Janke Allan Jirges Joshua Jones Robert Jones Morteza Khodaie Mark Koyna Frank Lambert Dave Lankutis Larry Larson Jim Lemke Jack Leonard Giancarlo Leone Gene Lindholm Ray Lings Nick Loehlein Ning Lu J. C. Mathieson Ethan Matthes Ed Mayer Tom McCarthy Tom McDermott Ma

19、rk McGranaghan Kale Meade Tom Menten Mathieu Mougeot Terry Nielsen Gregory Obenchain Ray OLeary Gregory Olson Jamie Ortega Anil Pahwa Milorad Papic Marc Patterson Dan Pearson Mike Pehosh Charles Perry Ray Piercy Jeff Pogue Steve Pullins Mike Rafferty Caryn Riley D. Tom Rizy Tim Rogelstad Ziolo Rolda

20、n Robert Rusch David Russo D. Daniel Sabin Robert Saint N. D. R. Sarma Josh Schellenberg David J. Schepers* Steven Schott Andy Schwalm Ken Sedziol Matt Seeley Mike Shepherd David Shibilia Tom Short Cheong Siew Georges Simard Jeff Smith Rusty Soderberg John Spare Joshua Stallings Lee Taylor Mark That

21、cher Casey Thompson Betty Tobin Tom Tobin S. S. (Mani) Venkata Joseph Viglietta* Marek Waclawiak Juli Wagner Reigh Walling David Wang Daniel J. Ward Greg Welch Charlie Williams* John Williams Taui Willis Mike Worden Bo YangCopyright 2012 IEEE. All rights reserved. vii*Acknowledgments: The following

22、members were primary authors and data analyzers for the development of the 2.5 Beta Methodology that is used for identification of Major Event Days: James D. Bouford Richard D. Christie Dan Kowalewski John McDaniel Rodney Robinson David J. Schepers Joseph Viglietta Cheryl A. Warren Charlie Williams

23、The following members of the individual balloting committee voted on this guide. Balloters may have voted for approval, disapproval, or abstention. William Ackerman Michael Adams Ali Al Awazi Saleman Alibhay Robert Arno Thomas Basso Wallace Binder Robin Blanton James D. Bouford Gustavo Brunello Will

24、iam Bush William Byrd Mark Carr Robert Christman James Cleary James Cole Larry Conrad Timothy Croushore Gary Donner April Dornbrook Randall Dotson Neal Dowling Donald Dunn Gary Engmann Rabiz Foda Fredric Friend David Gilmer Mietek Glinkowski Waymon Goch Edwin Goodwin Thomas Grebe Randall Groves Ajit

25、 Gwal Donald Hall Dennis Hansen Jeffrey Hartenberger David Haynes Lee Herron James Hettrick Scott Hietpas Werner Hoelzl Joseph Jancauskas Jeffrey Jelzer Gael Kennedy Yuri Khersonsky Morteza Khodaie Joseph L. Koepfinger Jim Kulchisky Chung-Yiu Lam Paul Lindemulder Greg Luri William McBride John McDan

26、iel John McDonald Gary Michel C. Michael Miller Joydeep Mitra Jerry Murphy Arthur Neubauer Michael S. Newman Joe Nims Lorraine Padden Mirko Palazzo Bansi Patel Michael Roberts Rodney Robinson Charles Rogers Thomas Rozek D. Daniel Sabin Robert Saint Bartien Sayogo Dennis Schlender Robert Schuerger Gi

27、l Shultz Christine Siebenshuh Cheong Siew James Smith Jerry Smith John Spare Joshua Stallings Gary Stoedter Lee Taylor Mark Thatcher Eric Udren John Vergis Mark Walton Daniel J. Ward Lee Welch Kenneth White Jonathan Woodworth Jian Yu Francisc Zavoda Copyright 2012 IEEE. All rights reserved. viiiWhen

28、 the IEEE-SA Standards Board approved this guide on 14 May 2012, it had the following membership: Richard H. Hulett, Chair John Kulick, Vice Chair Robert M. Grow, Past President Satish Aggarwal Masayuki Ariyoshi Peter Balma William Bartley Ted Burse Clint Chaplin Wael Diab Jean-Philippe Faure Alexan

29、der Gelman Paul Houz Jim Hughes Young Kyun Kim Joseph L. Koepfinger* John Kulick David J. Law Thomas Lee Hung Ling Oleg Logvinov Ted Olsen Gary Robinson Jon Walter Rosdahl Mike Seavey Yatin Trivedi Phil Winston Yu Yuan *Member Emeritus Also included are the following nonvoting IEEE-SA Standards Boar

30、d liaisons: Richard DeBlasio, DOE Representative Michael Janezic, NIST Representative Julie Alessi IEEE Standards Program Manager, Document Development Matthew J. Ceglia IEEE Client Services Manager, Professional Services Copyright 2012 IEEE. All rights reserved. ixIntroduction This introduction is

