IEEE 1310-2012 en Recommended Practice for Thermal Cycle Testing of Form-Wound Stator Bars and Coils for Large Rotating Machines《大型发电机用模绕定子棒和模绕线圈的热循环试验用IEEE推荐性操.pdf
《IEEE 1310-2012 en Recommended Practice for Thermal Cycle Testing of Form-Wound Stator Bars and Coils for Large Rotating Machines《大型发电机用模绕定子棒和模绕线圈的热循环试验用IEEE推荐性操.pdf》由会员分享,可在线阅读,更多相关《IEEE 1310-2012 en Recommended Practice for Thermal Cycle Testing of Form-Wound Stator Bars and Coils for Large Rotating Machines《大型发电机用模绕定子棒和模绕线圈的热循环试验用IEEE推荐性操.pdf(30页珍藏版)》请在麦多课文档分享上搜索。
1、 IEEE Recommended Practice for Thermal Cycle Testing of Form-Wound Stator Bars and Coils for Large Rotating Machines Sponsored by the Electric Machinery Committee IEEE 3 Park Avenue New York, NY 10016-5997 USA 21 May 2012 IEEE Power +1 978 750 8400. Permission to photocopy portions of any individual
2、 standard for educational classroom use can also be obtained through the Copyright Clearance Center. Copyright 2012 IEEE. All rights reserved. ivNotice to users Laws and regulations Users of IEEE Standards documents should consult all applicable laws and regulations. Compliance with the provisions o
3、f any IEEE Standards document does not imply compliance to any applicable regulatory requirements. Implementers of the standard are responsible for observing or referring to the applicable regulatory requirements. IEEE does not, by the publication of its standards, intend to urge action that is not
4、in compliance with applicable laws, and these documents may not be construed as doing so. Copyrights This document is copyrighted by the IEEE. It is made available for a wide variety of both public and private uses. These include both use, by reference, in laws and regulations, and use in private se
5、lf-regulation, standardization, and the promotion of engineering practices and methods. By making this document available for use and adoption by public authorities and private users, the IEEE does not waive any rights in copyright to this document. Updating of IEEE documents Users of IEEE Standards
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8、tact the IEEE at the address listed previously. For more information about the IEEE Standards Association or the IEEE standards development process, visit IEEE-SA Website at http:/standards.ieee.org/index.html. Errata Errata, if any, for this and all other standards can be accessed at the following
9、URL: http:/standards.ieee.org/findstds/errata/index.html. Users are encouraged to check this URL for errata periodically. Patents Attention is called to the possibility that implementation of this standard may require use of subject matter covered by patent rights. By publication of this standard, n
10、o position is taken by the IEEE with respect to the existence or validity of any patent rights in connection therewith. If a patent holder or patent applicant has filed a statement of assurance via an Accepted Letter of Assurance, then the statement is listed on the IEEE-SA Website at http:/standard
11、s.ieee.org/about/sasb/patcom/patents.html. Letters of Assurance may indicate whether the Submitter is willing or unwilling to grant licenses under patent rights without compensation or under reasonable rates, with reasonable terms and conditions that are demonstrably free of any unfair discriminatio
12、n to applicants desiring to obtain such licenses. Copyright 2012 IEEE. All rights reserved. vEssential Patent Claims may exist for which a Letter of Assurance has not been received. The IEEE is not responsible for identifying Essential Patent Claims for which a license may be required, for conductin
13、g inquiries into the legal validity or scope of Patents Claims, or determining whether any licensing terms or conditions provided in connection with submission of a Letter of Assurance, if any, or in any licensing agreements are reasonable or non-discriminatory. Users of this standard are expressly
14、advised that determination of the validity of any patent rights, and the risk of infringement of such rights, is entirely their own responsibility. Further information may be obtained from the IEEE Standards Association. Copyright 2012 IEEE. All rights reserved. viParticipants At the time this IEEE
15、recommended practice was completed, the Materials Subcommittee Working Group had the following membership: Gregory Stone, Chair Richard Huber, Vice Chair Ray Bartnikas Stefano Bomben Andrew Brown Don Campbell Doug Conley Ian Culbert S. N. Fernando Nancy Frost Paul Gaberson George Gao Bal Gupta Gary
16、Heuston Aleksandra Jeremic Thomas Klamt Laurent Lamarre Gerhard Lemesch William McDermid Charles Millet Glen Mottershead Sophie Noel Jeffrey Sheaffer Meredith Stranges Joe Williams Chuck Wilson Hugh Zhu The following members of the individual balloting committee voted on this recommended practice. B
17、alloters may have voted for approval, disapproval, or abstention. Michael Adams Thomas Bishop William Bloethe Stefano Bomben Steven Brockschink Andrew Brown Gustavo Brunello Weijen Chen Jerry Corkran Ian Culbert Jorge Fernandez Daher Matthew Davis Gary Donner Donald Dunn James Dymond Gary Engmann Ro
18、styslaw Fostiak Ron Greenthaler J. Travis Griffith Randall Groves Bal Gupta Gary Heuston David Horvath Richard Huber Innocent Kamwa Joseph L. Koepfinger Chung-Yiu Lam Gerhard Lemesch William Lockley Greg Luri William McBride William McCown William McDermid Don McLaren James Michalec Gary Michel G. H
19、arold Miller Charles Millet Jerry Murphy Michael S. Newman William Newman Lorraine Padden Christopher Petrola Alvaro Portillo Bartien Sayogo Jeffrey Sheaffer Gil Shultz James Smith Gary Stoedter Gregory Stone Meredith Stranges James Timperley Remi Tremblay John Vergis John Yale Hugh Zhu Copyright 20
20、12 IEEE. All rights reserved. viiWhen the IEEE-SA Standards Board approved this recommended practice on 29 March 2012, it had the following membership: Richard H. Hulett, Chair John Kulick, Vice Chair Robert M. Grow, Past President Judith Gorman, Secretary Satish Aggarwal Masayuki Ariyoshi Peter Bal
21、ma William Bartley Ted Burse Clint Chaplin Wael Diab Jean-Philippe Faure Alexander Gelman Paul Houz Jim Hughes Young Kyun Kim Joseph L. Koepfinger* John Kulick David J. Law Thomas Lee Hung Ling Oleg Logvinov Ted Olsen Gary Robinson Jon Walter Rosdahl Mike Seavey Yatin Trivedi Phil Winston Yu Yuan *M
22、ember Emeritus Also included are the following nonvoting IEEE-SA Standards Board liaisons: Richard DeBlasio, DOE Representative Michael Janezic, NIST Representative Julie Alessi IEEE Standards Program Manager, Document Development Malia Zaman IEEE Standards Program Manager, Technical Program Develop
23、ment Copyright 2012 IEEE. All rights reserved. viiiIntroduction This introduction is not part of IEEE Std 1310-2012, IEEE Recommended Practice for Thermal Cycle Testing of Form-Wound Stator Bars and Coils for Large Rotating Machines. In some applications, large rotating machines are subjected to rap
24、id transitions from low power to full power, and vice versa. For example, hydrogenerators (peaking duty and pumped storage), synchronous condensers, and gas turbine generators are often raised from idle to full power in a matter of minutes, are operated at full power for hours, and are then rapidly
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