31、not part of IEEE Std 1366-2012, IEEE Guide for Electric Power Distribution Reliability Indices. This guide was originally developed in 1998 to create indices specifically designed for distribution systems. Other groups have created indices for transmission and industrial systems, but none were avail

32、able for distribution. This group will continue working in this area by refining the information contained in this guide. This guide was updated in the 2003 revision to clarify existing definitions and to introduce a statistically based definition for classification of Major Event Days. The working

33、group created a methodology, 2.5 Beta Method, for determination of Major Event Days. Once days are classified as normal or Major Event Days, appropriate analysis and reporting can be conducted. This 2012 revision of the guide clarified several of the definitions and introduced two new indices. The n

34、ew indices are CELID-sand CELID-t, customers experiencing long interruption durations (both single and total). A section was also added to explain the investigation of catastrophic days. Copyright 2012 IEEE. All rights reserved. xContents 1. Overview 1 1.1 Introduction . 1 1.2 Scope . 1 1.3 Purpose

35、1 2. Definitions 2 3. Definitions of reliability indices. 4 3.1 Basic factors 4 3.2 Sustained interruption indices 5 3.3 Load based indices. 8 3.4 Other indices (momentary) 9 3.5 Major Event Day classification 10 4. Application of the indices. 13 4.1 Sample system . 14 4.2 Calculation of indices for

36、 a system with no Major Event Days. 15 4.3 Examples . 17 5. Information about the factors that affect the calculation of reliability indices . 19 5.1 Rationale behind selecting the indices provided in this guide . 19 5.2 Factors that cause variation in reported indices. 19 5.3 Major Event Days and c

37、atastrophic days. 19 Annex A (informative) Bibliography 21 Annex B (informative) Major event definition development 22 Annex C (informative) Internal data subset. 31 Copyright 2012 IEEE. All rights reserved. 1IEEE Guide for Electric Power Distribution Reliability Indices IMPORTANT NOTICE: IEEE Stand

38、ards documents are not intended to ensure safety, health, or environmental protection, or ensure against interference with or from other devices or networks. Implementers of IEEE Standards documents are responsible for determining and complying with all appropriate safety, security, environmental, h

39、ealth, and interference protection practices and all applicable laws and regulations. This IEEE document is made available for use subject to important notices and legal disclaimers. These notices and disclaimers appear in all publications containing this document and may be found under the heading

40、“Important Notice” or “Important Notices and Disclaimers Concerning IEEE Documents.” They can also be obtained on request from IEEE or viewed at http:/standards.ieee.org/IPR/disclaimers.html. 1. Overview 1.1 Introduction This full-use guide has been updated to clarify existing definitions, introduce

41、 two additional reliability indices, and add a discussion of Major Event Days and catastrophic days (see 5.3). 1.2 Scope This guide identifies distribution reliability indices and factors that affect their calculation. It includes indices, which are useful today, as well as ones that may be useful i

42、n the future. The indices are intended to apply to distribution systems, substations, circuits, and defined regions. 1.3 Purpose The purpose of this guide is twofold. First, it is to present a set of terms and definitions which can be used to foster uniformity in the development of distribution serv

43、ice reliability indices, to identify factors which affect the indices, and to aid in consistent reporting practices among utilities. Secondly, it is to provide guidance for new personnel in the reliability area and to provide tools for internal as well as external comparisons. In the past, other gro

44、ups have defined reliability indices for transmission, generation, and IEEE Std 1366-2012 IEEE Guide for Electric Power Distribution Reliability Indices Copyright 2012 IEEE. All rights reserved. 2distribution but some of the definitions already in use are not specific enough to be wholly adopted for

45、 distribution. Users of this guide should recognize that not all utilities would have the data available to calculate all the indices. 2. Definitions For the purposes of this document, the following terms and definitions apply. The IEEE Standards Dictionary: Glossary of Terms and Definitions1should

46、be consulted for terms not defined in this clause. connected load: Connected transformer or metered demand (to be clearly specified when reporting) on the circuit or portion of circuit that is interrupted. When reporting, the report should state whether it is based on an annual peak or on a reportin

47、g period peak. customer: A metered electrical service point for which an active bill account is established at a specific location. customer count: The number of customers either served or interrupted, depending on usage. distribution system: That portion of an electric system that delivers electric

48、 energy from transformation points on the transmission system to the customer. NOTEThe distribution system is generally considered to be anything from the distribution substation fence to the customer meter. Often the initial overcurrent protection and voltage regulators are within the substation fe

49、nce and are considered part of the distribution system.2forced outage: The state of a component when it is not available to perform its intended function due to an unplanned event directly associated with that component. interrupting device: A device to stop the flow of power, usually in response to a fault. Operation of the device can be accomplished by manual, automatic, or remotely operated methods. Examples include circuit breakers, line reclosers, line fuses, disconnect switches, sectionalizers, and/or others. interruption: The total loss of electric power on